JP2013007740A5 - - Google Patents

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Publication number
JP2013007740A5
JP2013007740A5 JP2012084441A JP2012084441A JP2013007740A5 JP 2013007740 A5 JP2013007740 A5 JP 2013007740A5 JP 2012084441 A JP2012084441 A JP 2012084441A JP 2012084441 A JP2012084441 A JP 2012084441A JP 2013007740 A5 JP2013007740 A5 JP 2013007740A5
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JP
Japan
Prior art keywords
wavefront
electromagnetic wave
wave pulse
propagation path
pulse
Prior art date
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Abandoned
Application number
JP2012084441A
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English (en)
Japanese (ja)
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JP2013007740A (ja
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Publication date
Application filed filed Critical
Priority to JP2012084441A priority Critical patent/JP2013007740A/ja
Priority claimed from JP2012084441A external-priority patent/JP2013007740A/ja
Publication of JP2013007740A publication Critical patent/JP2013007740A/ja
Publication of JP2013007740A5 publication Critical patent/JP2013007740A5/ja
Abandoned legal-status Critical Current

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JP2012084441A 2011-05-23 2012-04-03 波面測定装置及び波面測定方法、物体測定装置 Abandoned JP2013007740A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2012084441A JP2013007740A (ja) 2011-05-23 2012-04-03 波面測定装置及び波面測定方法、物体測定装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2011114945 2011-05-23
JP2011114945 2011-05-23
JP2012084441A JP2013007740A (ja) 2011-05-23 2012-04-03 波面測定装置及び波面測定方法、物体測定装置

Publications (2)

Publication Number Publication Date
JP2013007740A JP2013007740A (ja) 2013-01-10
JP2013007740A5 true JP2013007740A5 (https=) 2015-05-21

Family

ID=47217019

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012084441A Abandoned JP2013007740A (ja) 2011-05-23 2012-04-03 波面測定装置及び波面測定方法、物体測定装置

Country Status (4)

Country Link
US (1) US20140183363A1 (https=)
EP (1) EP2715319A4 (https=)
JP (1) JP2013007740A (https=)
WO (1) WO2012160936A1 (https=)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104914478A (zh) * 2015-07-01 2015-09-16 博康智能网络科技股份有限公司 太赫兹人体安检系统及安检方法
CN106248616B (zh) * 2016-09-27 2017-10-24 深圳市太赫兹科技创新研究院有限公司 太赫兹全偏振态检测光谱仪
CN109520712B (zh) * 2018-12-03 2021-08-17 江苏慧光电子科技有限公司 光学检测方法、系统及光学器件制造系统
JP7362409B2 (ja) 2019-10-17 2023-10-17 キヤノン株式会社 照明装置およびカメラシステム
CN112097923B (zh) * 2020-07-30 2022-05-24 福建华科光电有限公司 一种简易的光学件波前测量方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0695044B2 (ja) 1987-01-16 1994-11-24 浜松ホトニクス株式会社 光波面を観測する装置
US6724125B2 (en) * 1999-03-30 2004-04-20 Massachusetts Institute Of Technology Methods and apparatus for diffractive optical processing using an actuatable structure
AU2003230610A1 (en) * 2002-03-08 2003-09-22 Trustees Of Boston University Method for linearizing deflection of a mems device using binary electrodes and voltage modulation
JP2004198192A (ja) 2002-12-17 2004-07-15 Olympus Corp 光学系の偏心量測定機及び偏心量測定方法
JP4654003B2 (ja) * 2004-11-09 2011-03-16 株式会社栃木ニコン 測定装置
JP2006214856A (ja) 2005-02-03 2006-08-17 Canon Inc 測定装置及び方法
JP4895109B2 (ja) * 2006-10-10 2012-03-14 アイシン精機株式会社 形状検査方法及び形状検査装置
EP2031374B1 (en) * 2007-08-31 2012-10-10 Canon Kabushiki Kaisha Apparatus and method for obtaining information related to terahertz waves

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