JP2011530423A5 - - Google Patents

Download PDF

Info

Publication number
JP2011530423A5
JP2011530423A5 JP2011523023A JP2011523023A JP2011530423A5 JP 2011530423 A5 JP2011530423 A5 JP 2011530423A5 JP 2011523023 A JP2011523023 A JP 2011523023A JP 2011523023 A JP2011523023 A JP 2011523023A JP 2011530423 A5 JP2011530423 A5 JP 2011530423A5
Authority
JP
Japan
Prior art keywords
polishing
substrate
polishing surface
delivery arm
slurry
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2011523023A
Other languages
English (en)
Japanese (ja)
Other versions
JP2011530423A (ja
Filing date
Publication date
Priority claimed from US12/191,959 external-priority patent/US20100041316A1/en
Application filed filed Critical
Publication of JP2011530423A publication Critical patent/JP2011530423A/ja
Publication of JP2011530423A5 publication Critical patent/JP2011530423A5/ja
Pending legal-status Critical Current

Links

JP2011523023A 2008-08-14 2009-07-15 改良された化学的機械的研磨システムのための方法 Pending JP2011530423A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/191,959 US20100041316A1 (en) 2008-08-14 2008-08-14 Method for an improved chemical mechanical polishing system
US12/191,959 2008-08-14
PCT/US2009/050663 WO2010019339A2 (en) 2008-08-14 2009-07-15 Method for an improved chemical mechanical polishing system

Publications (2)

Publication Number Publication Date
JP2011530423A JP2011530423A (ja) 2011-12-22
JP2011530423A5 true JP2011530423A5 (enExample) 2012-09-06

Family

ID=41669549

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011523023A Pending JP2011530423A (ja) 2008-08-14 2009-07-15 改良された化学的機械的研磨システムのための方法

Country Status (4)

Country Link
US (1) US20100041316A1 (enExample)
JP (1) JP2011530423A (enExample)
KR (1) KR20110055617A (enExample)
WO (1) WO2010019339A2 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8616935B2 (en) * 2010-06-02 2013-12-31 Applied Materials, Inc. Control of overpolishing of multiple substrates on the same platen in chemical mechanical polishing
US20110300776A1 (en) * 2010-06-03 2011-12-08 Applied Materials, Inc. Tuning of polishing process in multi-carrier head per platen polishing station
KR101105264B1 (ko) * 2010-09-02 2012-01-17 (주)레이나 Cmp 공정 중 연마 완료 시점 검출 시스템 및 방법
US20130115862A1 (en) * 2011-11-09 2013-05-09 Applied Materials, Inc. Chemical mechanical polishing platform architecture
US20140020830A1 (en) * 2012-07-19 2014-01-23 Applied Materials, Inc. Carrier Head Sweep Motor Current for In-Situ Monitoring
US20140024299A1 (en) * 2012-07-19 2014-01-23 Wen-Chiang Tu Polishing Pad and Multi-Head Polishing System
CN105164793B (zh) * 2013-03-15 2018-01-02 应用材料公司 对于利用用于化学机械抛光的晶片及晶片边缘/斜角清洁模块的盘/垫清洁的设计
US9806677B2 (en) 2015-03-16 2017-10-31 Telefonaktiebolaget Lm Ericsson (Publ) Amplifier adapted for noise suppression
KR102591906B1 (ko) * 2017-10-31 2023-10-20 가부시키가이샤 에바라 세이사꾸쇼 연마 장치 및 연마 방법
JP7763244B2 (ja) 2020-09-08 2025-10-31 アプライド マテリアルズ インコーポレイテッド Cmp処理のための基板ハンドリングシステム及び方法
KR102838644B1 (ko) 2021-03-03 2025-07-28 어플라이드 머티어리얼스, 인코포레이티드 통합된 기판 정렬 스테이지를 갖는 건조 시스템
JP7732785B2 (ja) * 2021-06-30 2025-09-02 株式会社荏原製作所 液体供給装置および研磨装置

Family Cites Families (49)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4991529A (en) * 1972-02-28 1991-02-12 The United States Of America As Represented By The Secretary Of The Navy Slurry Dispenser
US5938504A (en) * 1993-11-16 1999-08-17 Applied Materials, Inc. Substrate polishing apparatus
JP3594357B2 (ja) * 1995-04-10 2004-11-24 株式会社荏原製作所 ポリッシング方法及び装置
JP3678468B2 (ja) * 1995-07-18 2005-08-03 株式会社荏原製作所 ポリッシング装置
US5709593A (en) * 1995-10-27 1998-01-20 Applied Materials, Inc. Apparatus and method for distribution of slurry in a chemical mechanical polishing system
US5738574A (en) * 1995-10-27 1998-04-14 Applied Materials, Inc. Continuous processing system for chemical mechanical polishing
JP3672685B2 (ja) * 1996-11-29 2005-07-20 松下電器産業株式会社 研磨方法及び研磨装置
US5921855A (en) * 1997-05-15 1999-07-13 Applied Materials, Inc. Polishing pad having a grooved pattern for use in a chemical mechanical polishing system
US6139406A (en) * 1997-06-24 2000-10-31 Applied Materials, Inc. Combined slurry dispenser and rinse arm and method of operation
JPH11114811A (ja) * 1997-10-15 1999-04-27 Ebara Corp ポリッシング装置のスラリ供給装置
US5964413A (en) * 1997-11-05 1999-10-12 Mok; Peter Apparatus for dispensing slurry
US6098901A (en) * 1997-11-05 2000-08-08 Aplex, Inc. Apparatus for dispensing slurry
US6220941B1 (en) * 1998-10-01 2001-04-24 Applied Materials, Inc. Method of post CMP defect stability improvement
US6152806A (en) * 1998-12-14 2000-11-28 Applied Materials, Inc. Concentric platens
US6206760B1 (en) * 1999-01-28 2001-03-27 Taiwan Semiconductor Manufacturing Company, Ltd. Method and apparatus for preventing particle contamination in a polishing machine
US6375544B1 (en) * 1999-02-26 2002-04-23 Micron Technology, Inc. System and method for reducing surface defects integrated in circuits
US6429131B2 (en) * 1999-03-18 2002-08-06 Infineon Technologies Ag CMP uniformity
EP1190455A2 (en) * 1999-04-01 2002-03-27 Koninklijke Philips Electronics N.V. Dual cmp pad conditioner
US6053801A (en) * 1999-05-10 2000-04-25 Applied Materials, Inc. Substrate polishing with reduced contamination
US6251001B1 (en) * 1999-05-10 2001-06-26 Applied Materials, Inc. Substrate polishing with reduced contamination
JP3797822B2 (ja) * 1999-06-30 2006-07-19 株式会社荏原製作所 ポリッシング装置
US6283840B1 (en) * 1999-08-03 2001-09-04 Applied Materials, Inc. Cleaning and slurry distribution system assembly for use in chemical mechanical polishing apparatus
US6284092B1 (en) * 1999-08-06 2001-09-04 International Business Machines Corporation CMP slurry atomization slurry dispense system
JP2001054857A (ja) * 1999-08-20 2001-02-27 Okamoto Machine Tool Works Ltd 曲率表面を有する長尺状ワ−クの製造方法およびそれに用いる平面ラップ装置
US6196900B1 (en) * 1999-09-07 2001-03-06 Vlsi Technology, Inc. Ultrasonic transducer slurry dispenser
US6626744B1 (en) * 1999-12-17 2003-09-30 Applied Materials, Inc. Planarization system with multiple polishing pads
KR100718737B1 (ko) * 2000-01-17 2007-05-15 가부시키가이샤 에바라 세이사꾸쇼 폴리싱 장치
US6623341B2 (en) * 2000-01-18 2003-09-23 Applied Materials, Inc. Substrate polishing apparatus
US6533645B2 (en) * 2000-01-18 2003-03-18 Applied Materials, Inc. Substrate polishing article
US6347650B1 (en) * 2000-06-16 2002-02-19 Discovery Partners International, Inc. Device and method for dispensing particulate material
JP2002075939A (ja) * 2000-08-30 2002-03-15 Jsr Corp 化学機械研磨における終点の検出方法およびそれに用いる化学機械研磨用水系分散体
JP2002110598A (ja) * 2000-09-26 2002-04-12 Toshiba Corp Cmp装置
US6398627B1 (en) * 2001-03-22 2002-06-04 Taiwan Semiconductor Manufacturing Co., Ltd. Slurry dispenser having multiple adjustable nozzles
JP4682449B2 (ja) * 2001-05-30 2011-05-11 ソニー株式会社 化学的機械的研磨方法及び化学的機械的研磨装置
US6390902B1 (en) * 2001-06-06 2002-05-21 United Microelectronics Corp. Multi-conditioner arrangement of a CMP system
US20030027505A1 (en) * 2001-08-02 2003-02-06 Applied Materials, Inc. Multiport polishing fluid delivery system
US6699356B2 (en) * 2001-08-17 2004-03-02 Applied Materials, Inc. Method and apparatus for chemical-mechanical jet etching of semiconductor structures
US6806948B2 (en) * 2002-03-29 2004-10-19 Lam Research Corporation System and method of broad band optical end point detection for film change indication
US6921317B2 (en) * 2002-11-21 2005-07-26 The Boeing Company Automated lapping system
US6882290B2 (en) * 2002-12-20 2005-04-19 Mobile Knowledge Inc. Method and system for dynamically personalizing transportation in a vehicle
US7229339B2 (en) * 2004-07-02 2007-06-12 Novellus Systems, Inc. CMP apparatus and method
US6945857B1 (en) * 2004-07-08 2005-09-20 Applied Materials, Inc. Polishing pad conditioner and methods of manufacture and recycling
US7066795B2 (en) * 2004-10-12 2006-06-27 Applied Materials, Inc. Polishing pad conditioner with shaped abrasive patterns and channels
US7182677B2 (en) * 2005-01-14 2007-02-27 Applied Materials, Inc. Chemical mechanical polishing pad for controlling polishing slurry distribution
US7052374B1 (en) * 2005-03-01 2006-05-30 Taiwan Semiconductor Manufacturing Co., Ltd. Multipurpose slurry delivery arm for chemical mechanical polishing
US20060201532A1 (en) * 2005-03-14 2006-09-14 Applied Materials, Inc. Semiconductor substrate cleaning system
US7764377B2 (en) * 2005-08-22 2010-07-27 Applied Materials, Inc. Spectrum based endpointing for chemical mechanical polishing
JP2007109767A (ja) * 2005-10-12 2007-04-26 Mitsubishi Materials Corp Cmpコンディショナおよびその製造方法
JP2007331108A (ja) * 2007-08-20 2007-12-27 Ebara Corp 基板研磨装置および基板研磨方法

Similar Documents

Publication Publication Date Title
JP2011530423A5 (enExample)
US9375825B2 (en) Polishing pad conditioning system including suction
US9138861B2 (en) CMP pad cleaning apparatus
US10065288B2 (en) Chemical mechanical polishing (CMP) platform for local profile control
JP4924593B2 (ja) Cmp研磨方法、cmp装置、半導体装置及びその製造方法
US20140295737A1 (en) Polishing apparatus and wear detection method
TW200305210A (en) Method for manufacturing semiconductor device and polishing apparatus
CN104303272B (zh) 用于抛光模组的预化学机械平坦化的方法与设备
TW200810881A (en) Methods and apparatus for polishing an edge of a substrate
JP2014195847A5 (enExample)
JP2009028892A5 (enExample)
WO2012054149A3 (en) Apparatus and method for compensation of variability in chemical mechanical polishing consumables
JP2011530423A (ja) 改良された化学的機械的研磨システムのための方法
TW524728B (en) Method and apparatus for multiphase chemical mechanical polishing
CN103846777A (zh) 化学机械研磨装置及研磨方法
KR20110055654A (ko) 화학적 기계 연마 장치, 화학적 기계 연마 방법 및 제어 프로그램이 기록된 기록매체
EP3345724A1 (en) Chemical mechanical polishing device and chemical mechanical polishing method
JP2012209480A (ja) 電極が埋設されたウエーハの加工方法
CN102729136B (zh) 研磨盘调节器的监控装置及监控方法
CN106233432B (zh) 用于化学机械平面化后的基板清洁的系统、方法及设备
CN110774076A (zh) 化学机械抛光设备和方法
KR20090103205A (ko) 화학기계적연마 장비
JPH10335288A (ja) 基板研磨装置及び研磨終点検出方法
CN201490163U (zh) 一种用于化学机械抛光装置的在线终点检测系统
TW201238712A (en) Polishing method of glass plate