JP2011517338A - 無指向性渦電流プローブを用いた部品検査方法及び装置 - Google Patents
無指向性渦電流プローブを用いた部品検査方法及び装置 Download PDFInfo
- Publication number
- JP2011517338A JP2011517338A JP2010540222A JP2010540222A JP2011517338A JP 2011517338 A JP2011517338 A JP 2011517338A JP 2010540222 A JP2010540222 A JP 2010540222A JP 2010540222 A JP2010540222 A JP 2010540222A JP 2011517338 A JP2011517338 A JP 2011517338A
- Authority
- JP
- Japan
- Prior art keywords
- eddy current
- defect
- array probe
- detected
- probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 title claims abstract description 107
- 238000000034 method Methods 0.000 title claims abstract description 50
- 238000007689 inspection Methods 0.000 title claims description 59
- 230000007547 defect Effects 0.000 claims abstract description 89
- 230000004044 response Effects 0.000 claims abstract description 32
- 238000001514 detection method Methods 0.000 claims abstract description 22
- 238000012545 processing Methods 0.000 claims abstract description 22
- 238000004458 analytical method Methods 0.000 claims abstract description 4
- 238000005259 measurement Methods 0.000 claims description 2
- 238000013480 data collection Methods 0.000 claims 1
- 230000003044 adaptive effect Effects 0.000 description 5
- 229910045601 alloy Inorganic materials 0.000 description 5
- 239000000956 alloy Substances 0.000 description 5
- 230000008458 response to injury Effects 0.000 description 5
- 230000014509 gene expression Effects 0.000 description 4
- 230000011218 segmentation Effects 0.000 description 4
- 239000007787 solid Substances 0.000 description 4
- 230000008901 benefit Effects 0.000 description 3
- 238000012512 characterization method Methods 0.000 description 3
- 230000001066 destructive effect Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 238000000354 decomposition reaction Methods 0.000 description 2
- 230000004907 flux Effects 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 229910000990 Ni alloy Inorganic materials 0.000 description 1
- 229910001069 Ti alloy Inorganic materials 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 230000002159 abnormal effect Effects 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 230000002547 anomalous effect Effects 0.000 description 1
- -1 but not limited to Substances 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 238000010606 normalization Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000000611 regression analysis Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
- 230000005641 tunneling Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/904—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents with two or more sensors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Abstract
【解決手段】この方法は、渦電流アレイプローブを較正するステップと;解析のために、渦電流アレイプローブからデータを収集するステップと;検出された欠陥の検出された方向による応答ばらつきを補償すること、並びに、ノイズを最小化させることのうち、少なくとも一方を行うために収集データを処理するステップと、を含む。方法は、処理済みデータを解析して、前記部品内の潜在的欠陥を識別するステップを更に含むことができる。方法は、検出された欠陥のサイズを推定するステップと、所定の検出確率に基づいて閾値を算出するステップと、を更に含むことができる。
【選択図】図1
Description
Claims (15)
- 渦電流アレイプローブを用いて部品を検査する方法であって、
前記渦電流アレイプローブを較正するステップと、
解析のために、前記渦電流アレイプローブからデータを収集するステップと、
検出された欠陥の検出された方向による応答ばらつきを補償すること、並びに、ノイズを最小化させることのうち、少なくとも一方を行うために、前記収集データを処理するステップと、
を含む方法。 - 前記処理済みデータを解析して、前記部品内の潜在的欠陥を識別するステップを更に含む、請求項1に記載の方法。
- 前記検出された欠陥のサイズを推定するステップと、
所定の検出確率に基づいて閾値を算出するステップと、
を更に含む、請求項1又は2に記載の方法。 - 欠陥の誤識別を最小限に抑えるために、前記検出された欠陥の前記推定サイズを、前記算出された閾値と比較するステップを更に含む、請求項3に記載の方法。
- 渦電流損傷検出システムにより、データの収集及び処理が自動的に実行される、請求項1乃4至のいずれか1項に記載の方法。
- 前記渦電流アレイプローブを較正する前記ステップが、
較正ブロック内に複数の検査ノッチを生成するステップと、
前記部品の検査に用いる渦電流アレイプローブゲインを、前記較正ブロックの検査時に前記渦電流アレイプローブによって取得された測定値に基づいて算出するステップと、
を含む、請求項1乃至5のいずれか1項に記載の方法。 - 応答ばらつきを補償するために前記収集データを処理する前記ステップが、
複数の部分的欠陥応答を解析することによって、検出された欠陥の方向を特定するステップと、
前記複数の部分的欠陥応答から1つの最大欠陥応答を生成するステップと、
を含む、請求項1乃至6のいずれか1項に記載の方法。 - 前記複数の部分的欠陥応答から1つの最大欠陥応答を生成する前記ステップが、
円周方向の欠陥が検出された場合に前記複数の部分的欠陥応答から最大電圧を算出するステップを含む、請求項7に記載の方法。 - 前記複数の部分的欠陥応答から1つの最大欠陥応答を生成する前記ステップが、
半径方向の欠陥が検出された場合に前記複数の部分的欠陥応答の総和を算出するステップを含む、請求項7に記載の方法。 - 渦電流アレイプローブと、前記渦電流アレイプローブと結合された処理装置とを備えた渦電流損傷検出システムであって、
該処理装置が、前記渦電流アレイプローブからデータを収集することと、検出された欠陥の方向のばらつきに関して収集データを補償することを行うように構成された、渦電流損傷検出システム。 - 前記処理装置が、前記収集データを解析して、検出された欠陥の方向を特定するように更に構成された、請求項10に記載の渦電流損傷検出システム。
- 前記処理装置が、
前記検出された欠陥のサイズを推定することと、
欠陥の誤判定を最小限に抑えるために、前記推定サイズを所定の閾値と比較することと、
を行うように更に構成された、請求項10又は11に記載の渦電流損傷検出システム。 - 複数の行及び列の方向を向いた複数の検査ノッチであって、隣接する行どうしが所定の距離だけ離間しており、隣接する列どうしが所定の距離だけ離間している、複数の検査ノッチと、
前記複数のノッチのそれぞれにおいて前記渦電流アレイプローブによって検出されたセンス電圧を測定するように構成された電圧測定装置と、
を備える渦電流アレイプローブ較正装置。 - 前記測定電圧から、部品の検査時に用いる渦電流プローブゲインを算出するように構成された処理装置を更に備える、請求項13に記載の較正装置。
- 渦電流アレイプローブを較正する方法であって、
複数のノッチを所定の様式で検査ブロック上に配置するステップと、
前記複数のノッチのそれぞれについて、前記渦電流アレイプローブによってセンスされた電圧を測定するステップと、
前記測定電圧に基づいて前記渦電流アレイプローブのゲインを設定するステップと、
を含む方法。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/IN2007/000609 WO2009083995A2 (en) | 2007-12-28 | 2007-12-28 | Process and apparatus for testing a component using an omni-directional eddy current probe |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2011517338A true JP2011517338A (ja) | 2011-06-02 |
JP5194131B2 JP5194131B2 (ja) | 2013-05-08 |
Family
ID=40824825
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2010540222A Expired - Fee Related JP5194131B2 (ja) | 2007-12-28 | 2007-12-28 | 無指向性渦電流プローブを用いた部品検査方法及び装置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US20100312494A1 (ja) |
JP (1) | JP5194131B2 (ja) |
CA (1) | CA2711129A1 (ja) |
DE (1) | DE112007003747T5 (ja) |
GB (1) | GB2468097B (ja) |
WO (1) | WO2009083995A2 (ja) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104007172A (zh) * | 2014-06-18 | 2014-08-27 | 武汉理工大学 | 发动机缸体无损检测装置 |
WO2015072365A1 (ja) * | 2013-11-18 | 2015-05-21 | Ntn株式会社 | 渦流探傷装置 |
JP2020510217A (ja) * | 2017-04-10 | 2020-04-02 | プリューフテヒニーク ディーター ブッシュ ゲゼルシャフト ミット ベシュレンクテル ハフツング | 差動プローブ、検査装置ならびに製造方法 |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CA2711168A1 (en) * | 2007-12-31 | 2009-07-09 | General Electric Company | Method for compensation of responses from eddy current probes |
JP5789911B2 (ja) * | 2009-10-06 | 2015-10-07 | 株式会社ジェイテクト | 回転角検出装置及び電動パワーステアリング装置 |
CN101975819B (zh) * | 2010-09-03 | 2011-12-21 | 中国人民解放军装甲兵工程学院 | 旧缸体缸筒内壁表层缺陷的自动化涡流/磁记忆检测装置 |
US8742752B2 (en) * | 2010-10-01 | 2014-06-03 | Westinghouse Electric Company Llc | Nondestructive inspection method for a heat exchanger employing adaptive noise thresholding |
KR20190039619A (ko) * | 2012-07-11 | 2019-04-12 | 일렉트릭 파워 리서치 인스티튜트, 인크. | 플렉시블 와전류 프로브 |
US20140091784A1 (en) * | 2012-10-01 | 2014-04-03 | United Technologies Corporation | Artificial Defect for Eddy Current Inspection |
JP5922633B2 (ja) * | 2013-10-22 | 2016-05-24 | 三菱重工業株式会社 | 渦電流探傷プローブ、及び、渦電流探傷方法 |
US9435766B2 (en) | 2013-12-05 | 2016-09-06 | General Electric Company | System and method for inspection of components |
US9243883B2 (en) * | 2014-03-27 | 2016-01-26 | Olympus Ndt, Inc. | Apparatus and method for conducting and real-time application of EC probe calibration |
GB201515483D0 (en) | 2015-09-01 | 2015-10-14 | Rolls Royce Plc | Multi-element sensor array calibration method |
CN107271541B (zh) * | 2016-04-08 | 2024-02-02 | 中国航发贵州黎阳航空动力有限公司 | 一种涡轮叶片涡流探伤对比试块加工夹具及其制作方法 |
WO2023201193A1 (en) * | 2022-04-13 | 2023-10-19 | Metso Outotec USA Inc. | Autonomous non-destructive testing system and use thereof for inspecting gear teeth in an open gear set |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05240840A (ja) * | 1991-09-16 | 1993-09-21 | General Electric Co <Ge> | 部品を検査する方法 |
JPH06294775A (ja) * | 1993-04-12 | 1994-10-21 | Nippon Steel Corp | 無方向性欠陥検出器及び無方向性欠陥検出装置 |
JPH10282065A (ja) * | 1997-04-01 | 1998-10-23 | Daido Steel Co Ltd | 渦流探傷装置 |
JP2000028585A (ja) * | 1998-06-23 | 2000-01-28 | General Electric Co <Ge> | センサ配列体を正規化、較正するシステムおよび方法 |
JP2001281226A (ja) * | 2000-03-29 | 2001-10-10 | Daido Steel Co Ltd | 蛍光磁粉探傷方法および蛍光磁粉探傷装置 |
JP2007171199A (ja) * | 2005-12-21 | 2007-07-05 | General Electric Co <Ge> | 構成部品を試験するための渦電流検査システム |
Family Cites Families (51)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4207520A (en) * | 1978-04-06 | 1980-06-10 | The United States Of America As Represented By The Secretary Of The Air Force | Multiple frequency digital eddy current inspection system |
US4355281A (en) * | 1978-06-14 | 1982-10-19 | Republic Steel Corporation | Eddy current surface flaw detection employing signal correlation |
US4383218A (en) * | 1978-12-29 | 1983-05-10 | The Boeing Company | Eddy current flow detection including compensation for system variables such as lift-off |
US4292589A (en) * | 1979-05-09 | 1981-09-29 | Schlumberger Technology Corporation | Eddy current method and apparatus for inspecting ferromagnetic tubular members |
FR2540630B1 (fr) * | 1983-02-08 | 1985-08-09 | Commissariat Energie Atomique | Sonde multibobines a courants de foucault munie d'un dispositif d'equilibrage des bobines |
US4808927A (en) * | 1987-02-19 | 1989-02-28 | Atomic Energy Of Canada Limited | Circumferentially compensating eddy current probe with alternately polarized receiver coil |
US4808924A (en) * | 1987-02-19 | 1989-02-28 | Atomic Energy Of Canada Limited | Circumferentially compensating eddy current probe with alternately polarized transmit coils and receiver coils |
US4942545A (en) * | 1988-06-06 | 1990-07-17 | Combustion Engineering, Inc. | Calibration of eddy current profilometry |
US4953710A (en) * | 1988-12-21 | 1990-09-04 | China Steel Corporation | Automated apparatus for inspecting columnar bodies by eddy current method |
US5140265A (en) * | 1989-12-20 | 1992-08-18 | Olympus Optical Co., Ltd | Eddy current flaw detecting endoscope apparatus which produces signals which control other devices |
AU650049B2 (en) * | 1990-06-29 | 1994-06-09 | Abb Amdata Inc. | Eddy current imaging system |
US5130651A (en) * | 1990-09-10 | 1992-07-14 | United Technologies Corporation | Method and apparatus for providing compensation for variations in probe-surface separation in non-contact eddy current inspection systems |
US5424640A (en) * | 1991-01-23 | 1995-06-13 | The United States Of America As Represented By The United States Department Of Energy | Method for removal of random noise in eddy-current testing system |
US5161413A (en) * | 1991-03-08 | 1992-11-10 | Westinghouse Electric Corp. | Apparatus and method for guided inspection of an object |
US5182513A (en) * | 1991-04-06 | 1993-01-26 | General Electric Company | Method and apparatus for a multi-channel multi-frequency data acquisition system for nondestructive eddy current inspection testing |
US5389876A (en) * | 1991-05-06 | 1995-02-14 | General Electric Company | Flexible eddy current surface measurement array for detecting near surface flaws in a conductive part |
US5262722A (en) * | 1992-04-03 | 1993-11-16 | General Electric Company | Apparatus for near surface nondestructive eddy current scanning of a conductive part using a multi-layer eddy current probe array |
US5371461A (en) * | 1992-06-26 | 1994-12-06 | General Electric Company | Apparatus and method for compensating for variations in the lift-off of eddy current surface inspection array elements |
FR2696550B1 (fr) * | 1992-10-07 | 1994-10-28 | Commissariat Energie Atomique | Procédé de traitement de signaux recueillis par un capteur ponctuel absolu à courants de Foucault. |
US5418457A (en) * | 1993-03-12 | 1995-05-23 | General Electric Company | System and method for aligning an inspection probe and maintaining uniform spacing between the probe surface and an inspection surface |
US5371462A (en) * | 1993-03-19 | 1994-12-06 | General Electric Company | Eddy current inspection method employing a probe array with test and reference data acquisition and signal processing |
US5717332A (en) * | 1993-05-03 | 1998-02-10 | General Electric Company | System and method using eddy currents to acquire positional data relating to fibers in a composite |
US5510709A (en) * | 1993-09-27 | 1996-04-23 | General Electric Company | Eddy current surface inspection probe for aircraft fastener inspection, and inspection method |
US5670879A (en) * | 1993-12-13 | 1997-09-23 | Westinghouse Electric Corporation | Nondestructive inspection device and method for monitoring defects inside a turbine engine |
US6031566A (en) * | 1996-12-27 | 2000-02-29 | Olympus America Inc. | Method and device for providing a multiple source display and a remote visual inspection system specially adapted for use with the device |
US6037768A (en) * | 1997-04-02 | 2000-03-14 | Iowa State University Research Foundation, Inc. | Pulsed eddy current inspections and the calibration and display of inspection results |
GB9718891D0 (en) * | 1997-09-06 | 1997-11-12 | British Gas Plc | Pipeline inspection device |
US6040695A (en) * | 1997-12-22 | 2000-03-21 | United Technologies Corporation | Method and apparatus for inspection of components |
US6220099B1 (en) * | 1998-02-17 | 2001-04-24 | Ce Nuclear Power Llc | Apparatus and method for performing non-destructive inspections of large area aircraft structures |
US6115674A (en) * | 1998-06-30 | 2000-09-05 | The United States Of America As Represented By The United States Department Of Energy | Automated detection and location of indications in eddy current signals |
US6205859B1 (en) * | 1999-01-11 | 2001-03-27 | Southwest Research Institute | Method for improving defect detectability with magnetostrictive sensors for piping inspection |
US6265870B1 (en) * | 1999-09-02 | 2001-07-24 | Ndt Technologies, Inc. | Eddy current sensor assembly for detecting structural faults in magnetically permeable objects |
US7161350B2 (en) * | 1999-09-07 | 2007-01-09 | Jentek Sensors, Inc. | Method for material property monitoring with perforated, surface mounted sensors |
AU1569101A (en) * | 1999-09-20 | 2001-04-24 | Jentek Sensors, Inc. | Eddy-current sensor arrays |
US20010047691A1 (en) * | 2000-01-03 | 2001-12-06 | Yuris Dzenis | Hybrid transient-parametric method and system to distinguish and analyze sources of acoustic emission for nondestructive inspection and structural health monitoring |
US6519535B1 (en) * | 2000-06-05 | 2003-02-11 | The University Of Chicago | Eddy current technique for predicting burst pressure |
US6414480B1 (en) * | 2000-08-22 | 2002-07-02 | General Electric Company | Method and system for eddy current inspection calibration |
US7385392B2 (en) * | 2000-11-13 | 2008-06-10 | Jentek Sensors, Inc. | Eddy current sensing arrays and system |
US6469503B2 (en) * | 2001-03-26 | 2002-10-22 | General Electric Company | Eddy current inspection probe and method of use |
US6720775B2 (en) * | 2001-06-12 | 2004-04-13 | General Electric Company | Pulsed eddy current two-dimensional sensor array inspection probe and system |
US6772098B1 (en) * | 2001-07-11 | 2004-08-03 | General Electric Company | Systems and methods for managing inspections |
US6563307B2 (en) * | 2001-08-03 | 2003-05-13 | General Electric Company | Eddy current inspection probe |
US7205166B2 (en) * | 2002-06-28 | 2007-04-17 | Lam Research Corporation | Method and apparatus of arrayed, clustered or coupled eddy current sensor configuration for measuring conductive film properties |
US6914427B2 (en) * | 2003-03-14 | 2005-07-05 | The Boeing Company | Eddy current probe having sensing elements defined by first and second elongated coils and an associated inspection method |
US6888347B2 (en) * | 2003-09-12 | 2005-05-03 | General Electric Company | Omnidirectional eddy current probes, array probes, and inspection systems |
US7005851B2 (en) * | 2003-09-30 | 2006-02-28 | General Electric Company | Methods and apparatus for inspection utilizing pulsed eddy current |
US7795863B2 (en) * | 2004-02-23 | 2010-09-14 | Iowa State University Research Foundation, Inc. | Method and apparatus for forming coil for use in eddy current sensing probe |
US7015690B2 (en) * | 2004-05-27 | 2006-03-21 | General Electric Company | Omnidirectional eddy current probe and inspection system |
US20060132123A1 (en) * | 2004-12-22 | 2006-06-22 | General Electric Company | Eddy current array probes with enhanced drive fields |
US7918014B2 (en) * | 2005-07-13 | 2011-04-05 | Headway Technologies, Inc. | Method of manufacturing a CPP structure with enhanced GMR ratio |
US7408147B2 (en) * | 2005-07-27 | 2008-08-05 | Wisconsin Alumni Research Foundation | Nanoelectromechanical and microelectromechanical sensors and analyzers |
-
2007
- 2007-12-28 JP JP2010540222A patent/JP5194131B2/ja not_active Expired - Fee Related
- 2007-12-28 CA CA2711129A patent/CA2711129A1/en not_active Abandoned
- 2007-12-28 DE DE112007003747T patent/DE112007003747T5/de not_active Withdrawn
- 2007-12-28 GB GB1011330.6A patent/GB2468097B/en not_active Expired - Fee Related
- 2007-12-28 US US12/810,597 patent/US20100312494A1/en not_active Abandoned
- 2007-12-28 WO PCT/IN2007/000609 patent/WO2009083995A2/en active Application Filing
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05240840A (ja) * | 1991-09-16 | 1993-09-21 | General Electric Co <Ge> | 部品を検査する方法 |
JPH06294775A (ja) * | 1993-04-12 | 1994-10-21 | Nippon Steel Corp | 無方向性欠陥検出器及び無方向性欠陥検出装置 |
JPH10282065A (ja) * | 1997-04-01 | 1998-10-23 | Daido Steel Co Ltd | 渦流探傷装置 |
JP2000028585A (ja) * | 1998-06-23 | 2000-01-28 | General Electric Co <Ge> | センサ配列体を正規化、較正するシステムおよび方法 |
JP2001281226A (ja) * | 2000-03-29 | 2001-10-10 | Daido Steel Co Ltd | 蛍光磁粉探傷方法および蛍光磁粉探傷装置 |
JP2007171199A (ja) * | 2005-12-21 | 2007-07-05 | General Electric Co <Ge> | 構成部品を試験するための渦電流検査システム |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2015072365A1 (ja) * | 2013-11-18 | 2015-05-21 | Ntn株式会社 | 渦流探傷装置 |
CN104007172A (zh) * | 2014-06-18 | 2014-08-27 | 武汉理工大学 | 发动机缸体无损检测装置 |
JP2020510217A (ja) * | 2017-04-10 | 2020-04-02 | プリューフテヒニーク ディーター ブッシュ ゲゼルシャフト ミット ベシュレンクテル ハフツング | 差動プローブ、検査装置ならびに製造方法 |
US11604167B2 (en) | 2017-04-10 | 2023-03-14 | Prüftechnik Dieter Busch GmbH | Differential probe, testing device and production method |
Also Published As
Publication number | Publication date |
---|---|
GB2468097A (en) | 2010-08-25 |
US20100312494A1 (en) | 2010-12-09 |
DE112007003747T5 (de) | 2010-12-09 |
WO2009083995A2 (en) | 2009-07-09 |
GB201011330D0 (en) | 2010-08-18 |
JP5194131B2 (ja) | 2013-05-08 |
CA2711129A1 (en) | 2009-07-09 |
WO2009083995A3 (en) | 2016-06-09 |
GB2468097B (en) | 2012-06-13 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5194131B2 (ja) | 無指向性渦電流プローブを用いた部品検査方法及び装置 | |
JP5557412B2 (ja) | 部品を検査するための装置およびシステム | |
US11898986B2 (en) | Systems and methods for steam generator tube analysis for detection of tube degradation | |
US20040004475A1 (en) | High throughput absolute flaw imaging | |
US8988071B2 (en) | Nondestructive inspection of a structure in an aircraft | |
JP2008309573A (ja) | 渦電流探傷装置および渦電流探傷方法 | |
US7505859B2 (en) | Method and algorithms for inspection of longitudinal defects in an eddy current inspection system | |
JP4616695B2 (ja) | マルチセンサ信号異常検知装置および方法 | |
US10132906B2 (en) | Multi-element sensor array calibration method | |
US10775346B2 (en) | Virtual channels for eddy current array probes | |
JP2011069623A (ja) | 渦電流探傷方法 | |
US20070029997A1 (en) | Test circuit with drive windings and sense elements | |
US12061169B2 (en) | System and method for hole inspection | |
US20110004452A1 (en) | Method for compensation of responses from eddy current probes | |
Postolache et al. | Uniform eddy current probe based on GMR sensor array and image processing for NDT | |
KR102052849B1 (ko) | 멀티 채널 와전류센서를 이용한 레일 결함 검출 장치, 센서 교정 방법 및 결함 검출 방법 | |
Bernieri et al. | An SVM approach to crack shape reconstruction in eddy current testing | |
KR101574102B1 (ko) | 터빈 블레이드 핑거 도브테일 결함 검사용 와전류 검사장치 및 검사방법 | |
JP5922383B2 (ja) | 壁厚検査方法、校正用具および渦電流検出システム | |
CN112683997A (zh) | 一种巴克豪森噪声分析法监控轴承套圈表面磨削质量方法 | |
JP4286821B2 (ja) | 半導体デバイス検査装置 | |
US20180246065A1 (en) | Eddy-current testing method and eddy-current testing device | |
US20060202688A1 (en) | Detection system and method thereof | |
JP5907750B2 (ja) | 検査位置の検出方法、検査範囲確認方法、検査方法及び検査装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20120822 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20120911 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20121205 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20130108 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20130204 |
|
R150 | Certificate of patent or registration of utility model |
Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20160208 Year of fee payment: 3 |
|
LAPS | Cancellation because of no payment of annual fees |