CN102985010A - X射线成像装置和成像方法 - Google Patents

X射线成像装置和成像方法 Download PDF

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Publication number
CN102985010A
CN102985010A CN2011800337537A CN201180033753A CN102985010A CN 102985010 A CN102985010 A CN 102985010A CN 2011800337537 A CN2011800337537 A CN 2011800337537A CN 201180033753 A CN201180033753 A CN 201180033753A CN 102985010 A CN102985010 A CN 102985010A
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CN
China
Prior art keywords
ray
detection pixel
ray beam
detection
shielding
Prior art date
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Pending
Application number
CN2011800337537A
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English (en)
Chinese (zh)
Inventor
向出大平
中辻七朗
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Canon Inc
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Canon Inc
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Publication date
Application filed by Canon Inc filed Critical Canon Inc
Publication of CN102985010A publication Critical patent/CN102985010A/zh
Pending legal-status Critical Current

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    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/484—Diagnostic techniques involving phase contrast X-ray imaging
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/40—Arrangements for generating radiation specially adapted for radiation diagnosis
    • A61B6/4035—Arrangements for generating radiation specially adapted for radiation diagnosis the source being combined with a filter or grating
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/42—Arrangements for detecting radiation specially adapted for radiation diagnosis
    • A61B6/4291—Arrangements for detecting radiation specially adapted for radiation diagnosis the detector being combined with a grid or grating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/04—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers
    • G21K1/043—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers changing time structure of beams by mechanical means, e.g. choppers, spinning filter wheels
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/04—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers
    • G21K1/046—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers varying the contour of the field, e.g. multileaf collimators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
    • G21K2207/005—Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Medical Informatics (AREA)
  • General Health & Medical Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Pathology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Surgery (AREA)
  • Chemical & Material Sciences (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Molecular Biology (AREA)
  • Optics & Photonics (AREA)
  • Animal Behavior & Ethology (AREA)
  • Biophysics (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Biomedical Technology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Pulmonology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
CN2011800337537A 2010-07-12 2011-06-20 X射线成像装置和成像方法 Pending CN102985010A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2010-158133 2010-07-12
JP2010158133A JP5610885B2 (ja) 2010-07-12 2010-07-12 Ｘ線撮像装置および撮像方法
PCT/JP2011/064606 WO2012008287A1 (en) 2010-07-12 2011-06-20 X-ray imaging apparatus and imaging method

Publications (1)

Publication Number Publication Date
CN102985010A true CN102985010A (zh) 2013-03-20

Family

ID=44629162

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2011800337537A Pending CN102985010A (zh) 2010-07-12 2011-06-20 X射线成像装置和成像方法

Country Status (5)

Country Link
US (1) US9101322B2 (enExample)
EP (1) EP2593017A1 (enExample)
JP (1) JP5610885B2 (enExample)
CN (1) CN102985010A (enExample)
WO (1) WO2012008287A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104274198A (zh) * 2013-07-05 2015-01-14 西门子公司 对检查对象进行高分辨率微分相衬成像的x射线拍摄系统

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3092398B1 (fr) * 2019-01-31 2021-02-26 Imagine Optic Procédés et systèmes pour l’imagerie de contraste phase

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4651002A (en) * 1984-02-29 1987-03-17 Kabushiki Kaisha Toshiba Radiographic method and apparatus for reducing the effects of scatter in the image
WO2008029107A2 (en) * 2006-09-08 2008-03-13 Ucl Business Plc Phase contrast imaging
CN101495853A (zh) * 2006-07-12 2009-07-29 保罗·谢勒学院 用于相衬成像的x射线干涉仪
WO2009115966A1 (en) * 2008-03-19 2009-09-24 Koninklijke Philips Electronics N.V. Rotational x ray device for phase contrast imaging
WO2010147125A1 (en) * 2009-06-18 2010-12-23 Canon Kabushiki Kaisha X-ray imaging apparatus and x-ray imaging method
CN102187207A (zh) * 2008-10-24 2011-09-14 佳能株式会社 X射线成像装置和x射线成像方法
CN102272860A (zh) * 2009-01-15 2011-12-07 佳能株式会社 X射线成像装置和x射线成像方法
CN102713679A (zh) * 2010-01-29 2012-10-03 佳能株式会社 X射线成像装置和x射线成像方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4709382A (en) * 1984-11-21 1987-11-24 Picker International, Inc. Imaging with focused curved radiation detectors
JPH0824676B2 (ja) * 1986-09-29 1996-03-13 株式会社東芝 Ｘ線ｃｔ装置
US6483891B1 (en) * 1998-09-17 2002-11-19 Quanta Vision, Inc. Reduced-angle mammography device and variants
JP4118535B2 (ja) * 2001-07-03 2008-07-16 株式会社日立メディコ Ｘ線検査装置
CN101952900B (zh) * 2008-02-14 2013-10-23 皇家飞利浦电子股份有限公司 用于相位对比成像的x射线探测器
JP2010158133A (ja) 2009-01-05 2010-07-15 Alpha Corp 電気自動車の充電終了案内システム

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4651002A (en) * 1984-02-29 1987-03-17 Kabushiki Kaisha Toshiba Radiographic method and apparatus for reducing the effects of scatter in the image
CN101495853A (zh) * 2006-07-12 2009-07-29 保罗·谢勒学院 用于相衬成像的x射线干涉仪
WO2008029107A2 (en) * 2006-09-08 2008-03-13 Ucl Business Plc Phase contrast imaging
WO2009115966A1 (en) * 2008-03-19 2009-09-24 Koninklijke Philips Electronics N.V. Rotational x ray device for phase contrast imaging
CN102187207A (zh) * 2008-10-24 2011-09-14 佳能株式会社 X射线成像装置和x射线成像方法
CN102272860A (zh) * 2009-01-15 2011-12-07 佳能株式会社 X射线成像装置和x射线成像方法
WO2010147125A1 (en) * 2009-06-18 2010-12-23 Canon Kabushiki Kaisha X-ray imaging apparatus and x-ray imaging method
CN102458254A (zh) * 2009-06-18 2012-05-16 佳能株式会社 X射线成像装置和x射线成像方法
CN102713679A (zh) * 2010-01-29 2012-10-03 佳能株式会社 X射线成像装置和x射线成像方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104274198A (zh) * 2013-07-05 2015-01-14 西门子公司 对检查对象进行高分辨率微分相衬成像的x射线拍摄系统
CN104274198B (zh) * 2013-07-05 2018-12-14 西门子公司 对检查对象进行高分辨率微分相衬成像的x射线拍摄系统

Also Published As

Publication number Publication date
US9101322B2 (en) 2015-08-11
US20120148023A1 (en) 2012-06-14
JP5610885B2 (ja) 2014-10-22
JP2012021813A (ja) 2012-02-02
EP2593017A1 (en) 2013-05-22
WO2012008287A1 (en) 2012-01-19

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Application publication date: 20130320