JP2013058733A - 両面冷却パワー半導体パッケージ - Google Patents
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 85
- 238000001816 cooling Methods 0.000 title claims abstract description 24
- 239000000758 substrate Substances 0.000 claims description 37
- 229910052802 copper Inorganic materials 0.000 claims description 10
- 239000010949 copper Substances 0.000 claims description 10
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 9
- 239000004020 conductor Substances 0.000 claims description 8
- 238000003825 pressing Methods 0.000 abstract description 6
- 239000000463 material Substances 0.000 description 29
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 12
- 238000000034 method Methods 0.000 description 8
- 239000003989 dielectric material Substances 0.000 description 6
- 230000008878 coupling Effects 0.000 description 5
- 238000010168 coupling process Methods 0.000 description 5
- 238000005859 coupling reaction Methods 0.000 description 5
- 239000000919 ceramic Substances 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 239000002184 metal Substances 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 230000017525 heat dissipation Effects 0.000 description 2
- 229910001092 metal group alloy Inorganic materials 0.000 description 2
- 229910044991 metal oxide Inorganic materials 0.000 description 2
- 150000004706 metal oxides Chemical class 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 230000001351 cycling effect Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
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- H—ELECTRICITY
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- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/07—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00
- H01L25/072—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00 the devices being arranged next to each other
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/373—Cooling facilitated by selection of materials for the device or materials for thermal expansion adaptation, e.g. carbon
- H01L23/3735—Laminates or multilayers, e.g. direct bond copper ceramic substrates
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- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/40—Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs
- H01L23/4006—Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs with bolts or screws
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/46—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements involving the transfer of heat by flowing fluids
- H01L23/473—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements involving the transfer of heat by flowing fluids by flowing liquids
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/492—Bases or plates or solder therefor
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- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L24/33—Structure, shape, material or disposition of the layer connectors after the connecting process of a plurality of layer connectors
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/18—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof the devices being of types provided for in two or more different subgroups of the same main group of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32245—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
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- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
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- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
- H01L2924/13055—Insulated gate bipolar transistor [IGBT]
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- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1306—Field-effect transistor [FET]
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- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1306—Field-effect transistor [FET]
- H01L2924/13091—Metal-Oxide-Semiconductor Field-Effect Transistor [MOSFET]
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/161—Cap
- H01L2924/1615—Shape
- H01L2924/16152—Cap comprising a cavity for hosting the device, e.g. U-shaped cap
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- Engineering & Computer Science (AREA)
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- Computer Hardware Design (AREA)
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- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
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- Ceramic Engineering (AREA)
- Materials Engineering (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
- Inverter Devices (AREA)
Abstract
【解決手段】パワー半導体パッケージ300は複数のパワーデバイスを有するパワーモジュール322を備える。複数のパワーデバイスのそれぞれはパワースイッチであってもよい。パワー半導体パッケージは、上部324が複数のパワーデバイス上面に接触し、下部326がパワーモジュールの下面に接触する両面ヒートシンク320をさらに備える。パワー半導体パッケージは、両面ヒートシンクの上部および下部をパワーモジュールに押し付ける少なくとも1つの固定用クランプ330を備えることができる。
【選択図】図3A
Description
Claims (20)
- パワー半導体パッケージであって、
複数のパワーデバイスを備えるパワーモジュールであって、前記複数のパワーデバイスが、対応する複数のパワーデバイス上面を有するパワーモジュールと、
上部が前記複数のパワーデバイス上面に接触し、下部が前記パワーモジュールの下面に接触する両面ヒートシンクとを備えることを特徴とするパワー半導体パッケージ。 - 請求項1に記載のパワー半導体パッケージであって、前記両面ヒートシンクの前記上部および前記下部を前記パワーモジュールに押し付ける少なくとも1つの固定用クランプを備えることを特徴とするパワー半導体パッケージ。
- 請求項1に記載のパワー半導体パッケージであって、前記両面ヒートシンクの前記上部および前記下部を前記パワーモジュールに押し付ける少なくとも1つのヒートシンクねじを備えることを特徴とするパワー半導体パッケージ。
- 請求項1に記載のパワー半導体パッケージであって、少なくとも1つの固定用クランプによって前記両面ヒートシンクの前記上部および前記下部が互いに固定されるパワー半導体パッケージ。
- 請求項1に記載のパワー半導体パッケージであって、少なくとも1つのヒートシンクねじによって前記両面ヒートシンクの前記上部および前記下部が互いに固定されることを特徴とするパワー半導体パッケージ。
- 請求項1に記載のパワー半導体パッケージであって、前記両面ヒートシンクが前記パワーモジュールを包囲することを特徴とするパワー半導体パッケージ。
- 請求項1に記載のパワー半導体パッケージであって、前記両面ヒートシンクが水冷素子を含むことを特徴とするパワー半導体パッケージ。
- 請求項1に記載のパワー半導体パッケージであって、前記両面ヒートシンクが、前記両面ヒートシンクの前記上部と前記下部を結合させる水冷素子を含むことを特徴とするパワー半導体パッケージ。
- 請求項1に記載のパワー半導体パッケージであって、前記対応する複数のパワーデバイス上面のそれぞれに電流が流れるよう構成されることを特徴とするパワー半導体パッケージ。
- 請求項1に記載のパワー半導体パッケージであって、前記対応する複数のパワーデバイス上面のそれぞれに電流が流れるよう構成された導電性クリップを備えることを特徴とするパワー半導体パッケージ。
- 請求項1に記載のパワー半導体パッケージであって、前記複数のパワーデバイス上面が銅からなることを特徴とするパワー半導体パッケージ。
- 請求項1に記載のパワー半導体パッケージであって、前記パワーモジュールの前記下面が前記パワーモジュールの基板の下面であることを特徴とするパワー半導体パッケージ。
- 請求項1に記載のパワー半導体パッケージであって、前記パワーモジュールの前記下面が導電性材料からなることを特徴とするパワー半導体パッケージ。
- 請求項1に記載のパワー半導体パッケージであって、前記複数のパワーデバイスが前記パワーモジュールの基板上に位置し、キャップ層が前記複数のパワーデバイスの少なくとも1つの上方に位置することを特徴とするパワー半導体パッケージ。
- 請求項14に記載のパワー半導体パッケージであって、前記基板および前記キャップ層がそれぞれ銅直接接合(DBC)からなることを特徴とするパワー半導体パッケージ。
- 請求項14に記載のパワー半導体パッケージであって、前記複数のパワーデバイスのうちの前記少なくとも1つが前記基板を介して前記両面ヒートシンクの前記下部に熱的に結合され、前記キャップ層を介して前記両面ヒートシンクの前記上部に熱的に結合されることを特徴とするパワー半導体パッケージ。
- 請求項1に記載のパワー半導体パッケージであって、前記パワーモジュールに接続するよう前記両面ヒートシンクから外部に延びる複数のコンタクトを備えることを特徴とするパワー半導体パッケージ。
- 請求項1に記載のパワー半導体パッケージであって、前記複数のパワーデバイスのそれぞれがパワースイッチであることを特徴とするパワー半導体パッケージ。
- 請求項1に記載のパワー半導体パッケージであって、前記複数のパワーデバイスのそれぞれがダイオードに並列の絶縁ゲートバイポーラトランジスタ(IGBT)を備えることを特徴とするパワー半導体パッケージ。
- 請求項1に記載のパワー半導体パッケージであって、前記パワーモジュールがモータ駆動用インバータモジュールを備えることを特徴とするパワー半導体パッケージ。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13/155,804 US8804340B2 (en) | 2011-06-08 | 2011-06-08 | Power semiconductor package with double-sided cooling |
US13/155,804 | 2011-06-08 |
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Publication Number | Publication Date |
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JP2013058733A true JP2013058733A (ja) | 2013-03-28 |
JP5596748B2 JP5596748B2 (ja) | 2014-09-24 |
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Application Number | Title | Priority Date | Filing Date |
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JP2012119032A Active JP5596748B2 (ja) | 2011-06-08 | 2012-05-24 | 両面冷却パワー半導体パッケージ |
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Country | Link |
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US (1) | US8804340B2 (ja) |
EP (1) | EP2533284A3 (ja) |
JP (1) | JP5596748B2 (ja) |
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KR20180023365A (ko) * | 2016-08-25 | 2018-03-07 | 현대오트론 주식회사 | 파워 모듈 |
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US20140291832A1 (en) * | 2013-03-28 | 2014-10-02 | Infineon Technologies Ag | Integrated cooling modules of power semiconductor device |
US20160005675A1 (en) | 2014-07-07 | 2016-01-07 | Infineon Technologies Ag | Double sided cooling chip package and method of manufacturing the same |
US10099574B2 (en) | 2015-04-15 | 2018-10-16 | Ford Global Technologies, Llc | Vehicle power module assemblies |
US10373890B1 (en) | 2018-04-09 | 2019-08-06 | Infineon Technologies Ag | Cooling techniques for semiconductor package |
KR102645198B1 (ko) | 2018-10-24 | 2024-03-06 | 현대자동차주식회사 | 양면 냉각형 파워모듈 |
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US8804340B2 (en) | 2014-08-12 |
EP2533284A2 (en) | 2012-12-12 |
US20120314372A1 (en) | 2012-12-13 |
JP5596748B2 (ja) | 2014-09-24 |
EP2533284A3 (en) | 2013-11-13 |
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