JP2011508462A - 化学的機械的平坦化パッド - Google Patents
化学的機械的平坦化パッド Download PDFInfo
- Publication number
- JP2011508462A JP2011508462A JP2010541541A JP2010541541A JP2011508462A JP 2011508462 A JP2011508462 A JP 2011508462A JP 2010541541 A JP2010541541 A JP 2010541541A JP 2010541541 A JP2010541541 A JP 2010541541A JP 2011508462 A JP2011508462 A JP 2011508462A
- Authority
- JP
- Japan
- Prior art keywords
- pad
- chemical agent
- polishing
- polishing pad
- fiber
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000126 substance Substances 0.000 title claims abstract description 20
- 238000005498 polishing Methods 0.000 claims abstract description 62
- 239000013043 chemical agent Substances 0.000 claims abstract description 53
- 239000002245 particle Substances 0.000 claims abstract description 25
- 238000005054 agglomeration Methods 0.000 claims abstract description 10
- 230000002776 aggregation Effects 0.000 claims abstract description 10
- 239000011230 binding agent Substances 0.000 claims abstract description 10
- 238000000034 method Methods 0.000 claims description 34
- 229920002451 polyvinyl alcohol Polymers 0.000 claims description 31
- 239000004372 Polyvinyl alcohol Substances 0.000 claims description 25
- 239000000835 fiber Substances 0.000 claims description 18
- 239000000758 substrate Substances 0.000 claims description 9
- 230000007062 hydrolysis Effects 0.000 claims description 6
- 238000006460 hydrolysis reaction Methods 0.000 claims description 6
- 229920002689 polyvinyl acetate Polymers 0.000 claims description 5
- 239000011118 polyvinyl acetate Substances 0.000 claims description 5
- 239000002243 precursor Substances 0.000 claims description 3
- 239000003795 chemical substances by application Substances 0.000 claims 2
- 238000000465 moulding Methods 0.000 claims 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 8
- 239000004065 semiconductor Substances 0.000 description 8
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 6
- 239000007788 liquid Substances 0.000 description 6
- 239000011248 coating agent Substances 0.000 description 5
- 238000000576 coating method Methods 0.000 description 5
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 description 4
- 229910052581 Si3N4 Inorganic materials 0.000 description 4
- 238000005260 corrosion Methods 0.000 description 4
- 230000007797 corrosion Effects 0.000 description 4
- 239000003112 inhibitor Substances 0.000 description 4
- VCJMYUPGQJHHFU-UHFFFAOYSA-N iron(3+);trinitrate Chemical compound [Fe+3].[O-][N+]([O-])=O.[O-][N+]([O-])=O.[O-][N+]([O-])=O VCJMYUPGQJHHFU-UHFFFAOYSA-N 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 239000000377 silicon dioxide Substances 0.000 description 4
- 235000012239 silicon dioxide Nutrition 0.000 description 4
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 4
- 229920001730 Moisture cure polyurethane Polymers 0.000 description 3
- 150000001735 carboxylic acids Chemical class 0.000 description 3
- 230000002209 hydrophobic effect Effects 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- -1 triazole compounds Chemical class 0.000 description 3
- VHUUQVKOLVNVRT-UHFFFAOYSA-N Ammonium hydroxide Chemical compound [NH4+].[OH-] VHUUQVKOLVNVRT-UHFFFAOYSA-N 0.000 description 2
- 229910052684 Cerium Inorganic materials 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- 239000002202 Polyethylene glycol Substances 0.000 description 2
- 239000012670 alkaline solution Substances 0.000 description 2
- 239000000908 ammonium hydroxide Substances 0.000 description 2
- ZMIGMASIKSOYAM-UHFFFAOYSA-N cerium Chemical compound [Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce][Ce] ZMIGMASIKSOYAM-UHFFFAOYSA-N 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 239000002270 dispersing agent Substances 0.000 description 2
- GVGUFUZHNYFZLC-UHFFFAOYSA-N dodecyl benzenesulfonate;sodium Chemical compound [Na].CCCCCCCCCCCCOS(=O)(=O)C1=CC=CC=C1 GVGUFUZHNYFZLC-UHFFFAOYSA-N 0.000 description 2
- 230000003628 erosive effect Effects 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 150000002823 nitrates Chemical class 0.000 description 2
- 150000002895 organic esters Chemical class 0.000 description 2
- 239000007800 oxidant agent Substances 0.000 description 2
- 229920001223 polyethylene glycol Polymers 0.000 description 2
- 229940080264 sodium dodecylbenzenesulfonate Drugs 0.000 description 2
- 239000004094 surface-active agent Substances 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 239000000080 wetting agent Substances 0.000 description 2
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 1
- 235000021355 Stearic acid Nutrition 0.000 description 1
- 238000005299 abrasion Methods 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004090 dissolution Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- QIQXTHQIDYTFRH-UHFFFAOYSA-N octadecanoic acid Chemical compound CCCCCCCCCCCCCCCCCC(O)=O QIQXTHQIDYTFRH-UHFFFAOYSA-N 0.000 description 1
- OQCDKBAXFALNLD-UHFFFAOYSA-N octadecanoic acid Natural products CCCCCCCC(C)CCCCCCCCC(O)=O OQCDKBAXFALNLD-UHFFFAOYSA-N 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 229920005594 polymer fiber Polymers 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 239000002002 slurry Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
- 239000008117 stearic acid Substances 0.000 description 1
- 230000037303 wrinkles Effects 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/042—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D3/00—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
- B24D3/34—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents characterised by additives enhancing special physical properties, e.g. wear resistance, electric conductivity, self-cleaning properties
- B24D3/346—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents characterised by additives enhancing special physical properties, e.g. wear resistance, electric conductivity, self-cleaning properties utilised during polishing, or grinding operation
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US1787207P | 2007-12-31 | 2007-12-31 | |
| PCT/US2008/088669 WO2009088945A1 (en) | 2007-12-31 | 2008-12-31 | Chemical-mechanical planarization pad |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2011508462A true JP2011508462A (ja) | 2011-03-10 |
| JP2011508462A5 JP2011508462A5 (enExample) | 2012-02-16 |
Family
ID=40799064
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010541541A Pending JP2011508462A (ja) | 2007-12-31 | 2008-12-31 | 化学的機械的平坦化パッド |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US8172648B2 (enExample) |
| EP (1) | EP2242615A4 (enExample) |
| JP (1) | JP2011508462A (enExample) |
| KR (1) | KR101570732B1 (enExample) |
| WO (1) | WO2009088945A1 (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012517715A (ja) * | 2009-02-12 | 2012-08-02 | イノパッド,インコーポレイテッド | Cmpパッドにおける3次元ネットワーク |
| JP2020124801A (ja) * | 2015-10-16 | 2020-08-20 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 付加製造プロセスを用いて高機能研磨パッドを形成する方法及び装置 |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9873180B2 (en) | 2014-10-17 | 2018-01-23 | Applied Materials, Inc. | CMP pad construction with composite material properties using additive manufacturing processes |
| US10875153B2 (en) | 2014-10-17 | 2020-12-29 | Applied Materials, Inc. | Advanced polishing pad materials and formulations |
| US9776361B2 (en) | 2014-10-17 | 2017-10-03 | Applied Materials, Inc. | Polishing articles and integrated system and methods for manufacturing chemical mechanical polishing articles |
| US11745302B2 (en) | 2014-10-17 | 2023-09-05 | Applied Materials, Inc. | Methods and precursor formulations for forming advanced polishing pads by use of an additive manufacturing process |
| CN107078048B (zh) | 2014-10-17 | 2021-08-13 | 应用材料公司 | 使用加成制造工艺的具复合材料特性的cmp衬垫建构 |
| KR20230169424A (ko) | 2015-10-30 | 2023-12-15 | 어플라이드 머티어리얼스, 인코포레이티드 | 원하는 제타 전위를 가진 연마 제품을 형성하는 장치 및 방법 |
| US10593574B2 (en) | 2015-11-06 | 2020-03-17 | Applied Materials, Inc. | Techniques for combining CMP process tracking data with 3D printed CMP consumables |
| US10391605B2 (en) | 2016-01-19 | 2019-08-27 | Applied Materials, Inc. | Method and apparatus for forming porous advanced polishing pads using an additive manufacturing process |
| US11471999B2 (en) | 2017-07-26 | 2022-10-18 | Applied Materials, Inc. | Integrated abrasive polishing pads and manufacturing methods |
| WO2019032286A1 (en) | 2017-08-07 | 2019-02-14 | Applied Materials, Inc. | ABRASIVE DISTRIBUTION POLISHING PADS AND METHODS OF MAKING SAME |
| CN112654655A (zh) | 2018-09-04 | 2021-04-13 | 应用材料公司 | 先进抛光垫配方 |
| US11878389B2 (en) | 2021-02-10 | 2024-01-23 | Applied Materials, Inc. | Structures formed using an additive manufacturing process for regenerating surface texture in situ |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001047357A (ja) * | 1999-04-13 | 2001-02-20 | Freudenberg Nonwovens Lp | 研磨剤粒子を含むスラリーにより基板を化学機械研磨するために使用される研磨パッド |
| JP2002066908A (ja) * | 2000-08-29 | 2002-03-05 | Toray Ind Inc | 研磨用パッドおよび研磨装置ならびに研磨方法 |
| JP2002075934A (ja) * | 2000-08-29 | 2002-03-15 | Toray Ind Inc | 研磨用パッドおよび研磨装置ならびに研磨方法 |
| JP2003124166A (ja) * | 2001-10-18 | 2003-04-25 | Toray Ind Inc | 研磨パッドおよびそれを用いた研磨装置及び研磨方法 |
| US20050153643A1 (en) * | 2002-02-04 | 2005-07-14 | Simpson Alexander W. | Polyelectrolyte dispensing polishing pad |
| JP2007537050A (ja) * | 2004-05-11 | 2007-12-20 | フロイデンバーグ ノンウォウブンズ | 研磨用パッド |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4728552A (en) * | 1984-07-06 | 1988-03-01 | Rodel, Inc. | Substrate containing fibers of predetermined orientation and process of making the same |
| MY114512A (en) * | 1992-08-19 | 2002-11-30 | Rodel Inc | Polymeric substrate with polymeric microelements |
| US5958288A (en) | 1996-11-26 | 1999-09-28 | Cabot Corporation | Composition and slurry useful for metal CMP |
| US5759917A (en) | 1996-12-30 | 1998-06-02 | Cabot Corporation | Composition for oxide CMP |
| US6503418B2 (en) | 1999-11-04 | 2003-01-07 | Advanced Micro Devices, Inc. | Ta barrier slurry containing an organic additive |
| US6991528B2 (en) | 2000-02-17 | 2006-01-31 | Applied Materials, Inc. | Conductive polishing article for electrochemical mechanical polishing |
| US7579071B2 (en) * | 2002-09-17 | 2009-08-25 | Korea Polyol Co., Ltd. | Polishing pad containing embedded liquid microelements and method of manufacturing the same |
| US20040224622A1 (en) * | 2003-04-15 | 2004-11-11 | Jsr Corporation | Polishing pad and production method thereof |
| KR100741984B1 (ko) * | 2006-02-17 | 2007-07-23 | 삼성전자주식회사 | 화학기계적 연마 장치의 연마 패드 및 그의 제조방법 |
| US7754611B2 (en) * | 2006-02-28 | 2010-07-13 | Macronix International Co., Ltd. | Chemical mechanical polishing process |
| JP4990543B2 (ja) * | 2006-03-23 | 2012-08-01 | 富士フイルム株式会社 | 金属用研磨液 |
-
2008
- 2008-12-31 WO PCT/US2008/088669 patent/WO2009088945A1/en not_active Ceased
- 2008-12-31 EP EP08869230.6A patent/EP2242615A4/en not_active Withdrawn
- 2008-12-31 JP JP2010541541A patent/JP2011508462A/ja active Pending
- 2008-12-31 KR KR1020107015202A patent/KR101570732B1/ko active Active
- 2008-12-31 US US12/347,734 patent/US8172648B2/en not_active Expired - Fee Related
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001047357A (ja) * | 1999-04-13 | 2001-02-20 | Freudenberg Nonwovens Lp | 研磨剤粒子を含むスラリーにより基板を化学機械研磨するために使用される研磨パッド |
| JP2002066908A (ja) * | 2000-08-29 | 2002-03-05 | Toray Ind Inc | 研磨用パッドおよび研磨装置ならびに研磨方法 |
| JP2002075934A (ja) * | 2000-08-29 | 2002-03-15 | Toray Ind Inc | 研磨用パッドおよび研磨装置ならびに研磨方法 |
| JP2003124166A (ja) * | 2001-10-18 | 2003-04-25 | Toray Ind Inc | 研磨パッドおよびそれを用いた研磨装置及び研磨方法 |
| US20050153643A1 (en) * | 2002-02-04 | 2005-07-14 | Simpson Alexander W. | Polyelectrolyte dispensing polishing pad |
| JP2007537050A (ja) * | 2004-05-11 | 2007-12-20 | フロイデンバーグ ノンウォウブンズ | 研磨用パッド |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012517715A (ja) * | 2009-02-12 | 2012-08-02 | イノパッド,インコーポレイテッド | Cmpパッドにおける3次元ネットワーク |
| JP2020124801A (ja) * | 2015-10-16 | 2020-08-20 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 付加製造プロセスを用いて高機能研磨パッドを形成する方法及び装置 |
| JP7009542B2 (ja) | 2015-10-16 | 2022-01-25 | アプライド マテリアルズ インコーポレイテッド | 付加製造プロセスを用いて高機能研磨パッドを形成する方法及び装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| US8172648B2 (en) | 2012-05-08 |
| US20090170410A1 (en) | 2009-07-02 |
| EP2242615A4 (en) | 2013-10-30 |
| KR101570732B1 (ko) | 2015-11-20 |
| KR20100110325A (ko) | 2010-10-12 |
| EP2242615A1 (en) | 2010-10-27 |
| WO2009088945A1 (en) | 2009-07-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2011508462A (ja) | 化学的機械的平坦化パッド | |
| KR100597449B1 (ko) | 금속용 연마액 재료, 금속용 연마액, 그 제조방법 및그것을 사용한 연마방법 | |
| CN104471684B (zh) | 用于化学机械抛光的浆料和化学机械抛光方法 | |
| US20080034670A1 (en) | Chemically modified chemical mechanical polishing pad | |
| TWI413678B (zh) | 研磨液 | |
| TWI461517B (zh) | 研磨液組合及研磨方法 | |
| JPWO2000039844A1 (ja) | 金属用研磨液材料、金属用研磨液、その製造方法及びそれを用いた研磨方法 | |
| JP2008235357A (ja) | 化学的機械的研磨方法および半導体装置の製造方法 | |
| TW200426935A (en) | Chemical/mechanical polishing method for STI | |
| JP5322921B2 (ja) | Cmpスラリー用補助剤 | |
| EP3406684B1 (en) | Polishing composition and method for polishing silicon substrate | |
| JP2003529663A (ja) | アミノ酸含有組成物でのメモリ又は硬質ディスク表面の研磨方法 | |
| US7052373B1 (en) | Systems and slurries for chemical mechanical polishing | |
| JP2001139937A (ja) | 金属用研磨液及び研磨方法 | |
| JP5915842B2 (ja) | 化学機械研磨方法 | |
| TWI662096B (zh) | 具有改善之凹陷及圖案選擇性之對氧化物及氮化物有選擇性之cmp組成物 | |
| TWI303659B (en) | Capsulated abrasive composition and polishing pad using the same | |
| WO2013187358A1 (ja) | 研磨材組成物及びその製造方法 | |
| JP2001152135A (ja) | 化学機械研磨用水系分散体の製造方法 | |
| WO2014051104A1 (ja) | 研磨パッド | |
| TWI413679B (zh) | 研磨液 | |
| US20090053896A1 (en) | Copper polishing slurry | |
| JP2006282755A (ja) | 有機無機ハイブリッド粒子水性分散体及びそれから得られる研磨スラリー | |
| JP7765194B2 (ja) | 研磨パッド及びその製造方法 | |
| JP7718426B2 (ja) | 研磨液、研磨液セット及び研磨方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20111226 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20111226 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20130507 |
|
| A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20130712 |
|
| A602 | Written permission of extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A602 Effective date: 20130722 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20140311 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20140805 |