JP2010506203A - 並行化された顕微鏡イメージングのための方法および装置 - Google Patents

並行化された顕微鏡イメージングのための方法および装置 Download PDF

Info

Publication number
JP2010506203A
JP2010506203A JP2009530795A JP2009530795A JP2010506203A JP 2010506203 A JP2010506203 A JP 2010506203A JP 2009530795 A JP2009530795 A JP 2009530795A JP 2009530795 A JP2009530795 A JP 2009530795A JP 2010506203 A JP2010506203 A JP 2010506203A
Authority
JP
Japan
Prior art keywords
illumination
fluorescence
sample
region
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2009530795A
Other languages
English (en)
Japanese (ja)
Other versions
JP2010506203A5 (enExample
Inventor
カンペ、ミカエル
クラムペルト、ゲルハルト
ヴァルト、マティアス
ヴォレシェンスキー、ラルフ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Carl Zeiss Microscopy GmbH
Original Assignee
Carl Zeiss MicroImaging GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Carl Zeiss MicroImaging GmbH filed Critical Carl Zeiss MicroImaging GmbH
Publication of JP2010506203A publication Critical patent/JP2010506203A/ja
Publication of JP2010506203A5 publication Critical patent/JP2010506203A5/ja
Pending legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/16Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/645Specially adapted constructive features of fluorimeters
    • G01N21/6456Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458Fluorescence microscopy
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052Optical details of the image generation
    • G02B21/0072Optical details of the image generation details concerning resolution or correction, including general design of CSOM objectives
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052Optical details of the image generation
    • G02B21/0076Optical details of the image generation arrangements using fluorescence or luminescence

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Microscoopes, Condenser (AREA)
JP2009530795A 2006-10-06 2007-10-02 並行化された顕微鏡イメージングのための方法および装置 Pending JP2010506203A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102006047912A DE102006047912A1 (de) 2006-10-06 2006-10-06 Verfahren und Anordnung zur parallelisierten mikroskopischen Bildgebung
PCT/EP2007/008556 WO2008043460A1 (de) 2006-10-06 2007-10-02 Verfahren und anordnung zur parallelisierten mikroskopischen bildgebung

Publications (2)

Publication Number Publication Date
JP2010506203A true JP2010506203A (ja) 2010-02-25
JP2010506203A5 JP2010506203A5 (enExample) 2011-08-18

Family

ID=38963139

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009530795A Pending JP2010506203A (ja) 2006-10-06 2007-10-02 並行化された顕微鏡イメージングのための方法および装置

Country Status (5)

Country Link
US (2) US20090250632A1 (enExample)
EP (1) EP2102695B1 (enExample)
JP (1) JP2010506203A (enExample)
DE (1) DE102006047912A1 (enExample)
WO (1) WO2008043460A1 (enExample)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013515249A (ja) * 2009-12-22 2013-05-02 カール ツァイス マイクロスコピー ゲーエムベーハー 物体の2次元または3次元の位置調整のための高解像度顕微鏡および方法
JP2013114265A (ja) * 2011-11-28 2013-06-10 Leica Microsystems Cms Gmbh 顕微鏡照明系および方法
WO2015162921A1 (ja) * 2014-04-25 2015-10-29 株式会社ニコン 構造化照明顕微鏡装置及び構造化照明観察方法
JP2016503892A (ja) * 2013-01-09 2016-02-08 マックス−プランク−ゲゼルシャフト ツア フェーデルンク デア ヴィッセンシャフテン エー.ファオ. 発光団を有する試料構造の高空間分解イメージング方法
US9335181B2 (en) 2010-11-10 2016-05-10 Qualcomm Incorporated Haptic based personal navigation
JP2019211788A (ja) * 2013-09-19 2019-12-12 カール ツァイス マイクロスコピー ゲーエムベーハーCarl Zeiss Microscopy Gmbh 高分解能走査顕微鏡

Families Citing this family (45)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102008024954A1 (de) * 2008-05-23 2009-11-26 Carl Zeiss Microlmaging Gmbh Mikroskop mit einer optischen Anordnung zur Strukturierung des Beleuchtungslichtes
DE102008049886B4 (de) 2008-09-30 2021-11-04 Carl Zeiss Microscopy Gmbh Vorrichtung, insbesondere ein Mikroskop, zur Untersuchung von Proben
WO2010045949A2 (en) 2008-10-21 2010-04-29 Chemometec A/S A method and apparatus for analysis of a particle
DE102008054317A1 (de) 2008-11-03 2010-05-06 Carl Zeiss Microlmaging Gmbh Kombinationsmikroskopie
JP2012515930A (ja) * 2009-01-26 2012-07-12 ザ ジェネラル ホスピタル コーポレーション 広視野の超解像顕微鏡を提供するためのシステム、方法及びコンピューターがアクセス可能な媒体
DE102010028138A1 (de) * 2010-04-22 2011-10-27 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Bestimmen der Verteilung einer Substanz durch Abtasten mit einer Messfront
US8711211B2 (en) 2010-06-14 2014-04-29 Howard Hughes Medical Institute Bessel beam plane illumination microscope
US10051240B2 (en) 2010-06-14 2018-08-14 Howard Hughes Medical Institute Structured plane illumination microscopy
DE102011013614A1 (de) * 2011-03-08 2012-09-13 Carl Zeiss Microimaging Gmbh Laser-Scanning-Mikroskop und Verfahren zu seinem Betrieb
DE102011100507B4 (de) * 2011-04-29 2020-05-14 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Tragbares optisches Analysegerät
US9664614B2 (en) 2011-07-11 2017-05-30 University Of Limerick Method for high resolution sum-frequency generation and infrared microscopy
WO2013108626A1 (ja) * 2012-01-18 2013-07-25 株式会社ニコン 構造化照明装置、構造化照明顕微鏡装置、構造化照明方法
US20130250088A1 (en) * 2012-03-22 2013-09-26 Molecular Devices, Llc Multi-color confocal microscope and imaging methods
DE102012017922B4 (de) 2012-09-11 2024-03-14 Carl Zeiss Microscopy Gmbh Optikanordnung und Lichtmikroskop
EP2898312B1 (en) * 2012-09-24 2021-03-24 Global Life Sciences Solutions USA LLC Methods for resolving positions in fluorescence stochastic microscopy using three-dimensional structured illumination.
US9897536B2 (en) 2013-01-04 2018-02-20 University Of Limerick Differential infra red nanoscopy system and method
EP2801854B1 (en) 2013-05-10 2017-07-19 Ruprecht-Karls-Universität Heidelberg Method and apparatus for combination of localization microscopy and structured illumination microscopy
DE102013227107A1 (de) * 2013-09-03 2015-03-05 Leica Microsystems Cms Gmbh Mikroskop mit einem Element zum Verändern der Form des Beleuchtungslichtfokus
US10656401B2 (en) * 2013-12-09 2020-05-19 Nikon Corporation Optical apparatus, measuring apparatus, measuring method, screening apparatus, and screening method
DE102013114860B3 (de) 2013-12-23 2015-05-28 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Verfahren und Vorrichtung zur Bestimmung der Orte einzelner Moleküle einer Substanz in einer Probe
WO2016054118A1 (en) * 2014-09-29 2016-04-07 Howard Hughes Medical Institute Non-linear structured illumination microscopy
US10795144B2 (en) 2014-12-06 2020-10-06 Howard Hughes Medical Institute Microscopy with structured plane illumination and point accumulation for imaging and nanoscale topography
EP3465319A4 (en) 2016-05-30 2020-02-19 The Trustees of Columbia University in the City of New York SCAPE MICROSCOPY WITH PHASE MODULATION ELEMENT AND IMAGE RECONSTRUCTION
LU93117B1 (de) * 2016-06-23 2018-01-24 Leica Microsystems Beleuchtungsvorrichtung für ein Mikroskop
US10955652B2 (en) * 2016-09-30 2021-03-23 The Trustees Of Columbia University In The City Of New York Three-dimensional imaging using swept, confocally aligned planar excitation with a Powell lens and/or deliberate misalignment
JP6673497B2 (ja) * 2016-11-02 2020-03-25 株式会社ニコン 蛍光観察装置
DE102017011843A1 (de) 2017-12-21 2019-06-27 Horst Wochnowski Initialisierung von chemischen, physikalisch-chemischen und/oder physikalischen Reaktionen mittels eines angefangenen und nicht zu Ende geführten STED-Prozesses mit einer örtlichen Auflösung unterhalb des klassischen optischen Auflösungsgrenze mit Anwendungen aus der Biochemie
AU2019205496B2 (en) 2018-01-08 2021-08-19 Illumina, Inc. High-throughput sequencing with semiconductor-based detection
NL2020621B1 (en) 2018-01-08 2019-07-15 Illumina Inc Multiplexing of an active sensor detector using structured illumination
TWI725875B (zh) 2018-01-16 2021-04-21 美商伊路米納有限公司 結構照明成像系統和使用結構化光來創建高解析度圖像的方法
NL2020620B1 (en) 2018-01-16 2019-07-25 Illumina Inc Pattern angle spatial selection structured illumination imaging
NL2020619B1 (en) 2018-01-16 2019-07-25 Illumina Inc Dual optical grating slide structured illumination imaging
NL2020623B1 (en) 2018-01-24 2019-07-30 Illumina Inc Structured illumination microscopy with line scanning
NL2020622B1 (en) 2018-01-24 2019-07-30 Lllumina Cambridge Ltd Reduced dimensionality structured illumination microscopy with patterned arrays of nanowells
NL2021258B1 (en) 2018-06-14 2019-12-20 Illumina Inc Device for luminescent imaging
TWI718557B (zh) 2018-06-29 2021-02-11 美商伊路米納有限公司 用於預測結構照明參數之方法、系統和非暫時性電腦可讀取媒體
US10901202B2 (en) 2018-09-19 2021-01-26 Illumina, Inc. Structured illumination of a sample
CN109375358B (zh) * 2018-11-28 2020-07-24 南京理工大学 一种基于最优照明模式设计下的差分相衬定量相位显微成像方法
DE102019110160B4 (de) 2019-04-17 2023-07-27 Leica Microsystems Cms Gmbh Fluoreszenzmikroskop und Verfahren zur Abbildung einer Probe
DE102020113998A1 (de) * 2020-05-26 2021-12-02 Abberior Instruments Gmbh Verfahren, Computerprogramm und Vorrichtung zum Bestimmen von Positionen von Molekülen in einer Probe
CN112260053B (zh) * 2020-10-23 2023-01-03 长春理工大学 高效率的叠阵型半导体激光器
CN112649405B (zh) * 2020-11-27 2022-04-19 浙江大学 基于共路并行荧光辐射差分的超分辨显微成像方法和装置
DE102021005684A1 (de) 2021-11-16 2023-05-17 Jörn Volkher Wochnowski STED-Verfahren mit Hohllichtwellenleitern
US20230314327A1 (en) * 2022-04-04 2023-10-05 10X Genomics, Inc. Systems and methods for nearly isotropic optical resolution using tilted structured illumination microscopy
CN115291406B (zh) * 2022-07-20 2024-12-27 中国航空工业集团公司济南特种结构研究所 一种基于激光准直的光轴校准装置

Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61163314A (ja) * 1985-01-04 1986-07-24 ユナイテッド キングドム アトミック エナ↓−ヂイ オ↓−ソリテイ 走査顕微鏡
JPH09280954A (ja) * 1996-04-17 1997-10-31 Nikon Corp 物体検査装置
JP2002062261A (ja) * 2000-08-21 2002-02-28 Olympus Optical Co Ltd 光学装置および顕微鏡
JP2003167197A (ja) * 2001-12-04 2003-06-13 Lasertec Corp コンフォーカル顕微鏡
JP2004132781A (ja) * 2002-10-09 2004-04-30 Olympus Corp 分光器およびこれを用いた共焦点光学系、走査型光学顕微鏡
JP2004239660A (ja) * 2003-02-04 2004-08-26 Japan Science & Technology Agency 顕微鏡
JP2005266705A (ja) * 2004-03-22 2005-09-29 Japan Science & Technology Agency 超解像顕微鏡
JP2005266084A (ja) * 2004-03-17 2005-09-29 Lasertec Corp コンフォーカル顕微鏡及び膜厚測定装置
JP2006030178A (ja) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh 高度な分解能を持つ顕微鏡
JP2006030989A (ja) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh ライン走査式のレーザ走査型顕微鏡
JP2006510926A (ja) * 2002-12-05 2006-03-30 ライカ ミクロジュステムス ツェーエムエス ゲーエムベーハー 共焦点スリットスキャナを備える、対象物を結像するための走査型顕微鏡

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6903347B2 (en) * 1994-07-15 2005-06-07 Stephen C. Baer Superresolution in microlithography and fluorescence microscopy
DE10254139A1 (de) * 2002-11-15 2004-05-27 Carl Zeiss Jena Gmbh Verfahren und Anordnung zur tiefenaufgelösten optischen Erfassung einer Probe
DE102004034991A1 (de) 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Zoomoptik für ein Lichtrastermikroskop
DE102004034960A1 (de) 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Korrektur-Vorrichtung für eine optische Anordnung und konfokales Mikroskop mit einer solchen Vorrichtung
ATE441103T1 (de) * 2005-07-22 2009-09-15 Zeiss Carl Microimaging Gmbh Auflísungsgesteigerte lumineszenz-mikroskopie

Patent Citations (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61163314A (ja) * 1985-01-04 1986-07-24 ユナイテッド キングドム アトミック エナ↓−ヂイ オ↓−ソリテイ 走査顕微鏡
JPH09280954A (ja) * 1996-04-17 1997-10-31 Nikon Corp 物体検査装置
JP2002062261A (ja) * 2000-08-21 2002-02-28 Olympus Optical Co Ltd 光学装置および顕微鏡
JP2003167197A (ja) * 2001-12-04 2003-06-13 Lasertec Corp コンフォーカル顕微鏡
JP2004132781A (ja) * 2002-10-09 2004-04-30 Olympus Corp 分光器およびこれを用いた共焦点光学系、走査型光学顕微鏡
JP2006510926A (ja) * 2002-12-05 2006-03-30 ライカ ミクロジュステムス ツェーエムエス ゲーエムベーハー 共焦点スリットスキャナを備える、対象物を結像するための走査型顕微鏡
JP2004239660A (ja) * 2003-02-04 2004-08-26 Japan Science & Technology Agency 顕微鏡
JP2005266084A (ja) * 2004-03-17 2005-09-29 Lasertec Corp コンフォーカル顕微鏡及び膜厚測定装置
JP2005266705A (ja) * 2004-03-22 2005-09-29 Japan Science & Technology Agency 超解像顕微鏡
JP2006030178A (ja) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh 高度な分解能を持つ顕微鏡
JP2006030989A (ja) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh ライン走査式のレーザ走査型顕微鏡

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013515249A (ja) * 2009-12-22 2013-05-02 カール ツァイス マイクロスコピー ゲーエムベーハー 物体の2次元または3次元の位置調整のための高解像度顕微鏡および方法
JP2015187745A (ja) * 2009-12-22 2015-10-29 カール ツァイス マイクロスコピー ゲーエムベーハーCarl Zeiss Microscopy Gmbh 物体の2次元または3次元の位置調整のための高解像度顕微鏡および方法
US9335181B2 (en) 2010-11-10 2016-05-10 Qualcomm Incorporated Haptic based personal navigation
US9733086B2 (en) 2010-11-10 2017-08-15 Qualcomm Incorporated Haptic based personal navigation
JP2013114265A (ja) * 2011-11-28 2013-06-10 Leica Microsystems Cms Gmbh 顕微鏡照明系および方法
JP2016503892A (ja) * 2013-01-09 2016-02-08 マックス−プランク−ゲゼルシャフト ツア フェーデルンク デア ヴィッセンシャフテン エー.ファオ. 発光団を有する試料構造の高空間分解イメージング方法
JP2019211788A (ja) * 2013-09-19 2019-12-12 カール ツァイス マイクロスコピー ゲーエムベーハーCarl Zeiss Microscopy Gmbh 高分解能走査顕微鏡
WO2015162921A1 (ja) * 2014-04-25 2015-10-29 株式会社ニコン 構造化照明顕微鏡装置及び構造化照明観察方法
JPWO2015162921A1 (ja) * 2014-04-25 2017-04-13 株式会社ニコン 構造化照明顕微鏡装置及び構造化照明観察方法
US10393661B2 (en) 2014-04-25 2019-08-27 Nikon Corporation Structured illumination microscopic device and structured illumination observation method

Also Published As

Publication number Publication date
EP2102695A1 (de) 2009-09-23
DE102006047912A1 (de) 2008-04-10
EP2102695B1 (de) 2013-03-27
US8207510B2 (en) 2012-06-26
US20110215258A1 (en) 2011-09-08
WO2008043460A1 (de) 2008-04-17
US20090250632A1 (en) 2009-10-08

Similar Documents

Publication Publication Date Title
JP2010506203A (ja) 並行化された顕微鏡イメージングのための方法および装置
EP3055674B1 (en) Method of imaging a sample
JP5485352B2 (ja) 解像度を高めたルミネセンス顕微鏡検査
US8362448B2 (en) Apparatus and method for high spatial resolution imaging of a structure of a sample
Vangindertael et al. An introduction to optical super-resolution microscopy for the adventurous biologist
JP4723806B2 (ja) 共焦点顕微鏡
US9891417B2 (en) Locally imaging a structure in a sample at high spatial resolution
US9234846B2 (en) High-resolution microscope and method for determining the two- or three-dimensional positions of objects
US20110267688A1 (en) Microscopy Method and Microscope With Enhanced Resolution
JP7649648B2 (ja) 誘導放出抑制を伴う蛍光顕微鏡を使用してサンプルを結像するための方法
JP2012504226A (ja) 試料を検査するための装置、特に顕微鏡
JP2007233370A (ja) 試料を高い空間分解能で検査するための方法および顕微鏡
JP2019507921A (ja) 多数の対象の対象固有の場所間の輸送方法
JP2018517178A (ja) ライトシート顕微鏡法のための構成及び方法
US20140339439A1 (en) Method for High-Resolution 3D Localization Microscopy
JP2005292839A (ja) スリット共焦点顕微鏡およびその作動方法
JP2007506146A (ja) 共焦点レーザ走査顕微鏡
US12468136B2 (en) Random access projection microscopy
JP7534226B2 (ja) フォトスイッチング及び定在波照明技術を用いた顕微鏡における改善された軸分解能のためのシステム及び方法
US20130034913A1 (en) Method for Investigating a Specimen Containing Fluorescing Dyes with the Aid of a Microscope
Sanderson Confocal microscopy
US11073477B2 (en) Epi-cone shell light-sheet super-resolution system and microscope
JP2008281708A (ja) レーザ走査型顕微鏡
EP4268003B1 (en) Light microscopy method and light microscopy device
Wurm et al. STED Nanoscopy

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20101004

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20110630

RD04 Notification of resignation of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7424

Effective date: 20120113

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20120416

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20130219

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20130520

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20130527

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20130814

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20140603

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20140903

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20140910

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20141003

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20141010

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20141128

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20150127