Classifications

• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
  • G01B9/00—Measuring instruments characterised by the use of optical techniques
  • G01B9/02—Interferometers
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
  • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
  • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
  • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
  • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
  • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
  • G01N21/3586—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation by Terahertz time domain spectroscopy [THz-TDS]
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
  • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
  • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
  • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
  • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
  • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
  • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
• • G—PHYSICS
  • G02—OPTICS
  • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
  • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
  • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
  • G02B26/0816—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
  • G02B26/0833—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
  • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
  • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
  • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
  • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
  • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
  • G01N21/3554—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for determining moisture content

Definitions

• the present invention relates to a wavefront measuring apparatus, wavefront measuring method, and object measuring apparatus used to measure wavefront shapes of electromagnetic wave pulses.
• wavefronts of electromagnetic waves using the wavefront measuring apparatus have been developed recently. Such apparatuses find applications in a diverse range of fields including the fields of astronomy and medical imaging. Regarding wavefront measuring apparatuses, measuring apparatuses which use a Shack-Hartmann sensor, shearing interferometer, or wavefront curvature sensor are known generally.
• Japanese Patent No. 4249016 discloses a wavefront
• the wavefront measuring apparatus capable of measuring a wavefront with high accuracy in a short time using a wavefront measuring scheme of a Shack-Hartmann sensor for the wavefront measuring apparatus.
• the wavefront measuring apparatus includes a lens array and a two-dimensional detector adapted to convert a focused spot into an image signal, where the focused spot is produced when light to be measured converges by being transmitted through the lens array.
• apparatus finds coordinates of the focused spot using binary center of gravity calculations and computes the wavefront of the light to be measured from the coordinates of the focused spot.
• the wavefront measuring apparatus described in Patent Literature 1 requires as many detecting elements as resolution (number of divisions) of the wavefront, and consequently the resolution of the wavefront is limited by the number of detecting elements.
• An invention is a wavefront measuring apparatus which measures a wavefront of an electromagnetic wave pulse, comprising: an optical delaying part adapted to delay the electromagnetic wave pulse so as to provide a first propagation path and a second propagation path as propagation paths for the electromagnetic wave pulse, the second propagation path being provided in, a region different from a region of the first propagation path and having a length different from a length of the first propagation path; a detecting part adapted to detect a signal associated with electric field strength of the electromagnetic wave pulse delayed by the optical delaying part; a waveform constructing part adapted to construct time waveforms of the
• electromagnetic wave pulse using the signal associated with the electric field strength detected by the detecting part; and a wavefront obtaining part adapted to obtain the wavefront of the electromagnetic wave pulse based on the time waveforms of the
• electromagnetic wave pulse and information associated with the lengths of the first and second propagation paths in the optical delaying part.
• present invention is a wavefront measuring method for measuring a wavefront of an electromagnetic wave pulse in a wavefront measuring apparatus which comprises an optical delaying part adapted to delay the
• the electromagnetic wave pulse so as to provide a first propagation path and a second propagation path as propagation paths for the electromagnetic wave pulse, the second propagation path being provided in a region different from a region of the first propagation path and having a length different from a length of the first propagation path, and a detecting part adapted to detect a signal associated with electric field strength of the electromagnetic wave pulse delayed by the optical delaying part, the method comprising: obtaining time waveforms of the electromagnetic wave pulse; and measuring a pulse peak time interval between the time waveforms corresponding to the wavefront of the
• electromagnetic wave pulse in each of regions resulting from division and calculating the pulse peak time interval as a time difference for the each region of the wavefront of the electromagnetic wave pulse.
• An invention according to a third aspect of the present invention is a wavefront measuring apparatus which measures a wavefront of an electromagnetic wave pulse by calculating a time difference between various parts of the wavefront of the electromagnetic wave pulse, comprising: an optical delaying part adapted to delay the electromagnetic wave pulse so as to provide a first propagation path and a second propagation path as propagation paths for the electromagnetic wave pulse, the second propagation path being provided in a region different from a region of the first propagation path and having a length different from a length of the first propagation path; a detecting part adapted to detect the electromagnetic wave pulse delayed by the optical delaying part; a processing part adapted to obtain time waveforms of the electromagnetic wave pulse using a detection signal from the detecting part, measure a pulse peak time interval between the time waveforms corresponding to the various parts of the wavefront of the electromagnetic wave pulse, and calculate the pulse peak time interval as the time difference between the various parts of the wavefront of the electromagnetic wave pulse.
• An object of the present invention is to provide a
• wavefront measuring apparatus wavefront measuring method, and object measuring apparatus which can increase resolution of wavefronts of electromagnetic wave pulses without being limited by the number of detecting elements.
• FIG. 1 is a diagram showing a configuration example of a wavefront measuring apparatus according to the first embodiment .
• Fig. 2B is a diagram illustrating a configuration example of a wavefront adjusting part according to the first embodiment.
• Fig. 3 is a flowchart showing a wavefront measuring method according to the first embodiment.
• Fig. 4A is an enlarged view of the wavefront adjusting part according to the first embodiment.
• Fig. 4B is an enlarged view of the wavefront adjusting part according to the first embodiment.
• Fig. 5A is a diagram for illustrating an example of a wavefront measuring method which uses time waveforms.
• Fig. 5B is a diagram for illustrating an example of a wavefront measuring method which uses time waveforms.
• Fig. 5C is a diagram for illustrating an example of a wavefront measuring method which uses time waveforms.
• Fig. 5D is a diagram for illustrating an example of a wavefront measuring method which uses time waveforms.
• Fig. 6A is a diagram showing variations of the
• Fig. 6B is a diagram showing variations of the
• Fig. 7 is a diagram showing a schematic configuration of an electromagnetic wavefront adjusting apparatus according to the second embodiment.
• electromagnetic wave pulse into plural parts and measure the resulting parts in time sequence. That is, the wavefront is divided into plural parts and
• a detecting part can detect signals associated with the detected electromagnetic wave pulse in a temporally separated state based on the propagation distance of each part of the wavefront.
• a time delay ⁇ 1 is given to each region of the divided wavefront, the time delay ⁇ 1 varying from one region to another, and a pulse peak time interval ⁇ 2 between wavefront regions of the electromagnetic wave pulse is measured, ⁇ 2 - ⁇ 1 can be obtained as a wavefront time difference between two sub-wavefronts . Consequently, since the electromagnetic wave in each region resulting from. the division is detected in a temporally separated manner, resolution of the wavefront of the electromagnetic wave pulse can be increased without being limited by the number of detecting elements.
• a time delay ⁇ 1 larger than a pulse time width of the electromagnetic wave pulse may be provided among sub-wavefronts using a wavefront adjusting part adapted to adjust the
• Fig. 1 is a diagram showing a schematic configuration of the wavefront measuring apparatus 100.
• the wavefront measuring apparatus 100 includes a detecting part 3 adapted to detect electromagnetic wave pulses and a wavefront adjusting part 2 which is an optical delaying part adapted to delay the
• the wavefront measuring apparatus 100 includes a focusing part 6 adapted to focus electromagnetic wave pulses onto the detecting part 3, a wavefront controlling part 5, and a processing part 4 adapted to measure and process the wavefronts of the electromagnetic wave pulses using signals detected by the detecting part 3. Furthermore, the wavefront measuring apparatus 100 includes a beam splitter 9 adapted to transmit and reflect
• the processing part 4 includes a waveform constructing part 4a adapted to construct time waveforms of
• electromagnetic wave pulses using signals associated with electric field strength of the electromagnetic wave pulses detected by the detecting part 3 and a wavefront obtaining part 4b adapted to obtain
• wavefronts of the electromagnetic wave pulses based on the time waveforms of the electromagnetic wave pulses and information associated with lengths of the first and second propagation paths, where the information is provided by the wavefront adjusting part 2.
• electromagnetic wave pulse to the detecting part will be equal among the reflecting surfaces, i.e., such that the propagation paths of the wavefront of the
• electromagnetic wave pulse from the wavefront adjusting part 2 to the detecting part 3 via the beam splitter 9 and focusing part 6 will be equal excluding propagation distances given by the wavefront adjusting part 2 to different spatial regions.
• the propagated electromagnetic wave pulses 1 may have any shape and the electromagnetic wave may be propagated in parallel or may converge or diverge.
• the wavefront adjusting part 2 divides the wavefront of the electromagnetic wave pulse 1 into regions and give propagation paths of different lengths to the sub- wavefronts of the electromagnetic wave pulse in the resulting regions.
• the electromagnetic wave pulse 1 is divided into at least two or more regions and at least a first
• the wavefront of an electromagnetic wave pulse 1 herein means a plane obtained by continuously linking peak values of the electric field intensity of the electromagnetic wave pulse at a given time point. Also, wavefront division is the act of spatially dividing a wavefront into plural parts in a plane.
• the wavefront adjusting part 2 delays the
• electromagnetic wave pulse such that different regions will have propagation paths of different lengths.
• a deformable mirror or segmented mirror which can continuously or discontinuously change
• reflecting surfaces are fixed continuously or
• the mirror is configured to be tiltable or rotatable in order to allow length (propagation distance) of the propagation path given to each spatial region to be adjusted variably.
• FIGs. 2A to 2C are diagrams showing a configuration
• Fig. 2A is a diagram showing the wavefront adjusting part 2 as viewed along a propagation direction of the electromagnetic wave pulses 1 while Figs. 2B and 2C are sectional views taken along line A-A ' of Fig. 2A.
• the wavefront adjusting part 2 includes mirror segments 31, 32, 33, 34 and 35. Furthermore, the wavefront
• adjusting part 2 includes actuators 41, 42 and 43 which are drive units adapted to drive the mirrors in such a way as to make mirror positions variable.
• the wavefront is divided into five regions and a mirror and actuator are placed in each of the regions.
• Each mirror 31, 32, 33, 34 or 35 is
• Fig. 2C is a diagram showing how the mirror 31 has been moved by operating the actuator 41. In this way, by moving the mirror 31 by a length corresponding to a time ⁇ 1, length of the propagation path (length of the first propagation path) via the mirror 31 can be reduced by 2 x ⁇ 1 compared to length of the
• the wavefront adjusting part 2 may be configured to be able to move all the reflecting surfaces all together without dividing the wavefront into regions to enable constructing time waveforms using time-domain spectroscopy. Details will be described later.
• the detecting part 3 configured to detect
• electromagnetic waves detects information associated with the electric field strength (electric field intensity) of the electromagnetic wave pulse 1.
• the processing part 4 constructs time waveforms of the electromagnetic wave pulse 1 using a detection signal transmitted from the detecting part 3 and also obtains a wavefront of the electromagnetic wave pulse.
• the wavefront controlling part 5 variably controls a wavefront division pattern of the electromagnetic wave pulse 1 produced by the wavefront adjusting part 2 as well as propagation distances given to the sub- wavefronts resulting from division.
• Fig. 3 is a flowchart showing the wavefront measuring method for electromagnetic wave pulses on the wavefront measuring apparatus 100 according to the present embodiment.
• steps of the wavefront measuring method for electromagnetic wave pulses correspond to the following processes.
• the electromagnetic wave pulses used are in the so-called terahertz wave frequency band including a frequency band ranging from 30 GHz to 30 THz.
• terahertz wave the present embodiment is expected to be applied to imaging related to moisture content and other physical properties of samples, observation of cancer cell, and so on.
• electromagnetic wave pulse is obtained based on the time waveforms of the divided electromagnetic wave pulse 1 and information (time delay ⁇ 1 provided) associated with the propagation distances (lengths of propagation paths) adjusted by the wavefront adjusting part 2 (step S4) .
• FIGs. 4A and 4B are enlarged views of the wavefront adjusting part, showing a wavefront of the
• FIGs. 5A to 5D are diagrams for illustrating an example of a wavefront measuring method which uses time
• Fig. 5A is a diagram showing a time
• FIG. 5B is a diagram showing a time waveform in peripheral part 8 of the electromagnetic wave pulse
• Fig. 5C is a diagram showing time waveforms in the case where the central part 7 and peripheral part 8 of the electromagnetic wave pulse are detected as being
• Fig. 5D is a diagram showing time waveforms in the case where the central part 7 and peripheral part 8 of the electromagnetic wave pulse are detected as being separated from each other .
• the wavefront of the electromagnetic wave pulse la is such that the central part 7 of the wavefront of the electromagnetic wave pulse la is temporally ahead of the peripheral part 8 and that a peak of the
• electromagnetic wave pulse in the central part 7 is located downstream of the peripheral part 8 along the propagation direction of the electromagnetic wave pulse.
• a pulse width (the pulse width herein is an F HM (Full Width at Half Maximum) of the electric field intensity) of the electromagnetic wave pulse 1 is 400 fs.
• the electromagnetic wave pulse 1 does not have its wavefront shape changed before and after being reflected by the wavefront adjusting part 2.
• the electromagnetic wave pulse reaches the detecting part 3.
• the time waveform (Fig. 5A) in the central part 7 and time waveform (Fig. 5B) in the peripheral part 8 of the electromagnetic wave pulse 1 are detected by the detecting part 3 as being temporally superimposed on each other (Fig. 5C) .
• Fig. 5C time waveform
• electromagnetic wave pulse lb has its wavefront shape changed after reflection off the mirrors.
• protrusion length of the center mirror 31 is, for example, 60 ⁇ , a length of a propagation path (a first propagation path) of a beam in the central part 7 of the electromagnetic wave pulse lb, i.e., a first
• ⁇ 1 which is a time delay corresponding to the difference between the lengths of the first and second propagation paths is equal to or larger than the pulse time width of the electromagnetic wave pulse 1. That is, desirably ⁇ 1 is equal to or larger than 400 fs, which is the pulse width of the electromagnetic wave pulse 1 according to the present embodiment.
• the time delay ⁇ 1 corresponding to the difference between the lengths of the first and second propagation paths should not exceed measured time width of the time waveform of the electromagnetic wave pulse 1.
• the larger the measured time width the easier it is to separate pulses, but the longer it takes to measure the wavefront. The tradeoff between the ease of pulse separation and the length of wavefront measuring time can be determined based on system demand.
• electromagnetic wave pulse la before reflection can be calculated using Eq. 1 below.
• electromagnetic wave pulse la can be measured on a region by region basis.
• the division pattern and number of divisions of wavefront can be arbitrary.
• electromagnetic wave pulse 1 with respect the wavefront adjusting part 2 may be tilted from a direction
• the wavefront adjusting part 2 may be a propagation type.
• the wavefront may be divided by varying the propagation distance from region to region using a liquid lens or the like.
• a glass or plastic plate whose surface is provided with a concavo-convex pattern may be inserted during
• wavefront measurement to give a different propagation path to each sub-wavefront to be produced by division.
• a propagation-type wavefront adjusting part 2 desirably a substance highly transparent to electromagnetic wave pulses 1 is used as a material for the wavefront adjusting part 2.
• the detecting part 3 is equipped with a single detecting element have been described so far, the detecting part 3 may be equipped with plural detecting elements. In that case, the detecting elements may be arranged in a line or in an array. However, the number of detecting elements is smaller than the number of regions resulting from division (resolution) .
• a feature of the present embodiment is a step of
• Fig. 7 is a diagram showing a schematic configuration of a wavefront measuring apparatus (or an
• a wavefront adjustment-controlling part 51 is added to the configuration according to the first embodiment.
• the wavefront adjustment-controlling part 51 variably controls the length of the propagation path by moving the wavefront adjusting part 2 and performs control so as to bring a detected wavefront of the electromagnetic wave pulse 1 into coincidence with the predetermined wavefront .
• a step of adjusting the wavefront of an electromagnetic wave pulse according to the present embodiment is largely divided into two parts.
• a first step involves measuring the wavefront of the electromagnetic wave pulse 1.
• the measuring method described in the first embodiment can be used for the first step.
• a second step involves comparing the wavefront of the electromagnetic wave pulse 1 measured in the first step with any predetermined target wavefront and bringing the wavefront of the electromagnetic wave pulse 1 close to the predetermined wavefront (ideal wavefront) by variably controlling the length of the propagation distance in each region of the wavefront adjusting part 2 using the wavefront adjustment-controlling part 51.
• the predetermined wavefront is determined arbitrarily.
• the predetermined wavefront may be such as to make the measured wavefront of the electromagnetic wave pulse planar or spherical.
• predetermined wavefront may be calculated using optical simulations or a wavefront measured at some point may be set as a predetermined wavefront. It can also be determined arbitrarily how close the measured wavefront should be brought to the predetermined wavefront. In the present embodiment, the closeness is set to 1/10 the pulse width of the electromagnetic wave pulse 1 to restrain the pulse width of the electromagnetic wave pulse 1 from broadening, but may be set as appropriate depending on the product.
• the second step involves moving the mirrors 31 to 35 of the wavefront adjusting part 2 by a propagation
• a time difference which represents a wavefront deviation amount (difference from the predetermined wavefront) obtained in the first step.
• the wavefront deviation amount represented by the time difference between parts A and B on the wavefront is 30 fs
• corresponding parts in the wavefront adjusting part 2 can be shifted from each other by 5 ⁇ along an optical axis (however this applies when the wavefront adjusting part 2 is a reflection type) .
• the wavefront adjusting part 2 will require a large difference in the propagation distance of the
• the location of the wavefront adjusting part 2 is optically conjugate to a location of aberration.
• wavefront adjusting parts 2 may be provided along the optical axis for the electromagnetic wave pulse 1.
• electromagnetic wave pulse 1 will undergo reduction of power or broadening of pulse width. This is because various parts of the wavefront will spatially spread or lag in time when reaching the detecting part 3.
• the configuration according to the present embodiment can reduce the impact of aberrations, improve detection capacity, and limit the broadening of pulse width.
• wavefront measuring apparatus is applied to an object measuring apparatus 200 which measures objects using terahertz time-domain spectroscopy.
• the configuration of the wavefront measuring apparatus is substantially the same as the first embodiment, and thus will be omitted in the following description. [0050] (Object measuring apparatus)
• Fig. 8 is a diagram showing a schematic configuration of the object measuring apparatus 200 according to the present embodiment.
• the object measuring apparatus 200 according to the present embodiment is a configuration example in which the above-described wavefront
• THz-TDS Transmissionhertz Time Domain Spectroscopy
• an excitation light pulse generating part 10 adapted to generate excitation light pulses emits excitation light pulses 11.
• the excitation light pulse generating part 10 can use fiber laser and the
• excitation light pulses 11 are laser pulses with a wavelength in the 1.5 ⁇ band and a pulse time width (FWHM in electric field intensity display) of about 30 fs.
• the excitation light pulses 11 are bifurcated by a beam splitter 12.
• One branch of excitation light pulses 11 enters an electromagnetic wave pulse generating element 13 which is an electromagnetic wave pulse generating part and the other branch of the excitation light pulses 11 enters a second harmonic generating part 17.
• the electromagnetic wave pulse generating element 13 which is an electromagnetic wave pulse generating part includes a photoconductive element and a hemispherical silicon lens.
• the photoconductive element includes a photoconductive layer adapted to absorb the excitation light pulses 11 and generate photoexcited carriers, an electrode adapted to apply an electric field to the photoconductive layer, and an antenna adapted to radiate generated electromagnetic wave pulses 1.
• the electromagnetic wave pulses 1 are generated when the photoexcited carriers are accelerated by an electric field.
• the electromagnetic wave pulses 1 are radiated intensely toward the back side of a substrate where the photoconductive element is formed, and so the hemispherical silicon lens is placed on the back side of the substrate to enhance power radiated into space.
• a voltage source 14 applies a voltage to the electrode of the photoconductive element.
• the above configuration generally enables radiating electromagnetic wave pulses 1 with up to about a pulse time width (FWHM in electric field intensity display) of a few 100 fs in a frequency domain of a few THz .
• the electromagnetic wave pulses 1 radiated into space are focused and directed at a sample 15 by optical elements such as lenses and mirrors.
• the second branch of excitation light pulses 11 which enters a second harmonic generating part 17 after being split by the beam splitter 12 is converted into a pulsed laser with a wavelength in the 0.8 ⁇ band by a second harmonic conversion process.
• the excitation light pulses 11 enter the electromagnetic wave pulse detecting element 16 by passing through an excitation light delay system 18.
• a photoconductive element and hemispherical silicon lens with a configuration similar to that of the electromagnetic wave pulse generating element 13 can be used as the electromagnetic wave pulse detecting element 16.
• low- temperature-grown GaAs is used suitably for the
• the photoexcited carriers generated in the photoconductive layer are accelerated by an electric field of the electromagnetic wave pulses 1 to generate a current between electrodes until trapped.
• the current is converted into a voltage by a current- to-voltage converting part 19.
• the voltage value reflects the electric field intensity of the
• the time waveforms of the electric field intensity of the electromagnetic wave pulses 1 can be reconstructed by sweeping a delay time of the excitation light pulses 11 using the excitation light delay system 18. From the time waveforms of the divided electromagnetic wave pulse 1 thus obtained as well as from frequency components thereof, the
• the wavefronts of the electromagnetic wave pulses 1 contain aberrations caused by various factors. For example, aberrations are produced by the sample 15 itself, disturbance of ambient gas on an optical path, and the optical element until the electromagnetic wave pulses 1 reach a measurement site in the sample 15.
• the wavefront controlling part 5 adjusts the wavefronts of the electromagnetic wave pulses 1 by controlling the wavefront adjusting part 2.
• a wavefront measuring step and wavefront adjusting step can be carried out in the manner described in the first and second embodiments. Since the wavelength of terahertz waves is about 300 ⁇ (at a frequency of 1 THz), if the size of sub- wavefronts in the wavefront adjusting part 2 is a few mm or above, the impact of diffraction effects can be kept down. For example, if beam size of the
• electromagnetic wave pulses 1 is 50 mm in diameter, the size of sub-wavefronts can be set to 10 mm.
• Lock-in detection may be performed after the voltage to be applied to the electromagnetic wave pulse generating element 13 is subjected to voltage modulation of about a few 10 kHz.
• voltage modulation of about a few 10 kHz.
• the amount of wavefront adjustment of the wavefront adjusting part 2 thus determined may be used subsequently in measurement of the sample 15.
• the wavefront obtained when a mirror is placed at the location of the sample 15 may be designated as an ideal wavefront. Consequently, aberrations caused by the sample 15 itself can be reduced during wavefront adjustment, with the sample 15 installed.
• the wavefront adjusting part 2 is placed between the sample 15 and electromagnetic wave pulse detecting element 16 in the above example, but may be placed between the electromagnetic wave pulse generating element 13 and sample 15.
• the wavefront of the electromagnetic wave pulse 1 is measured. This enables measuring the wavefront deviation between the electromagnetic wave pulse generating element 13 and wavefront adjusting part 2 without being affected by the sample 15. In this state, measurements are not free from the impact of aberration-causing factors (e.g., aberration caused by an atmosphere on the optical path subsequent to the wavefront adjusting part 2) other than the sample.
• aberration-causing factors e.g., aberration caused by an atmosphere on the optical path subsequent to the wavefront adjusting part 2

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  • 2012-04-03 JP JP2012084441A patent/JP2013007740A/ja not_active Abandoned
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