JP2012021813A5 - - Google Patents

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Publication number
JP2012021813A5
JP2012021813A5 JP2010158133A JP2010158133A JP2012021813A5 JP 2012021813 A5 JP2012021813 A5 JP 2012021813A5 JP 2010158133 A JP2010158133 A JP 2010158133A JP 2010158133 A JP2010158133 A JP 2010158133A JP 2012021813 A5 JP2012021813 A5 JP 2012021813A5
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JP
Japan
Prior art keywords
detection pixel
ray
shielding
detection
rays
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JP2010158133A
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English (en)
Japanese (ja)
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JP5610885B2 (ja
JP2012021813A (ja
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Priority claimed from JP2010158133A external-priority patent/JP5610885B2/ja
Priority to JP2010158133A priority Critical patent/JP5610885B2/ja
Priority to CN2011800337537A priority patent/CN102985010A/zh
Priority to US13/376,576 priority patent/US9101322B2/en
Priority to PCT/JP2011/064606 priority patent/WO2012008287A1/en
Priority to EP11736466.1A priority patent/EP2593017A1/en
Publication of JP2012021813A publication Critical patent/JP2012021813A/ja
Publication of JP2012021813A5 publication Critical patent/JP2012021813A5/ja
Publication of JP5610885B2 publication Critical patent/JP5610885B2/ja
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Expired - Fee Related legal-status Critical Current
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JP2010158133A 2010-07-12 2010-07-12 Ｘ線撮像装置および撮像方法 Expired - Fee Related JP5610885B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2010158133A JP5610885B2 (ja) 2010-07-12 2010-07-12 Ｘ線撮像装置および撮像方法
EP11736466.1A EP2593017A1 (en) 2010-07-12 2011-06-20 X-ray imaging apparatus and imaging method
US13/376,576 US9101322B2 (en) 2010-07-12 2011-06-20 X-ray imaging apparatus and imaging method
PCT/JP2011/064606 WO2012008287A1 (en) 2010-07-12 2011-06-20 X-ray imaging apparatus and imaging method
CN2011800337537A CN102985010A (zh) 2010-07-12 2011-06-20 X射线成像装置和成像方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010158133A JP5610885B2 (ja) 2010-07-12 2010-07-12 Ｘ線撮像装置および撮像方法

Publications (3)

Publication Number Publication Date
JP2012021813A JP2012021813A (ja) 2012-02-02
JP2012021813A5 true JP2012021813A5 (enExample) 2013-08-29
JP5610885B2 JP5610885B2 (ja) 2014-10-22

Family

ID=44629162

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010158133A Expired - Fee Related JP5610885B2 (ja) 2010-07-12 2010-07-12 Ｘ線撮像装置および撮像方法

Country Status (5)

Country Link
US (1) US9101322B2 (enExample)
EP (1) EP2593017A1 (enExample)
JP (1) JP5610885B2 (enExample)
CN (1) CN102985010A (enExample)
WO (1) WO2012008287A1 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102013213244A1 (de) * 2013-07-05 2015-01-08 Siemens Aktiengesellschaft Röntgenaufnahmesystem zur hochaufgelösten differentiellen Phasenkontrast-Bildgebung eines Untersuchungsobjekts
FR3092398B1 (fr) * 2019-01-31 2021-02-26 Imagine Optic Procédés et systèmes pour l’imagerie de contraste phase

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60181638A (ja) * 1984-02-29 1985-09-17 Toshiba Corp 放射線像撮影装置
US4709382A (en) * 1984-11-21 1987-11-24 Picker International, Inc. Imaging with focused curved radiation detectors
JPH0824676B2 (ja) * 1986-09-29 1996-03-13 株式会社東芝 Ｘ線ｃｔ装置
US6483891B1 (en) * 1998-09-17 2002-11-19 Quanta Vision, Inc. Reduced-angle mammography device and variants
JP4118535B2 (ja) * 2001-07-03 2008-07-16 株式会社日立メディコ Ｘ線検査装置
EP1879020A1 (en) * 2006-07-12 2008-01-16 Paul Scherrer Institut X-ray interferometer for phase contrast imaging
GB2441578A (en) * 2006-09-08 2008-03-12 Ucl Business Plc Phase Contrast X-Ray Imaging
CN101952900B (zh) * 2008-02-14 2013-10-23 皇家飞利浦电子股份有限公司 用于相位对比成像的x射线探测器
EP2257793B1 (en) * 2008-03-19 2015-05-13 Koninklijke Philips N.V. Rotational x-ray device for phase contrast imaging comprising a ring-shaped grating
JP4847568B2 (ja) 2008-10-24 2011-12-28 キヤノン株式会社 Ｘ線撮像装置およびｘ線撮像方法
JP2010158133A (ja) 2009-01-05 2010-07-15 Alpha Corp 電気自動車の充電終了案内システム
WO2010082688A2 (en) 2009-01-15 2010-07-22 Canon Kabushiki Kaisha X-ray imaging apparatus and method of x-ray imaging
JP5675169B2 (ja) * 2009-06-18 2015-02-25 キヤノン株式会社 Ｘ線撮像装置およびｘ線撮像方法
JP5213923B2 (ja) * 2010-01-29 2013-06-19 キヤノン株式会社 Ｘ線撮像装置およびｘ線撮像方法

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