JP2013004680A5 - - Google Patents

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Publication number
JP2013004680A5
JP2013004680A5 JP2011133486A JP2011133486A JP2013004680A5 JP 2013004680 A5 JP2013004680 A5 JP 2013004680A5 JP 2011133486 A JP2011133486 A JP 2011133486A JP 2011133486 A JP2011133486 A JP 2011133486A JP 2013004680 A5 JP2013004680 A5 JP 2013004680A5
Authority
JP
Japan
Prior art keywords
charged particle
electrode
particle beam
opening
support
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2011133486A
Other languages
English (en)
Japanese (ja)
Other versions
JP2013004680A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2011133486A priority Critical patent/JP2013004680A/ja
Priority claimed from JP2011133486A external-priority patent/JP2013004680A/ja
Priority to US13/493,833 priority patent/US20120319001A1/en
Publication of JP2013004680A publication Critical patent/JP2013004680A/ja
Publication of JP2013004680A5 publication Critical patent/JP2013004680A5/ja
Pending legal-status Critical Current

Links

JP2011133486A 2011-06-15 2011-06-15 荷電粒子線レンズ Pending JP2013004680A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2011133486A JP2013004680A (ja) 2011-06-15 2011-06-15 荷電粒子線レンズ
US13/493,833 US20120319001A1 (en) 2011-06-15 2012-06-11 Charged particle beam lens

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2011133486A JP2013004680A (ja) 2011-06-15 2011-06-15 荷電粒子線レンズ

Publications (2)

Publication Number Publication Date
JP2013004680A JP2013004680A (ja) 2013-01-07
JP2013004680A5 true JP2013004680A5 (enExample) 2014-07-31

Family

ID=47352947

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011133486A Pending JP2013004680A (ja) 2011-06-15 2011-06-15 荷電粒子線レンズ

Country Status (2)

Country Link
US (1) US20120319001A1 (enExample)
JP (1) JP2013004680A (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013004216A (ja) * 2011-06-14 2013-01-07 Canon Inc 荷電粒子線レンズ
US9824851B2 (en) * 2013-01-20 2017-11-21 William M. Tong Charge drain coating for electron-optical MEMS
DE112014003890B4 (de) * 2013-09-30 2018-08-02 Hitachi High-Technologies Corporation Mit einem Strahl geladener Teilchen arbeitende Vorrichtung
US9349564B2 (en) * 2014-07-17 2016-05-24 Fei Company Charged-particle lens that transmits emissions from sample
US11137581B2 (en) * 2018-09-27 2021-10-05 Himax Technologies Limited Wafer-level homogeneous bonding optical structure and method to form the same
EP3783917B1 (en) * 2019-03-28 2024-07-17 Sumitomo Riko Company Limited Electrostatic transducer and electrostatic transducer unit
WO2022135926A1 (en) * 2020-12-23 2022-06-30 Asml Netherlands B.V. Electron lens
EP4020517A1 (en) * 2020-12-23 2022-06-29 ASML Netherlands B.V. Electron-optical device
WO2023018496A1 (en) * 2021-08-08 2023-02-16 ViaMEMS Technologies, Inc. Electrostatic devices to influence beams of charged particles
EP4307335A1 (en) * 2022-07-12 2024-01-17 ASML Netherlands B.V. Isolating spacer for electron-optical assembly

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5684853A (en) * 1979-12-14 1981-07-10 Jeol Ltd Face structure of member located close to electron beam path
JPH05190129A (ja) * 1992-01-13 1993-07-30 Toshiba Corp 静電型レンズ
JPH09283015A (ja) * 1996-04-12 1997-10-31 Canon Inc 遮蔽部材の作製方法、及び画像形成装置
JP2000208038A (ja) * 1999-01-08 2000-07-28 Canon Inc 電子源及び画像形成装置の製造方法
JP3763446B2 (ja) * 1999-10-18 2006-04-05 キヤノン株式会社 静電レンズ、電子ビーム描画装置、荷電ビーム応用装置、および、デバイス製造方法
JP2001283756A (ja) * 2000-03-31 2001-10-12 Canon Inc 電子光学系アレイ、これを用いた荷電粒子線露光装置ならびにデバイス製造方法
JP2002080828A (ja) * 2000-09-11 2002-03-22 Toshiba Corp 帯電防止用分散液と帯電防止膜および画像表示装置
US7081630B2 (en) * 2004-03-12 2006-07-25 Zyvex Corporation Compact microcolumn for automated assembly
JP4541798B2 (ja) * 2004-08-06 2010-09-08 キヤノン株式会社 荷電粒子線レンズアレイ、及び該荷電粒子線レンズアレイを用いた荷電粒子線露光装置
JPWO2006106781A1 (ja) * 2005-03-31 2008-09-11 日本板硝子株式会社 イットリウムを含むガラス組成物を含む電子線励起型ディスプレイ用ガラススペーサおよび電子線励起型ディスプレイ
JP2006350125A (ja) * 2005-06-17 2006-12-28 Seiko Epson Corp 光学デバイス
JP2008235101A (ja) * 2007-03-22 2008-10-02 Horiba Ltd 荷電粒子線装置における帯電防止構造
US8707734B2 (en) * 2009-10-19 2014-04-29 The Regents Of The University Of Michigan Method of embedding material in a glass substrate
JP2011198738A (ja) * 2010-02-23 2011-10-06 Nissin Ion Equipment Co Ltd 複数の磁場集中部材をカバーする保護部材を備えたイオンビーム照射装置用磁石

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