JP2012512467A5 - - Google Patents

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Publication number
JP2012512467A5
JP2012512467A5 JP2011541038A JP2011541038A JP2012512467A5 JP 2012512467 A5 JP2012512467 A5 JP 2012512467A5 JP 2011541038 A JP2011541038 A JP 2011541038A JP 2011541038 A JP2011541038 A JP 2011541038A JP 2012512467 A5 JP2012512467 A5 JP 2012512467A5
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JP
Japan
Prior art keywords
error
packet
semiconductor memory
memory devices
command
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Application number
JP2011541038A
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English (en)
Japanese (ja)
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JP2012512467A (ja
JP5753988B2 (ja
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Priority claimed from US12/418,892 external-priority patent/US8880970B2/en
Application filed filed Critical
Priority claimed from PCT/CA2009/001777 external-priority patent/WO2010069045A1/en
Publication of JP2012512467A publication Critical patent/JP2012512467A/ja
Publication of JP2012512467A5 publication Critical patent/JP2012512467A5/ja
Application granted granted Critical
Publication of JP5753988B2 publication Critical patent/JP5753988B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2011541038A 2008-12-18 2009-12-10 エラー検出方法および１つまたは複数のメモリデバイスを含むシステム Expired - Fee Related JP5753988B2 (ja)

Applications Claiming Priority (7)

Application Number Priority Date Filing Date Title
US13857508P 2008-12-18 2008-12-18
US61/138,575 2008-12-18
US14014708P 2008-12-23 2008-12-23
US61/140,147 2008-12-23
US12/418,892 US8880970B2 (en) 2008-12-23 2009-04-06 Error detection method and a system including one or more memory devices
US12/418,892 2009-04-06
PCT/CA2009/001777 WO2010069045A1 (en) 2008-12-18 2009-12-10 Error detection method and a system including one or more memory devices

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2014257755A Division JP2015099598A (ja) 2008-12-18 2014-12-19 エラー検出方法および１つまたは複数のメモリデバイスを含むシステム

Publications (3)

Publication Number Publication Date
JP2012512467A JP2012512467A (ja) 2012-05-31
JP2012512467A5 true JP2012512467A5 (enExample) 2013-01-24
JP5753988B2 JP5753988B2 (ja) 2015-07-22

Family

ID=42268218

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2011541038A Expired - Fee Related JP5753988B2 (ja) 2008-12-18 2009-12-10 エラー検出方法および１つまたは複数のメモリデバイスを含むシステム
JP2014257755A Pending JP2015099598A (ja) 2008-12-18 2014-12-19 エラー検出方法および１つまたは複数のメモリデバイスを含むシステム

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2014257755A Pending JP2015099598A (ja) 2008-12-18 2014-12-19 エラー検出方法および１つまたは複数のメモリデバイスを含むシステム

Country Status (6)

Country Link
EP (1) EP2359372B1 (enExample)
JP (2) JP5753988B2 (enExample)
KR (1) KR101687038B1 (enExample)
CN (1) CN102257573B (enExample)
TW (1) TWI517174B (enExample)
WO (1) WO2010069045A1 (enExample)

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CN107239363B (zh) * 2017-05-27 2020-04-24 北京东土军悦科技有限公司 一种ecc信息上报方法及系统
CN107134294B (zh) * 2017-05-27 2020-04-24 北京东土军悦科技有限公司 一种ecc信息获取方法及系统
KR102433098B1 (ko) 2018-02-26 2022-08-18 에스케이하이닉스 주식회사 어드레스 생성회로, 어드레스 및 커맨드 생성회로 및 반도체 시스템
US10963336B2 (en) 2019-08-29 2021-03-30 Micron Technology, Inc. Semiconductor device with user defined operations and associated methods and systems
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JP7575955B2 (ja) * 2021-01-13 2024-10-30 キヤノン株式会社 制御装置、システム、リソグラフィ装置、物品の製造方法、制御方法及びプログラム
KR102867713B1 (ko) 2021-04-07 2025-10-13 삼성전자주식회사 반도체 메모리 장치 및 이를 포함하는 메모리 시스템
US11822793B2 (en) * 2022-04-04 2023-11-21 Western Digital Technologies, Inc. Complete and fast protection against CID conflict
CN119339751A (zh) * 2023-07-19 2025-01-21 美光科技公司 基于错误率的电压缩放

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