JP2011520094A - 試験装置 - Google Patents

試験装置 Download PDF

Info

Publication number
JP2011520094A
JP2011520094A JP2010550263A JP2010550263A JP2011520094A JP 2011520094 A JP2011520094 A JP 2011520094A JP 2010550263 A JP2010550263 A JP 2010550263A JP 2010550263 A JP2010550263 A JP 2010550263A JP 2011520094 A JP2011520094 A JP 2011520094A
Authority
JP
Japan
Prior art keywords
test sample
test
identification
article
monitoring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2010550263A
Other languages
English (en)
Japanese (ja)
Other versions
JP2011520094A5 (enExample
Inventor
パーミー、リチャード・ジョン
Original Assignee
チェイニー・デザイン・アンド・ディベロップメント・リミテッド
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=39328131&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=JP2011520094(A) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by チェイニー・デザイン・アンド・ディベロップメント・リミテッド filed Critical チェイニー・デザイン・アンド・ディベロップメント・リミテッド
Publication of JP2011520094A publication Critical patent/JP2011520094A/ja
Publication of JP2011520094A5 publication Critical patent/JP2011520094A5/ja
Pending legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00613—Quality control
    • G01N35/00623—Quality control of instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G01N21/278—Constitution of standards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
    • G06Q10/00—Administration; Management
    • G06Q10/20—Administration of product repair or maintenance
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
    • G06Q50/00—Information and communication technology [ICT] specially adapted for implementation of business processes of specific business sectors, e.g. utilities or tourism
    • G06Q50/04—Manufacturing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N2001/2893—Preparing calibration standards
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/30—Computing systems specially adapted for manufacturing

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Business, Economics & Management (AREA)
  • Quality & Reliability (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Theoretical Computer Science (AREA)
  • Human Resources & Organizations (AREA)
  • Strategic Management (AREA)
  • Tourism & Hospitality (AREA)
  • Economics (AREA)
  • General Business, Economics & Management (AREA)
  • Marketing (AREA)
  • Mathematical Physics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Primary Health Care (AREA)
  • Manufacturing & Machinery (AREA)
  • Entrepreneurship & Innovation (AREA)
  • Operations Research (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Toxicology (AREA)
  • Electromagnetism (AREA)
  • Artificial Intelligence (AREA)
  • Computer Vision & Pattern Recognition (AREA)
JP2010550263A 2008-03-14 2009-03-16 試験装置 Pending JP2011520094A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB0804764.9 2008-03-14
GBGB0804764.9A GB0804764D0 (en) 2008-03-14 2008-03-14 Test apparatus
PCT/GB2009/000707 WO2009112852A1 (en) 2008-03-14 2009-03-16 Test apparatus

Publications (2)

Publication Number Publication Date
JP2011520094A true JP2011520094A (ja) 2011-07-14
JP2011520094A5 JP2011520094A5 (enExample) 2012-05-10

Family

ID=39328131

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010550263A Pending JP2011520094A (ja) 2008-03-14 2009-03-16 試験装置

Country Status (5)

Country Link
US (2) US20110048104A1 (enExample)
EP (1) EP2265904B1 (enExample)
JP (1) JP2011520094A (enExample)
GB (1) GB0804764D0 (enExample)
WO (1) WO2009112852A1 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013113693A (ja) * 2011-11-29 2013-06-10 Tokuee:Kk 検針機の性能チェック用テストカード及びそれを収納する収納ケース
JP2016017823A (ja) * 2014-07-08 2016-02-01 株式会社日立ハイテクサイエンス Ｘ線分析用試料板及び蛍光ｘ線分析装置

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0804764D0 (en) * 2008-03-14 2008-04-16 Cheyney Design & Dev Ltd Test apparatus
DE102010018217A1 (de) * 2010-04-23 2011-10-27 Rondotest Gmbh & Co.Kg Verfahren zur Validierung, Kalibrierung und/ oder Funktionsüberprüfung einer Fremdkörpererkennungseinrichtung
US9063856B2 (en) * 2012-05-09 2015-06-23 Infosys Limited Method and system for detecting symptoms and determining an optimal remedy pattern for a faulty device
US20140121810A1 (en) * 2012-10-29 2014-05-01 Elwha Llc Food Supply Chain Automation Food Service Information System And Method
US20140122184A1 (en) 2012-10-29 2014-05-01 Elwha Llc Food Supply Chain Automation Grocery Information System And Method
JP6317397B2 (ja) * 2016-06-07 2018-04-25 京セラ株式会社 携帯端末、表示制御プログラムおよび表示制御方法
GB2565522B (en) * 2017-05-26 2020-05-20 Cheyney Design & Dev Ltd Test apparatus
EP3486640B1 (en) * 2017-11-17 2020-06-03 Mettler-Toledo, LLC Radiographic inspection system with reject bin
DE102018116063A1 (de) 2018-07-03 2020-01-09 Minebea Intec Aachen GmbH & Co. KG Testteil für einen Fremdkörperdetektor
CN115034418B (zh) * 2022-06-14 2024-06-25 江苏科技大学 船模试验水池实验室仪器设备借用管理系统及方法
ES3033321T3 (en) 2023-01-30 2025-08-01 Mettler Toledo Safeline X Ray Ltd Inspection and sorting apparatus

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003232752A (ja) * 2002-02-12 2003-08-22 Yamato Scale Co Ltd Ｘ線異物検査装置の感度校正方法及び感度校正用異物試料体
JP2004223138A (ja) * 2003-01-27 2004-08-12 Fuji Photo Film Co Ltd Ｑｃファントムおよび放射線画像読取システム
JP2005003481A (ja) * 2003-06-11 2005-01-06 Ishida Co Ltd Ｘ線検査装置
JP2009031149A (ja) * 2007-07-27 2009-02-12 Anritsu Sanki System Co Ltd 異物検出装置

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1030620A (en) * 1963-12-17 1966-05-25 British Nylon Spinners Ltd Measuring apparatus
US3899915A (en) * 1973-11-07 1975-08-19 Reliance Electric Co Conveyor scale calibration
DE4006375A1 (de) 1990-03-01 1991-09-05 Torres Peraza Mario Verfahren zur eichung einer elektronischen waage und system zur durchfuehrung dieser eichung
CH680617A5 (enExample) * 1990-07-27 1992-09-30 Mettler Toledo Ag
US5257741A (en) * 1992-09-21 1993-11-02 Rode Jerry A Method and apparatus for container redemption and recycling
US5377697A (en) * 1993-08-27 1995-01-03 Hoechst Celanese Corporation Cigarette filter test apparatus and associated method for measuring filter hot collapse and tobacco consumption
US5374395A (en) 1993-10-14 1994-12-20 Amoco Corporation Diagnostics instrument
GB2288016B (en) * 1994-03-31 1998-05-13 Tomra Systems As Device for generating,detecting and recognizing a contour image of a liquid container
US5735387A (en) * 1995-07-14 1998-04-07 Chiron Diagnostics Corporation Specimen rack handling system
US6802659B2 (en) * 1996-08-07 2004-10-12 Mats Cremon Arrangement for automatic setting of programmable devices and materials therefor
NO313496B1 (no) * 2000-10-03 2002-10-14 Repant As Anordning ved utstyr for automatisk mottak, avlesing og håndtering av beholdere
US20020052703A1 (en) * 2000-10-17 2002-05-02 Tabet Nicolas N. Automatic calibration system for scanner-scale
US6583370B2 (en) 2001-05-11 2003-06-24 Safe-T Products, Inc. Plastic encased weights
JP2002365368A (ja) 2001-06-04 2002-12-18 Anritsu Corp Ｘ線検出器及び該検出器を用いたｘ線異物検出装置
GB0211387D0 (en) 2002-05-17 2002-06-26 Sensor Highway Ltd Interchangeable equipment
JP2004245623A (ja) 2003-02-12 2004-09-02 Fuji Photo Film Co Ltd Ｑｃファントム
US20040228766A1 (en) * 2003-05-14 2004-11-18 Witty Thomas R. Point of care diagnostic platform
WO2004104601A2 (en) * 2003-05-16 2004-12-02 The Boc Group, Inc. Nmr measuring system
US7178416B2 (en) * 2003-07-08 2007-02-20 Alexeter Technologies, Llc. Radio frequency identification (RFID) test information control and tracking system
DE102004024109A1 (de) * 2004-05-14 2005-12-08 Garvens Automation Gmbh Verfahren zum Wiegen eines Produktes, Wägesystem und Bestückungsvorrichtung
US7320205B2 (en) 2005-02-02 2008-01-22 Tvi Corporation Method for manufacturing filter canisters and tracking quality assurance
JP2006329907A (ja) 2005-05-30 2006-12-07 Ishida Co Ltd 異物検出装置及び包装容器
JP4500749B2 (ja) * 2005-09-05 2010-07-14 株式会社日立ハイテクノロジーズ 自動分析装置
US8401269B2 (en) 2006-03-13 2013-03-19 Clemex Technologies Inc. System and method for automatic measurements and calibration of computerized magnifying instruments
US8001825B2 (en) * 2007-11-30 2011-08-23 Lifescan, Inc. Auto-calibrating metering system and method of use
GB0804764D0 (en) * 2008-03-14 2008-04-16 Cheyney Design & Dev Ltd Test apparatus

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003232752A (ja) * 2002-02-12 2003-08-22 Yamato Scale Co Ltd Ｘ線異物検査装置の感度校正方法及び感度校正用異物試料体
JP2004223138A (ja) * 2003-01-27 2004-08-12 Fuji Photo Film Co Ltd Ｑｃファントムおよび放射線画像読取システム
JP2005003481A (ja) * 2003-06-11 2005-01-06 Ishida Co Ltd Ｘ線検査装置
JP2009031149A (ja) * 2007-07-27 2009-02-12 Anritsu Sanki System Co Ltd 異物検出装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013113693A (ja) * 2011-11-29 2013-06-10 Tokuee:Kk 検針機の性能チェック用テストカード及びそれを収納する収納ケース
JP2016017823A (ja) * 2014-07-08 2016-02-01 株式会社日立ハイテクサイエンス Ｘ線分析用試料板及び蛍光ｘ線分析装置

Also Published As

Publication number Publication date
WO2009112852A1 (en) 2009-09-17
EP2265904A1 (en) 2010-12-29
US20150052967A1 (en) 2015-02-26
EP2265904B1 (en) 2019-02-27
GB0804764D0 (en) 2008-04-16
US20110048104A1 (en) 2011-03-03
US9696326B2 (en) 2017-07-04

Similar Documents

Publication Publication Date Title
JP2011520094A (ja) 試験装置
US8019040B2 (en) X-ray inspection device and production system
JP5297049B2 (ja) 物品検査装置
JP2011520094A5 (enExample)
US10435192B2 (en) Multiple inspection system and method that inspects different medications
KR20140022805A (ko) 패키지된 약제 검사 시스템 및 방법
CN114200151A (zh) 一种全自动化学发光免疫分析仪管理系统
JP5357507B2 (ja) テストピースおよび異物検出装置
CN118966910B (zh) 基于工业数据处理的药品生产质量管理方法和系统
JP2021167825A (ja) 擬似不良品を用いて動作確認される検査装置
JP4652583B2 (ja) 物品検査システム
JP2021526212A (ja) テスト容器プロトコール法
US20180328813A1 (en) Method And Device For Sealing Medical Packages With Integrated Real-Time Seal Integrity Vacuum Pressure Decay Testing
JP4249587B2 (ja) 検体管理システムおよびその方法
NL2012686B1 (en) A device for checking a bundle of banknotes, system for reducing a bundle of banknotes checked by said device, as well as a method for checking and/or reducing a bundle of banknotes.
JP7212446B2 (ja) 物品検査装置及び物品検査システム
US11125701B2 (en) Test apparatus for x-ray inspection
JP2008185540A (ja) 物品検査装置
JP6983747B2 (ja) 物品検査情報管理装置、そのプログラム及び物品検査システム
JP6941077B2 (ja) 物品検査システム及びそのプログラム
JP2011185685A (ja) 検査装置
US8970370B2 (en) Method and system to calibrate physical data
CN109784747B (zh) 一种血液检测能力考核的方法、质控品核查终端及系统
Fahmy et al. Excipient Quality Assurance: Handling, Sampling, and Regulatory Issues
Raval et al. Basic Concept and Application of Sampling Procedures

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20120315

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20120315

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20130731

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20130910

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20131210

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20131217

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20140310

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20140701

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20141001

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20141008

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20150414