JP2012047516A5 - - Google Patents

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Publication number
JP2012047516A5
JP2012047516A5 JP2010188100A JP2010188100A JP2012047516A5 JP 2012047516 A5 JP2012047516 A5 JP 2012047516A5 JP 2010188100 A JP2010188100 A JP 2010188100A JP 2010188100 A JP2010188100 A JP 2010188100A JP 2012047516 A5 JP2012047516 A5 JP 2012047516A5
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JP
Japan
Prior art keywords
circuit
voltage
amplifier
output
source follower
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2010188100A
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English (en)
Japanese (ja)
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JP5672853B2 (ja
JP2012047516A (ja
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Publication date
Priority claimed from JP2010188100A external-priority patent/JP5672853B2/ja
Priority to JP2010188100A priority Critical patent/JP5672853B2/ja
Application filed filed Critical
Priority to US13/137,209 priority patent/US8618492B2/en
Priority to TW100127797A priority patent/TWI466540B/zh
Priority to CN201110245646.2A priority patent/CN102420945B/zh
Publication of JP2012047516A publication Critical patent/JP2012047516A/ja
Publication of JP2012047516A5 publication Critical patent/JP2012047516A5/ja
Priority to US14/072,114 priority patent/US8859978B2/en
Publication of JP5672853B2 publication Critical patent/JP5672853B2/ja
Application granted granted Critical
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2010188100A 2010-08-25 2010-08-25 放射線撮像装置 Expired - Fee Related JP5672853B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2010188100A JP5672853B2 (ja) 2010-08-25 2010-08-25 放射線撮像装置
US13/137,209 US8618492B2 (en) 2010-08-25 2011-07-28 Radiation image pickup device
TW100127797A TWI466540B (zh) 2010-08-25 2011-08-04 輻射影像拾取裝置
CN201110245646.2A CN102420945B (zh) 2010-08-25 2011-08-25 放射线图像拾取设备
US14/072,114 US8859978B2 (en) 2010-08-25 2013-11-05 Radiation image pickup device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010188100A JP5672853B2 (ja) 2010-08-25 2010-08-25 放射線撮像装置

Publications (3)

Publication Number Publication Date
JP2012047516A JP2012047516A (ja) 2012-03-08
JP2012047516A5 true JP2012047516A5 (OSRAM) 2013-09-19
JP5672853B2 JP5672853B2 (ja) 2015-02-18

Family

ID=45695874

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010188100A Expired - Fee Related JP5672853B2 (ja) 2010-08-25 2010-08-25 放射線撮像装置

Country Status (4)

Country Link
US (2) US8618492B2 (OSRAM)
JP (1) JP5672853B2 (OSRAM)
CN (1) CN102420945B (OSRAM)
TW (1) TWI466540B (OSRAM)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
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US8872120B2 (en) 2012-08-23 2014-10-28 Semiconductor Energy Laboratory Co., Ltd. Imaging device and method for driving the same
KR102069683B1 (ko) * 2012-08-24 2020-01-23 가부시키가이샤 한도오따이 에네루기 켄큐쇼 방사선 검출 패널, 방사선 촬상 장치, 및 화상 진단 장치
JP5996442B2 (ja) * 2013-01-10 2016-09-21 アンリツインフィビス株式会社 Ｘ線検査装置
CN103200367B (zh) * 2013-04-15 2016-01-13 华为技术有限公司 一种视频监控设备及补光装置
EP2793053A1 (de) * 2013-04-16 2014-10-22 Agfa HealthCare N.V. Verfahren und Vorrichtungen zum Auslesen von in einer Speicherleuchtstoffschicht gespeicherten Röntgeninformationen
JP2015023359A (ja) * 2013-07-17 2015-02-02 ソニー株式会社 照射装置、照射方法及びプログラム
KR20170072889A (ko) * 2014-10-10 2017-06-27 가부시키가이샤 한도오따이 에네루기 켄큐쇼 촬상 장치
JP6541344B2 (ja) * 2014-12-22 2019-07-10 キヤノン株式会社 放射線撮像装置、放射線撮像システム、及び、放射線撮像装置の制御方法
ES2895277T3 (es) * 2016-03-18 2022-02-18 Univ Texas Detector de radiación para detectar simultáneamente una pluralidad de radiaciones
CN105935296B (zh) * 2016-04-13 2019-03-08 成都京东方光电科技有限公司 一种像元电路、数字x射线探测装置及其探测方法
KR20250024036A (ko) * 2022-06-15 2025-02-18 소니 세미컨덕터 솔루션즈 가부시키가이샤 고체 촬상 소자, 및 촬상 장치

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JPH0772256A (ja) * 1993-09-01 1995-03-17 Fuji Photo Film Co Ltd 画像信号補正装置および方法
JPH11307756A (ja) 1998-02-20 1999-11-05 Canon Inc 光電変換装置および放射線読取装置
US6393098B1 (en) * 1999-08-31 2002-05-21 General Electric Company Amplifier offset and gain correction system for X-ray imaging panel
JP2001189929A (ja) * 1999-12-28 2001-07-10 Shimadzu Corp Ｘ線透視画像装置
EP1301031A1 (de) * 2001-09-29 2003-04-09 Philips Corporate Intellectual Property GmbH Verfahren zur Korrektur unterschiedlicher Umwandlungscharakteristiken von Bildsensoren
JP2003284707A (ja) * 2002-03-27 2003-10-07 Canon Inc 撮影装置、ゲイン補正方法、記録媒体及びプログラム
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JP4965931B2 (ja) * 2005-08-17 2012-07-04 キヤノン株式会社 放射線撮像装置、放射線撮像システム、その制御方法、及び制御プログラム
JP4812503B2 (ja) 2006-04-13 2011-11-09 株式会社日立メディコ Ｘ線撮影装置
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