JP2013010673A - Method for manufacturing glass substrates - Google Patents

Method for manufacturing glass substrates Download PDF

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JP2013010673A
JP2013010673A JP2011145170A JP2011145170A JP2013010673A JP 2013010673 A JP2013010673 A JP 2013010673A JP 2011145170 A JP2011145170 A JP 2011145170A JP 2011145170 A JP2011145170 A JP 2011145170A JP 2013010673 A JP2013010673 A JP 2013010673A
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glass
base material
chemical polishing
main surface
glass substrate
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JP5166573B2 (en
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Sakae Nishiyama
榮 西山
Yasuhiro Kashiwabara
康宏 柏原
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NSC Co Ltd
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Priority to PCT/JP2012/066694 priority patent/WO2013002368A1/en
Priority to CN201280029748.3A priority patent/CN103608309B/en
Priority to KR1020147000637A priority patent/KR20140036306A/en
Priority to TW101123487A priority patent/TWI526411B/en
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means

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Abstract

PROBLEM TO BE SOLVED: To provide a method for manufacturing glass substrates such that it is possible to obtain multiple glass substrates stably from a large glass matrix on which a strong strengthening treatment has been performed.SOLUTION: A method for manufacturing glass substrates comprises a first chemical polishing step and a second chemical polishing step. In the first chemical polishing step, a chemical polishing treatment is performed on only the first major surface of a glass matrix 10 by a predetermined amount of single-side polishing. In the second chemical polishing step, a chemical polishing treatment is performed on each of the first major surface and the second major surface. Subsequently, first partitioning grooves 102 formed in the first major surface and second partitioning grooves 104 formed in the second major surface are connected to each other at a position shifted from the center line 110 in the thickness direction of the glass matrix 10 by an amount of shift 114 which corresponds to the amount of single-side polishing.

Description

本発明は、強化処理が施されたガラス母材であって、切断すべき位置である区画ラインをまたぐようにレジスト層が第1の主面および第2の主面に形成されたガラス母材を化学研磨処理によって切断分離することによって複数のガラス基板を得るガラス基板の製造方法に関する。   The present invention relates to a glass base material that has been subjected to a tempering treatment, wherein a resist layer is formed on the first main surface and the second main surface so as to straddle a partition line that is a position to be cut. It is related with the manufacturing method of the glass substrate which obtains a some glass substrate by cut-separating by a chemical polishing process.

携帯電話等の表示装置のスクリーンに適用されるカバーガラスやタッチパネルには、その透明性からガラス基板が用いられることが多い。そのようなガラス基板は装置の携帯性を高める観点から薄型化が要求される一方で、安全性等の観点から高強度化が要求される。このため、従来、風冷強化法や化学強化法等によって強化処理が施された強化ガラスをガラス基板に用いる試みが為されている。とりわけ、薄さが要求される表示装置用のガラス基板に対しては、化学強化処理が広く用いられてきた。   A glass substrate is often used for a cover glass or a touch panel applied to a screen of a display device such as a mobile phone because of its transparency. Such a glass substrate is required to be thin from the viewpoint of improving the portability of the apparatus, but is required to have high strength from the viewpoint of safety and the like. For this reason, conventionally, attempts have been made to use tempered glass that has been tempered by a wind-cooling tempering method, a chemical tempering method, or the like for a glass substrate. In particular, chemical strengthening treatment has been widely used for glass substrates for display devices that are required to be thin.

ところが、化学強化処理等の強化処理が施された強化済みガラスは、切断等の加工が困難になる傾向がある。一般的には、σを圧縮応力[MPa]、DOLを化学強化層の厚み[μm]、Tを板厚[μm]、およびσをCT値(Calculated Tensile Stress)[MPa]としたときに、下記の式で計算されるσの値であるCT値が大きくなるほど化学強化ガラスの切断等の加工が困難になるとされている。

Figure 2013010673
切断等の加工ができない場合には、大型の強化処理済みガラス母材からガラス基板を複数枚採りをすることができなくなるため、単個のガラス基板に対して化学強化処理やチップ領域形成処理等を行うことが余儀なくされる。このため、強化ガラスを用いたガラス基板の生産性の向上を図ることができず、ガラス基板の生産コストが増大するという問題があった。 However, tempered glass subjected to a tempering treatment such as a chemical tempering treatment tends to be difficult to process such as cutting. Generally, when σ c is a compressive stress [MPa], DOL is a thickness of a chemically strengthened layer [μm], T is a plate thickness [μm], and σ T is a CT value (Calculated Tensile Stress) [MPa]. Furthermore, it is said that processing such as cutting of chemically strengthened glass becomes more difficult as the CT value, which is the value of σ T calculated by the following equation, increases.
Figure 2013010673
When processing such as cutting is not possible, it is not possible to take multiple glass substrates from a large tempered glass base material, so chemical strengthening processing or chip area formation processing etc. for a single glass substrate Will be forced to do. For this reason, the improvement of the productivity of the glass substrate using tempered glass cannot be aimed at, but there existed a problem that the production cost of a glass substrate increased.

そこで、従来技術の中には、圧縮応力層の厚さ(上記DOLに相当)が10μm以上30μm以下、および圧縮応力の値(上記σに相当)が30kgf/mm2 以上60kgf/mm2 以下(294MPa以上588MPa以下)とすることによって切断性を向上させた化学強化ガラスが存在する(例えば、特許文献1参照。)。この技術によれば、市場ニーズを満たす化学強化ガラスの切断が安定してできるようになったとされている。 Therefore, in the prior art, the thickness of the compressive stress layer (corresponding to the DOL) is 10 μm or more and 30 μm or less, and the value of the compressive stress (corresponding to the σ c ) is 30 kgf / mm 2 or more and 60 kgf / mm 2 or less. There exists a chemically strengthened glass whose cutting property is improved by setting it to (294 MPa or more and 588 MPa or less) (for example, see Patent Document 1). According to this technology, it is said that the chemically tempered glass that satisfies the market needs can be stably cut.

特開2004−83378号公報JP 2004-83378 A

しかしながら、上述の特許文献1に係る技術では、圧縮応力層(化学強化層)の厚さおよび圧縮応力の値が所定の範囲内のものしか切断することができないという不都合がある。実際に、上述したCT値が15程度であれば切断できているが、CT値が20程度になるとスクライブ線に沿って分断できない場合が生じたり、切断圧を強くするとガラスが破壊したりするという不都合が発生している。一方で、より薄型でより強固なガラス基板を求める市場ニーズが存在するため、CT値が20を超えるものについても安定して切断できる技術が求められていると言える。   However, the technique according to Patent Document 1 described above has a disadvantage that only the thickness of the compressive stress layer (chemical strengthening layer) and the value of the compressive stress can be cut. Actually, if the above CT value is about 15, it can be cut, but if the CT value becomes about 20, there are cases where it cannot be divided along the scribe line, or if the cutting pressure is increased, the glass is broken. An inconvenience has occurred. On the other hand, since there is a market need for a thinner and stronger glass substrate, it can be said that there is a demand for a technique that can stably cut even a CT value exceeding 20.

この発明の目的は、強固な強化処理が施された大型のガラス母材からガラス基板を安定して複数枚採りをすることが可能なガラス基板の製造方法を提供することである。   An object of the present invention is to provide a method for producing a glass substrate capable of stably collecting a plurality of glass substrates from a large glass base material subjected to a strong strengthening treatment.

この発明に係るガラス基板の製造方法は、強化処理が施されたガラス母材であって、切断すべき位置である区画ラインをまたぐようにレジスト層が第1の主面および第2の主面に形成されたガラス母材を化学研磨処理によって切断分離することによって複数のガラス基板を得るものである。ここで主面とは、ガラス母材の周囲6面のうちの4端面を除く表側と裏側の2平面を意味する。このガラス基板の製造方法は、第1の化学研磨ステップおよび第2の化学研磨ステップを含む。第1の化学研磨ステップでは、ガラス母材の第1の主面のみに所定の片面研磨量だけ化学研磨処理が施される。第2の化学研磨ステップでは、第1の主面および第2の主面の両方に化学研磨処理が施される。
第2の化学研磨処理を行う前または後に、第1の化学研磨処理を行うことにより、第1の主面に形成される第1の区画溝および第2の主面に形成される第2の区画溝が、ガラス母材の厚み方向の中心から前記片面研磨量に相当する量だけズレた位置にて貫通する。
第1の化学研磨処理(片面化学研磨処理)および第2の化学研磨処理(両面化学研磨処理)は、この順序で行っても良いし、順序を前後させて行っても同様の作用効果を享受することができる。
The method for producing a glass substrate according to the present invention is a glass base material that has been subjected to a tempering treatment, and the resist layer has a first main surface and a second main surface so as to straddle a partition line that is a position to be cut. A plurality of glass substrates are obtained by cutting and separating the glass base material formed by the chemical polishing process. Here, the main surface means two planes on the front side and the back side excluding the four end surfaces of the six surrounding surfaces of the glass base material. The glass substrate manufacturing method includes a first chemical polishing step and a second chemical polishing step. In the first chemical polishing step, a chemical polishing process is performed only on the first main surface of the glass base material by a predetermined single-side polishing amount. In the second chemical polishing step, chemical polishing is performed on both the first main surface and the second main surface.
Before or after performing the second chemical polishing treatment, by performing the first chemical polishing treatment, the first partition groove formed on the first main surface and the second partition formed on the second main surface The partition groove penetrates at a position shifted from the center in the thickness direction of the glass base material by an amount corresponding to the single-side polishing amount.
The first chemical polishing process (single-sided chemical polishing process) and the second chemical polishing process (double-sided chemical polishing process) may be performed in this order, or the same effects can be obtained even when the order is changed. can do.

通常、上述したCT値が20程度を超えると、スクライブブレーク法等の物理的方法ではガラス母材の切断が困難になり、また、化学研磨処理によって切断した場合であっても、エッチングにより発生する区画溝の貫通と同時にガラス基板が割れる傾向がある。しかしながら、上述のように、第1の区画溝および第2の区画溝を、ガラス母材の厚み方向の中心から片面研磨量に相当する量だけズレた位置にて貫通させることにより、貫通と同時にガラス基板に発生する内部応力の変化が低減され、ガラス基板の割れが防止可能となる。
また、第1の区画溝および第2の区画溝が貫通した後に、さらに、ガラス基板の端面を断面視円弧状に変形させる端面処理を行うことが好ましい。この端面処理を行うことにより、ガラス基板における端面の突出部の厚み方向の中心からズレが矯正され、外観性や強度が向上することが期待できる。なお、ここで、円弧状とは、完全に曲率半径が一致する円の一部のみを意味するものではなく、曲率半径が互いに±5%程度の範囲内で互いに異なる複数の円弧が連続するような形状も含むものとする。
Usually, when the CT value described above exceeds about 20, it becomes difficult to cut the glass base material by a physical method such as a scribe break method, and it is generated by etching even when it is cut by chemical polishing treatment. There is a tendency that the glass substrate breaks simultaneously with the penetration of the partition groove. However, as described above, by passing through the first partition groove and the second partition groove at a position shifted from the center in the thickness direction of the glass base material by an amount corresponding to the single-side polishing amount, simultaneously with the penetration. Changes in internal stress generated in the glass substrate are reduced, and the glass substrate can be prevented from cracking.
Moreover, after the 1st division groove and the 2nd division groove penetrate, it is preferable to perform the end surface process which further deform | transforms the end surface of a glass substrate into a cross-sectional arc shape. By performing this end surface treatment, it is expected that the deviation from the center in the thickness direction of the protruding portion of the end surface of the glass substrate is corrected and the appearance and strength are improved. Here, the circular arc shape does not mean only a part of a circle whose curvature radii completely coincide with each other, and a plurality of different arcs are continuous within a range where the curvature radii are about ± 5% of each other. Including various shapes.

本発明によれば、強固な強化処理が施された大型のガラス母材からガラス基板を安定して複数枚採りをすることが可能になる。   According to the present invention, it is possible to stably take a plurality of glass substrates from a large glass base material that has been subjected to a strong strengthening treatment.

本発明の実施形態に係るガラス基板の製造方法が施されるガラス母材の概略を示す図である。It is a figure which shows the outline of the glass base material with which the manufacturing method of the glass substrate which concerns on embodiment of this invention is given. ガラス母材をガラス支持具に縦置きにセットした状態を示す図である。It is a figure which shows the state which set the glass base material vertically to the glass support. 化学研磨処理によってガラス母材に区画溝が形成される状態を説明する図である。It is a figure explaining the state in which a partition groove | channel is formed in a glass base material by a chemical polishing process. ガラス母材をガラス支持具に横置きにセットした状態を示す図である。It is a figure which shows the state which set the glass base material horizontally on the glass support. 区画溝が貫通した状態のガラス部材の状態を示す図である。It is a figure which shows the state of the glass member of the state which the partition groove penetrated. ガラス基板の端面に対して化学研磨処理を施す状態を示す図である。It is a figure which shows the state which performs a chemical polishing process with respect to the end surface of a glass substrate. 本発明の他の実施形態を示す図である。It is a figure which shows other embodiment of this invention. 本発明が適用されるガラス母材の他の例を示す図である。It is a figure which shows the other example of the glass base material to which this invention is applied.

図1(A)および図1(B)は、本発明に係る製造方法が施されるガラス母材10の概略を示している。ガラス母材10は、例えば、400×500mm程度の面積を有し、板厚0.5mm〜1.2mm程度(この実施形態では、0.7mm程度)に薄型化されたアルミノシリケートガラスからなるガラス母材10が使用される。ガラス母材10は、例えば、350〜450℃程度の硝酸カリウム溶融塩中にて化学強化処理がされている。ガラス母材10は、化学強化処理がされた後、タッチパネル用のセンサ素子等を有する複数のチップ領域(使用領域)およびチップ領域を保護するオーバーコート層が第1の主面側に形成され、その後さらに、第1の主面および第2の主面に耐酸性のレジスト層14が形成される。   1 (A) and 1 (B) show an outline of a glass base material 10 to which the manufacturing method according to the present invention is applied. The glass base material 10 is, for example, a glass made of aluminosilicate glass having an area of about 400 × 500 mm and reduced in thickness to about 0.5 mm to 1.2 mm (in this embodiment, about 0.7 mm). A base material 10 is used. The glass base material 10 is chemically strengthened in, for example, a potassium nitrate molten salt at about 350 to 450 ° C. After the glass base material 10 is subjected to the chemical strengthening treatment, a plurality of chip regions (use regions) having sensor elements for a touch panel and an overcoat layer for protecting the chip regions are formed on the first main surface side, Thereafter, an acid-resistant resist layer 14 is further formed on the first main surface and the second main surface.

レジスト層14は、上記チップ領域を区画するための線幅1mm〜5mm程度の区画領域をまたぐように形成されている。レジスト層14に用いる耐フッ酸エッチングレジストについては、様々なものが使用可能であるが、例えば、この実施形態では日本ペイント株式会社製オプト(登録商標)を用いている。ガラス母材10の第2の主面には、さらにレジスト層14の上から耐酸性フィルム12が貼付されている。   The resist layer 14 is formed so as to straddle a partition region having a line width of about 1 mm to 5 mm for partitioning the chip region. Various resists resistant to hydrofluoric acid used for the resist layer 14 can be used. For example, OPT (registered trademark) manufactured by Nippon Paint Co., Ltd. is used in this embodiment. On the second main surface of the glass base material 10, an acid resistant film 12 is further stuck on the resist layer 14.

耐酸性フィルム12は、通常、チップ領域が形成されている面とは反対側に添付される。その理由は、チップ領域側のレジスト層14の剥離性を良くするためである。また、耐酸性フィルム12は、ガラス母材10との間に空気が混入しないように貼り付けることが好ましい。この実施形態では、ガラスラミネータを用いて耐酸性フィルム12の貼付を行っているが、これに限定されるものではない。また、ここでは、耐酸性フィルム12として、厚み70μm程度のPET(ポリエチレンテレフタレート)からなる樹脂フィルムを用いているが、その他の素材のフィルムを用いることも可能である。なお、図1(A)では、耐酸性フィルム12を貼付する前のガラス母材10を示しており、図1(B)では、第2の主面に耐酸性フィルム12を貼付したガラス母材10を示している。   The acid resistant film 12 is usually attached to the side opposite to the surface on which the chip region is formed. The reason is to improve the peelability of the resist layer 14 on the chip region side. Moreover, it is preferable to affix the acid resistant film 12 between the glass base material 10 so that air may not mix. In this embodiment, the acid resistant film 12 is attached using a glass laminator, but the present invention is not limited to this. Here, as the acid-resistant film 12, a resin film made of PET (polyethylene terephthalate) having a thickness of about 70 μm is used, but a film made of other materials can also be used. 1A shows the glass base material 10 before the acid resistant film 12 is pasted, and FIG. 1B shows the glass base material with the acid resistant film 12 pasted on the second main surface. 10 is shown.

耐酸性フィルム12が貼付されたガラス母材10は、化学研磨処理をする前にガラス支持具16内にセットされる。ガラス支持具16は、ポリ塩化ビニル等の耐フッ酸性を有する素材によって構成される。また、ガラス支持具16は、ガラス母材10の端部を支持するように構成されたガイド溝を複数備えており、開口面からガイド溝に沿ってガラス母材10を挿入できるように構成されている。複数のガラス母材10をガイド溝に沿ってガラス支持具16内に挿入すると、複数のガラス母材10が互いに間隙を設けた状態で、かつ、それぞれが垂直に立った状態でガラス支持具16内に配置されることになる。ガラス母材10に対して化学研磨処理をする際には、ガラス母材10を収容したガラス支持具16を化学研磨槽に浸漬させる。   The glass base material 10 to which the acid resistant film 12 is attached is set in the glass support 16 before chemical polishing treatment. The glass support 16 is made of a material having hydrofluoric acid resistance such as polyvinyl chloride. Further, the glass support 16 includes a plurality of guide grooves configured to support the end portion of the glass base material 10, and is configured so that the glass base material 10 can be inserted along the guide grooves from the opening surface. ing. When the plurality of glass base materials 10 are inserted into the glass support 16 along the guide grooves, the glass support 16 is in a state in which the plurality of glass base materials 10 are spaced from each other and are standing vertically. Will be placed inside. When the chemical polishing process is performed on the glass base material 10, the glass support 16 containing the glass base material 10 is immersed in the chemical polishing tank.

続いて、図3(A)〜図3(B)を用いて、ガラス母材10に対する化学研磨処理を説明する。化学研磨液として、2〜10重量%のフッ酸、2〜6重量%の硫酸、5〜20重量%の塩酸を含有するものが用いられる。ガラス母材10を化学研磨液に浸漬させると、図3(A)に示すように、ガラス母材10の第1の主面におけるレジスト層14を設けていない部分がエッチングされ、第1の区画溝102が形成される。一方で、ガラス母材10の第2の主面には耐酸性フィルム12が貼付されているため、第2の主面はエッチングされない。   Then, the chemical polishing process with respect to the glass base material 10 is demonstrated using FIG. 3 (A)-FIG. 3 (B). A chemical polishing liquid containing 2 to 10% by weight of hydrofluoric acid, 2 to 6% by weight of sulfuric acid and 5 to 20% by weight of hydrochloric acid is used. When the glass base material 10 is immersed in the chemical polishing liquid, as shown in FIG. 3A, the portion of the first main surface of the glass base material 10 where the resist layer 14 is not provided is etched, and the first section is etched. A groove 102 is formed. On the other hand, since the acid resistant film 12 is stuck on the second main surface of the glass base material 10, the second main surface is not etched.

続いて、第1の区画溝102が所望の量だけ深化した段階で、ガラス支持具16を化学研磨槽から取り出し、ガラス母材10から耐酸性フィルム12を剥離する。耐酸性フィルム12が剥離されたガラス母材10は再度ガラス支持具16にセットされ、化学研磨槽内に戻される。第1の主面のみを片面化学研磨する片面研磨量は、ガラス母材10のCT値によって設定される。原則として、片面研磨量は、CT値が大きくなるに伴って増加させる必要があるが、後処理の便宜等を考慮するとなるべく小さい値にすることが好ましい。この実施形態では、CT値25程度の化学強化ガラスに対して50μm程度の片面研磨を施している。   Subsequently, when the first partition groove 102 is deepened by a desired amount, the glass support 16 is taken out from the chemical polishing tank, and the acid resistant film 12 is peeled from the glass base material 10. The glass base material 10 from which the acid-resistant film 12 has been peeled is set again on the glass support 16 and returned to the chemical polishing tank. The single-side polishing amount for single-side chemical polishing of only the first main surface is set by the CT value of the glass base material 10. In principle, the single-side polishing amount needs to be increased as the CT value increases, but it is preferable to make it as small as possible in consideration of the convenience of post-processing and the like. In this embodiment, single-side polishing of about 50 μm is applied to chemically strengthened glass having a CT value of about 25.

その後、図3(B)に示すように、ガラス母材10の第1の主面では第1の区画溝102がさらに深化する一方で、ガラス母材10の第2の主面におけるレジスト層14を設けていない部分がエッチングされ、第2の区画溝104が形成される。さらに、化学研磨処理を続けていると、図3(C)に示すように、第1の区画溝102および第2の区画溝104がさらに深化する。ガラス母材10におけるレジスト層14が設けられていない部分の厚みが0.1mm程度になれば、ガラス支持具16を化学研磨槽から取り出す。   Thereafter, as shown in FIG. 3B, the first partition groove 102 is further deepened on the first main surface of the glass base material 10, while the resist layer 14 on the second main surface of the glass base material 10. The portion not provided with the etching is etched, and the second partition groove 104 is formed. Further, when the chemical polishing process is continued, as shown in FIG. 3C, the first partition groove 102 and the second partition groove 104 are further deepened. When the thickness of the portion of the glass base material 10 where the resist layer 14 is not provided is about 0.1 mm, the glass support 16 is removed from the chemical polishing tank.

続いて、ガラス母材10は、第1の主面を上にした状態でガラス支持具18上に水平に載置される。ガラス母材10の上には必要に応じて図示しない別のガラス支持具18が載置される。そして、ガラス母材10を支持したガラス支持具18が化学研磨槽内に浸漬される。ガラス母材10が化学研磨槽に浸漬されると、図5(A)に示すように、第1の区画溝102および第2の区画溝104がさらに深化していき、やがて第1の区画溝102および第2の区画溝104が貫通する。第1の区画溝102および第2の区画溝104が貫通することによりガラス母材10が切断され、図4(B)および図5(B)に示すような複数のガラス基板100が得られる。   Subsequently, the glass base material 10 is horizontally placed on the glass support 18 with the first main surface facing up. Another glass support 18 (not shown) is placed on the glass base material 10 as necessary. And the glass support 18 which supported the glass base material 10 is immersed in a chemical polishing tank. When the glass base material 10 is immersed in the chemical polishing tank, the first partition groove 102 and the second partition groove 104 are further deepened as shown in FIG. 102 and the second partition groove 104 pass therethrough. By passing through the first partition groove 102 and the second partition groove 104, the glass base material 10 is cut, and a plurality of glass substrates 100 as shown in FIGS. 4B and 5B are obtained.

通常、上述したCT値が20程度を超える化学強化ガラスをエッチングによって切断した場合、区画溝の貫通と同時にガラス基板100が割れる。しかしながら、この実施形態のように、まず片面研磨を行うことにより、区画溝の貫通と同時にガラス基板100が割れることが防止される。   Normally, when chemically tempered glass having a CT value exceeding about 20 is cut by etching, the glass substrate 100 breaks simultaneously with the penetration of the partition grooves. However, as in this embodiment, first-side polishing is performed to prevent the glass substrate 100 from being broken simultaneously with the penetration of the partition grooves.

区画溝の貫通と同時にガラス基板100が割れることが防止されるメカニズムの詳細は不明であるが、数々の実験の結果、そのメカニズムは以下のとおりであると推測される。すわなち、通常、ガラス母材10における第1の主面および第2の主面を同時にエッチングした場合、図5(B)に示す中心ライン110上において区画溝が貫通し、稜線112が中心ライン110上に位置する。ここで、化学強化ガラスでは、表面に圧縮応力層が形成される一方で、裏面に引張応力層が形成され、中心ライン110上において引張応力が最も強くなると考えられている。この最も引張応力が強くなる箇所において区画溝が貫通すると、貫通と同時に発生する内部応力の変化が巨大化し、ガラス基板が割れるものと予想される。   The details of the mechanism that prevents the glass substrate 100 from being broken simultaneously with the penetration of the partition groove are unknown, but as a result of numerous experiments, the mechanism is assumed to be as follows. That is, normally, when the first main surface and the second main surface of the glass base material 10 are simultaneously etched, the partition groove penetrates on the center line 110 shown in FIG. Located on line 110. Here, in the chemically strengthened glass, a compressive stress layer is formed on the surface, while a tensile stress layer is formed on the back surface, and the tensile stress is considered to be strongest on the center line 110. When the partition groove penetrates at the place where the tensile stress becomes strongest, it is expected that the change in internal stress generated simultaneously with the penetration becomes enormous and the glass substrate is broken.

このため、本発明の実施形態では、この最も引張応力が強くなる中心ライン110から所定のズレ量114だけズラした位置にガラス基板の稜線112を発生させるために、上述した片面研磨処理を採り入れている。上記のズレ量114は、原則として、CT値が高くなるにつれて大きく設定する必要があることが実験によって明らかになっている。その理由は、ズレ量114が大きくなり中心ラインから遠ざかるほど、ガラス母材10の内部の引張応力が低下するからであると考えられる。一方で、ズレ量114を必要以上に大きくした場合には、強度や意匠性が低下する可能性があるため、ズレ量114は、ガラス基板100の割れの発生を防止可能な範囲で可能な限り小さく設定することが好ましいと言える。   For this reason, in the embodiment of the present invention, in order to generate the ridgeline 112 of the glass substrate at a position shifted by a predetermined shift amount 114 from the center line 110 where the tensile stress is strongest, the above-described single-side polishing process is adopted. Yes. As a general rule, it has become clear from experiments that the above-described deviation amount 114 needs to be set larger as the CT value increases. The reason is considered to be that the tensile stress inside the glass base material 10 decreases as the shift amount 114 increases and moves away from the center line. On the other hand, when the amount of deviation 114 is increased more than necessary, the strength and design may be lowered. Therefore, the amount of deviation 114 is as much as possible within a range in which the occurrence of cracks in the glass substrate 100 can be prevented. It can be said that it is preferable to set a small value.

例えば、ガラス母材10の板厚が0.5mm〜1.2mm程度であってCT値が30程度までであれば、ズレ量114を50μm〜100μmに設定することによりガラス基板100の割れが防止される。例えば、ズレ量114を50μmに設定するためには、約2〜3μm/分程度のエッチングレートで20分程度片面化学研磨処理を実行した後、4〜6μm/分程度のエッチングレートで区画溝が貫通するまで両面化学研磨処理を行うようにすると良い。この実施形態では、片面研磨速度を2.5μm/分、かつ、両面研磨速度を5μm/分に設定しているが、研磨速度は必要に応じて適宜増減させることが可能である。   For example, if the thickness of the glass base material 10 is about 0.5 mm to 1.2 mm and the CT value is up to about 30, the deviation 114 is set to 50 μm to 100 μm to prevent the glass substrate 100 from cracking. Is done. For example, in order to set the deviation amount 114 to 50 μm, the single-side chemical polishing process is performed for about 20 minutes at an etching rate of about 2 to 3 μm / minute, and then the partition groove is formed at an etching rate of about 4 to 6 μm / minute. It is preferable to perform double-sided chemical polishing until it penetrates. In this embodiment, the single-side polishing rate is set to 2.5 μm / min and the double-side polishing rate is set to 5 μm / min. However, the polishing rate can be increased or decreased as necessary.

続いて、図6(A)〜図6(B)を用いて、各ガラス基板100の端面に適用する端面処理について説明する。図6(A)に示すように、区画溝が貫通した時点ではガラス基板100の端面は稜線112の位置にて尖るような形状になっている。このため、区画溝が貫通して複数のガラス基板100が得られた後も、ガラス基板100の端面が断面視で円弧状になるように端面処理を行うことが好ましい。   Then, the end surface process applied to the end surface of each glass substrate 100 is demonstrated using FIG. 6 (A)-FIG. 6 (B). As shown in FIG. 6A, the end surface of the glass substrate 100 is sharpened at the position of the ridgeline 112 when the partitioning groove penetrates. For this reason, it is preferable to perform the end surface treatment so that the end surface of the glass substrate 100 has an arc shape in a cross-sectional view even after the partitioning grooves penetrate and a plurality of glass substrates 100 are obtained.

ガラス基板100に対して端面処理を施す場合には、ガラス支持具18にて複数のガラス基板100の上下面を支持した状態で、ガラス基板100を化学研磨槽に1時間〜10時間程度浸漬する。このとき、より多くエッチングしたい側(この実施形態では第2の主面側)を上にすることが好ましい。その理由は、上側の面の方がスラッジ等が滞留しにくくより新鮮な化学研磨液が循環され易くなるため、研磨速度が下側よりも高くなる傾向があるからである。図6(A)に示すように、第2の主面側の研磨量が第1の主面側よりも大きくなる結果、第1の主面側および第2の主面側のバランスがとれるようになる。この実施形態では、より多くエッチングしたい側を上にして端面処理を行うことによって第1の主面側および第2の主面側のバランスをとるようにしているが、端面処理の方法はこれに限定されるものではない。例えば、エッチング液の循環速度を上下で差を設けたり、エッチング液の粘度を上下で差を設けたりすることによっても同様の作用効果を得ることができる。   When the end surface treatment is performed on the glass substrate 100, the glass substrate 100 is immersed in the chemical polishing tank for about 1 to 10 hours with the glass support 18 supporting the upper and lower surfaces of the plurality of glass substrates 100. . At this time, it is preferable that the side to be etched more (in this embodiment, the second main surface side) is on the upper side. The reason is that the upper surface is less likely to retain sludge and the like, and a fresher chemical polishing liquid is more easily circulated, so that the polishing rate tends to be higher than the lower surface. As shown in FIG. 6A, the amount of polishing on the second main surface side is larger than that on the first main surface side, so that the first main surface side and the second main surface side are balanced. become. In this embodiment, the first main surface side and the second main surface side are balanced by performing the end surface processing with the side to be etched more upward, but the end surface processing method is the same. It is not limited. For example, the same effect can be obtained by providing a difference in the circulation rate of the etchant up and down, or providing a difference in the viscosity of the etchant up and down.

端面処理が完了したガラス基板100は、苛性ソーダまたはTMAH(テトラメチルアンモニウムハイドロキシド)およびDMI(1,3−ジメチルー2−イミダゾリジノン)の混合液等のアルカリ性剥離液が収容する剥離槽に浸漬されて、図6(C)に示すように、レジスト14が剥離される。以上の処理を行うことにより、化学強化済みのガラス母材から安定的にかつ効率的に複数のガラス基板を得ることが可能になる。なお、この実施形態では、レジスト層14の剥離の前に端面処理を行う例を説明したが、端面処理を行うことは必ずしも必須ではない。ガラス基板100の端面に形成される稜線112が厚み方向の中心からズレても実用上問題がないようであれば、端面処理を行うことなくガラス基板100を使用することが可能である。
上述の実施形態では、まず片面化学研磨処理を行った後に両面化学研磨処理を行う例を説明したが、まず両面化学研磨処理を行った後に片面化学研磨処理を行うことによっても同様の作用効果を奏するため、必要に応じて処理の順序を変更することが可能である。
The glass substrate 100 after the end face treatment is immersed in a peeling tank containing an alkaline peeling solution such as caustic soda or a mixed solution of TMAH (tetramethylammonium hydroxide) and DMI (1,3-dimethyl-2-imidazolidinone). Then, as shown in FIG. 6C, the resist 14 is peeled off. By performing the above processing, a plurality of glass substrates can be stably and efficiently obtained from the chemically strengthened glass base material. In this embodiment, the example in which the end surface treatment is performed before the resist layer 14 is peeled has been described, but it is not always necessary to perform the end surface treatment. If there is no practical problem even if the ridgeline 112 formed on the end surface of the glass substrate 100 is displaced from the center in the thickness direction, the glass substrate 100 can be used without performing the end surface treatment.
In the above-described embodiment, the example in which the double-sided chemical polishing process is performed after the single-sided chemical polishing process is performed first is described. However, the same effect can be obtained by performing the single-sided chemical polishing process after performing the double-sided chemical polishing process. In order to perform, it is possible to change the order of processing as necessary.

続いて、図7(A)および図7(B)を用いて、片面研磨処理のバリエーションを説明する。上述の実施形態では、ガラス母材10の第2の主面に耐酸性フィルム12を貼付した状態で所定時間だけ化学研磨処理を行うことにより区画溝が厚み方向の中心で貫通することを防止している。区画溝が厚み方向の中心で貫通することを防止するための手法は、上述の耐酸性フィルム12を貼付する以外の方法によっても達成することができる。   Next, variations of the single-side polishing process will be described with reference to FIGS. 7A and 7B. In the above-described embodiment, the chemical polishing treatment is performed for a predetermined time in a state where the acid-resistant film 12 is attached to the second main surface of the glass base material 10, thereby preventing the partition groove from penetrating at the center in the thickness direction. ing. The technique for preventing the partition groove from penetrating at the center in the thickness direction can also be achieved by a method other than applying the acid-resistant film 12 described above.

図7(A)および図7(B)は、ガラス母材10を搬送ローラ36によって搬送しつつ、搬送ローラ36の上下に配置された上側シャワーノズル34および下側シャワーノズル32によって化学研磨処理を行う枚葉式の化学研磨装置30である。この研磨装置30において、図7(A)に示すように、下側シャワーノズル34からのみエッチング液を噴射しつつ所定時間だけ片面化学研磨処理を行うことによっても、上記の耐酸性フィルム12と用いて片面研磨処理と同様の作用効果を得ることができる。このとき、図7(A)に示すように片面化学研磨処理を行った後に、図7(B)に示すような両面化学研磨処理に移行しても良いし、図7(A)に示すように片面化学研磨処理を行った後に、上述の化学研磨液槽への浸漬処理を行うようにしても良い。また、必要に応じて、上述のガラス支持具18を用いてガラス母材10を支持しつつ搬送するようにしても良い。さらに、片面化学研磨処理および両面化学研磨処理の順序を変更することも可能である。   7A and 7B, the glass base material 10 is transported by the transport roller 36 and the chemical polishing process is performed by the upper shower nozzle 34 and the lower shower nozzle 32 disposed above and below the transport roller 36. A single wafer chemical polishing apparatus 30 is provided. In the polishing apparatus 30, as shown in FIG. 7A, the single-sided chemical polishing process is performed only for a predetermined time while spraying the etching solution only from the lower shower nozzle 34, and the polishing apparatus 30 is used with the acid-resistant film 12 described above. Thus, it is possible to obtain the same effect as that of the single-side polishing process. At this time, after performing the single-sided chemical polishing process as shown in FIG. 7A, the process may be shifted to the double-sided chemical polishing process as shown in FIG. 7B, or as shown in FIG. 7A. After the single-side chemical polishing treatment, the immersion treatment in the chemical polishing liquid tank described above may be performed. Moreover, you may make it convey, supporting the glass base material 10 using the above-mentioned glass support tool 18 as needed. Furthermore, it is also possible to change the order of the single-sided chemical polishing treatment and the double-sided chemical polishing treatment.

また、上述の実施形態では、大型のガラス母材10を切断して複数の長方形ガラス基板を得る例を説明したが、ガラス基板100の形状は図8(A)に示すような長方形には限定されない。ガラス基板の形状は、レジスト層14に形成される区画領域の形状をフォトリソグラフィ技術によって適宜変更することにより任意の形状とすることができる。ガラス母材を化学研磨処理によって切断する場合、図8(B)に示すように、曲率半径が小さい複数の円弧が連続するような複雑な形状であっても問題なく、また、端部近傍に貫通孔152が設けられるような形状であっても問題ない。   Moreover, although the above-mentioned embodiment demonstrated the example which cut | disconnects the large sized glass base material 10 and obtains several rectangular glass substrates, the shape of the glass substrate 100 is limited to a rectangle as shown to FIG. 8 (A). Not. The shape of the glass substrate can be made into an arbitrary shape by appropriately changing the shape of the partition region formed in the resist layer 14 by a photolithography technique. When the glass base material is cut by the chemical polishing process, as shown in FIG. 8 (B), there is no problem even in a complicated shape in which a plurality of arcs having a small curvature radius are continuous, and in the vicinity of the end portion. There is no problem even if the shape is such that the through hole 152 is provided.

上述の製造方法によって得られるガラス基板100は、タッチパネル一体型の液晶ディスプレイを構成する使用者側のガラス基板として使用することができる。また、携帯電話機の液晶ディスプレイのカバーガラスとして使用することも可能である。   The glass substrate 100 obtained by the above-described manufacturing method can be used as a user-side glass substrate constituting a touch panel integrated liquid crystal display. It can also be used as a cover glass for a liquid crystal display of a mobile phone.

チップ領域に設けられるセンサ素子は一般的に熱に弱いため、チップ領域を形成したガラスに対して化学強化処理を行うことが困難であったが、この発明の実施形態によればチップ領域が形成された化学強化済みの大型ガラス母材10を安定的に切断して複数のガラス基板100を得ることが可能であるため、特にタッチパネル用のセンサ素子を搭載したガラス基板において生産性を顕著に向上させることが可能になる。   Since the sensor element provided in the chip region is generally vulnerable to heat, it has been difficult to perform chemical strengthening treatment on the glass in which the chip region is formed. According to the embodiment of the present invention, the chip region is formed. Since it is possible to stably cut the chemically strengthened large glass base material 10 to obtain a plurality of glass substrates 100, productivity is remarkably improved particularly in a glass substrate on which a sensor element for a touch panel is mounted. It becomes possible to make it.

上述の実施形態の説明は、すべての点で例示であって、制限的なものではないと考えられるべきである。本発明の範囲は、上述の実施形態ではなく、特許請求の範囲によって示される。さらに、本発明の範囲には、特許請求の範囲と均等の意味および範囲内でのすべての変更が含まれることが意図される。   The above description of the embodiment is to be considered in all respects as illustrative and not restrictive. The scope of the present invention is shown not by the above embodiments but by the claims. Furthermore, the scope of the present invention is intended to include all modifications within the meaning and scope equivalent to the scope of the claims.

10−ガラス母材
12−耐酸性フィルム
14−レジスト層
16−ガラス支持具
18−ガラス支持具
100−ガラス基板
102−第1の区画溝
104−第2の区画溝
10-glass base material 12-acid resistant film 14-resist layer 16-glass support 18-glass support 100-glass substrate 102-first partition groove 104-second partition groove

Claims (2)

強化処理が施されたガラス母材であって、切断すべき位置である区画ラインをまたぐようにレジスト層が第1の主面および第2の主面に形成されたガラス母材を化学研磨処理によって切断分離することによって複数のガラス基板を得るガラス基板の製造方法であって、
第1の主面のみに所定の片面研磨量だけ化学研磨処理を施す第1の化学研磨ステップと、
第1の主面および第2の主面の両方に化学研磨処理を施す第2の化学研磨ステップと、
を含み、
第1の主面に形成される第1の区画溝および第2の主面に形成される第2の区画溝を、ガラス母材の厚み方向の中心から前記片面研磨量に相当する量だけズレた位置にて貫通させることを特徴とするガラス基板の製造方法。
A glass base material that has been subjected to a tempering treatment, and a glass base material in which a resist layer is formed on the first main surface and the second main surface so as to straddle a partition line that is a position to be cut. A glass substrate manufacturing method for obtaining a plurality of glass substrates by cutting and separating by:
A first chemical polishing step in which only a predetermined amount of single-side polishing is applied to only the first main surface;
A second chemical polishing step of subjecting both the first main surface and the second main surface to a chemical polishing treatment;
Including
The first partition groove formed on the first main surface and the second partition groove formed on the second main surface are shifted by an amount corresponding to the single-side polishing amount from the center in the thickness direction of the glass base material. A method for producing a glass substrate, wherein the glass substrate is penetrated at a different position.
前記第1の区画溝および前記第2の区画溝が貫通した後に、さらに、ガラス基板の端面を断面視円弧状に変形させる端面処理を行う端面処理ステップを含むことを特徴とする請求項1に記載のガラス基板の製造方法。   2. The method according to claim 1, further comprising an end surface processing step of performing an end surface processing for deforming the end surface of the glass substrate into an arc shape in a sectional view after the first partition groove and the second partition groove have penetrated. The manufacturing method of the glass substrate of description.
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