JP2012164877A5 - Lead frame, semiconductor device, lead frame manufacturing method, and semiconductor device manufacturing method - Google Patents
Lead frame, semiconductor device, lead frame manufacturing method, and semiconductor device manufacturing method Download PDFInfo
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本発明の一観点によれば、セクションバーと、前記セクションバーによって支持されたダイパッド及びリードを有する単位リードフレームが複数個連設されたリードフレームであって、前記セクションバー及び前記ダイパッド及び前記リードを画定する開口部と、前記セクションバーの下面に形成された凹部と、前記ダイパッドの側面又は前記リードの側面である前記開口部の内壁面の少なくとも一部及び前記凹部の内壁面のみに形成される、表面が粗面化された粗面めっき層と、前記粗面めっき層に接するように前記開口部の少なくとも一部と前記凹部とに埋め込まれた絶縁性の樹脂層と、を有する。 According to one aspect of the present invention, there is provided a lead frame and a section bar, the unit lead frame having a supported die pad and lead by the section bar is plural continuously provided, said section bars and the die pad and the An opening for defining a lead, a recess formed on the lower surface of the section bar, a side surface of the die pad or at least a part of an inner wall surface of the opening that is a side surface of the lead, and only an inner wall surface of the recess. A rough surface plating layer having a roughened surface, and an insulating resin layer embedded in at least a part of the opening and the recess so as to be in contact with the rough surface plating layer.
本発明の一観点によれば、セクションバーと、前記セクションバーによって支持されたダイパッド及びリードを有する単位リードフレームが複数個連設されるリードフレームの製造方法であって、前記セクションバー及び前記ダイパッド及び前記リードを画定するための開口部を導電性基板に形成するとともに、前記セクションバーとなる前記導電性基板の下面に凹部を形成して基板フレームを形成する基板形成工程と、前記ダイパッドの側面又は前記リードの側面である前記開口部の内壁面の少なくとも一部及び前記凹部の内壁面のみに、表面が粗面化された粗面めっき層を形成する粗化工程と、前記粗面めっき層に接するように絶縁性の樹脂を、前記開口部の少なくとも一部と前記凹部とに埋め込む樹脂埋め込み工程と、を有する。 According to one aspect of the present invention, a manufacturing method of a lead frame and a section bar, the unit lead frame having a supported die pad and lead by the section bar is plural continuously provided, said section bars and the Forming a substrate frame by forming an opening for defining the die pad and the lead in the conductive substrate, and forming a substrate frame by forming a recess on a lower surface of the conductive substrate serving as the section bar ; A roughening step of forming a rough surface plating layer having a roughened surface only on at least a part of the inner wall surface of the opening and the inner wall surface of the recess, which is the side surface or the side surface of the lead; an insulating resin so as to be in contact with the layer, having a resin embedding step embeds into at least a portion with the recess of the opening.
次に、図13(c)に示すように、ダイシングソーにより、矢印の位置のセクションバー11及び封止樹脂73を切断し、個別の半導体装置70に個片化する。このような工程により、図13(d)に示す個別の半導体装置70が製造される。 Next, as shown in FIG. 1 3 (c), a dicing saw, to cut the section bar 11 and the sealing resin 73 of the position of the arrow, to 70 two pieces of individual semiconductor devices. Through such a process, the individual semiconductor device 70 shown in FIG. 1 3 (d) is manufactured.
Claims (16)
前記セクションバー及び前記ダイパッド及び前記リードを画定する開口部と、
前記セクションバーの下面に形成された凹部と、
前記ダイパッドの側面又は前記リードの側面である前記開口部の内壁面の少なくとも一部及び前記凹部の内壁面のみに形成される、表面が粗面化された粗面めっき層と、
前記粗面めっき層に接するように前記開口部の少なくとも一部と前記凹部とに埋め込まれた絶縁性の樹脂層と、
を有することを特徴とするリードフレーム。 And section bar, the unit lead frame having a supported die pad and lead by the section bar is a lead frame, which is several continuously arranged,
An opening defining the section bar and the die pad and the lead;
A recess formed in the lower surface of the section bar;
A rough surface plating layer having a roughened surface formed on at least a part of the inner wall surface of the opening and the inner wall surface of the recess, which is the side surface of the die pad or the side surface of the lead,
An insulating resin layer embedded in at least a part of the opening and the recess so as to be in contact with the rough surface plating layer;
A lead frame comprising:
前記樹脂層は、前記第1凹部及び前記第2凹部及び前記凹部を充填するように埋め込まれていることを特徴とする請求項1に記載のリードフレーム。 The lead frame according to claim 1, wherein the resin layer is embedded to fill the first recess, the second recess, and the recess.
前記樹脂層は、前記凹部と前記第1凹部を充填するように埋め込まれ、 The resin layer is embedded to fill the recess and the first recess,
前記第2凹部の内壁面は、前記樹脂層から露出されていることを特徴とする請求項1に記載のリードフレーム。 The lead frame according to claim 1, wherein an inner wall surface of the second recess is exposed from the resin layer.
前記セクションバー及び前記ダイパッド及び前記リードを画定するとともに、前記ダイパッドの下面側に形成された第1凹部と、前記ダイパッドの上面側に形成された第2凹部とが連通して形成されてなる開口部と、 An opening that defines the section bar, the die pad, and the lead, and is formed by communicating a first recess formed on the lower surface side of the die pad and a second recess formed on the upper surface side of the die pad. And
前記セクションバーの下面に形成された凹部と、 A recess formed in the lower surface of the section bar;
前記第2凹部の内壁面のみに形成される、表面が粗面化された粗面めっき層と、 A rough plating layer having a roughened surface formed only on the inner wall surface of the second recess,
前記粗面めっき層に接するように、前記第2凹部を充填するように埋め込まれた絶縁性の樹脂層と、を有し、 An insulating resin layer embedded so as to fill the second recess so as to be in contact with the rough plating layer,
前記第1凹部及び前記凹部の内壁面は外部に露出されていることを特徴とするリードフレーム。 The lead frame, wherein the first recess and the inner wall surface of the recess are exposed to the outside.
前記ダイパッド上に搭載された半導体素子と、 A semiconductor element mounted on the die pad;
前記半導体素子と前記リードとを電気的に接続するボンディングワイヤと、 A bonding wire for electrically connecting the semiconductor element and the lead;
前記半導体素子及び前記ボンディングワイヤを封止する封止樹脂と、を有し、 A sealing resin for sealing the semiconductor element and the bonding wire;
前記リードの外側面と、前記凹部に充填された前記樹脂層の外側面とが面一に形成されていることを特徴とする半導体装置。 2. A semiconductor device according to claim 1, wherein an outer side surface of the lead and an outer side surface of the resin layer filled in the recess are formed flush with each other.
前記ダイパッド上に搭載された半導体素子と、 A semiconductor element mounted on the die pad;
前記半導体素子と前記リードとを電気的に接続するボンディングワイヤと、 A bonding wire for electrically connecting the semiconductor element and the lead;
前記半導体素子及び前記ボンディングワイヤを封止する封止樹脂と、 A sealing resin for sealing the semiconductor element and the bonding wire;
を有することを特徴とする半導体装置。A semiconductor device comprising:
前記セクションバー及び前記ダイパッド及び前記リードを画定するための開口部を導電性基板に形成するとともに、前記セクションバーとなる前記導電性基板の下面に凹部を形成して基板フレームを形成する基板形成工程と、
前記ダイパッドの側面又は前記リードの側面である前記開口部の内壁面の少なくとも一部及び前記凹部の内壁面のみに、表面が粗面化された粗面めっき層を形成する粗化工程と、
前記粗面めっき層に接するように絶縁性の樹脂を、前記開口部の少なくとも一部と前記凹部とに埋め込む樹脂埋め込み工程と、
を有することを特徴とするリードフレームの製造方法。 And section bar, the unit lead frame having a supported die pad and lead by the section bar is a manufacturing method of a lead frame are plural continuously provided,
A substrate forming step of forming an opening for defining the section bar, the die pad and the lead in the conductive substrate, and forming a substrate frame by forming a recess on a lower surface of the conductive substrate to be the section bar. When,
A roughening step of forming a rough surface plating layer having a roughened surface only on at least a part of the inner wall surface of the opening and the inner wall surface of the recess which is the side surface of the die pad or the side surface of the lead;
An insulating resin so as to be in contact with the rough surface plated layer, a resin embedding step embeds into at least a portion with the recess of the opening,
A method for manufacturing a lead frame, comprising:
前記樹脂埋め込み工程は、
前記粗化工程後の基板フレームを金型で固定し、前記単位リードフレームよりも外側に設けられたゲート部から絶縁性の前記樹脂を加熱及び加圧しながら注入することにより、前記樹脂を前記開口部に充填することを特徴とする請求項9に記載のリードフレームの製造方法。 In the substrate forming step, the substrate frame is formed so that the openings are continuously formed in space.
The resin embedding step includes
By the base frame after the roughening step was fixed in a mold, injecting while applying heat and pressure to the insulating of the resin from the gate portion provided on the outer side than the unit lead frames, the resin said opening The lead frame manufacturing method according to claim 9 , wherein the portion is filled.
前記導電性基板の両面に前記開口部及び前記凹部の形状に対応する開口部を有するレジスト層を形成する工程と、
前記レジスト層をエッチングマスクとして、前記導電性基板を両面からエッチングする工程と、を含み、
前記粗面めっき層を形成する工程は、前記レジスト層をマスクとした電解めっきにより前記粗面めっき層を形成し、
前記樹脂埋め込み工程は、前記開口部及び前記凹部を充填するように、前記樹脂を前記開口部及び前記凹部に埋め込むことを特徴とする請求項9又は10に記載のリードフレームの製造方法。 The substrate forming step includes
Forming a resist layer having openings corresponding to the shapes of the openings and the recesses on both surfaces of the conductive substrate;
Etching the conductive substrate from both sides using the resist layer as an etching mask,
The step of forming the rough surface plating layer includes forming the rough surface plating layer by electrolytic plating using the resist layer as a mask ,
The resin filling step is to fill the opening and the recess, the manufacturing method of lead frame according to claim 9 or 10, characterized in that filling the resin into the opening and the recess.
前記セクションバー及び前記ダイパッド及び前記リードを画定する開口部を構成する第1凹部を導電性基板の下面に形成するとともに、前記セクションバーとなる前記導電性基板の下面に凹部を形成する第1基板加工工程と、
前記第1凹部の内壁面及び前記凹部の内壁面のみに、表面が粗面化された粗面めっき層を形成する粗化工程と、
前記粗面めっき層に接するように、且つ前記第1凹部及び前記凹部を充填するように、絶縁性の樹脂を前記第1凹部及び前記凹部に埋め込む樹脂埋め込み工程と、
前記導電性基板の上面に、前記第1凹部と連通する第2凹部を形成して前記開口部を形成する第2基板加工工程と、
を有することを特徴とするリードフレームの製造方法。 And section bar, the unit lead frame having a supported die pad and lead by the section bar is a manufacturing method of a lead frame are plural continuously provided,
A first substrate is formed on the lower surface of the conductive substrate that forms the opening defining the section bar, the die pad, and the lead, and the concave portion is formed on the lower surface of the conductive substrate serving as the section bar. Processing steps,
A roughening step of forming a rough surface plating layer having a roughened surface only on the inner wall surface of the first recess and the inner wall surface of the recess ;
So as to be in contact with the rough surface plated layer, and before SL so as to fill the first recess and the recess, a step potting embedding an insulating resin into the first recess and the recess,
The upper surface of the conductive substrate, a second substrate processing step of forming the opening portion forms a second recess communicating with the first recess,
A method for manufacturing a lead frame, comprising:
前記樹脂埋め込み工程は、
前記粗化工程後の導電性基板を金型で固定し、前記単位リードフレームよりも外側に設けられたゲート部から絶縁性の樹脂を加熱及び加圧しながら注入することにより、前記樹脂を前記第1凹部に充填することを特徴とする請求項12に記載のリードフレームの製造方法。 In the first substrate processing step, the conductive substrate is processed so that the first concave portions are spatially continuously formed,
The resin embedding step includes
The conductive substrate after the roughening step is fixed with a mold, and an insulating resin is injected from a gate portion provided outside the unit lead frame while being heated and pressurized, whereby the resin is injected into the first substrate. The lead frame manufacturing method according to claim 12 , wherein one recess is filled.
前記セクションバー及び前記ダイパッド及び前記リードを画定する開口部を構成する第2凹部を導電性基板の上面に形成する第1基板加工工程と、 A first substrate processing step of forming, on an upper surface of a conductive substrate, a second recess that constitutes an opening that defines the section bar, the die pad, and the lead;
前記第2凹部の内壁面のみに、表面が粗面化された粗面めっき層を形成する粗化工程と、 A roughening step of forming a rough surface plating layer having a roughened surface only on the inner wall surface of the second recess;
前記粗面めっき層に接するように、且つ前記第2凹部を充填するように、絶縁性の樹脂を前記第2凹部に埋め込む樹脂埋め込み工程と、 A resin embedding step of embedding an insulating resin in the second recess so as to be in contact with the rough plating layer and filling the second recess;
前記導電性基板の下面に、前記第2凹部と連通する第1凹部を形成して前記開口部を形成するとともに、前記セクションバーとなる前記導電性基板の下面に凹部を形成する第2基板加工工程と、 Second substrate processing for forming a first concave portion communicating with the second concave portion on the lower surface of the conductive substrate to form the opening, and forming a concave portion on the lower surface of the conductive substrate serving as the section bar Process,
を有することを特徴とするリードフレームの製造方法。A method for manufacturing a lead frame, comprising:
前記リードフレームの各ダイパッド上に半導体素子を搭載する工程と、
前記半導体素子の電極と前記リードとをボンディングワイヤにより電気的に接続する工程と、
前記半導体素子及び前記ボンディングワイヤを封止樹脂により封止する工程と、
所定の位置における前記封止樹脂と、前記セクションバーと、前記凹部に充填された樹脂を切断して、各半導体装置単位に分割する工程と、
を有することを特徴とする半導体装置の製造方法。 A method for manufacturing a semiconductor device using a lead frame manufactured by the method for manufacturing a lead frame according to any one of claims 9 to 13 ,
Mounting a semiconductor element on each die pad of the lead frame;
Electrically connecting the electrode of the semiconductor element and the lead by a bonding wire;
Sealing the semiconductor element and the bonding wire with a sealing resin;
Cutting the sealing resin at a predetermined position, the section bar, and the resin filled in the recesses, and dividing the semiconductor resin unit into units;
A method for manufacturing a semiconductor device, comprising:
前記リードフレームの各ダイパッド上に半導体素子を搭載する工程と、 Mounting a semiconductor element on each die pad of the lead frame;
前記半導体素子の電極と前記リードとをボンディングワイヤにより電気的に接続する工程と、 Electrically connecting the electrode of the semiconductor element and the lead by a bonding wire;
前記半導体素子及び前記ボンディングワイヤを封止樹脂により封止する工程と、 Sealing the semiconductor element and the bonding wire with a sealing resin;
所定の位置における前記封止樹脂と、前記セクションバーとを切断して、各半導体装置単位に分割する工程と、 Cutting the sealing resin at a predetermined position and the section bar, and dividing each semiconductor device unit;
を有することを特徴とする半導体装置の製造方法。A method for manufacturing a semiconductor device, comprising:
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JP6266350B2 (en) * | 2014-01-08 | 2018-01-24 | 新日本無線株式会社 | Electronic component and manufacturing method thereof |
JP6493952B2 (en) * | 2014-08-26 | 2019-04-03 | 大口マテリアル株式会社 | Lead frame and manufacturing method thereof |
JP6362108B2 (en) * | 2014-09-08 | 2018-07-25 | 大口マテリアル株式会社 | Lead frame for mounting a semiconductor element and manufacturing method thereof |
JP6362111B2 (en) * | 2014-12-01 | 2018-07-25 | 大口マテリアル株式会社 | Lead frame manufacturing method |
CN104779224B (en) * | 2015-04-15 | 2017-07-28 | 苏州聚达晟芯微电子有限公司 | A kind of QFN encapsulating structures of power device |
JP6493975B2 (en) * | 2015-07-03 | 2019-04-03 | 大口マテリアル株式会社 | Multi-row type LED lead frame, LED package, and manufacturing method thereof |
KR102474509B1 (en) * | 2015-11-25 | 2022-12-07 | 해성디에스 주식회사 | lead frame strip and method of manufacturing the same |
JP2017147272A (en) * | 2016-02-15 | 2017-08-24 | ローム株式会社 | Semiconductor device and manufacturing method thereof, and lead frame intermediate body used to manufacture semiconductor device |
US11309231B2 (en) * | 2017-02-21 | 2022-04-19 | Mitsubishi Electric Corporation | Semiconductor device |
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