JP2011029653A5 - - Google Patents
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- Publication number
- JP2011029653A5 JP2011029653A5 JP2010211817A JP2010211817A JP2011029653A5 JP 2011029653 A5 JP2011029653 A5 JP 2011029653A5 JP 2010211817 A JP2010211817 A JP 2010211817A JP 2010211817 A JP2010211817 A JP 2010211817A JP 2011029653 A5 JP2011029653 A5 JP 2011029653A5
- Authority
- JP
- Japan
- Prior art keywords
- contaminant
- trap
- platelets
- traps
- central zone
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000356 contaminant Substances 0.000 claims 33
- 230000005855 radiation Effects 0.000 claims 11
- 230000002093 peripheral effect Effects 0.000 claims 6
- 238000005286 illumination Methods 0.000 claims 4
- 238000000059 patterning Methods 0.000 claims 4
- 230000003287 optical effect Effects 0.000 claims 1
- 238000011144 upstream manufacturing Methods 0.000 claims 1
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/944,422 US7161653B2 (en) | 2004-09-20 | 2004-09-20 | Lithographic apparatus having a contaminant trapping system, a contamination trapping system, a device manufacturing method, and a method for improving trapping of contaminants in a lithographic apparatus |
| US10/944,422 | 2004-09-20 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007532268A Division JP5005544B2 (ja) | 2004-09-20 | 2005-09-19 | 汚染物トラップシステムを有するリソグラフィ装置、汚染物トラップシステム及びデバイス製造方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2011029653A JP2011029653A (ja) | 2011-02-10 |
| JP2011029653A5 true JP2011029653A5 (enExample) | 2012-09-06 |
| JP5249296B2 JP5249296B2 (ja) | 2013-07-31 |
Family
ID=35677316
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007532268A Expired - Fee Related JP5005544B2 (ja) | 2004-09-20 | 2005-09-19 | 汚染物トラップシステムを有するリソグラフィ装置、汚染物トラップシステム及びデバイス製造方法 |
| JP2010211817A Expired - Fee Related JP5249296B2 (ja) | 2004-09-20 | 2010-09-22 | 汚染物トラップシステム及び汚染物トラップシステムを有するリソグラフィ装置 |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007532268A Expired - Fee Related JP5005544B2 (ja) | 2004-09-20 | 2005-09-19 | 汚染物トラップシステムを有するリソグラフィ装置、汚染物トラップシステム及びデバイス製造方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US7161653B2 (enExample) |
| JP (2) | JP5005544B2 (enExample) |
| TW (1) | TWI327256B (enExample) |
| WO (1) | WO2006049489A1 (enExample) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7368733B2 (en) * | 2006-03-30 | 2008-05-06 | Asml Netherlands B.V. | Contamination barrier and lithographic apparatus comprising same |
| US7889312B2 (en) * | 2006-09-22 | 2011-02-15 | Asml Netherlands B.V. | Apparatus comprising a rotating contaminant trap |
| US8227771B2 (en) * | 2007-07-23 | 2012-07-24 | Asml Netherlands B.V. | Debris prevention system and lithographic apparatus |
| US7700930B2 (en) * | 2007-09-14 | 2010-04-20 | Asml Netherlands B.V. | Lithographic apparatus with rotation filter device |
| JP5577351B2 (ja) * | 2008-12-22 | 2014-08-20 | エーエスエムエル ネザーランズ ビー.ブイ. | リソグラフィ装置および放射システム |
| JP5355115B2 (ja) * | 2009-01-30 | 2013-11-27 | 株式会社東芝 | 極端紫外光光源装置及びその調整方法 |
| US9753383B2 (en) * | 2012-06-22 | 2017-09-05 | Asml Netherlands B.V. | Radiation source and lithographic apparatus |
| KR102813711B1 (ko) | 2019-05-02 | 2025-05-29 | 삼성전자주식회사 | 반도체 소자의 제조 장치 및 그를 이용한 반도체 소자의 제조 방법 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| NL1008352C2 (nl) | 1998-02-19 | 1999-08-20 | Stichting Tech Wetenschapp | Inrichting, geschikt voor extreem ultraviolet lithografie, omvattende een stralingsbron en een verwerkingsorgaan voor het verwerken van de van de stralingsbron afkomstige straling, alsmede een filter voor het onderdrukken van ongewenste atomaire en microscopische deeltjes welke door een stralingsbron zijn uitgezonden. |
| EP1223468B1 (en) | 2001-01-10 | 2008-07-02 | ASML Netherlands B.V. | Lithographic projection apparatus and device manufacturing method |
| JP2003022950A (ja) | 2001-07-05 | 2003-01-24 | Canon Inc | X線光源用デブリ除去装置及び、デブリ除去装置を用いた露光装置 |
| DE10138284A1 (de) * | 2001-08-10 | 2003-02-27 | Zeiss Carl | Beleuchtungssystem mit genesteten Kollektoren |
| JP2005505945A (ja) * | 2001-10-12 | 2005-02-24 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | リソグラフィック装置及びデバイス製造方法 |
| JP4115913B2 (ja) * | 2002-08-23 | 2008-07-09 | エーエスエムエル ネザーランズ ビー.ブイ. | リソグラフィ投影装置及び前記装置で使用する微粒子バリヤ |
| TWI230847B (en) * | 2002-12-23 | 2005-04-11 | Asml Netherlands Bv | Contamination barrier with expandable lamellas |
-
2004
- 2004-09-20 US US10/944,422 patent/US7161653B2/en not_active Expired - Fee Related
-
2005
- 2005-09-19 WO PCT/NL2005/000680 patent/WO2006049489A1/en not_active Ceased
- 2005-09-19 JP JP2007532268A patent/JP5005544B2/ja not_active Expired - Fee Related
- 2005-09-20 TW TW094132537A patent/TWI327256B/zh not_active IP Right Cessation
-
2010
- 2010-09-22 JP JP2010211817A patent/JP5249296B2/ja not_active Expired - Fee Related
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