JP2013011445A5 - - Google Patents
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- JP2013011445A5 JP2013011445A5 JP2011142588A JP2011142588A JP2013011445A5 JP 2013011445 A5 JP2013011445 A5 JP 2013011445A5 JP 2011142588 A JP2011142588 A JP 2011142588A JP 2011142588 A JP2011142588 A JP 2011142588A JP 2013011445 A5 JP2013011445 A5 JP 2013011445A5
- Authority
- JP
- Japan
- Prior art keywords
- support
- rotating
- workpiece
- region
- holding device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Links
- 230000003028 elevating effect Effects 0.000 claims description 6
- 239000000523 sample Substances 0.000 claims 5
- 239000004065 semiconductor Substances 0.000 claims 1
- 238000005259 measurement Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011142588A JP5971902B2 (ja) | 2011-06-28 | 2011-06-28 | ワーク保持装置及び、このワーク保持装置を備えた3次元形状測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011142588A JP5971902B2 (ja) | 2011-06-28 | 2011-06-28 | ワーク保持装置及び、このワーク保持装置を備えた3次元形状測定装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2013011445A JP2013011445A (ja) | 2013-01-17 |
| JP2013011445A5 true JP2013011445A5 (https=) | 2014-08-14 |
| JP5971902B2 JP5971902B2 (ja) | 2016-08-17 |
Family
ID=47685446
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011142588A Expired - Fee Related JP5971902B2 (ja) | 2011-06-28 | 2011-06-28 | ワーク保持装置及び、このワーク保持装置を備えた3次元形状測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP5971902B2 (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102389557B1 (ko) * | 2020-01-17 | 2022-04-21 | 고흥도 | 하이트 게이지 측정 지그 |
| JPWO2024252551A1 (https=) * | 2023-06-07 | 2024-12-12 |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05240798A (ja) * | 1992-02-28 | 1993-09-17 | Nec Yamagata Ltd | パターン付きウエハ表面のレーザ検査装置 |
| JP3430788B2 (ja) * | 1996-04-26 | 2003-07-28 | 株式会社日立製作所 | 試料像測定装置 |
| JP5043476B2 (ja) * | 2007-03-06 | 2012-10-10 | 株式会社神戸製鋼所 | 形状測定装置及びその方法 |
| JP2010133841A (ja) * | 2008-12-05 | 2010-06-17 | Nikon Corp | 周部検査装置 |
-
2011
- 2011-06-28 JP JP2011142588A patent/JP5971902B2/ja not_active Expired - Fee Related
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