JP2013004984A - 半導体パッケージ - Google Patents
半導体パッケージ Download PDFInfo
- Publication number
- JP2013004984A JP2013004984A JP2012135669A JP2012135669A JP2013004984A JP 2013004984 A JP2013004984 A JP 2013004984A JP 2012135669 A JP2012135669 A JP 2012135669A JP 2012135669 A JP2012135669 A JP 2012135669A JP 2013004984 A JP2013004984 A JP 2013004984A
- Authority
- JP
- Japan
- Prior art keywords
- carrier
- semiconductor package
- component
- test
- seat
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/67—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their insulating layers or insulating parts
- H10W70/68—Shapes or dispositions thereof
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/62—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
- H10W70/65—Shapes or dispositions of interconnections
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/62—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
- H10W70/65—Shapes or dispositions of interconnections
- H10W70/657—Shapes or dispositions of interconnections on sidewalls or bottom surfaces of the package substrates, interposers or redistribution layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/67—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their insulating layers or insulating parts
- H10W70/68—Shapes or dispositions thereof
- H10W70/682—Shapes or dispositions thereof comprising holes having chips therein
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
- H10W72/07541—Controlling the environment, e.g. atmosphere composition or temperature
- H10W72/07554—Controlling the environment, e.g. atmosphere composition or temperature changes in dispositions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/541—Dispositions of bond wires
- H10W72/5445—Dispositions of bond wires being orthogonal to a side surface of the chip, e.g. parallel arrangements
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/541—Dispositions of bond wires
- H10W72/5449—Dispositions of bond wires not being orthogonal to a side surface of the chip, e.g. fan-out arrangements
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/851—Dispositions of multiple connectors or interconnections
- H10W72/874—On different surfaces
- H10W72/884—Die-attach connectors and bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/20—Configurations of stacked chips
- H10W90/24—Configurations of stacked chips at least one of the stacked chips being laterally offset from a neighbouring stacked chip, e.g. chip stacks having a staircase shape
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/20—Configurations of stacked chips
- H10W90/284—Configurations of stacked chips characterised by structural arrangements for measuring or testing
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/732—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between stacked chips
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/734—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDL
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/754—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Physics & Mathematics (AREA)
- Geometry (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161497966P | 2011-06-17 | 2011-06-17 | |
| US61/497,966 | 2011-06-17 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2013004984A true JP2013004984A (ja) | 2013-01-07 |
| JP2013004984A5 JP2013004984A5 (https=) | 2015-05-21 |
Family
ID=46087515
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012135669A Pending JP2013004984A (ja) | 2011-06-17 | 2012-06-15 | 半導体パッケージ |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US8981546B2 (https=) |
| EP (1) | EP2535926A3 (https=) |
| JP (1) | JP2013004984A (https=) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104966708B (zh) * | 2015-07-01 | 2018-06-12 | 英特尔公司 | 半导体封装结构 |
| US10916529B2 (en) * | 2018-03-29 | 2021-02-09 | Taiwan Semiconductor Manufacturing Company, Ltd. | Electronics card including multi-chip module |
| EP3603740A1 (de) * | 2018-08-02 | 2020-02-05 | BIOTRONIK SE & Co. KG | Implantat |
| GB2600918B (en) | 2020-10-30 | 2022-11-23 | Npl Management Ltd | Ion microtrap assembly and method of making of making such an assembly |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08250620A (ja) * | 1995-03-07 | 1996-09-27 | Matsushita Electron Corp | 半導体装置 |
| JPH10233464A (ja) * | 1997-02-19 | 1998-09-02 | Nec Corp | Bga型半導体装置およびそのプローブ装置 |
| JPH1117058A (ja) * | 1997-06-26 | 1999-01-22 | Nec Corp | Bgaパッケージ、その試験用ソケットおよびbgaパッケージの試験方法 |
| JP2006344917A (ja) * | 2005-06-10 | 2006-12-21 | Sharp Corp | 半導体装置、積層型半導体装置、および半導体装置の製造方法 |
| WO2008035650A1 (en) * | 2006-09-19 | 2008-03-27 | Panasonic Corporation | Socket, module board, and inspection system using the module board |
| JP2008277595A (ja) * | 2007-05-01 | 2008-11-13 | Matsushita Electric Ind Co Ltd | 半導体装置およびその製造方法 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05102262A (ja) * | 1991-10-03 | 1993-04-23 | Hitachi Ltd | 半導体装置及びそれを実装した実装装置 |
| US5334857A (en) * | 1992-04-06 | 1994-08-02 | Motorola, Inc. | Semiconductor device with test-only contacts and method for making the same |
| JP3447908B2 (ja) * | 1997-02-13 | 2003-09-16 | 富士通株式会社 | ボールグリッドアレイパッケージ |
| US20040135242A1 (en) * | 2003-01-09 | 2004-07-15 | Hsin Chung Hsien | Stacked structure of chips |
| US7100814B2 (en) * | 2004-02-18 | 2006-09-05 | Cardiac Pacemakers, Inc. | Method for preparing integrated circuit modules for attachment to printed circuit substrates |
-
2012
- 2012-05-09 EP EP12167254.7A patent/EP2535926A3/en not_active Withdrawn
- 2012-05-29 US US13/482,511 patent/US8981546B2/en active Active
- 2012-06-15 JP JP2012135669A patent/JP2013004984A/ja active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08250620A (ja) * | 1995-03-07 | 1996-09-27 | Matsushita Electron Corp | 半導体装置 |
| JPH10233464A (ja) * | 1997-02-19 | 1998-09-02 | Nec Corp | Bga型半導体装置およびそのプローブ装置 |
| JPH1117058A (ja) * | 1997-06-26 | 1999-01-22 | Nec Corp | Bgaパッケージ、その試験用ソケットおよびbgaパッケージの試験方法 |
| JP2006344917A (ja) * | 2005-06-10 | 2006-12-21 | Sharp Corp | 半導体装置、積層型半導体装置、および半導体装置の製造方法 |
| WO2008035650A1 (en) * | 2006-09-19 | 2008-03-27 | Panasonic Corporation | Socket, module board, and inspection system using the module board |
| JP2008277595A (ja) * | 2007-05-01 | 2008-11-13 | Matsushita Electric Ind Co Ltd | 半導体装置およびその製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP2535926A2 (en) | 2012-12-19 |
| US8981546B2 (en) | 2015-03-17 |
| EP2535926A3 (en) | 2015-08-05 |
| US20120319288A1 (en) | 2012-12-20 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US11700692B2 (en) | Stackable via package and method | |
| KR100884172B1 (ko) | 집적회로 패키지 적층 및 그것에 의해 형성된 집적회로패키지 | |
| KR101019793B1 (ko) | 반도체 장치 및 그 제조 방법 | |
| US5777381A (en) | Semiconductor devices method of connecting semiconductor devices and semiconductor device connectors | |
| US8916958B2 (en) | Semiconductor package with multiple chips and substrate in metal cap | |
| US8106507B2 (en) | Semiconductor package having socket function, semiconductor module, electronic circuit module and circuit board with socket | |
| US20110147908A1 (en) | Module for Use in a Multi Package Assembly and a Method of Making the Module and the Multi Package Assembly | |
| TW201417237A (zh) | 立體堆疊式封裝結構及其製作方法 | |
| JP2013004984A (ja) | 半導体パッケージ | |
| JP2008147598A (ja) | 積層型パッケージ及びその製造方法 | |
| TWM540449U (zh) | 多功能系統級封裝的堆疊結構(一) | |
| JP4119146B2 (ja) | 電子部品パッケージ | |
| US10236270B2 (en) | Interposer and semiconductor module for use in automotive applications | |
| WO2013181768A1 (zh) | 具有线路布局的预注成形模穴式立体封装模块 | |
| US7777324B2 (en) | Interposer and semiconductor package with reduced contact area | |
| CN104037096B (zh) | 封装装置和制造封装装置的方法 | |
| JP4459421B2 (ja) | 半導体装置 | |
| JP2007188945A (ja) | 半導体装置とそれを用いた電子部品モジュール | |
| CN103779298B (zh) | 立体堆叠式封装结构及其制作方法 | |
| CN118448282A (zh) | 一种叠层封装方法 | |
| JP2000357757A (ja) | 半導体装置および電子回路装置 | |
| CN104465606B (zh) | 可拆卸、可组装的半导体封装体堆叠结构及其制备方法 | |
| KR100646489B1 (ko) | 반도체 장치 및 그의 제조 방법 | |
| CN121816068A (zh) | Sip芯片封装方法及结构 | |
| JP2004356420A (ja) | 半導体装置およびデバイス搭載基板 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20150402 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20150402 |
|
| A871 | Explanation of circumstances concerning accelerated examination |
Free format text: JAPANESE INTERMEDIATE CODE: A871 Effective date: 20150402 |
|
| A975 | Report on accelerated examination |
Free format text: JAPANESE INTERMEDIATE CODE: A971005 Effective date: 20150612 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20150616 |
|
| A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20150916 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20160114 |