JP2007309857A5 - - Google Patents

Download PDF

Info

Publication number
JP2007309857A5
JP2007309857A5 JP2006140883A JP2006140883A JP2007309857A5 JP 2007309857 A5 JP2007309857 A5 JP 2007309857A5 JP 2006140883 A JP2006140883 A JP 2006140883A JP 2006140883 A JP2006140883 A JP 2006140883A JP 2007309857 A5 JP2007309857 A5 JP 2007309857A5
Authority
JP
Japan
Prior art keywords
optical path
time
electromagnetic wave
terahertz
delay
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2006140883A
Other languages
English (en)
Japanese (ja)
Other versions
JP5127159B2 (ja
JP2007309857A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2006140883A priority Critical patent/JP5127159B2/ja
Priority claimed from JP2006140883A external-priority patent/JP5127159B2/ja
Publication of JP2007309857A publication Critical patent/JP2007309857A/ja
Publication of JP2007309857A5 publication Critical patent/JP2007309857A5/ja
Application granted granted Critical
Publication of JP5127159B2 publication Critical patent/JP5127159B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP2006140883A 2006-05-19 2006-05-19 測定装置及び測定方法 Expired - Fee Related JP5127159B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2006140883A JP5127159B2 (ja) 2006-05-19 2006-05-19 測定装置及び測定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006140883A JP5127159B2 (ja) 2006-05-19 2006-05-19 測定装置及び測定方法

Publications (3)

Publication Number Publication Date
JP2007309857A JP2007309857A (ja) 2007-11-29
JP2007309857A5 true JP2007309857A5 (https=) 2009-06-04
JP5127159B2 JP5127159B2 (ja) 2013-01-23

Family

ID=38842837

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006140883A Expired - Fee Related JP5127159B2 (ja) 2006-05-19 2006-05-19 測定装置及び測定方法

Country Status (1)

Country Link
JP (1) JP5127159B2 (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4817336B2 (ja) * 2008-02-21 2011-11-16 国立大学法人茨城大学 テラヘルツ電磁波を用いた試料の構造分析方法およびテラヘルツ電磁波を用いた試料の構造分析装置
US8378304B2 (en) * 2010-08-24 2013-02-19 Honeywell Asca Inc. Continuous referencing for increasing measurement precision in time-domain spectroscopy
CN103323420B (zh) * 2013-05-27 2016-12-07 杭州电子科技大学 一种用于胃癌检测太赫兹系统样品采样装置及其使用方法
WO2017138061A1 (ja) * 2016-02-08 2017-08-17 パイオニア株式会社 計測装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004279352A (ja) * 2003-03-18 2004-10-07 Tochigi Nikon Corp テラヘルツ光を用いた測定装置

Similar Documents

Publication Publication Date Title
Tuli et al. Defect detection by pulse compression in frequency modulated thermal wave imaging
JP2015024125A5 (ja) 被検体情報取得装置、被検体情報取得装置の制御方法、および、プログラム
JP2009210560A5 (https=)
JP2009058310A5 (https=)
US9835494B2 (en) Terahertz wave phase difference measurement device
EP2031374A3 (en) Apparatus and method for obtaining information related to terahertz waves
JP2009075069A5 (https=)
JP2019533817A5 (https=)
ATE511075T1 (de) Interferometrische vorrichtung zum messen von formen
Hedayatrasa et al. On the application of an optimized Frequency-Phase Modulated waveform for enhanced infrared thermal wave radar imaging of composites
EP2335579A3 (en) Component concentration measuring device and method of controlling component concentration measuring device
CN106442378A (zh) 基于太赫兹光梳提高光谱吸收率测试精准度的装置
JP2012013437A5 (https=)
JP2013170899A5 (https=)
JP2016534344A5 (https=)
JP2012002798A5 (https=)
JP2016053516A (ja) 時間計測装置、時間計測方法、発光寿命計測装置、及び発光寿命計測方法
WO2009069818A4 (en) Inspection apparatus and inspection method using electromagnetic wave
JP2016053516A5 (https=)
JP2009192524A5 (https=)
WO2014056708A3 (en) Mark position measuring apparatus and method, lithographic apparatus and device manufacturing method
JP5540236B2 (ja) 単位面積あたりの重量及びその面内均一性の測定方法
CN107003232B (zh) 光谱测量系统
JP2010281700A5 (https=)
JP2007309857A5 (https=)