JP2011028465A5 - - Google Patents

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Publication number
JP2011028465A5
JP2011028465A5 JP2009172676A JP2009172676A JP2011028465A5 JP 2011028465 A5 JP2011028465 A5 JP 2011028465A5 JP 2009172676 A JP2009172676 A JP 2009172676A JP 2009172676 A JP2009172676 A JP 2009172676A JP 2011028465 A5 JP2011028465 A5 JP 2011028465A5
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JP
Japan
Prior art keywords
logic
logic cones
order
cones
netlist
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2009172676A
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English (en)
Japanese (ja)
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JP2011028465A (ja
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Publication date
Application filed filed Critical
Priority to JP2009172676A priority Critical patent/JP2011028465A/ja
Priority claimed from JP2009172676A external-priority patent/JP2011028465A/ja
Priority to US12/825,848 priority patent/US8266573B2/en
Publication of JP2011028465A publication Critical patent/JP2011028465A/ja
Publication of JP2011028465A5 publication Critical patent/JP2011028465A5/ja
Pending legal-status Critical Current

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JP2009172676A 2009-07-24 2009-07-24 テストポイント挿入方法 Pending JP2011028465A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2009172676A JP2011028465A (ja) 2009-07-24 2009-07-24 テストポイント挿入方法
US12/825,848 US8266573B2 (en) 2009-07-24 2010-06-29 Method and system for test point insertion

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009172676A JP2011028465A (ja) 2009-07-24 2009-07-24 テストポイント挿入方法

Publications (2)

Publication Number Publication Date
JP2011028465A JP2011028465A (ja) 2011-02-10
JP2011028465A5 true JP2011028465A5 (enExample) 2012-03-29

Family

ID=43498325

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009172676A Pending JP2011028465A (ja) 2009-07-24 2009-07-24 テストポイント挿入方法

Country Status (2)

Country Link
US (1) US8266573B2 (enExample)
JP (1) JP2011028465A (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5899781B2 (ja) * 2011-10-11 2016-04-06 富士通株式会社 設計支援装置、設計支援方法および設計支援プログラム
JP6036134B2 (ja) * 2012-10-05 2016-11-30 富士通株式会社 設計支援装置、設計支援方法、および設計支援プログラム
TWI509408B (zh) * 2013-01-23 2015-11-21 Realtek Semiconductor Corp 死結偵測方法以及機器可讀媒體
EP3081509A4 (en) * 2013-12-09 2017-08-30 Fuji Seal International, Inc. Pouch container and method for manufacturing pouch container
CN105631077B (zh) 2014-11-07 2020-05-15 恩智浦美国有限公司 具有增大的故障覆盖率的集成电路
US11947887B1 (en) * 2022-09-27 2024-04-02 Cadence Design Systems, Inc. Test-point flop sharing with improved testability in a circuit design

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3777129A (en) * 1972-05-22 1973-12-04 Gte Automatic Electric Lab Inc Fault detection and localization in digital systems
US5225771A (en) * 1988-05-16 1993-07-06 Dri Technology Corp. Making and testing an integrated circuit using high density probe points
JP2000250946A (ja) * 1999-02-25 2000-09-14 Toshiba Corp Ｌｓｉ回路のテスト容易化設計方法および装置ならびにテスト容易化設計処理プログラムを記録したコンピュータ読取り可能な記録媒体
JP2004185550A (ja) * 2002-12-06 2004-07-02 Matsushita Electric Ind Co Ltd 半導体集積回路のテスト容易化設計方法および装置
JP2005135226A (ja) * 2003-10-31 2005-05-26 Matsushita Electric Ind Co Ltd 半導体集積回路のテスト回路挿入方法及び装置
JP4541196B2 (ja) * 2005-03-15 2010-09-08 富士通株式会社 故障検出改善装置、故障検出改善プログラム、故障検出改善方法
US7376875B2 (en) * 2005-07-14 2008-05-20 International Business Machines Corporation Method of improving logical built-in self test (LBIST) AC fault isolations
US7562321B2 (en) * 2005-12-12 2009-07-14 Nec Laboratories America, Inc. Method and apparatus for structured ASIC test point insertion

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