JP2010530474A - 単一の有機金属化学気相蒸着工程によるi−iii−vi2化合物薄膜の製造方法 - Google Patents
単一の有機金属化学気相蒸着工程によるi−iii−vi2化合物薄膜の製造方法 Download PDFInfo
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- JP2010530474A JP2010530474A JP2009553506A JP2009553506A JP2010530474A JP 2010530474 A JP2010530474 A JP 2010530474A JP 2009553506 A JP2009553506 A JP 2009553506A JP 2009553506 A JP2009553506 A JP 2009553506A JP 2010530474 A JP2010530474 A JP 2010530474A
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- iii
- thin film
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- vapor deposition
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/46—Sulfur-, selenium- or tellurium-containing compounds
-
- H01L21/205—
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02367—Substrates
- H01L21/0237—Materials
- H01L21/02422—Non-crystalline insulating materials, e.g. glass, polymers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02568—Chalcogenide semiconducting materials not being oxides, e.g. ternary compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/12—Active materials
- H10F77/126—Active materials comprising only Group I-III-VI chalcopyrite materials, e.g. CuInSe2, CuGaSe2 or CuInGaSe2 [CIGS]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K99/00—Subject matter not provided for in other groups of this subclass
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/541—CuInSe2 material PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Materials Engineering (AREA)
- Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Photovoltaic Devices (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020070024682A KR100857227B1 (ko) | 2007-03-13 | 2007-03-13 | 단일 유기금속 화학기상 증착 공정에 의한 ⅰ-ⅲ-ⅵ2화합물 박막의 제조방법 |
| PCT/KR2008/001041 WO2008111738A1 (en) | 2007-03-13 | 2008-02-22 | Method for fabricating 1-3-6 2 compound thin film using single metal-organic chemical vapor deposition process |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2010530474A true JP2010530474A (ja) | 2010-09-09 |
| JP2010530474A5 JP2010530474A5 (enExample) | 2010-10-21 |
Family
ID=39759657
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009553506A Ceased JP2010530474A (ja) | 2007-03-13 | 2008-02-22 | 単一の有機金属化学気相蒸着工程によるi−iii−vi2化合物薄膜の製造方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20100098856A1 (enExample) |
| EP (1) | EP2126964A1 (enExample) |
| JP (1) | JP2010530474A (enExample) |
| KR (1) | KR100857227B1 (enExample) |
| CN (1) | CN101632154B (enExample) |
| WO (1) | WO2008111738A1 (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2018100429A (ja) * | 2016-12-19 | 2018-06-28 | 富士通株式会社 | 層状カルコゲナイド膜の形成方法及び半導体装置の製造方法 |
| JP2019502265A (ja) * | 2016-01-13 | 2019-01-24 | メカロ カンパニー リミテッドMecaro Co.,Ltd. | Cigs光吸収層を含む太陽電池及びその製造方法 |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100982475B1 (ko) * | 2008-09-29 | 2010-09-15 | 주식회사 쎄믹스 | 광 흡수용 화합물 박막 제조방법 |
| TWI373851B (en) * | 2008-11-25 | 2012-10-01 | Nexpower Technology Corp | Stacked-layered thin film solar cell and manufacturing method thereof |
| KR101071545B1 (ko) * | 2008-12-30 | 2011-10-11 | 주식회사 메카로닉스 | Cigs 박막 제조방법 |
| CN102652367B (zh) * | 2010-01-29 | 2015-01-28 | 京瓷株式会社 | 半导体层的制造方法,光电转换装置的制造方法及半导体层形成用溶液 |
| CN102634776B (zh) * | 2012-05-03 | 2014-03-12 | 徐明生 | 一种连续制备二维纳米薄膜的化学气相沉积设备 |
| KR102772781B1 (ko) * | 2017-02-28 | 2025-02-27 | 고쿠리츠 다이가쿠 호우징 도우카이 고쿠리츠 다이가쿠 기코우 | 반도체 나노 입자 및 그 제조 방법 및 발광 디바이스 |
| JP7070826B2 (ja) * | 2017-02-28 | 2022-05-18 | 国立大学法人東海国立大学機構 | 半導体ナノ粒子およびその製造方法ならびに発光デバイス |
| US20200082995A1 (en) * | 2018-09-06 | 2020-03-12 | Ascent Solar Technologies, Inc. | Chalcopyrite-perovskite pn-junction thin-film photovoltaic device |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000144014A (ja) * | 1998-11-06 | 2000-05-26 | Asahi Chem Ind Co Ltd | 化合物半導体薄膜の形成方法 |
| US6992202B1 (en) * | 2002-10-31 | 2006-01-31 | Ohio Aerospace Institute | Single-source precursors for ternary chalcopyrite materials, and methods of making and using the same |
| JP2006528838A (ja) * | 2003-07-26 | 2006-12-21 | イン−ソーラー−テック カンパニー,リミテッド | 太陽電池吸収層の製造方法 |
| JP2008527735A (ja) * | 2005-01-12 | 2008-07-24 | イン−ソーラー テク カンパニー リミテッド | 太陽電池用光吸収層及びその製造方法 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100495924B1 (ko) * | 2003-07-26 | 2005-06-16 | (주)인솔라텍 | 태양전지 흡수층의 제조 방법 |
| KR100810730B1 (ko) * | 2006-06-19 | 2008-03-07 | (주)인솔라텍 | 태양전지용 광흡수층의 제조방법 |
-
2007
- 2007-03-13 KR KR1020070024682A patent/KR100857227B1/ko not_active Expired - Fee Related
-
2008
- 2008-02-22 US US12/530,881 patent/US20100098856A1/en not_active Abandoned
- 2008-02-22 EP EP08723079A patent/EP2126964A1/en not_active Withdrawn
- 2008-02-22 JP JP2009553506A patent/JP2010530474A/ja not_active Ceased
- 2008-02-22 CN CN2008800076821A patent/CN101632154B/zh not_active Expired - Fee Related
- 2008-02-22 WO PCT/KR2008/001041 patent/WO2008111738A1/en not_active Ceased
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000144014A (ja) * | 1998-11-06 | 2000-05-26 | Asahi Chem Ind Co Ltd | 化合物半導体薄膜の形成方法 |
| US6992202B1 (en) * | 2002-10-31 | 2006-01-31 | Ohio Aerospace Institute | Single-source precursors for ternary chalcopyrite materials, and methods of making and using the same |
| JP2006528838A (ja) * | 2003-07-26 | 2006-12-21 | イン−ソーラー−テック カンパニー,リミテッド | 太陽電池吸収層の製造方法 |
| JP2008527735A (ja) * | 2005-01-12 | 2008-07-24 | イン−ソーラー テク カンパニー リミテッド | 太陽電池用光吸収層及びその製造方法 |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2019502265A (ja) * | 2016-01-13 | 2019-01-24 | メカロ カンパニー リミテッドMecaro Co.,Ltd. | Cigs光吸収層を含む太陽電池及びその製造方法 |
| JP2018100429A (ja) * | 2016-12-19 | 2018-06-28 | 富士通株式会社 | 層状カルコゲナイド膜の形成方法及び半導体装置の製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN101632154A (zh) | 2010-01-20 |
| CN101632154B (zh) | 2011-11-02 |
| US20100098856A1 (en) | 2010-04-22 |
| WO2008111738A1 (en) | 2008-09-18 |
| EP2126964A1 (en) | 2009-12-02 |
| KR100857227B1 (ko) | 2008-09-05 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20120905 |
|
| A045 | Written measure of dismissal of application [lapsed due to lack of payment] |
Free format text: JAPANESE INTERMEDIATE CODE: A045 Effective date: 20130129 |