JP2011520170A5 - - Google Patents

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Publication number
JP2011520170A5
JP2011520170A5 JP2011502289A JP2011502289A JP2011520170A5 JP 2011520170 A5 JP2011520170 A5 JP 2011520170A5 JP 2011502289 A JP2011502289 A JP 2011502289A JP 2011502289 A JP2011502289 A JP 2011502289A JP 2011520170 A5 JP2011520170 A5 JP 2011520170A5
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JP
Japan
Prior art keywords
prediction
damage
linear regression
measured
predictions
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JP2011502289A
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English (en)
Japanese (ja)
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JP2011520170A (ja
JP5295352B2 (ja
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Priority claimed from FR0852171A external-priority patent/FR2929728B1/fr
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Publication of JP2011520170A publication Critical patent/JP2011520170A/ja
Publication of JP2011520170A5 publication Critical patent/JP2011520170A5/ja
Application granted granted Critical
Publication of JP5295352B2 publication Critical patent/JP5295352B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2011502289A 2008-04-02 2009-04-01 システムに関する動作予測を特定するための方法 Expired - Fee Related JP5295352B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR0852171 2008-04-02
FR0852171A FR2929728B1 (fr) 2008-04-02 2008-04-02 Procede de determination du pronostic de fonctionnement d'un systeme.
PCT/EP2009/002378 WO2009121583A1 (fr) 2008-04-02 2009-04-01 Procede de determination du pronostic de fonctionnement d'un systeme

Publications (3)

Publication Number Publication Date
JP2011520170A JP2011520170A (ja) 2011-07-14
JP2011520170A5 true JP2011520170A5 (enExample) 2012-12-27
JP5295352B2 JP5295352B2 (ja) 2013-09-18

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ID=39768819

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011502289A Expired - Fee Related JP5295352B2 (ja) 2008-04-02 2009-04-01 システムに関する動作予測を特定するための方法

Country Status (8)

Country Link
US (1) US20110046996A1 (enExample)
EP (1) EP2266005B1 (enExample)
JP (1) JP5295352B2 (enExample)
CN (1) CN101999101B (enExample)
BR (1) BRPI0911371A2 (enExample)
CA (1) CA2719130C (enExample)
FR (1) FR2929728B1 (enExample)
WO (1) WO2009121583A1 (enExample)

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US8909453B2 (en) 2012-01-12 2014-12-09 Bell-Helicopter Textron Inc. System and method of measuring and monitoring torque in a rotorcraft drive system
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US10496787B2 (en) 2013-07-02 2019-12-03 Bell Helicopter Textron Inc. System and method of rotorcraft usage monitoring
US20160306555A1 (en) * 2013-12-20 2016-10-20 Sinchan Banerjee Storage capacity regression
CN105469980A (zh) * 2014-09-26 2016-04-06 西门子公司 电容器模块、电路布置及运行方法
US9568912B2 (en) * 2015-06-15 2017-02-14 Honeywell International Inc. Aircraft prognostic systems and methods for determining adaptive time between overhaul for line replaceable units
CN108268076B (zh) * 2018-01-23 2020-12-22 江苏省兴安科技发展有限公司 一种基于大数据的机房运行安全评估系统
CA3189540A1 (en) * 2020-07-16 2022-01-20 Invacare Corporation System and method for concentrating gas
WO2022015908A1 (en) 2020-07-16 2022-01-20 Invacare Corporation System and method for concentrating gas
EP4182057A4 (en) 2020-07-16 2025-04-30 Ventec Life Systems, Inc. SYSTEM AND METHOD FOR CONCENTRATING GAS
CN116648278A (zh) 2020-07-16 2023-08-25 英瓦卡尔公司 用于浓缩气体的系统和方法
JP2022077373A (ja) * 2020-11-11 2022-05-23 富士電機株式会社 寿命診断装置、半導体装置、寿命診断方法、
US11952142B2 (en) * 2021-05-10 2024-04-09 Honeywell International Inc. Methods and systems for depicting avionics data anomalies
DE102023203885A1 (de) * 2023-04-26 2024-10-31 Siemens Aktiengesellschaft Verfahren und Anordnung zur Restlebensdauerbestimmung eines elektronischen Geräts, insbesondere im gewerblichen, beispielsweise industriellen Umfeld

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US4866714A (en) * 1987-10-15 1989-09-12 Westinghouse Electric Corp. Personal computer-based dynamic burn-in system
JP2738732B2 (ja) * 1988-09-16 1998-04-08 株式会社日立製作所 劣化度予測装置および方法
JP3201809B2 (ja) * 1992-01-30 2001-08-27 三菱電機株式会社 パルスレーザ装置
JPH0714948A (ja) * 1993-06-15 1995-01-17 Hitachi Ltd パワー半導体モジュール
DE19708617C2 (de) * 1997-03-03 1999-02-04 Siemens Ag Chipkartenmodul und Verfahren zu seiner Herstellung sowie diesen umfassende Chipkarte
US6977517B2 (en) * 2002-05-20 2005-12-20 Finisar Corporation Laser production and product qualification via accelerated life testing based on statistical modeling
JP2004045343A (ja) * 2002-07-15 2004-02-12 Toshiba Corp はんだ接合部の寿命診断方法及び装置
FR2844902B1 (fr) 2002-09-19 2013-09-13 Eads Ccr Groupement D Interet Economique Dispositif et procede d'enregistrement de donnees environnementales
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JP4244194B2 (ja) * 2004-02-17 2009-03-25 日本電信電話株式会社 ニッケル水素蓄電池の寿命予測法
JP4115405B2 (ja) * 2004-02-27 2008-07-09 三菱重工業株式会社 水中構造物の劣化速度予測方法及び劣化診断システム
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