JP2016053516A5 - - Google Patents

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JP2016053516A5
JP2016053516A5 JP2014179391A JP2014179391A JP2016053516A5 JP 2016053516 A5 JP2016053516 A5 JP 2016053516A5 JP 2014179391 A JP2014179391 A JP 2014179391A JP 2014179391 A JP2014179391 A JP 2014179391A JP 2016053516 A5 JP2016053516 A5 JP 2016053516A5
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JP
Japan
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signal
time
input
digital
trigger
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JP2014179391A
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Japanese (ja)
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JP2016053516A (ja
JP5978266B2 (ja
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Priority claimed from JP2014179391A external-priority patent/JP5978266B2/ja
Priority to JP2014179391A priority Critical patent/JP5978266B2/ja
Priority to EP15838064.2A priority patent/EP3190468B1/en
Priority to US15/508,195 priority patent/US10962932B2/en
Priority to KR1020177007596A priority patent/KR102299156B1/ko
Priority to CN201580047263.0A priority patent/CN106716266B/zh
Priority to PCT/JP2015/070858 priority patent/WO2016035469A1/ja
Priority to TW104125680A priority patent/TWI660253B/zh
Publication of JP2016053516A publication Critical patent/JP2016053516A/ja
Publication of JP2016053516A5 publication Critical patent/JP2016053516A5/ja
Publication of JP5978266B2 publication Critical patent/JP5978266B2/ja
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JP2014179391A 2014-09-03 2014-09-03 時間計測装置、時間計測方法、発光寿命計測装置、及び発光寿命計測方法 Active JP5978266B2 (ja)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP2014179391A JP5978266B2 (ja) 2014-09-03 2014-09-03 時間計測装置、時間計測方法、発光寿命計測装置、及び発光寿命計測方法
CN201580047263.0A CN106716266B (zh) 2014-09-03 2015-07-22 时间测量装置、时间测量方法、发光寿命测量装置及发光寿命测量方法
US15/508,195 US10962932B2 (en) 2014-09-03 2015-07-22 Time measurement device, time measurement method, light-emission-lifetime measurement device, and light-emission-lifetime measurement method
KR1020177007596A KR102299156B1 (ko) 2014-09-03 2015-07-22 시간 계측 장치, 시간 계측 방법, 발광 수명 계측 장치, 및 발광 수명 계측 방법
EP15838064.2A EP3190468B1 (en) 2014-09-03 2015-07-22 Time measurement device, time measurement method, light-emission-lifetime measurement device, and light-emission-lifetime measurement method
PCT/JP2015/070858 WO2016035469A1 (ja) 2014-09-03 2015-07-22 時間計測装置、時間計測方法、発光寿命計測装置、及び発光寿命計測方法
TW104125680A TWI660253B (zh) 2014-09-03 2015-08-06 時間測量裝置、時間測量方法、發光壽命測量裝置及發光壽命測量方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014179391A JP5978266B2 (ja) 2014-09-03 2014-09-03 時間計測装置、時間計測方法、発光寿命計測装置、及び発光寿命計測方法

Publications (3)

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JP2016053516A JP2016053516A (ja) 2016-04-14
JP2016053516A5 true JP2016053516A5 (https=) 2016-06-02
JP5978266B2 JP5978266B2 (ja) 2016-08-24

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ID=55439538

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JP2014179391A Active JP5978266B2 (ja) 2014-09-03 2014-09-03 時間計測装置、時間計測方法、発光寿命計測装置、及び発光寿命計測方法

Country Status (7)

Country Link
US (1) US10962932B2 (https=)
EP (1) EP3190468B1 (https=)
JP (1) JP5978266B2 (https=)
KR (1) KR102299156B1 (https=)
CN (1) CN106716266B (https=)
TW (1) TWI660253B (https=)
WO (1) WO2016035469A1 (https=)

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EP3239788B1 (en) 2016-04-25 2021-02-24 ams AG Method of operating a time-to-digital converter and time-to-digital converter circuit
KR102030457B1 (ko) * 2017-10-30 2019-10-10 현대오트론 주식회사 거리 검출 센서 시간 변이 보상 장치 및 방법
JP7221759B2 (ja) * 2019-03-28 2023-02-14 アズビル株式会社 時間計測回路
CN110174381B (zh) * 2019-05-15 2023-05-02 杭州柔谷科技有限公司 氧浓度检测方法、装置、计算机设备和存储介质
CN110208228B (zh) * 2019-05-15 2023-05-09 杭州柔谷科技有限公司 荧光寿命检测方法、装置、计算机设备和存储介质
CN114270211B (zh) * 2019-08-28 2026-02-27 索尼半导体解决方案公司 测距系统和发光元件驱动器
EP4121824B1 (en) 2020-03-17 2025-06-25 Telefonaktiebolaget LM ERICSSON (PUBL) Time-to-digital converter circuitry
EP4170436A4 (en) * 2020-08-06 2024-07-10 Hamamatsu Photonics K.K. TIME MEASUREMENT DEVICE, FLUORESCENCE LIFE MEASUREMENT DEVICE, AND TIME MEASUREMENT METHOD
CN115735115B (zh) * 2020-08-06 2025-04-08 浜松光子学株式会社 时间测量装置、荧光寿命测量装置及时间测量方法
US11976546B2 (en) * 2020-12-08 2024-05-07 Halliburton Energy Services, Inc. Deep learning methods for wellbore pipe inspection
KR102507274B1 (ko) * 2020-12-16 2023-03-07 현대모비스 주식회사 라이다 장치 및 그 거리 측정 방법
KR102567575B1 (ko) * 2021-03-16 2023-08-16 이화여자대학교 산학협력단 시간 디지털 변환기 및 이를 포함하는 라이다
KR102773773B1 (ko) * 2023-04-21 2025-02-27 에스디티 주식회사 입력신호를 재구성하는 멀티플렉서를 포함하는 tdc 및 이를 포함하는 fpga

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JPS5576919A (en) * 1978-12-06 1980-06-10 Japan Spectroscopic Co Measuring method for rapid time division spectroscopic analysis
JPS5997077A (ja) * 1982-11-25 1984-06-04 Horiba Ltd 時間電圧変換器
EP0426748A1 (en) 1988-07-29 1991-05-15 Edinburgh Instruments Ltd. Electro-optical measuring instruments
US6522395B1 (en) * 1999-04-30 2003-02-18 Canesta, Inc. Noise reduction techniques suitable for three-dimensional information acquirable with CMOS-compatible image sensor ICS
US6501706B1 (en) 2000-08-22 2002-12-31 Burnell G. West Time-to-digital converter
WO2005017643A2 (en) * 2003-08-18 2005-02-24 Speedark Ltd. Data conversion methods and systems
CN101600972B (zh) * 2006-07-28 2012-08-29 皇家飞利浦电子股份有限公司 正电子发射断层摄影中的飞行时间测量
US8487600B2 (en) * 2007-04-10 2013-07-16 Aleksandar Prodic Continuous-time digital controller for high-frequency DC-DC converters
US8471754B2 (en) * 2008-08-01 2013-06-25 Advantest Corporation Time measurement circuit
DE102009040749A1 (de) * 2009-09-08 2011-03-10 Becker & Hickl Gmbh Verfahren und Anordnung zur Verarbeitung von Einzelphotonen-Daten in optischen Meßsystemen zur Bestimmung von Struktur und Eigenschaften von biologischem Gewebe
DE102011055330B4 (de) * 2011-11-14 2024-10-31 Leica Microsystems Cms Gmbh Verfahren zum Messen der Lebensdauer eines angeregten Zustandes in einer Probe
JP6021670B2 (ja) * 2012-02-16 2016-11-09 オリンパス株式会社 内視鏡システムおよびａ／ｄ変換器
US8786474B1 (en) * 2013-03-15 2014-07-22 Kabushiki Kaisha Toshiba Apparatus for programmable metastable ring oscillator period for multiple-hit delay-chain based time-to-digital circuits
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