JP2007225431A - Visual inspection device - Google Patents

Visual inspection device Download PDF

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JP2007225431A
JP2007225431A JP2006046719A JP2006046719A JP2007225431A JP 2007225431 A JP2007225431 A JP 2007225431A JP 2006046719 A JP2006046719 A JP 2006046719A JP 2006046719 A JP2006046719 A JP 2006046719A JP 2007225431 A JP2007225431 A JP 2007225431A
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workpiece
inspection
imaging device
optical axis
axis direction
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JP2007225431A5 (en
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Seiji Takagi
誠司 高木
Makoto Kanda
誠 神田
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Mitsubishi Electric Corp
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Mitsubishi Electric Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a visual inspection device which images a workpiece without stopping it by moving a conveyance stage and an imaging device synchronously. <P>SOLUTION: The device comprises: the conveyance stage 3 for conveying the inspection workpiece 1 to a prescribed inspection position; a displacement sensor 4 for detecting each height in the optical axis direction of prescribed two points of the workpiece until the work reaches the inspection position; an imaging device 5 whose position in the optical axis direction is held within a focal point depth on the inspection position, having shutter speed of 1/20,000 for imaging the workpiece appearance; an image processing device 8 for processing an image imaged by the imaging device; and a control device 9 for moving the conveyance stage from prescribed one point to the other point of the workpiece, and adjusting the position in the optical axis direction of the imaging device synchronously with movement of the conveyance stage. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

この発明は外観検査装置、例えば電子基板などの検査個所である外観を撮像し、その画像を高速で精度よく取り込むことにより外観検査を行う装置に関するものである。   BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an appearance inspection apparatus, for example, an apparatus that performs an appearance inspection by capturing an appearance that is an inspection site such as an electronic substrate and capturing the image with high speed and accuracy.

従来の外観検査装置は、検査対象であるワークを所定の検査位置に移動させる搬送ステージと、上記ワークが検査位置へ到達するまでの所でワーク内の所定の2点における光軸方向の高さ、即ち基準面からの高さの変位量を検出する変位センサと、検査位置において光軸方向の高さ位置が焦点範囲内に保持され、その状態でワークの外観を撮像する撮像デバイスと、撮像デバイスによって撮像された画像を処理する画像処理装置と、搬送ステージ及び撮像デバイスの位置を制御する制御装置とから構成されていた。(例えば特許文献1参照)。   A conventional visual inspection apparatus includes a transfer stage that moves a workpiece to be inspected to a predetermined inspection position, and heights in the optical axis direction at two predetermined points in the workpiece until the workpiece reaches the inspection position. That is, a displacement sensor that detects the amount of displacement of the height from the reference plane, an imaging device that captures the appearance of the workpiece in the state where the height position in the optical axis direction is held in the focus range at the inspection position, and imaging The image processing apparatus includes an image processing apparatus that processes an image captured by the device, and a control apparatus that controls the positions of the transfer stage and the imaging device. (For example, refer to Patent Document 1).

特開2000−266691号公報JP 2000-266991 A

従来の外観検査装置は上記のように構成されており、ワーク内の1点について検査位置で撮像した後、他の1点に移動させて次の撮像を行なうが、撮像デバイスのシャッタ速度が1/10000以下と遅かったため、図3に示すように、ワークを移動させる搬送ステージをX1〜X5に示すように各検査点において停止させ、それぞれの位置で撮像デバイスを焦点範囲内に収めるように、撮像デバイスの光軸方向の高さ位置をh1〜h5に示すように調整する必要があった。   The conventional appearance inspection apparatus is configured as described above, and after imaging one point in the work at the inspection position, the image is moved to another point and the next imaging is performed, but the shutter speed of the imaging device is 1 As shown in FIG. 3, the transfer stage for moving the workpiece is stopped at each inspection point as shown in X1 to X5, and the imaging device is kept in the focal range at each position, as shown in FIG. It was necessary to adjust the height position of the imaging device in the optical axis direction as indicated by h1 to h5.

しかし、検査効率向上などのためにワークを移動させる搬送ステージの速度が速くなった場合には、ワーク内の所定の2点間の移動時間が短縮されることから、撮像デバイスの高さ方向の移動、停止も急激に行なわせる必要が生じる。   However, when the speed of the transfer stage for moving the workpiece is increased in order to improve inspection efficiency, the movement time between two predetermined points in the workpiece is shortened. It is necessary to move and stop suddenly.

しかしながら、撮像デバイスには顕微鏡ユニットなどの重量の大きい光学系が用いられている場合があるため、停止するための時間(静定時間)が大きくなって高速での停止が困難となり、結果として高速の画像取得ができないという問題点があった。   However, since the imaging device may use a heavy optical system such as a microscope unit, the time to stop (settling time) becomes long and it becomes difficult to stop at high speed, resulting in high speed. There was a problem that the image could not be acquired.

また、重量の大きいものを急激に移動、停止させるためには、一般的に非常に高価な上下移動ステージを用いなければならないという問題点もあった。   In addition, in order to rapidly move and stop a heavy object, it is generally necessary to use a very expensive up / down moving stage.

この発明は上記のような問題点に対処するためになされたもので、搬送ステージと撮像デバイスとを同期させて移動し、ワークを停止させることなく撮像することができる外観検査装置を提供することを目的とする。   The present invention has been made in order to cope with the above-described problems, and provides an appearance inspection apparatus that can move an imaging stage and an imaging device in synchronization with each other and perform imaging without stopping the workpiece. With the goal.

この発明に係る外観検査装置は、検査用のワークを所定の検査位置へ搬送する搬送ステージと、上記ワークが上記検査位置へ到達するまでに上記ワークの所定の2点における光軸方向の高さを検出する変位センサと、上記検査位置において光軸方向の位置が焦点深度内に保持され、上記ワークの外観を撮像するシャッタ速度1/20000以上の撮像デバイスと、上記撮像デバイスによって撮像された画像を処理する画像処理装置と、上記ワークの所定の1点から他の1点に向けて上記搬送ステージを移動させると共に、上記搬送ステージの移動と同期して上記撮像デバイスの光軸方向の位置を調整する制御装置とを備えたものである。   The visual inspection apparatus according to the present invention includes a transport stage for transporting an inspection work to a predetermined inspection position, and heights in the optical axis direction at predetermined two points of the work before the work reaches the inspection position. A position sensor in the optical axis direction at the inspection position, an imaging device having a shutter speed of 1/20000 or more that images the appearance of the workpiece, and an image captured by the imaging device The image processing apparatus for processing the image and the position of the imaging device in the optical axis direction in synchronization with the movement of the transfer stage, while moving the transfer stage from one predetermined point of the workpiece to another point. And a control device for adjustment.

この発明に係る外観検査装置は上記のように構成され、シャッタ速度の速い撮像デバイスを用いると共に、搬送ステージと撮像デバイスとの光軸方向の移動を同期させているため、ワークを停止させることなく、必要な外観を撮像することができる。従って、撮像デバイスに重量の大きい光学系が用いられていた場合でも支障なく外観検査を実施することができる。   The appearance inspection apparatus according to the present invention is configured as described above, uses an imaging device with a high shutter speed, and synchronizes the movement of the conveyance stage and the imaging device in the optical axis direction without stopping the workpiece. The required appearance can be imaged. Therefore, even when an optical system having a large weight is used for the imaging device, the appearance inspection can be performed without any trouble.

実施の形態1.
以下、この発明の実施の形態1を図にもとづいて説明する。図1は、実施の形態1の構成を示すブロック図、図2は、実施の形態1における搬送ステージの位置と撮像デバイスの上下方向位置との関係を示す説明図である。
Embodiment 1 FIG.
Embodiment 1 of the present invention will be described below with reference to the drawings. FIG. 1 is a block diagram showing the configuration of the first embodiment, and FIG. 2 is an explanatory diagram showing the relationship between the position of the transfer stage and the vertical position of the imaging device in the first embodiment.

図1に示すように、実施の形態1の外観検査装置は、検査対象であるワーク1をモータ2の駆動力によって矢印で示す方向に駆動し、所定の検査位置に移動させる搬送ステージ3と、上記ワーク1が検査位置へ到達する前に適宜の個所でワーク内の所定の2点(図示せず)における光軸方向の高さ、即ち基準面(図示せず)からの高さの変位量を検出する変位センサ4と、検査位置の上方でワーク1の高さ方向の変位量に対して焦点範囲となる焦点深度内に位置するように予め設定され、その高さ位置でワーク1の外観を撮像する焦点距離固定でシャッタ速度が1/20000以上の例えばCCDカメラからなる撮像デバイス5と、モータ6によって駆動され、撮像デバイス5の上下方向の位置を調整する上下ステージ7と、撮像デバイス5によって撮像された画像を処理する画像処理装置8と、変位センサ4からの信号にもとづいて搬送ステージ3のモータ2及び上下ステージ7のモータ6を制御し、搬送ステージ3と撮像デバイス5の位置を同期させて調整する制御装置9とから構成されている。   As shown in FIG. 1, the appearance inspection apparatus according to the first embodiment is configured to drive a workpiece 1 to be inspected in a direction indicated by an arrow by a driving force of a motor 2 and move the workpiece 1 to a predetermined inspection position. Before the workpiece 1 reaches the inspection position, the height in the optical axis direction at two predetermined points (not shown) in the workpiece, that is, the height displacement from the reference plane (not shown) at an appropriate location. The displacement sensor 4 for detecting the position of the workpiece 1 is set in advance so as to be positioned within the depth of focus which is a focal range with respect to the displacement amount in the height direction of the workpiece 1 above the inspection position. An imaging device 5 composed of, for example, a CCD camera with a fixed focal length and a shutter speed of 1/20000 or more, an upper and lower stage 7 that is driven by a motor 6 and adjusts the vertical position of the imaging device 5, and an imaging device 5 Imaged by The motor 2 of the transfer stage 3 and the motor 6 of the upper and lower stages 7 are controlled based on the signal from the image processing apparatus 8 that processes the image and the displacement sensor 4, and the positions of the transfer stage 3 and the imaging device 5 are synchronized. And a control device 9 for adjusting.

実施の形態1は上記のように構成され、撮像デバイス5がシャッタ速度1/20000以上の高速カメラとして構成され、少ない光で撮影することができるようにされているため、ワーク1内の1点、例えば図2のXaにおいて撮像した後、他の1点、例えば図2のXbへの移動に際しては図2に示す途中の検査点X1〜X5では搬送ステージ3を停止させることなくXbまで連続して移動させ、その間、ワーク1の各検査点X1〜X5に至るごとに予め変位センサ4で検出されている各検査点の高さに対してジャストフォーカスとなる焦点深度(図2に△で示している)に対応するように撮像デバイス5の位置を搬送ステージ3と同期させてh1〜h5に調整し、それぞれの位置でワーク1を移動させながら撮像を行なう。   The first embodiment is configured as described above, and the imaging device 5 is configured as a high-speed camera having a shutter speed of 1/20000 or higher so that it can shoot with less light. For example, after imaging at Xa in FIG. 2, when moving to another point, for example, Xb in FIG. 2, the inspection stage X1 to X5 in the middle of FIG. 2 continues to Xb without stopping the transfer stage 3. In the meantime, every time the inspection point X1 to X5 of the work 1 is reached, the depth of focus that is just focused with respect to the height of each inspection point detected in advance by the displacement sensor 4 (indicated by Δ in FIG. 2) The position of the imaging device 5 is adjusted to h1 to h5 in synchronization with the transfer stage 3 so as to correspond to the above, and imaging is performed while moving the workpiece 1 at each position.

このように実施の形態1によれば、撮像デバイスが1/20000以上のシャッタ速度を有し、搬送ステージと撮像デバイスとを同期して移動させているため、各検査点においてワークを停止させることなく撮像できる結果、撮像デバイス5に重量の大きな光学系が用いられている場合でも支障なくワークの撮像を行なうことができ、外観の検査を実施することができる。   As described above, according to the first embodiment, since the imaging device has a shutter speed of 1/20000 or more, and the transfer stage and the imaging device are moved in synchronization, the workpiece is stopped at each inspection point. As a result, the workpiece can be picked up without any trouble even when a heavy optical system is used for the image pickup device 5, and the appearance can be inspected.

実施の形態2.
次に、この発明の実施の形態2について説明する。外観検査装置の基本的な構成は図1と同じであるため、図示及び説明を省略する。実施の形態1と異なる点は、搬送ステージ3の移動量の計測方法である。
Embodiment 2. FIG.
Next, a second embodiment of the present invention will be described. Since the basic configuration of the appearance inspection apparatus is the same as that shown in FIG. 1, illustration and description thereof are omitted. The difference from the first embodiment is a method of measuring the movement amount of the transfer stage 3.

実施の形態1においては、モータ2の位置を計測してワーク1の位置を推定する形を取っているが、具体的には搬送ステージ3に装着されたモータ2によってボールねじを回動する構成とされ、モータの回転数に対応してワークの位置が読み取られるようになっている。しかしながら、ボールねじのねじ山間隔は、ボールねじの全長にわたって一様ではないため、これに起因する誤差が発生し、ワーク位置、検査点の位置の情報の精度が低下している。   In the first embodiment, the position of the work 1 is estimated by measuring the position of the motor 2. Specifically, the ball screw is rotated by the motor 2 mounted on the transfer stage 3. Thus, the position of the workpiece is read in accordance with the rotational speed of the motor. However, since the screw thread interval of the ball screw is not uniform over the entire length of the ball screw, an error due to this occurs, and the accuracy of the information on the work position and the position of the inspection point is lowered.

このため実施の形態2は、モータ位置によってワークの位置を推定するのをやめ、搬送ステージ3の周辺の適宜の固定部にリニアスケール等を装着し、この固定されたスケールを基準としてワークの位置を計測するようにしたものである。
これによって、位置情報の精度を向上することができる。
For this reason, the second embodiment stops estimating the position of the workpiece based on the motor position, attaches a linear scale or the like to an appropriate fixing portion around the transfer stage 3, and uses the fixed scale as a reference for the position of the workpiece. Is to measure.
Thereby, the accuracy of position information can be improved.

実施の形態3.
次に、この発明の実施の形態3について説明する。外観検査装置の基本的な構成は図1と同じであるため、図示及び説明を省略する。実施の形態1と異なる点は、撮像デバイス5としてラインセンサを使用した点である。
Embodiment 3 FIG.
Next, a third embodiment of the present invention will be described. Since the basic configuration of the appearance inspection apparatus is the same as that shown in FIG. 1, illustration and description thereof are omitted. The difference from the first embodiment is that a line sensor is used as the imaging device 5.

実施の形態1におけるCCDカメラとは異なり、ラインセンサは横方向に多数の画素が配列されているため、この配列方向をワークの搬送方向と直角方向に配設することにより、ワークの搬送方向と直角方向の視野を拡大することができ、広範囲の検査が可能となるものである。   Unlike the CCD camera according to the first embodiment, the line sensor has a large number of pixels arranged in the lateral direction. By arranging this arrangement direction in a direction perpendicular to the workpiece conveyance direction, The field of view in the perpendicular direction can be enlarged, and a wide range of inspections can be performed.

この発明の実施の形態1〜3の構成を示すブロック図である。It is a block diagram which shows the structure of Embodiment 1-3 of this invention. 実施の形態1における搬送ステージと撮像デバイスとの位置関係を説明するための説明図である。6 is an explanatory diagram for explaining a positional relationship between a transfer stage and an imaging device in Embodiment 1. FIG. 従来装置における搬送ステージと撮像デバイスとの位置関係を説明するための説明図である。It is explanatory drawing for demonstrating the positional relationship of the conveyance stage and imaging device in a conventional apparatus.

符号の説明Explanation of symbols

1 ワーク、 2 モータ、 3 搬送ステージ、 4 変位センサ、
5 撮像デバイス、 6 モータ、 7 上下ステージ、 8 画像処理装置、
9 制御装置。
1 work, 2 motor, 3 transport stage, 4 displacement sensor,
5 imaging device, 6 motor, 7 upper and lower stage, 8 image processing device,
9 Control device.

Claims (3)

検査用のワークを所定の検査位置へ搬送する搬送ステージと、上記ワークが上記検査位置へ到達するまでに上記ワークの所定の2点における光軸方向の高さを検出する変位センサと、上記検査位置において光軸方向の位置が焦点深度内に保持され、上記ワークの外観を撮像するシャッタ速度1/20000以上の撮像デバイスと、上記撮像デバイスによって撮像された画像を処理する画像処理装置と、上記ワークの所定の1点から他の1点に向けて上記搬送ステージを移動させると共に、上記搬送ステージの移動と同期して上記撮像デバイスの光軸方向の位置を調整する制御装置とを備えた外観検査装置。   A transport stage for transporting a workpiece for inspection to a predetermined inspection position, a displacement sensor for detecting the height in the optical axis direction at two predetermined points of the workpiece until the workpiece reaches the inspection position, and the inspection An image pickup device in which the position in the optical axis direction is held within the depth of focus at the position, the shutter speed is 1/20000 or more for picking up the appearance of the workpiece, the image processing device for processing the image picked up by the image pickup device, and the above An external appearance including a control device that moves the transfer stage from a predetermined point of the workpiece toward another point and adjusts the position of the imaging device in the optical axis direction in synchronization with the movement of the transfer stage. Inspection device. 上記ワークの位置確認は、固定部に装着されたリニアスケールによって行うことを特徴とする請求項1記載の外観検査装置。   2. The appearance inspection apparatus according to claim 1, wherein the position of the workpiece is confirmed by a linear scale attached to a fixed portion. 上記撮像デバイスはラインセンサであることを特徴とする請求項1または請求項2記載の外観検査装置。   The appearance inspection apparatus according to claim 1, wherein the imaging device is a line sensor.
JP2006046719A 2006-02-23 2006-02-23 Visual inspection device Pending JP2007225431A (en)

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011169661A (en) * 2010-02-17 2011-09-01 Mitsutoyo Corp Image measuring device
TWI396840B (en) * 2008-07-04 2013-05-21 Hon Hai Prec Ind Co Ltd Vision measuring device and focusing method thereof
CN110702200A (en) * 2019-11-14 2020-01-17 江苏汇鑫新能源汽车科技有限公司 Full automatic check out test set of new energy automobile accessories
WO2020241648A1 (en) * 2019-05-30 2020-12-03 三菱電機株式会社 Image acquisition apparatus and image acquisition method

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62144008A (en) * 1985-12-18 1987-06-27 Hitachi Ltd Apparatus for inspecting pattern of printed circuit board
JPH056422A (en) * 1991-06-28 1993-01-14 Matsushita Electric Ind Co Ltd Image checking device
JPH10213522A (en) * 1997-01-29 1998-08-11 Olympus Optical Co Ltd Substrate inspection device
JP2000081319A (en) * 1998-09-03 2000-03-21 Ricoh Microelectronics Co Ltd Visual inspection method and equipment
JP2000266691A (en) * 1999-03-16 2000-09-29 Olympus Optical Co Ltd Visual examination apparatus
JP2002214147A (en) * 2001-01-12 2002-07-31 Nissan Motor Co Ltd Surface flaw inspecting device
JP2005164254A (en) * 2003-11-28 2005-06-23 Yokohama Rubber Co Ltd:The Tire failure detection method and system

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62144008A (en) * 1985-12-18 1987-06-27 Hitachi Ltd Apparatus for inspecting pattern of printed circuit board
JPH056422A (en) * 1991-06-28 1993-01-14 Matsushita Electric Ind Co Ltd Image checking device
JPH10213522A (en) * 1997-01-29 1998-08-11 Olympus Optical Co Ltd Substrate inspection device
JP2000081319A (en) * 1998-09-03 2000-03-21 Ricoh Microelectronics Co Ltd Visual inspection method and equipment
JP2000266691A (en) * 1999-03-16 2000-09-29 Olympus Optical Co Ltd Visual examination apparatus
JP2002214147A (en) * 2001-01-12 2002-07-31 Nissan Motor Co Ltd Surface flaw inspecting device
JP2005164254A (en) * 2003-11-28 2005-06-23 Yokohama Rubber Co Ltd:The Tire failure detection method and system

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI396840B (en) * 2008-07-04 2013-05-21 Hon Hai Prec Ind Co Ltd Vision measuring device and focusing method thereof
JP2011169661A (en) * 2010-02-17 2011-09-01 Mitsutoyo Corp Image measuring device
WO2020241648A1 (en) * 2019-05-30 2020-12-03 三菱電機株式会社 Image acquisition apparatus and image acquisition method
JPWO2020241648A1 (en) * 2019-05-30 2021-10-28 三菱電機株式会社 Image acquisition device and image acquisition method
JP7077485B2 (en) 2019-05-30 2022-05-30 三菱電機株式会社 Image acquisition device and image acquisition method
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