JP5127159B2 - 測定装置及び測定方法 - Google Patents

測定装置及び測定方法 Download PDF

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Publication number
JP5127159B2
JP5127159B2 JP2006140883A JP2006140883A JP5127159B2 JP 5127159 B2 JP5127159 B2 JP 5127159B2 JP 2006140883 A JP2006140883 A JP 2006140883A JP 2006140883 A JP2006140883 A JP 2006140883A JP 5127159 B2 JP5127159 B2 JP 5127159B2
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Japan
Prior art keywords
optical path
time
electromagnetic wave
delay
terahertz
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Expired - Fee Related
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JP2006140883A
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Japanese (ja)
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JP2007309857A (ja
JP2007309857A5 (https=
Inventor
道徳 塩田
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Canon Inc
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Canon Inc
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Priority to JP2006140883A priority Critical patent/JP5127159B2/ja
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Publication of JP5127159B2 publication Critical patent/JP5127159B2/ja
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JP2006140883A 2006-05-19 2006-05-19 測定装置及び測定方法 Expired - Fee Related JP5127159B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2006140883A JP5127159B2 (ja) 2006-05-19 2006-05-19 測定装置及び測定方法

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JP2006140883A JP5127159B2 (ja) 2006-05-19 2006-05-19 測定装置及び測定方法

Publications (3)

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JP2007309857A JP2007309857A (ja) 2007-11-29
JP2007309857A5 JP2007309857A5 (https=) 2009-06-04
JP5127159B2 true JP5127159B2 (ja) 2013-01-23

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JP2006140883A Expired - Fee Related JP5127159B2 (ja) 2006-05-19 2006-05-19 測定装置及び測定方法

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JP (1) JP5127159B2 (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4817336B2 (ja) * 2008-02-21 2011-11-16 国立大学法人茨城大学 テラヘルツ電磁波を用いた試料の構造分析方法およびテラヘルツ電磁波を用いた試料の構造分析装置
US8378304B2 (en) * 2010-08-24 2013-02-19 Honeywell Asca Inc. Continuous referencing for increasing measurement precision in time-domain spectroscopy
CN103323420B (zh) * 2013-05-27 2016-12-07 杭州电子科技大学 一种用于胃癌检测太赫兹系统样品采样装置及其使用方法
WO2017138061A1 (ja) * 2016-02-08 2017-08-17 パイオニア株式会社 計測装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004279352A (ja) * 2003-03-18 2004-10-07 Tochigi Nikon Corp テラヘルツ光を用いた測定装置

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JP2007309857A (ja) 2007-11-29

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