JP2011099819A - 電気特性測定基板 - Google Patents
電気特性測定基板 Download PDFInfo
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- JP2011099819A JP2011099819A JP2009256093A JP2009256093A JP2011099819A JP 2011099819 A JP2011099819 A JP 2011099819A JP 2009256093 A JP2009256093 A JP 2009256093A JP 2009256093 A JP2009256093 A JP 2009256093A JP 2011099819 A JP2011099819 A JP 2011099819A
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- main surface
- substrate
- ground electrode
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/08—Measuring resistance by measuring both voltage and current
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
- G01R1/24—Transmission-line, e.g. waveguide, measuring sections, e.g. slotted section
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
- Structure Of Printed Boards (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
【解決手段】電気特性測定基板1は複数の誘電体層を積層してなり、表主面にコプレーナライン14A〜14Dを備え、裏主面にコプレーナライン24A〜24Dを備え、誘電体層間に層間アース電極3A,3Bを備える。コプレーナライン14A〜14Dの第一端が集まって構成される表主面の部品搭載電極12と、コプレーナライン24A〜24Dの第一端が集まって構成される裏主面の部品搭載電極22とは、表主面法線方向から見て、互いに同一パターン、且つ、それぞれ表主面または裏主面の中心線に対して非線対称形な電極パターンである。
【選択図】 図2
Description
2…底面基板
3,3A,3B,3C…層間アース電極
7…ビア電極
12…部品搭載電極
14A〜14D,24A〜24D…コプレーナライン
15…表主面アース電極
22,64D…部品搭載電極
25…裏主面アース電極
30A,30B…電子部品
31…同軸コネクタ
57A…外側ビア電極
59…ハンダ
64A,64B…ストリップライン
64C…コネクタ接続電極
Claims (5)
- 複数の誘電体層を積層してなる基板と、
前記基板の表主面に設けた、電子部品を実装するための表主面部品搭載電極と、
前記基板の裏主面に設けた、電子部品を実装するための裏主面部品搭載電極と、
を備え、
前記表主面部品搭載電極と前記裏主面部品搭載電極とは、表主面法線方向または裏主面法線方向から見て、互いに同一パターン、且つ、それぞれ主面中心線に対して非線対称形で形成されることを特徴とする電気特性測定基板。 - 前記基板の誘電体層間に設けた層間アース電極と、
前記層間アース電極よりも前記基板の表主面側に設け、前記表主面部品搭載電極に接続した複数の表主面側線路と、
前記層間アース電極よりも前記基板の裏主面側に設け、前記裏主面部品搭載電極に接続した複数の裏主面側線路と、を備え、
前記複数の表主面側線路と前記複数の裏主面側線路とは、表主面法線方向または裏主面法線方向から見て、互いに同一パターンで形成される、請求項1に記載の電気特性測定基板。 - 前記表主面側線路に対向する第1の層間アース電極と、前記裏主面側線路に対向する第2の層間アース電極と、を異なる誘電体層間に備える、請求項2に記載の電気特性測定基板。
- 前記第1の層間アース電極と前記第2の層間アース電極との間に介在する層間アース電極を、さらに備える請求項3に記載の電気特性測定基板。
- 前記表主面側線路および前記裏主面側線路は、前記基板の表主面または裏主面に設けられ、
前記表主面側線路および前記裏主面側線路の脇に設けられる主面アース電極と、前記主面アース電極と前記層間アース電極とを導通するビア電極とをさらに備える、請求項1〜4のいずれかに記載の電気特性測定基板。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009256093A JP5024356B2 (ja) | 2009-11-09 | 2009-11-09 | 電気特性測定基板 |
EP10188204.1A EP2320239B1 (en) | 2009-11-09 | 2010-10-20 | Substrate for use in measuring electric characteristics |
KR1020100105946A KR101166645B1 (ko) | 2009-11-09 | 2010-10-28 | 전기특성 측정기판 |
US12/913,845 US8698514B2 (en) | 2009-11-09 | 2010-10-28 | Electrical characteristic measuring substrate |
CN201010529797.6A CN102095901B (zh) | 2009-11-09 | 2010-10-28 | 电特性测试基板 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009256093A JP5024356B2 (ja) | 2009-11-09 | 2009-11-09 | 電気特性測定基板 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2011099819A true JP2011099819A (ja) | 2011-05-19 |
JP5024356B2 JP5024356B2 (ja) | 2012-09-12 |
Family
ID=43602954
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2009256093A Active JP5024356B2 (ja) | 2009-11-09 | 2009-11-09 | 電気特性測定基板 |
Country Status (5)
Country | Link |
---|---|
US (1) | US8698514B2 (ja) |
EP (1) | EP2320239B1 (ja) |
JP (1) | JP5024356B2 (ja) |
KR (1) | KR101166645B1 (ja) |
CN (1) | CN102095901B (ja) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH1183936A (ja) * | 1997-09-08 | 1999-03-26 | Oki Electric Ind Co Ltd | 素子評価回路 |
JP2004340909A (ja) * | 2003-05-12 | 2004-12-02 | Arumotech Corp | 接触端子 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63136657A (ja) * | 1986-11-28 | 1988-06-08 | Toshiba Corp | 両面実装電子回路ユニツト |
DE3703030A1 (de) * | 1987-02-02 | 1988-09-08 | Siemens Ag | Testanordnung fuer hochgeschwindigkeits-ic |
JP2929948B2 (ja) * | 1994-09-20 | 1999-08-03 | 三菱電機株式会社 | プローブ式テストハンドラー及びそれを用いたicのテスト方法 |
JPH11112152A (ja) | 1997-10-03 | 1999-04-23 | Matsushita Electric Ind Co Ltd | フリップチップ実装の多層プリント基板 |
JPH11330292A (ja) * | 1998-05-11 | 1999-11-30 | Mitsubishi Heavy Ind Ltd | 多層基板 |
JP4349600B2 (ja) * | 2000-04-20 | 2009-10-21 | 大日本印刷株式会社 | 積層体、絶縁フィルム、電子回路及び積層体の製造方法 |
JP3792613B2 (ja) | 2002-06-27 | 2006-07-05 | 京セラ株式会社 | 高周波特性評価用基板ならびに測定方法 |
JP2006115429A (ja) | 2004-10-18 | 2006-04-27 | Murata Mfg Co Ltd | 高周波回路、高周波モジュールおよび通信装置 |
CN100504419C (zh) | 2005-06-20 | 2009-06-24 | 中国科学院半导体研究所 | 一种热光开关阵列光电特性测试装置及方法 |
JP5003359B2 (ja) * | 2007-08-31 | 2012-08-15 | 日本電気株式会社 | プリント配線基板 |
JP4839362B2 (ja) * | 2008-11-14 | 2011-12-21 | ホシデン株式会社 | 高周波回路モジュール |
-
2009
- 2009-11-09 JP JP2009256093A patent/JP5024356B2/ja active Active
-
2010
- 2010-10-20 EP EP10188204.1A patent/EP2320239B1/en active Active
- 2010-10-28 KR KR1020100105946A patent/KR101166645B1/ko active IP Right Grant
- 2010-10-28 US US12/913,845 patent/US8698514B2/en active Active
- 2010-10-28 CN CN201010529797.6A patent/CN102095901B/zh active Active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH1183936A (ja) * | 1997-09-08 | 1999-03-26 | Oki Electric Ind Co Ltd | 素子評価回路 |
JP2004340909A (ja) * | 2003-05-12 | 2004-12-02 | Arumotech Corp | 接触端子 |
Also Published As
Publication number | Publication date |
---|---|
JP5024356B2 (ja) | 2012-09-12 |
US20110109332A1 (en) | 2011-05-12 |
EP2320239A3 (en) | 2012-07-25 |
CN102095901A (zh) | 2011-06-15 |
EP2320239A2 (en) | 2011-05-11 |
KR101166645B1 (ko) | 2012-07-18 |
KR20110051140A (ko) | 2011-05-17 |
EP2320239B1 (en) | 2013-07-31 |
CN102095901B (zh) | 2013-06-12 |
US8698514B2 (en) | 2014-04-15 |
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