JP2011516859A5 - - Google Patents
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- Publication number
- JP2011516859A5 JP2011516859A5 JP2011503017A JP2011503017A JP2011516859A5 JP 2011516859 A5 JP2011516859 A5 JP 2011516859A5 JP 2011503017 A JP2011503017 A JP 2011503017A JP 2011503017 A JP2011503017 A JP 2011503017A JP 2011516859 A5 JP2011516859 A5 JP 2011516859A5
- Authority
- JP
- Japan
- Prior art keywords
- stage amplifier
- output
- inverting input
- feedback path
- stage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000000903 blocking effect Effects 0.000 claims 1
- 238000005259 measurement Methods 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/059,752 US8054085B2 (en) | 2008-03-31 | 2008-03-31 | Programmable gain trans-impedance amplifier overload recovery circuit |
| US12/059,752 | 2008-03-31 | ||
| PCT/US2009/037062 WO2009123845A1 (en) | 2008-03-31 | 2009-03-13 | Programmable gain trans-impedance amplifier overload recovery circuit |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2011516859A JP2011516859A (ja) | 2011-05-26 |
| JP2011516859A5 true JP2011516859A5 (enExample) | 2012-04-12 |
| JP5498478B2 JP5498478B2 (ja) | 2014-05-21 |
Family
ID=41116135
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011503017A Expired - Fee Related JP5498478B2 (ja) | 2008-03-31 | 2009-03-13 | プログラム可能な利得トランスインピーダンス増幅器過負荷回復回路 |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US8054085B2 (enExample) |
| JP (1) | JP5498478B2 (enExample) |
| KR (1) | KR20100131490A (enExample) |
| CN (1) | CN101981459B (enExample) |
| TW (1) | TWI439706B (enExample) |
| WO (1) | WO2009123845A1 (enExample) |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8040124B2 (en) * | 2009-02-18 | 2011-10-18 | Advanced Ion Beam Technology, Inc. | Method and apparatus for monitoring leakage current of a faraday cup |
| TWI510130B (zh) * | 2010-09-20 | 2015-11-21 | Novatek Microelectronics Corp | 短路偵測電路、發光二極體驅動晶片、發光二極體裝置及短路偵測方法 |
| US9086439B2 (en) * | 2011-02-25 | 2015-07-21 | Maxim Integrated Products, Inc. | Circuits, devices and methods having pipelined capacitance sensing |
| WO2013169777A1 (en) * | 2012-05-10 | 2013-11-14 | That Corporation | Programmable-gain amplifier |
| CN103852614A (zh) * | 2012-11-29 | 2014-06-11 | 山东电力集团公司济宁供电公司 | 一种检测母线漏电流的电路 |
| US8841971B1 (en) | 2012-12-17 | 2014-09-23 | Google Inc. | Short circuit current protection in an amplifier |
| EP2976650B1 (en) * | 2013-03-15 | 2021-05-05 | Ilium Technology, Inc. | Apparatus and method for measuring electrical properties of matter |
| US9625517B2 (en) | 2013-08-09 | 2017-04-18 | Huawei Technologies Co., Ltd. | Leakage current detection method and apparatus for detecting leakage of current from a board-mounted component |
| CN104345201A (zh) * | 2013-08-09 | 2015-02-11 | 华为技术有限公司 | 漏电流检测方法和装置 |
| JP6417137B2 (ja) * | 2014-07-14 | 2018-10-31 | 株式会社ヒューモラボラトリー | コンデンサの絶縁抵抗測定装置 |
| US10680566B2 (en) | 2015-10-23 | 2020-06-09 | Hewlett Packard Enterprise Development Lp | Noise-canceling transimpedance amplifier (TIA) systems |
| US10291207B2 (en) | 2016-07-07 | 2019-05-14 | Analog Devices, Inc. | Wide range programmable resistor for discrete logarithmic control, and tuning circuit for variable gain active filter using same |
| US10466296B2 (en) * | 2017-01-09 | 2019-11-05 | Analog Devices Global | Devices and methods for smart sensor application |
| EP3596823B8 (en) * | 2017-03-16 | 2021-04-14 | Isotopx Ltd | An amplifier |
| US10972063B2 (en) | 2018-10-17 | 2021-04-06 | Analog Devices Global Unlimited Company | Amplifier systems for measuring a wide range of current |
| CN112294187B (zh) * | 2019-07-31 | 2024-03-15 | 苏州市春菊电器有限公司 | 一种吸尘器的尘杯灰尘量检测装置及其检测方法 |
| CN116699463B (zh) * | 2023-07-28 | 2024-02-06 | 珠海禅光科技有限公司 | Mlcc电容器漏电流测量方法、装置、控制装置和介质 |
Family Cites Families (26)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58102173A (ja) | 1981-12-14 | 1983-06-17 | Fujitsu Ltd | コンデンサの漏洩電流測定回路 |
| US4862070A (en) * | 1987-10-30 | 1989-08-29 | Teradyne, Inc. | Apparatus for testing input pin leakage current of a device under test |
| JPH01172765A (ja) | 1987-12-28 | 1989-07-07 | Advantest Corp | 容量性物質の漏れ電流測定装置 |
| US4931721A (en) | 1988-12-22 | 1990-06-05 | E. I. Du Pont De Nemours And Company | Device for automatically ascertaining capacitance, dissipation factor and insulation resistance of a plurality of capacitors |
| US5003486A (en) | 1989-02-24 | 1991-03-26 | Nero Technologies Ltd. | Programmable safety electrical socket controller |
| JP2841345B2 (ja) | 1990-03-05 | 1998-12-24 | マルコン電子株式会社 | コンデンサの直流電圧印加試験回路 |
| DE59105964D1 (de) | 1990-07-24 | 1995-08-17 | Ifm Electronic Gmbh | Elektronisches Schaltgerät mit Anwesenheitsindikator. |
| US5402329A (en) | 1992-12-09 | 1995-03-28 | Ernest H. Wittenbreder, Jr. | Zero voltage switching pulse width modulated power converters |
| JPH0777548A (ja) | 1993-09-08 | 1995-03-20 | Ckd Corp | コンデンサの特性検査装置用治具 |
| JP3457412B2 (ja) * | 1995-01-11 | 2003-10-20 | 株式会社シバソク | 超低雑音プログラマブル直流電源 |
| JPH09113545A (ja) * | 1995-10-16 | 1997-05-02 | Murata Mfg Co Ltd | 電流測定装置 |
| US5677634A (en) | 1995-11-16 | 1997-10-14 | Electro Scientific Industries, Inc. | Apparatus for stress testing capacitive components |
| US5842579A (en) | 1995-11-16 | 1998-12-01 | Electro Scientific Industries, Inc. | Electrical circuit component handler |
| JP3673589B2 (ja) | 1996-03-05 | 2005-07-20 | ローム株式会社 | コンデンサのリーク電流の測定方法およびその装置 |
| JP3663251B2 (ja) | 1996-03-07 | 2005-06-22 | ローム株式会社 | コンデンサのリーク電流の測定方法 |
| JP3233037B2 (ja) | 1996-08-26 | 2001-11-26 | 株式会社村田製作所 | 絶縁抵抗測定装置 |
| US6011403A (en) * | 1997-10-31 | 2000-01-04 | Credence Systems Corporation | Circuit arrangement for measuring leakage current utilizing a differential integrating capacitor |
| US6008630A (en) | 1998-07-02 | 1999-12-28 | Compact Computer Corporation | Soft-switched built-in active snubber circuit |
| DE19842470A1 (de) | 1998-09-16 | 2000-03-23 | Siemens Ag | Fehlerstrom-Schutzeinrichtung mit Überlastschutz |
| MY121524A (en) * | 1999-09-22 | 2006-01-28 | Murata Manufacturing Co | Insulation resistance measuring apparatus for capacitive electronic parts |
| JP2002311074A (ja) | 2001-04-09 | 2002-10-23 | Matsushita Electric Ind Co Ltd | コンデンサの漏れ電流測定方法 |
| US6897731B2 (en) | 2003-10-24 | 2005-05-24 | Texas Instruments Incorporated | Method and circuit for overload recovery of an amplifier |
| JP4310695B2 (ja) | 2004-03-30 | 2009-08-12 | アイシン精機株式会社 | 静電容量変化検出装置 |
| JP2007129533A (ja) * | 2005-11-04 | 2007-05-24 | New Japan Radio Co Ltd | トランスインピーダンスアンプ |
| KR101319155B1 (ko) | 2006-01-27 | 2013-10-17 | 루돌프 테크놀로지스 인코퍼레이티드 | 고속 캐패시터 누설량 측정 시스템들 및 방법들 |
| US7940058B2 (en) * | 2007-05-24 | 2011-05-10 | Electro Scientific Industries, Inc. | Capacitive measurements with fast recovery current return |
-
2008
- 2008-03-31 US US12/059,752 patent/US8054085B2/en not_active Expired - Fee Related
-
2009
- 2009-03-13 JP JP2011503017A patent/JP5498478B2/ja not_active Expired - Fee Related
- 2009-03-13 WO PCT/US2009/037062 patent/WO2009123845A1/en not_active Ceased
- 2009-03-13 KR KR1020107023169A patent/KR20100131490A/ko not_active Ceased
- 2009-03-13 CN CN2009801112124A patent/CN101981459B/zh not_active Expired - Fee Related
- 2009-03-30 TW TW098110508A patent/TWI439706B/zh not_active IP Right Cessation
-
2011
- 2011-11-08 US US13/291,758 patent/US8686739B2/en not_active Expired - Fee Related