JP2013092508A5 - - Google Patents

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Publication number
JP2013092508A5
JP2013092508A5 JP2011236314A JP2011236314A JP2013092508A5 JP 2013092508 A5 JP2013092508 A5 JP 2013092508A5 JP 2011236314 A JP2011236314 A JP 2011236314A JP 2011236314 A JP2011236314 A JP 2011236314A JP 2013092508 A5 JP2013092508 A5 JP 2013092508A5
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JP
Japan
Prior art keywords
wiring board
light beam
irradiation
inspection apparatus
visual inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2011236314A
Other languages
English (en)
Japanese (ja)
Other versions
JP2013092508A (ja
JP5427222B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2011236314A priority Critical patent/JP5427222B2/ja
Priority claimed from JP2011236314A external-priority patent/JP5427222B2/ja
Priority to CN201280038252.2A priority patent/CN103718027B/zh
Priority to PCT/JP2012/077245 priority patent/WO2013061927A1/ja
Publication of JP2013092508A publication Critical patent/JP2013092508A/ja
Publication of JP2013092508A5 publication Critical patent/JP2013092508A5/ja
Application granted granted Critical
Publication of JP5427222B2 publication Critical patent/JP5427222B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2011236314A 2011-10-27 2011-10-27 外観検査装置 Expired - Fee Related JP5427222B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2011236314A JP5427222B2 (ja) 2011-10-27 2011-10-27 外観検査装置
CN201280038252.2A CN103718027B (zh) 2011-10-27 2012-10-22 外观检查装置
PCT/JP2012/077245 WO2013061927A1 (ja) 2011-10-27 2012-10-22 外観検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011236314A JP5427222B2 (ja) 2011-10-27 2011-10-27 外観検査装置

Publications (3)

Publication Number Publication Date
JP2013092508A JP2013092508A (ja) 2013-05-16
JP2013092508A5 true JP2013092508A5 (enExample) 2013-06-27
JP5427222B2 JP5427222B2 (ja) 2014-02-26

Family

ID=48167758

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011236314A Expired - Fee Related JP5427222B2 (ja) 2011-10-27 2011-10-27 外観検査装置

Country Status (3)

Country Link
JP (1) JP5427222B2 (enExample)
CN (1) CN103718027B (enExample)
WO (1) WO2013061927A1 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101893831B1 (ko) * 2016-10-20 2018-08-31 주식회사 고영테크놀러지 기판 검사장치 및 이를 이용한 기판 검사방법
CN108801921A (zh) * 2018-08-02 2018-11-13 佛山市坦斯盯科技有限公司 一种用于线路板的cis相机和光源模组
JP7387914B2 (ja) * 2020-10-05 2023-11-28 ヤマハ発動機株式会社 基板作業装置
JP2025043962A (ja) * 2023-09-19 2025-04-01 株式会社東芝 光学装置、光学検査システム、および、物体の撮像方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4240750A (en) * 1978-10-02 1980-12-23 Hurd William A Automatic circuit board tester
JPH0739996B2 (ja) * 1988-09-02 1995-05-01 日本電気株式会社 半田付検査装置
JPH06331563A (ja) * 1993-05-19 1994-12-02 Matsushita Electric Ind Co Ltd ビジュアルチェッカー
JP2002312766A (ja) * 2001-04-17 2002-10-25 Mitsubishi Electric Corp 半田付け状態検査装置
US7492449B2 (en) * 2004-04-12 2009-02-17 Georgia Tech Research Corporation Inspection systems and methods
US7486274B2 (en) * 2005-08-18 2009-02-03 Mitsubishi Electric Research Laboratories, Inc. Method for stabilizing and precisely locating pointers generated by handheld direct pointing devices
JP2009153119A (ja) * 2007-11-30 2009-07-09 Sanyo Electric Co Ltd 撮像／映像補助装置およびそれを備える撮像／映像装置
JP2010139461A (ja) * 2008-12-15 2010-06-24 Toppan Printing Co Ltd 目視検査システム

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