JP2011106975A5 - - Google Patents

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Publication number
JP2011106975A5
JP2011106975A5 JP2009262468A JP2009262468A JP2011106975A5 JP 2011106975 A5 JP2011106975 A5 JP 2011106975A5 JP 2009262468 A JP2009262468 A JP 2009262468A JP 2009262468 A JP2009262468 A JP 2009262468A JP 2011106975 A5 JP2011106975 A5 JP 2011106975A5
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JP
Japan
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JP2009262468A
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JP2011106975A (ja
JP4968965B2 (ja
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Priority to JP2009262468A priority Critical patent/JP4968965B2/ja
Priority claimed from JP2009262468A external-priority patent/JP4968965B2/ja
Priority to KR1020100110789A priority patent/KR101226088B1/ko
Priority to CN201010543240.8A priority patent/CN102062677B/zh
Priority to US12/949,024 priority patent/US8310664B2/en
Publication of JP2011106975A publication Critical patent/JP2011106975A/ja
Publication of JP2011106975A5 publication Critical patent/JP2011106975A5/ja
Application granted granted Critical
Publication of JP4968965B2 publication Critical patent/JP4968965B2/ja
Expired - Fee Related legal-status Critical Current
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JP2009262468A 2009-11-18 2009-11-18 屈折率分布の計測方法および計測装置 Expired - Fee Related JP4968965B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2009262468A JP4968965B2 (ja) 2009-11-18 2009-11-18 屈折率分布の計測方法および計測装置
KR1020100110789A KR101226088B1 (ko) 2009-11-18 2010-11-09 굴절률 분포의 계측방법 및 계측장치
CN201010543240.8A CN102062677B (zh) 2009-11-18 2010-11-15 折射率分布测量方法和折射率分布测量装置
US12/949,024 US8310664B2 (en) 2009-11-18 2010-11-18 Refractive index distribution measuring method and refractive index distribution measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009262468A JP4968965B2 (ja) 2009-11-18 2009-11-18 屈折率分布の計測方法および計測装置

Publications (3)

Publication Number Publication Date
JP2011106975A JP2011106975A (ja) 2011-06-02
JP2011106975A5 true JP2011106975A5 (ja) 2011-11-10
JP4968965B2 JP4968965B2 (ja) 2012-07-04

Family

ID=43998051

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009262468A Expired - Fee Related JP4968965B2 (ja) 2009-11-18 2009-11-18 屈折率分布の計測方法および計測装置

Country Status (4)

Country Link
US (1) US8310664B2 (ja)
JP (1) JP4968965B2 (ja)
KR (1) KR101226088B1 (ja)
CN (1) CN102062677B (ja)

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Publication number Priority date Publication date Assignee Title
JP5021054B2 (ja) * 2010-05-25 2012-09-05 キヤノン株式会社 屈折率分布計測方法および屈折率分布計測装置
US20120133958A1 (en) 2010-11-30 2012-05-31 Widman Michael F Laser confocal sensor metrology system
GB201107053D0 (en) 2011-04-27 2011-06-08 Univ Sheffield Improvements in providing image data
JP5868142B2 (ja) * 2011-11-24 2016-02-24 キヤノン株式会社 屈折率分布測定方法および屈折率分布測定装置
GB201201140D0 (en) 2012-01-24 2012-03-07 Phase Focus Ltd Method and apparatus for determining object characteristics
WO2013119460A1 (en) * 2012-02-07 2013-08-15 Bausch & Lomb Incorporated Aberrometer for measuring parameters of a lens using multiple point sources of light
JP5575161B2 (ja) * 2012-02-10 2014-08-20 キヤノン株式会社 屈折率分布計測方法および屈折率分布計測装置
WO2013119775A1 (en) * 2012-02-10 2013-08-15 Johnson & Johnson Vision Care, Inc. Method and apparatus for determining a thickness profile of an ophthalmic lens using a single point thickness and refractive index measurements
JP5868227B2 (ja) * 2012-03-12 2016-02-24 キヤノン株式会社 屈折率計測方法および屈折率計測装置
JP2014016253A (ja) * 2012-07-09 2014-01-30 Canon Inc 屈折率分布計測方法、光学素子の製造方法、および、屈折率分布計測装置
JP6157240B2 (ja) * 2013-06-28 2017-07-05 キヤノン株式会社 屈折率計測方法、屈折率計測装置および光学素子の製造方法
JP2016223982A (ja) * 2015-06-02 2016-12-28 キヤノン株式会社 計測方法、計測装置、光学素子の製造方法
US10634864B2 (en) 2017-05-30 2020-04-28 Panduit Corp. Channel equalization enclosure
CN110687074A (zh) * 2019-10-28 2020-01-14 华中科技大学 一种基于波前传感器的光学制件均匀性检测装置与方法
CN110779693B (zh) * 2019-11-11 2021-02-19 四川大学 双棱镜材质折射率的测量方法
CN211857087U (zh) * 2020-02-24 2020-11-03 宁波激智科技股份有限公司 一种减干涉准直膜
WO2023042346A1 (ja) * 2021-09-16 2023-03-23 株式会社東芝 光学装置、情報処理方法、および、プログラム

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JPS57211504A (en) * 1981-06-24 1982-12-25 Canon Inc Observation member for talbot interferometer
JPS5816216A (ja) * 1981-07-22 1983-01-29 Canon Inc タルボ干渉計
IT1155285B (it) * 1982-02-10 1987-01-28 Cselt Centro Studi Lab Telecom Procedimento e apparecchiatura per la determinazione del profilo d'indice di rifrazione di fibre ottiche e preforme per fibre ottiche
JPS6170436A (ja) * 1984-09-14 1986-04-11 Univ Kyoto 円柱内屈折率分布測定方法
US5151752A (en) * 1988-06-16 1992-09-29 Asahi Kogaku Kogyo K.K. Method of measuring refractive indices of lens and sample liquid
JP2678463B2 (ja) 1988-06-16 1997-11-17 旭光学工業株式会社 屈折率測定方法
JP2678464B2 (ja) * 1988-06-27 1997-11-17 旭光学工業株式会社 屈折率測定方法
JP3264469B2 (ja) * 1993-12-07 2002-03-11 富士写真フイルム株式会社 光散乱媒体の屈折率分布情報の計測装置
JP3287517B2 (ja) * 1994-06-29 2002-06-04 富士写真光機株式会社 干渉縞による測定方法および装置
JP3252708B2 (ja) * 1995-05-31 2002-02-04 キヤノン株式会社 光学素子及びそれを用いた走査光学装置
JP3699810B2 (ja) * 1997-07-29 2005-09-28 株式会社リコー 屈折率分布の測定方法及び装置
JP2001343604A (ja) * 2000-05-31 2001-12-14 Ricoh Co Ltd 光走査用レンズ・光走査装置および画像形成装置
JP4594114B2 (ja) 2005-01-19 2010-12-08 キヤノン株式会社 画像処理装置および屈折率分布測定装置
JP5450975B2 (ja) * 2008-04-10 2014-03-26 キヤノン株式会社 測定装置および測定方法

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