JP2012503311A5 - - Google Patents
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- Publication number
- JP2012503311A5 JP2012503311A5 JP2011526919A JP2011526919A JP2012503311A5 JP 2012503311 A5 JP2012503311 A5 JP 2012503311A5 JP 2011526919 A JP2011526919 A JP 2011526919A JP 2011526919 A JP2011526919 A JP 2011526919A JP 2012503311 A5 JP2012503311 A5 JP 2012503311A5
- Authority
- JP
- Japan
- Prior art keywords
- energy
- substrate
- annealing
- preheating
- substrate support
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000758 substrate Substances 0.000 claims 26
- 238000000137 annealing Methods 0.000 claims 11
- 230000003287 optical effect Effects 0.000 claims 8
- 238000010438 heat treatment Methods 0.000 claims 6
- 238000000034 method Methods 0.000 claims 6
- 238000007493 shaping process Methods 0.000 claims 3
- 230000001939 inductive effect Effects 0.000 claims 2
- 238000002844 melting Methods 0.000 claims 1
- 230000008018 melting Effects 0.000 claims 1
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/212,214 US8314369B2 (en) | 2008-09-17 | 2008-09-17 | Managing thermal budget in annealing of substrates |
US12/212,157 | 2008-09-17 | ||
US12/212,214 | 2008-09-17 | ||
US12/212,157 US20100068898A1 (en) | 2008-09-17 | 2008-09-17 | Managing thermal budget in annealing of substrates |
PCT/US2009/055838 WO2010033389A1 (en) | 2008-09-17 | 2009-09-03 | Managing thermal budget in annealing of substrates |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2012503311A JP2012503311A (ja) | 2012-02-02 |
JP2012503311A5 true JP2012503311A5 (enrdf_load_stackoverflow) | 2012-10-18 |
JP5611212B2 JP5611212B2 (ja) | 2014-10-22 |
Family
ID=42039812
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2011526919A Expired - Fee Related JP5611212B2 (ja) | 2008-09-17 | 2009-09-03 | 基板のアニールにおける熱量の管理 |
Country Status (7)
Country | Link |
---|---|
EP (1) | EP2342739A4 (enrdf_load_stackoverflow) |
JP (1) | JP5611212B2 (enrdf_load_stackoverflow) |
KR (2) | KR101800404B1 (enrdf_load_stackoverflow) |
CN (1) | CN102160157B (enrdf_load_stackoverflow) |
SG (2) | SG193882A1 (enrdf_load_stackoverflow) |
TW (3) | TWI549191B (enrdf_load_stackoverflow) |
WO (1) | WO2010033389A1 (enrdf_load_stackoverflow) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8546805B2 (en) * | 2012-01-27 | 2013-10-01 | Ultratech, Inc. | Two-beam laser annealing with improved temperature performance |
US9376731B2 (en) * | 2012-05-08 | 2016-06-28 | Applied Materials, Inc. | Magneto-thermal processing apparatus and methods |
US9239192B2 (en) * | 2013-02-20 | 2016-01-19 | Taiwan Semiconductor Manufacturing Co., Ltd. | Substrate rapid thermal heating system and methods |
CN104752174A (zh) * | 2013-12-30 | 2015-07-01 | 上海微电子装备有限公司 | 一种激光退火装置及方法 |
TW201610215A (zh) * | 2014-03-27 | 2016-03-16 | 應用材料股份有限公司 | 用於低熱預算處理的循環尖峰退火化學曝露 |
KR20170078795A (ko) * | 2014-10-31 | 2017-07-07 | 어플라이드 머티어리얼스, 인코포레이티드 | 전기화학 디바이스 층들의 증착과 레이저 프로세싱의 통합 |
CN113981414B (zh) * | 2015-03-20 | 2024-11-08 | 应用材料公司 | 用于3d共形处理的原子层处理腔室 |
JP6985249B2 (ja) * | 2015-07-29 | 2021-12-22 | アプライド マテリアルズ インコーポレイテッドApplied Materials, Incorporated | 回転基板レーザアニール |
JP6887234B2 (ja) * | 2016-09-21 | 2021-06-16 | 株式会社日本製鋼所 | レーザ照射装置、レーザ照射方法、及び半導体装置の製造方法 |
KR102099890B1 (ko) * | 2017-05-18 | 2020-04-14 | 세메스 주식회사 | 기판 처리 장치 및 기판 처리 방법 |
KR102180311B1 (ko) | 2018-07-27 | 2020-11-18 | 주식회사 코윈디에스티 | 레이저 어닐링 장치 |
KR102061424B1 (ko) * | 2018-07-27 | 2019-12-31 | 주식회사 코윈디에스티 | 로이 유리 어닐링 장치 |
CN112038223A (zh) * | 2020-08-27 | 2020-12-04 | 上海华力集成电路制造有限公司 | 一种改善双激光退火过程中晶圆表面热分布的方法 |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5696835A (en) * | 1979-12-29 | 1981-08-05 | Fujitsu Ltd | Manufacture of semiconductor device |
JPS58106836A (ja) * | 1981-12-18 | 1983-06-25 | Hitachi Ltd | レ−ザ−アニ−ル装置 |
JPS58176929A (ja) * | 1982-04-09 | 1983-10-17 | Fujitsu Ltd | 半導体装置の製造方法 |
JPH03266424A (ja) * | 1990-03-16 | 1991-11-27 | Sony Corp | 半導体基板のアニール方法 |
US5643801A (en) * | 1992-11-06 | 1997-07-01 | Semiconductor Energy Laboratory Co., Ltd. | Laser processing method and alignment |
US6423585B1 (en) * | 1997-03-11 | 2002-07-23 | Semiconductor Energy Laboratory Co., Ltd. | Heating treatment device, heating treatment method and fabrication method of semiconductor device |
WO1999041777A1 (fr) | 1998-02-13 | 1999-08-19 | Seiko Epson Corporation | Procede de production d'un dispositif semi-conducteur et appareil de traitement a chaud |
US6771895B2 (en) * | 1999-01-06 | 2004-08-03 | Mattson Technology, Inc. | Heating device for heating semiconductor wafers in thermal processing chambers |
TW457553B (en) * | 1999-01-08 | 2001-10-01 | Sony Corp | Process for producing thin film semiconductor device and laser irradiation apparatus |
WO2001064591A1 (en) * | 2000-03-01 | 2001-09-07 | Heraeus Amersil, Inc. | Method, apparatus, and article of manufacture for determining an amount of energy needed to bring a quartz workpiece to a fusion weldable condition |
JP2003045820A (ja) * | 2001-07-30 | 2003-02-14 | Semiconductor Energy Lab Co Ltd | レーザ照射装置およびレーザ照射方法、並びに半導体装置の作製方法 |
US6987240B2 (en) * | 2002-04-18 | 2006-01-17 | Applied Materials, Inc. | Thermal flux processing by scanning |
JP2004128421A (ja) * | 2002-10-07 | 2004-04-22 | Semiconductor Energy Lab Co Ltd | レーザ照射方法およびレーザ照射装置、並びに半導体装置の作製方法 |
US7098155B2 (en) * | 2003-09-29 | 2006-08-29 | Ultratech, Inc. | Laser thermal annealing of lightly doped silicon substrates |
TWI297521B (en) * | 2004-01-22 | 2008-06-01 | Ultratech Inc | Laser thermal annealing of lightly doped silicon substrates |
US7482254B2 (en) * | 2005-09-26 | 2009-01-27 | Ultratech, Inc. | Apparatus and methods for thermally processing undoped and lightly doped substrates without pre-heating |
US20080045040A1 (en) | 2006-08-17 | 2008-02-21 | Toshiba America Electronic Components, Inc. | Laser Spike Anneal With Plural Light Sources |
JP2008080371A (ja) * | 2006-09-27 | 2008-04-10 | Sumitomo Heavy Ind Ltd | レーザ加工方法、及び、レーザ加工装置 |
-
2009
- 2009-09-03 SG SG2013069232A patent/SG193882A1/en unknown
- 2009-09-03 SG SG10201807844VA patent/SG10201807844VA/en unknown
- 2009-09-03 WO PCT/US2009/055838 patent/WO2010033389A1/en active Application Filing
- 2009-09-03 KR KR1020117008790A patent/KR101800404B1/ko not_active Expired - Fee Related
- 2009-09-03 JP JP2011526919A patent/JP5611212B2/ja not_active Expired - Fee Related
- 2009-09-03 EP EP09814993.3A patent/EP2342739A4/en not_active Withdrawn
- 2009-09-03 CN CN200980136613.5A patent/CN102160157B/zh not_active Expired - Fee Related
- 2009-09-03 KR KR1020177033214A patent/KR101868378B1/ko not_active Expired - Fee Related
- 2009-09-09 TW TW102141287A patent/TWI549191B/zh not_active IP Right Cessation
- 2009-09-09 TW TW102122198A patent/TWI549190B/zh not_active IP Right Cessation
- 2009-09-09 TW TW098130387A patent/TWI419234B/zh not_active IP Right Cessation
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