JP2013104860A - Automatic visual inspection apparatus - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an automatic visual inspection apparatus capable of reducing an inspection time without constraints of imaging camera throughput.SOLUTION: An automatic visual inspection apparatus includes a table part, a scan stage part, a stroboscopic illumination part, a lens barrel part, imaging parts, and an inspection part for determining whether or not an obtained image to be inspected is acceptable on the basis of pre-registered inspection conditions. The scan stage part includes position measurement means for measuring the current position of a table. The lens barrel part includes optical branch means for transmitting part of observation light therethrough and reflecting part of the light by changing its angle. The lens barrel part includes the plural imaging parts each capable of imaging light branched by the optical branch means. A control part has a function to perform imaging while sequentially changing an imaging part to be used for imaging at each stroboscopic illumination.

Description

  The present invention relates to a technique for automatically inspecting a defect such as a circuit pattern formed on an inspection object such as glass or a semiconductor wafer.

  For example, a semiconductor device is manufactured by arranging and forming a plurality of circuit patterns on a single wafer and cutting it into individual pieces. Each circuit pattern is layered with multiple layers of wiring and film formation, but 100% inspection is performed after circuit patterning of each layer for defects such as wiring short-circuits, disconnections, and contamination. Has been done. (For example, Patent Document 1)

JP 2008-224303 A

  In order to increase the manufacturing quantity per unit time of a semiconductor device or the like, the inspection apparatus is also required to have a high throughput. Therefore, in order to shorten the inspection time spent per substrate, a form in which the speed of the moving stage is increased and a plurality of imaging units are arranged has been devised. However, even if the speed of the moving stage is increased, the time until the next image can be acquired after acquiring an image from the camera becomes a bottleneck, and there is a limit to increasing the speed.

  FIG. 10 is a time chart in the prior art, and shows a state in which images are captured by a camera according to an imaging instruction and data is transferred in time series. After instructing the camera to take an image, the camera is ready for imaging (depicted as imaging ON in the figure), and strobe illumination is emitted (denoted as ON in the figure) during that time. When the imaging of the camera is completed (when imaging is turned off in the figure), the image data is transferred from the camera to an external device or a buffer memory. Cameras that are widely used and have high general versatility are often used, but such cameras do not have a function to store captured images or only one next image during image data transfer. It is about to memorize. For this reason, imaging is sequentially performed at the same interval T1 in accordance with the interval Td at which image data can be transferred continuously. Therefore, when continuously capturing images, the interval T1 has become a bottleneck for time reduction.

  On the other hand, in order to shorten the inspection time, a form in which a plurality of image pickup units are arranged (for example, two circuit patterns are simultaneously acquired by two cameras) has been devised. When the interval could not be reduced, a plurality of circuits could not be imaged simultaneously, and the time could not be shortened as expected.

  In addition, when multiple objective lenses with different imaging magnifications are provided in order to support a wide variety of products, the number of lenses increases, which increases costs and corrects machine differences between multiple imaging units in order to ensure inspection quality. There is also a problem that it is necessary and causes further cost increase.

Accordingly, an object of the present invention is to provide an automatic visual inspection apparatus capable of reducing the inspection time without being restricted by the processing capability of the imaging camera.

In order to solve the above problems, the invention described in claim 1
An inspection object inspection apparatus for detecting defects in a pattern formed on an inspection object,
A table portion for placing the inspection object;
A scanning stage unit that scans and moves the table unit in a predetermined direction;
An illumination unit that emits illumination light toward the inspection object;
A lens barrel that guides, as observation light, light that is irradiated from the illumination unit and reflected by the inspection object or light that has passed through the inspection object;
An imaging unit that is attached to the lens barrel and images the observation light;
A control unit that images the observation light by causing the illumination unit to emit light while moving the scanning stage unit;
An inspection unit that determines the quality of the image of the imaged inspection object based on inspection conditions registered in advance;
The scanning stage unit is provided with position measuring means for measuring the current position of the table,
In the lens barrel portion, the observation light is partially transmitted and is partially reflected at a different angle.
Optical branching means are provided,
A plurality of the imaging units are attached to the lens barrel so that each of the lights branched by the light branching unit can be imaged.
The controller is
An automatic visual inspection apparatus having a function of performing imaging by sequentially changing an imaging unit used for imaging for each imaging.

  Since the apparatus of the present invention is used, the observation light is branched and can be simultaneously imaged by a plurality of imaging units, and by interlocking with the strobe light emission, one of the plurality of imaging units is being processed and the next Even in a state where imaging cannot be performed, imaging can be performed by another imaging unit.

The invention described in claim 2
An inspection object inspection apparatus for detecting defects in a pattern formed on an inspection object,
A table portion for placing the inspection object;
A scanning stage unit that scans and moves the table unit in a predetermined direction;
An illumination unit that emits illumination light toward the inspection object;
A lens barrel that guides, as observation light, light that is irradiated from the illumination unit and reflected by the inspection object or light that has passed through the inspection object;
An imaging unit that is attached to the lens barrel and images the observation light;
A control unit that images the observation light by causing the illumination unit to emit light while moving the scanning stage unit;
An inspection unit that determines the quality of the image of the imaged inspection object based on inspection conditions registered in advance;
The scanning stage unit is provided with position measuring means for measuring the current position of the table,
The lens barrel portion is provided with a light reflecting means that reflects and changes the angle or direction of the observation light,
A plurality of the imaging units are attached to the lens barrel so that each of the lights reflected by the light reflecting means can be imaged.
The controller is
An automatic appearance inspection characterized by having a function of changing the reflection direction of the light reflecting means in conjunction with the imaging and performing imaging by sequentially changing the imaging unit used for the imaging for each imaging. Device.

  Since the apparatus of the present invention is used, the observation light can be picked up by any one of the plurality of image pickup units by switching the direction, and by interlocking with the strobe light emission, Even when one image is being processed and the next image cannot be captured, the image capturing direction can be switched and an image can be captured by another image capturing unit.

The invention according to claim 3
The lens barrel is further provided with an actuator for changing the position or angle of the light reflecting means,
The control unit drives the actuator unit in conjunction with the imaging,
The automatic visual inspection apparatus according to claim 2, wherein the imaging is performed.

  If the apparatus of the said invention is used, the position or angle of a light reflection means can be controlled by an actuator part, and the shift | offset | difference of the position or angle of a light reflection means can be prevented.

The invention according to claim 4
The automatic appearance inspection apparatus according to claim 3, wherein the actuator unit is in a moving state at the position or the angle even during the imaging.

  By using the apparatus of the present invention, the position or angle of the light reflecting means continues to change before and after imaging, eliminating the inertial force caused by being stationary or moving again, and becoming a bottleneck for continuous imaging Can be reduced.

The invention described in claim 5
5. The automatic visual inspection apparatus according to claim 4, wherein the moving speed of the actuator unit during imaging is slower than the moving speed during non-imaging.

  By using the apparatus of the present invention, the position or angle of the light reflecting means continues to change before and after imaging, reducing the inertial force caused by being stationary or moving again, and image blurring during imaging. Can be reduced.

The invention described in claim 6
A position detector that detects a current position or an angle detector that detects a current angle is attached to the actuator unit or the light reflecting means.
6. The automatic appearance inspection apparatus according to claim 3, wherein the imaging is performed based on information of the position detector or the angle detector.

  If the apparatus of the said invention is used, the angle of the observation light reflected by the said light reflection means in a lens-barrel can be managed, and it can prevent that the to-be-inspected area | region of a test object remove | deviates from the visual field of an imaging part. it can.

The invention described in claim 7
The illumination unit that emits the illumination light is a strobe illumination unit that emits strobe illumination,
The automatic visual inspection apparatus according to claim 1, wherein the imaging is performed by light emission of strobe illumination.

If the apparatus of the said invention is used,
Since a flash with high emission energy can be irradiated relatively easily, the present invention can be applied even when an inexpensive camera with high versatility is used for imaging.

  The inspection time can be shortened without being restricted by the processing capability of the imaging camera.

It is a perspective view which shows an example of the form which embodies this invention. It is a system configuration figure showing an example of the form which embodies the present invention. It is a flowchart which shows an example of the form which embodies this invention. It is a time chart which shows an example of the form which embodies this invention. It is a perspective view which shows another example of the form which embodies this invention. It is a perspective view which shows another example of the form which embodies this invention. It is sectional drawing which shows another example of the form which embodies this invention. It is a time chart which shows another example of the form which embodies this invention. It is a time chart which shows another example of the form which embodies this invention. It is a time chart in the modification of the form which embodies this invention. It is a time chart in a prior art.

DESCRIPTION OF EMBODIMENTS Embodiments for carrying out the present invention will be described with reference to the drawings. In the following description, the inspection object of the present invention will be described based on an example in which a plurality of circuit patterns are formed on the semiconductor wafer 10.
FIG. 1 is a perspective view showing an example of a form embodying the present invention.
Hereinafter, in each figure, the three axes of the orthogonal coordinate system are X, Y, and Z, the XY plane is the horizontal plane, and the Z direction is the vertical direction. In particular, in the Y direction, the direction of the arrow is the back side, and the opposite direction is expressed as the near side, and in the Z direction, the direction of the arrow is up and the reverse direction is expressed as the down side. The rotation direction with the Z axis as the rotation center is expressed as the θ direction.

  The automatic appearance inspection apparatus 1 includes a transport unit 2 attached on the device base 11, a strobe illumination unit 3 that irradiates light toward the inspection object, a lens barrel unit 4 attached to the device base 11, The imaging unit 5 includes an imaging unit 5 that images observation light guided by the lens barrel unit 4 and a control unit 9. Each component is attached via a device frame (not shown), a fixing bracket, or the like so as to be arranged at a position shown in FIG.

  The transport unit 2 includes an X-axis stage 21 attached on the apparatus base 11, a Y-axis stage 22 attached on the X-axis stage 21, a rotary stage 23 attached on the Y-axis stage 22, and a rotation And a table portion 25 mounted on the stage 23.

  The X axis stage 21 can move the Y axis stage 22 mounted thereon in the X direction, and the Y axis stage 22 can move the rotary stage 23 mounted thereon in the Y direction. The rotation stage 23 can rotate the table 25 mounted thereon in the θ direction. Note that the X-axis stage 21, the Y-axis stage 22, and the rotary stage 23 constitute a scanning stage unit of the present invention.

  The table portion 25 has grooves and holes formed on the surface thereof, and the grooves and holes are connected to a vacuum source via an opening / closing control valve. The semiconductor wafer 10 placed on the table portion 25 is sucked and held by a negative pressure so that the position of the semiconductor wafer 10 does not shift during the movement of the table portion 25.

  The X-axis stage 21 is configured to include an X-axis position detector, and can acquire current position information in the X direction of the Y-axis stage 22 attached on the X-axis stage 21. Similarly, the Y-axis stage 22 includes a Y-axis position detector, and can acquire current position information in the Y direction of the rotary stage 23 attached on the Y-axis stage 22. Furthermore, the rotation stage 23 is configured to include a rotation angle detector, and can acquire current angle information in the θ direction of the table unit 25 attached on the rotation stage 23.

  Since the transfer unit 2 has the above-described configuration, the semiconductor wafer 10 placed on the table unit 25 is moved in the XY direction, rotated in the θ direction, and further scanned in a predetermined direction. It can be moved. Further, the current position information in the XY direction and the rotation angle information of the table unit can be acquired.

  The stroboscopic illumination unit 3 includes a coaxial falling illumination 31 and an illumination light emitting device 31s, and can emit a high amount of light (so-called stroboscopic light emission) in a very short time. The coaxial falling illumination 31 is attached to a lens barrel portion 4, which will be described in detail later, and emits light almost perpendicularly toward the semiconductor wafer 10 through an optical path coaxial with the observation light via a half mirror in the lens barrel portion 4. Can be irradiated.

Further, the strobe illumination unit 3 may be composed of a ring-type illumination 33 and an illumination light-emitting device 33 s, a surface-emitting illumination 35 and an illumination light-emitting device 35 s, etc., or alternatively or in combination with the coaxial falling illumination 31 and the illumination light-emitting device 31 s. Can be used.
The ring illumination 33 is attached to the outside of the lens barrel 4 and can irradiate illumination light obliquely toward the semiconductor wafer 10.
The surface-emitting illumination 35 is embedded and attached to the table unit 25 and can irradiate illumination light upward from the lower surface of the semiconductor wafer 10.

The lens barrel portion 4 has a structure in which light irradiated from the strobe illumination portion 3 toward the semiconductor wafer 10 and reflected by the semiconductor wafer 10 or transmitted through the semiconductor wafer 10 can be guided as observation light.
The lens barrel part 4 is provided with a light branching means 45 in the middle of the path through which the observation light is guided, and can partially transmit the observation light and reflect it partially at different angles.
In addition, the lens barrel 4 is configured to include an imaging mirror 42 as appropriate, and has a structure in which the direction of the observation light can be changed and guided.

  Examples of the light branching means 45 include optical elements such as a half mirror and a beam splitter.

  The imaging unit 5 includes a plurality of imaging cameras 51a and 51b attached to the lens barrel unit 4, and is configured to be able to capture the guided and branched observation light with the imaging cameras 51a and 51b. ing. Moreover, objective lenses 55a and 55b are attached to the lens barrel portion 4, and the observation light can be imaged at a predetermined observation magnification.

  Examples of the imaging cameras 51a and 51b include imaging cameras using CCDs, CMOSs, and other imaging elements, as long as the captured images can be output to the control unit 9 as video signals. Further, it is desirable that the imaging cameras 51a and 51b can perform high-sensitivity shooting. Then, the observation light 40v is branched into two observation lights 45v1 and 45v2 by the light branching means 45, and even if the respective light amounts are halved compared to the observation light 40v before branching, it is possible to capture a sufficient image. it can. Alternatively, the sensitivity of the imaging cameras 51a and 51b may be left as they are, and the light emission energy of the strobe illumination may be increased to ensure the brightness of the observation light.

FIG. 2 is a system configuration diagram showing an example of a form embodying the present invention.
As shown in FIG. 2, each device of the transport unit 2, the strobe lighting unit 3, and the imaging unit 5 described above is connected to each device of the control unit 9.

The control unit 9 includes a control computer 90, an information input unit 91, an information output unit 92, a notification unit 93, an information recording unit 94, and a device control unit 95 connected to each other.
Examples of the control computer 90 include a computer equipped with a numerical operation unit such as a microcomputer, a personal computer, or a workstation.
Examples of the information input unit 91 include a keyboard, a mouse, and a switch.
Examples of the information output unit 92 include an image display display and a lamp.

Examples of the reporting means 93 include a buzzer, a speaker, and a lamp that can alert the worker.
Examples of the information recording means 94 include a semiconductor recording medium, a magnetic recording medium, a magneto-optical recording medium, such as a memory card and a data disk.
Examples of the device control unit 95 include devices called programmable controllers and motion controllers.

  Video signals output from the imaging cameras 51 a and 51 b are input to the control computer 90 via the image processing unit 96. The image processing unit 96 is generally called a GPU (graphic processing unit), and is installed outside the control computer 90, connected to the housing of the control computer 90, or the control computer 90. The one using the image processing unit can be exemplified.

  The observation image input to the image processing unit 96 can be judged as good (that is, inspected) by the control computer 90, as will be described in detail later.

  The device control unit 95 is connected to the X axis stage 21, the Y axis stage 22, and the rotary stage 23. The device control unit 95 is connected to the illumination light emitting devices 31 s, 33 s, and 35 s of the strobe illumination unit 3. Examples of the method of adjusting the amount of illumination light in the illumination light emitting devices 31 s, 33 s, and 35 s include a method of adjusting an applied voltage or current, or adjusting a voltage or current application time. Based on the light emission command signal, the strobe illumination emits light under preset conditions.

  The device control unit 95 is connected to other control devices (not shown), and by giving control signals to them, each device can be operated or stopped. Yes.

[Operation flow]
FIG. 3 is a flowchart showing an example of a form embodying the present invention. In FIG. 3, a series of steps for performing imaging with each camera in order to inspect the entire surface of the semiconductor wafer 10 is shown for each step.
First, the semiconductor wafer 10 is placed on the table unit 25 of the automatic visual inspection apparatus 1 (s101), and previously registered inspection conditions are read (s102).
Next, it moves to the reading position of the reference mark 10m formed on the semiconductor wafer 10 (s103), and alignment is performed (s104).

Subsequently, the table unit 25 is moved to the measurement start position in the first row (s107), the scanning stage unit 2 is moved at a predetermined speed, and the movement of the table unit 25 is started (s108).
While moving the table unit 25, based on the current position information of the table unit acquired from the X-axis position detector and the Y-axis position detector of the scanning stage unit, it is determined whether the position is to be imaged by the camera 1 (s110). If it is at the imaging position of the camera 1, the strobe illumination is emitted and imaging is performed by the camera 1 (s112), and the movement of the table unit 25 is continued. Further, it is determined whether or not the current position information of the table portion is a position to be imaged by the camera 2 (s114), and if it is an imaging position of the camera 2, the strobe illumination is emitted and imaging is performed by the camera 2 (s115). The movement of the table unit 25 is continued.
On the other hand, if the current position information of the table part is not a position where the image is taken by any camera, the movement of the table part 25 is continued as it is.

  Then, based on the current position information of the table section, it is determined whether or not the first column imaging is completed (s116). If it is determined that the first column imaging is completed, the movement of the table section is stopped. (S117). On the other hand, if it is determined that the imaging in the first column has not been completed, steps s110 to s116 are repeated.

  Next, it is determined whether or not all the imaging has been completed in the above-described one column imaging (s118). On the other hand, if it is determined in step s118 that all imaging has not been completed, the table unit 25 is moved to the measurement start position in the next row, and the series of imaging steps (s107 to s118) are repeated.

[Time chart]
FIG. 4 is a time chart showing an example of a form embodying the present invention, and shows the operation of each part of the automatic visual inspection apparatus 1 described with reference to FIGS. 1 to 3 in time series. The horizontal axis in the figure represents time t, and a broken line is attached as an auxiliary line so that the state before and after the operation of each part at each time becomes clear. The same broken line means the same time.

  An imaging instruction is issued at every interval T2 based on the current position information of the table unit. First, the camera used for imaging is switched to the imaging camera 51a (that is, camera 1) side, and when an imaging instruction is given, imaging is performed by the camera 1. Strobe illumination is emitted during imaging of the camera 1 and image data is transferred after the imaging of the camera 1 is completed.

  During the data transfer of the camera 1, the camera is switched to the imaging camera 51b (that is, the camera 2) side as a camera to be used for imaging next time. Thereafter, when an imaging instruction is issued, imaging is performed by the camera 2. Strobe illumination is emitted during imaging by the camera 2, and image data is transferred after the imaging of the camera 2 is completed. During the data transfer of the camera 2, the camera 1 is switched to the camera 1 side as the next camera used for imaging. By repeating this series of operations, continuous imaging can be performed every interval T2, and continuous imaging can be performed in half the time compared to the conventional imaging interval T1. Further, if the number of cameras is increased, the interval for continuous imaging can be shortened. At this time, the imaging cameras 51a and 51b are the same as the conventional one, and the inspection time can be shortened without being restricted by the processing capability of the imaging camera.

  Further, even when a plurality of objective lenses 55a and 55b having different imaging magnifications are provided for the product type, it is not necessary to increase the number of objective lenses according to the number of cameras. Therefore, there is no cost increase factor due to the increase in the number of objective lenses. Furthermore, compared to a configuration in which the inspection apparatus is configured with a plurality of cameras and a plurality of objective lenses, there is no distortion or deviation between the circuit patterns captured due to individual differences of the objective lenses, and the inspection quality can be easily aligned. Further, it is not necessary to separately perform image correction for aligning the inspection quality, and various cost increase factors can be eliminated.

[Another version 1]
In the above description, the mode in which the observation light is branched by the light branching means 45 and the inspection object is imaged using a plurality of imaging cameras has been exemplified. However, the light reflecting means 47 may be disposed instead of the light branching means 45, and the position and angle of the light reflecting means 47 may be changed to switch the angle at which the observation light is guided.
FIG. 5 is a perspective view showing another example of a form embodying the present invention. In place of the lens barrel part 4 of the automatic visual inspection apparatus 1 described with reference to FIG. The automatic external appearance inspection apparatus 1a provided with 4a is shown. Hereinafter, the difference between the lens barrel portion 4a and the lens barrel portion 4 will be described, and description of other common points will be omitted.

The lens barrel 4 is provided with a light reflecting means 47 in the middle of the path through which the observation light is guided, and can be reflected by changing the direction (that is, the angle) of the observation light. The light reflecting means 47 can be arranged by changing its position or angle, and can be arranged by switching between a position shown by reference numeral 47 and a retracted position 47a shown by a broken line.
For example, as shown in FIG. 5, if the light reflecting means 47 is arranged at an angle of 45 ° so as to intersect the optical axis of the observation light, the observation light guided in the Z direction changes the 90 ° direction and changes to the X direction. The light is guided and the observation light is imaged by the observation camera 51b.
On the other hand, if the light reflecting means is disposed at the retreat position 47a where it does not intersect the optical axis of the observation light, the observation light guided in the Z direction is directly guided in the Z direction, and the observation light is imaged by the observation camera 51b. Is done.

As the light reflecting means 47, an optical element such as a mirror or a prism can be exemplified, and any light reflecting means may be used as long as it changes the direction of incident light.
The light reflecting means 47 is attached to the lens barrel portion 4a via a hinge so that one end is the center of rotation, and is rotatably connected to a movable member of the actuator portion 60 attached to the lens barrel portion 4a. Let me. If it does so, it can switch to the position shown by the code | symbol 47, and the position shown by the code | symbol 47a by ON / OFF operation | movement of the actuator part 60. FIG.

  Alternatively, the light reflecting means 47 may be attached to the movable member of the actuator unit 60 with the attachment angle fixed, and attached so that the position can be switched in the X direction by the ON / OFF operation of the actuator unit 60. The actuator section 60 is connected to the control controller 95 and is configured to be able to perform an ON / OFF operation based on a command signal from the control controller 95.

[Another version 2]
The actuator unit 60 is not limited to a direct acting type, and may be a rotary type, and can change the direction of the guided observation light 40v by changing the position, angle or direction of the light reflecting means 47. If it is good.
In addition, the number of imaging cameras can be appropriately increased and arranged.
FIG. 6A is a perspective view showing still another example of a form embodying the present invention, and shows a form using a rotary actuator unit 60a and two imaging cameras 51a and 51B.
FIG. 6B is a plan view showing still another example of a form embodying the present invention, and is a cross-sectional view in plan view of an arrow AA portion in FIG. 6A.

  The observation light passes through the opening 40 h of the lens barrel 40 b and is guided to the light reflecting means 48. The light reflecting means 48 is connected to a rotary actuator 60a attached to the lens barrel 40b, and can be rotated in the direction of the arrow 60v. In the present state, the observation light 40v guided in the Z direction is guided to the X direction arrow side by changing the angle in the direction indicated by the arrow 48v, reflected by the reflection mirror 43a, and guided in the Z direction. This shows a state where the image is captured by the imaging camera 51a. In addition, an angle detector 67 (a so-called rotary encoder) (not shown) is attached to the rotary actuator 60a, and angle information of the rotary actuator 60a can be acquired. 6A and 6B, when the light reflecting means 48 further rotates and the reflected observation light 48v is directed in the direction of the reflection mirror 43b, the observation light 40v is changed to the X direction arrow. The light is guided to the opposite side, reflected by the reflecting mirror 43b, guided in the Z direction, and can be observed by the imaging camera 51b. When the light reflecting means 48 further rotates and the reflected observation light 48v is directed again toward the reflecting mirror 43a, it can be observed with the imaging camera 51a, and the present invention is applied by repeating the above series of operations. Observation can be repeated.

  FIG. 7 is a time chart showing still another example of a form embodying the present invention, and shows the operation of each part of the automatic visual inspection apparatus described with reference to FIGS. 6A and 6B in time series. . The horizontal axis in the figure represents time t, and a broken line is attached as an auxiliary line so that the state before and after the operation of each part at each time becomes clear. The same broken line means the same time.

  An imaging instruction is issued at every interval T2 based on the current position information of the table unit. First, the camera used for imaging is switched to the imaging camera 51a (that is, camera 1) side, and when an imaging instruction is given, imaging is performed by the camera 1. Strobe illumination is emitted during imaging of the camera 1 and image data is transferred after the imaging of the camera 1 is completed.

During the data transfer of the camera 1, the camera is switched to the imaging camera 51b (that is, the camera 2) side as a camera to be used for imaging next time. Thereafter, when an imaging instruction is issued, imaging is performed by the camera 2. Strobe illumination is emitted during imaging by the camera 2, and image data is transferred after the imaging of the camera 2 is completed. During the data transfer of the camera 2, the camera 1 is switched to the next camera 1 used for imaging.
By repeating this series of operations, continuous imaging can be performed at every interval T2, and continuous imaging can be performed in half the time compared to the conventional imaging interval T1. Further, if the number of cameras is increased, the interval for continuous imaging can be shortened.

Furthermore, it is desirable to attach an encoder portion 65 to the movable member of the actuator portions 60 and 60a or the light reflecting means 47 attached to the tip of the movable portion so that the current position, current angle or direction can be detected.
As the encoder unit 65, a linear scale in which a large number of optical or electromagnetic pores (so-called slits) are engraved in a bar-like or ribbon-like member extending in one direction, or a slit similar to a disc or cylindrical member. For example, a rotary encoder in which is engraved.

  If it is a form using the above light reflection means 48, the light quantity fall of observation light which arises in the form which increases the number of cameras using the light branching means 45 can be prevented. Therefore, there is no need to increase the sensitivity of the imaging camera or use strobe lighting with higher emission energy, and the inspection time can be shortened by using an imaging camera with the same sensitivity as before and strobe lighting with the same emission energy. .

[Another version 3]
FIG. 8 is a time chart showing still another example of a form embodying the present invention, and shows the operation of each part of the automatic visual inspection apparatus in time series as described with reference to FIG. It is. In this embodiment, unlike the automatic visual inspection apparatus described with reference to FIG. 7, the light reflecting means 48 for changing the direction of the observation light in the barrel main body 40 is completely stopped when the strobe illumination is emitted. It does not become, and the position changes little by little. That is, the light reflecting means 48 is continuously moved by the actuator unit 60a, and is imaged by each observation camera in a state where it is not completely stopped. A specific mirror position / angle will be described with reference to the drawings. A locus indicated by a broken line A in FIG. 8 indicates a state in which the light reflecting means 48 is rotating at a constant rotation speed. That is, it continues to move without facing to the cameras 1 and 2 side.
At this time, as the illumination light, stroboscopic illumination with a very short emission time is used, so that the observation image can be handled as having no blur. In this way, it is not necessary to completely stop the actuator unit 60a in order to strictly switch the direction of the observation light, and the influence of inertia for waiting for the stop or moving again is reduced. The burden will be reduced. Therefore, continuous imaging can be performed at a higher speed.

  In this case, the allowable moving speed of the actuator unit 60a when the strobe illumination is emitted depends on the movement distance or angle of the actuator unit 60a when the strobe illumination is emitted, that is, the actual observation image is blurred. It is determined by the extent that it can be handled as non-existing. In other words, when the strobe illumination emission time is extremely short, or when the number of cameras to be switched is small and the imaging interval can be extended, the actuator unit 60a can be driven at the same movement speed when the flash is fired as when the flash is not fired. That's fine.

  On the other hand, if the number of cameras to be switched increases and the imaging interval needs to be shortened, or if the actuator unit 60a is driven at the same movement speed as when the flash is not emitted, due to the flash illumination emission time, When the observed image is blurred, the moving speed of the actuator unit 60a when the strobe light is emitted may be slower than that when the strobe light is not emitted. A specific mirror position / angle will be described with reference to the drawings. A locus indicated by a solid line B in FIG. 8 indicates a state in which the light reflecting means 48 is rotated while changing the rotation speed. In other words, the light reflecting means 48 is directed to the cameras 1 and 2 at the moment when the images are taken by the cameras 1 and 2, but is not completely stationary before and after that, and is not in the strobe non-emission (that is, non-lighting). Compared to during observation) and continues to rotate at a reduced speed. Then, a series of operations are repeated, such as rotating at a constant speed after accelerating, and decelerating before imaging again, except in the deceleration section before and after imaging.

(Example)
The Example in further another example of the form which embodies this invention demonstrated using FIGS. 1-7 is shown below.
As the imaging cameras 51 a and 51 b of the imaging unit 5, electronic shutter cameras with a maximum frame rate of 140 fps using a monochrome CMOS having a grid pixel with a pixel pitch of 5 microns as an imaging element were used. The imaging cameras 51a and 51b use area sensors in which about 1600 pixels are arranged in the moving direction of the observation object 10w and about 1600 pixels are arranged in the direction orthogonal to the moving direction. The magnification of the objective lens is set so that an observation area having a length of 4.0 mm is obtained in the moving direction of the observation object 10w. Then, every time the observation object 10w moves by 3.0 mm, illumination is emitted and imaging is performed alternately by the imaging cameras 51a and 51b. At this time, the scanning stage unit that moves the observation object 10w is set to 720 mm / sec. Then, the illumination unit 3 repeats light emission at 240 Hz. In the case of such a form, with the conventional technique, a camera with a frame rate of 140 fps could not perform continuous imaging with image transfer. However, by applying the present invention, it is possible to perform imaging and image transfer at substantially 120 fps. It is possible to respond.

  In addition, it is more preferable that the illumination unit 3 uses a form that uses strobe illumination using a halogen or a xenon lamp. In the case of strobe illumination, it is possible to irradiate flash light with high emission energy (for example, energy half width 3 μsec necessary and sufficient for imaging) within a very short time. By doing so, sufficient energy of the irradiated light can be obtained even when using an inexpensive imaging camera with high versatility that is not suitable for high-sensitivity shooting with a slow shutter speed. Therefore, it is possible to continuously image an inspection object that moves at high speed, and it is possible to perform an automatic appearance inspection by applying the present invention.

  Further, since the observation light is split into two by a half mirror and is observed by two cameras, the amount of light of the strobe illumination is irradiated twice as much as usual. By doing so, the amount of light observed by each camera becomes the same as usual.

  Focusing on the image blur at this time, the moving distance of the observation object 10w is 2.16 μm during the time when the strobe illumination emits light: 3 μsec, and this amount corresponds to the image blur. This image blur is about 1/1850 with respect to the entire observation visual field length of 4.0 mm, and is about 0.86 pixels when converted into pixels of the image sensor. This image blur amount depends on how closely the observation target is observed, but for example, if the minimum line width of the observation target is set to 22 μm or more (that is, 10 pixels) or more, it is generally regarded as a problem. It can be regarded and does not become a problem in applying the present invention. On the other hand, even if the minimum line width to be observed is less than 22 μm, the present invention can be applied by optimizing image processing and inspection algorithms.

  In the above description, an example in which strobe illumination is in a light emitting state within a predetermined imaging time has been described. However, the present invention is not limited to such a form, and it may be a form in which illumination light is irradiated for a predetermined time and imaging is performed instantaneously during that time, and is embodied in the embodiment as described below. Can be made.

  FIG. 9 is a time chart in a modification of the embodiment embodying the present invention, and is a modification of the embodiment shown in FIG. That is, in this modification, after the imaging instruction is turned on, the illumination is turned on for a predetermined time, and imaging is performed instantaneously during that time. For example, the electronic shutter of the imaging camera is set to 1 / 100,000 sec (that is, the imaging time is 10 μsec) to 1 / 500,000 sec (that is, the imaging time is 2 μsec), and the imaging instruction is ON. After that, the illumination with the amount of light necessary for imaging during the shutter time is emitted for about 1/100 second (that is, 10 msec) to 1/1000 second (that is, 1 msec), and the imaging camera captures the image during that time. Do. By doing so, it is possible to perform an automatic appearance inspection by applying the present invention.

  Focusing on the image blur at this time, the moving distance of the observation object 10w is 1.44 μm during the time when the strobe illumination emits light: 2 μsec, and this amount corresponds to the image blur. This image blur is about 1/2780 with respect to the entire observation visual field length of 4.0 mm, and is about 0.57 pixels when converted into pixels of the image sensor. Further, during the time when the strobe illumination is emitted: 10 μsec, the moving distance of the observation object 10 w is 7.2 μm, and this amount corresponds to image blur. This image blur is about 1/560 with respect to the entire observation visual field length of 4.0 mm, and is about 1.44 pixels when converted into pixels of the image sensor. Although this image blur amount depends on how closely the observation object is observed, for example, if the minimum line width of the observation object is set to 15 to 72 μm (that is, 10 pixels) or more, it is not generally regarded as a problem. It can be regarded as a degree, and is not a problem in applying the present invention. On the other hand, even if the minimum line width to be observed is less than 15 to 72 μm, the present invention can be applied by optimizing image processing and inspection algorithms.

(Example 2)
An embodiment in still another example of the embodiment embodying the present invention described with reference to FIGS. 6A, 6B, and 7 will be described below.
When two imaging cameras 51a and 51b are used, the rotary actuator 60a is driven so that the light reflecting means 48 rotates at 120 rotations per second (that is, 7200 rpm). Then, imaging is repeated with a half-cycle shift. If it does so, it will become the same as each imaging camera 51a, 51b being imaged at 120 fps, respectively, and actual imaging being repeated at 240 fps.

(Example 3)
An embodiment of still another example of the embodiment embodying the present invention described with reference to FIG. 8 will be described below.
When two imaging cameras are used and imaging is performed at 120 fps, the rotary actuator is rotated at 360 times per second (that is, 21600 rpm) while rotating at 30 times per second (that is, 21600 rpm) while being decelerated by 10 degrees before and after the imaging angle. 1800 rpm), and 10 degrees before and after that is set as an acceleration / deceleration region.
By doing so, the mirror rotation speed during imaging is reduced to ¼, and the amount of image blur is also reduced.
Furthermore, the amount of image blur can be further reduced if the configuration is such that the rotational speed of the mirror during imaging is increased while the rotational speed of the mirror during imaging is decreased.

(Example of increase in the number of cameras)
In the above description, the form using two cameras has been illustrated, but the present invention can also be applied to a form using more cameras.
For example, in addition to the configuration shown in FIGS. 6A and 6B, an imaging mirror and an imaging camera are arranged on the Y direction arrow side where the light reflecting means 48 is rotated 90 degrees and on the opposite side, respectively. By doing so, it is possible to perform imaging of substantially 480 fps using a total of four imaging cameras, with the rotational speed (720 rpm) and imaging rate (120 fps) of the light reflecting means 48 unchanged.
. At this time, the strobe illumination emits light at 480 fps.

  In addition, when the rotational angle is decelerated before and after imaging, the present invention can be applied by setting the angle defined as 10 degrees above to 5 degrees.

On the other hand, if the half mirror is branched, the observation light can be branched and guided to the four imaging cameras by further branching the light branched once. The present invention can be applied if the strobe illumination is emitted with a light amount four times that of a normal light and the strobe light is emitted at 480 fps.

DESCRIPTION OF SYMBOLS 1 Automatic appearance inspection apparatus 2 Scanning stage part 3 Illumination part 4 Lens barrel part 5 Imaging part 9 Control part 10 Inspection object (wafer)
10m Reference mark 10p Circuit pattern 10v Arrow 11 Device frame 12 Connecting member 20 Scanning stage unit 21 X-axis stage 22 X-axis stage 23 Rotating stage 25 Table unit 31 Coaxial falling illumination (regular reflection light)
31s Illumination light emitting device 33 Ring illumination (oblique reflected light)
33s Illumination light-emitting device 35 Surface-emitting illumination (transmitted light)
35s illumination light emitting device 40 lens barrel main body 40h opening 40v observation light 41 illumination half mirror 42 imaging mirror 43a imaging mirror 43b imaging mirror 43c imaging mirror 45 light branching means (half mirror, etc.)
45v1 arrow (direction after branching)
45v2 arrow (direction after branching)
47 Light reflection means (mirror etc.)
47a Light reflecting means (retreat position)
48 Light reflection means 48v Arrow (direction of reflection)
51a imaging camera 51b imaging camera 51c imaging camera 55a objective lens 55b objective lens 57a imaging field of view 57b imaging field of view 60 actuator 60a actuator (rotary)
60v arrow (direction of rotation)
65 Position detector 67 Angle detector 90 Control computer 91 Information input means 92 Information output means 93 Notification means 94 Information recording means 95 Control unit 96 Image processing unit

Claims (7)

An inspection object inspection apparatus for detecting defects in a pattern formed on an inspection object,
A table portion for placing the inspection object;
A scanning stage unit that scans and moves the table unit in a predetermined direction;
An illumination unit that emits illumination light toward the inspection object;
A lens barrel that guides, as observation light, light that is irradiated from the illumination unit and reflected by the inspection object or light that has passed through the inspection object;
An imaging unit that is attached to the lens barrel and images the observation light;
A control unit that images the observation light by causing the illumination unit to emit light while moving the scanning stage unit;
An inspection unit that determines the quality of the image of the imaged inspection object based on inspection conditions registered in advance;
The scanning stage unit is provided with position measuring means for measuring the current position of the table,
In the lens barrel portion, the observation light is partially transmitted and is partially reflected at a different angle.
Optical branching means are provided,
A plurality of the imaging units are attached to the lens barrel so that each of the lights branched by the light branching unit can be imaged.
The controller is
An automatic visual inspection apparatus having a function of performing imaging by sequentially changing an imaging unit used for imaging for each imaging.
An inspection object inspection apparatus for detecting defects in a pattern formed on an inspection object,
A table portion for placing the inspection object;
A scanning stage unit that scans and moves the table unit in a predetermined direction;
An illumination unit that emits illumination light toward the inspection object;
A lens barrel that guides, as observation light, light that is irradiated from the illumination unit and reflected by the inspection object or light that has passed through the inspection object;
An imaging unit that is attached to the lens barrel and images the observation light;
A control unit that images the observation light by causing the illumination unit to emit light while moving the scanning stage unit;
An inspection unit that determines the quality of the image of the imaged inspection object based on inspection conditions registered in advance;
The scanning stage unit is provided with position measuring means for measuring the current position of the table,
The lens barrel portion is provided with a light reflecting means that reflects and changes the angle or direction of the observation light,
A plurality of the imaging units are attached to the lens barrel so that each of the lights reflected by the light reflecting means can be imaged.
The controller is
An automatic appearance inspection characterized by having a function of changing the reflection direction of the light reflecting means in conjunction with the imaging and performing imaging by sequentially changing the imaging unit used for the imaging for each imaging. apparatus.
The lens barrel is further provided with an actuator for changing the position or angle of the light reflecting means,
The control unit drives the actuator unit in conjunction with the imaging,
The automatic visual inspection apparatus according to claim 2, wherein the imaging is performed.
The automatic appearance inspection apparatus according to claim 3, wherein the actuator unit is in a moving state at the position or the angle even during the imaging.
The automatic appearance inspection apparatus according to claim 4, wherein the moving speed of the actuator unit during imaging is slower than the moving speed during non-imaging.
A position detector that detects a current position or an angle detector that detects a current angle is attached to the actuator unit or the light reflecting means.
The automatic appearance inspection apparatus according to claim 3, wherein the imaging is performed based on information of the position detector or the angle detector.
The illumination unit that emits the illumination light is a strobe illumination unit that emits strobe illumination,
The automatic visual inspection apparatus according to claim 1, wherein the imaging is performed by light emission of strobe illumination.

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