JP2011237311A - クロマトグラフ質量分析用データ処理装置 - Google Patents

クロマトグラフ質量分析用データ処理装置 Download PDF

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Publication number
JP2011237311A
JP2011237311A JP2010109890A JP2010109890A JP2011237311A JP 2011237311 A JP2011237311 A JP 2011237311A JP 2010109890 A JP2010109890 A JP 2010109890A JP 2010109890 A JP2010109890 A JP 2010109890A JP 2011237311 A JP2011237311 A JP 2011237311A
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mass spectrum
mass
spectrum
component
standard
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Japanese (ja)
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JP2011237311A5 (https=
Inventor
Katsuyuki Taneda
克行 種田
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Shimadzu Corp
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Shimadzu Corp
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Priority to JP2010109890A priority Critical patent/JP2011237311A/ja
Publication of JP2011237311A publication Critical patent/JP2011237311A/ja
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Priority to US13/659,237 priority patent/US20140012515A1/en
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    • GPHYSICS
    • G16INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR SPECIFIC APPLICATION FIELDS
    • G16CCOMPUTATIONAL CHEMISTRY; CHEMOINFORMATICS; COMPUTATIONAL MATERIALS SCIENCE
    • G16C20/00Chemoinformatics, i.e. ICT specially adapted for the handling of physicochemical or structural data of chemical particles, elements, compounds or mixtures
    • G16C20/80Data visualisation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02Column chromatography
    • G01N30/86Signal analysis
    • G01N30/8624Detection of slopes or peaks; baseline correction
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02Column chromatography
    • G01N30/86Signal analysis
    • G01N30/8675Evaluation, i.e. decoding of the signal into analytical information
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/0027Methods for using particle spectrometers
    • H01J49/0036Step by step routines describing the handling of the data generated during a measurement
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02Column chromatography
    • G01N30/62Detectors specially adapted therefor
    • G01N30/72Mass spectrometers
    • GPHYSICS
    • G16INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR SPECIFIC APPLICATION FIELDS
    • G16CCOMPUTATIONAL CHEMISTRY; CHEMOINFORMATICS; COMPUTATIONAL MATERIALS SCIENCE
    • G16C20/00Chemoinformatics, i.e. ICT specially adapted for the handling of physicochemical or structural data of chemical particles, elements, compounds or mixtures
    • G16C20/20Identification of molecular entities, parts thereof or of chemical compositions

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  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Library & Information Science (AREA)
  • Data Mining & Analysis (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Computing Systems (AREA)
  • Theoretical Computer Science (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2010109890A 2010-05-05 2010-05-12 クロマトグラフ質量分析用データ処理装置 Pending JP2011237311A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2010109890A JP2011237311A (ja) 2010-05-12 2010-05-12 クロマトグラフ質量分析用データ処理装置
US13/659,237 US20140012515A1 (en) 2010-05-05 2012-10-24 Chromatograph mass spectrometry data processing device

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JP2010109890A JP2011237311A (ja) 2010-05-12 2010-05-12 クロマトグラフ質量分析用データ処理装置

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JP2011237311A true JP2011237311A (ja) 2011-11-24
JP2011237311A5 JP2011237311A5 (https=) 2012-09-20

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Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013234859A (ja) * 2012-05-07 2013-11-21 Shimadzu Corp クロマトグラフ質量分析用データ処理装置
JP2016095253A (ja) * 2014-11-17 2016-05-26 株式会社島津製作所 クロマトグラフ質量分析データ処理装置
JP2017026349A (ja) * 2015-07-16 2017-02-02 日本電子株式会社 スペクトル表示装置及びスペクトル表示方法
WO2017042917A1 (ja) * 2015-09-09 2017-03-16 株式会社島津製作所 分析データ解析装置及び分析データ解析用プログラム
US9754394B2 (en) 2014-12-17 2017-09-05 Shimadzu Corporation Analytical data display processing device
JP2018010014A (ja) * 2017-10-04 2018-01-18 株式会社島津製作所 クロマトグラフ質量分析装置用データ処理装置
JP2020201148A (ja) * 2019-06-11 2020-12-17 株式会社島津製作所 分析装置及びx線回折装置

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6020314B2 (ja) * 2013-04-04 2016-11-02 株式会社島津製作所 クロマトグラフ質量分析データ処理装置
AU2015231494A1 (en) * 2014-03-17 2016-09-01 MLS ACQ, Inc. D/B/A MAX Analyical Technologies Process and system for rapid sample analysis
WO2016002047A1 (ja) * 2014-07-03 2016-01-07 株式会社島津製作所 質量分析データ処理装置
GB201500377D0 (en) 2015-01-09 2015-02-25 Micromass Ltd Lock mass using chromatographic peaks
WO2017094170A1 (ja) * 2015-12-03 2017-06-08 株式会社島津製作所 ピーク検出方法及びデータ処理装置
JP7249976B2 (ja) * 2020-10-08 2023-03-31 日本電子株式会社 マススペクトル処理装置及び方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05164751A (ja) * 1991-12-19 1993-06-29 Shimadzu Corp クロマトグラフ/質量分析計用データ処理装置
JPH10318983A (ja) * 1997-05-16 1998-12-04 Hitachi Ltd 質量分析方法及び質量分析装置
WO2009025004A1 (ja) * 2007-08-10 2009-02-26 Shimadzu Corporation データ解析システム

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5744824A (en) * 1980-09-01 1982-03-13 Hitachi Ltd Spectrum display device
US6573492B2 (en) * 1999-12-27 2003-06-03 Hitachi, Ltd. Mass spectrometric analysis method and apparatus using the method
US8058417B2 (en) * 2006-11-27 2011-11-15 Robert Belas Biosynthetic pathway and genes required for tropodithietic acid biosynthesis in silicibacter TM1040
JP4602374B2 (ja) * 2007-03-30 2010-12-22 株式会社日立ハイテクノロジーズ クロマトグラフィー質量分析方法、及びクロマトグラフ質量分析装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05164751A (ja) * 1991-12-19 1993-06-29 Shimadzu Corp クロマトグラフ/質量分析計用データ処理装置
JPH10318983A (ja) * 1997-05-16 1998-12-04 Hitachi Ltd 質量分析方法及び質量分析装置
WO2009025004A1 (ja) * 2007-08-10 2009-02-26 Shimadzu Corporation データ解析システム

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013234859A (ja) * 2012-05-07 2013-11-21 Shimadzu Corp クロマトグラフ質量分析用データ処理装置
US10607722B2 (en) 2012-05-07 2020-03-31 Shimadzu Co. Data-processing for chromatographic mass spectrometry
JP2016095253A (ja) * 2014-11-17 2016-05-26 株式会社島津製作所 クロマトグラフ質量分析データ処理装置
US9754394B2 (en) 2014-12-17 2017-09-05 Shimadzu Corporation Analytical data display processing device
JP2017026349A (ja) * 2015-07-16 2017-02-02 日本電子株式会社 スペクトル表示装置及びスペクトル表示方法
WO2017042917A1 (ja) * 2015-09-09 2017-03-16 株式会社島津製作所 分析データ解析装置及び分析データ解析用プログラム
CN108027345A (zh) * 2015-09-09 2018-05-11 株式会社岛津制作所 分析数据解析装置以及分析数据解析用程序
JPWO2017042917A1 (ja) * 2015-09-09 2018-05-17 株式会社島津製作所 分析データ解析装置及び分析データ解析用プログラム
CN108027345B (zh) * 2015-09-09 2021-02-09 株式会社岛津制作所 分析数据解析装置以及分析数据解析用程序
JP2018010014A (ja) * 2017-10-04 2018-01-18 株式会社島津製作所 クロマトグラフ質量分析装置用データ処理装置
JP2020201148A (ja) * 2019-06-11 2020-12-17 株式会社島津製作所 分析装置及びx線回折装置
JP7163874B2 (ja) 2019-06-11 2022-11-01 株式会社島津製作所 分析装置及びx線回折装置

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