JP2010245103A - 固体撮像装置 - Google Patents
固体撮像装置 Download PDFInfo
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- JP2010245103A JP2010245103A JP2009089157A JP2009089157A JP2010245103A JP 2010245103 A JP2010245103 A JP 2010245103A JP 2009089157 A JP2009089157 A JP 2009089157A JP 2009089157 A JP2009089157 A JP 2009089157A JP 2010245103 A JP2010245103 A JP 2010245103A
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- 238000006243 chemical reaction Methods 0.000 claims abstract description 34
- 230000004888 barrier function Effects 0.000 claims abstract description 20
- 238000003384 imaging method Methods 0.000 claims description 28
- 230000010354 integration Effects 0.000 abstract description 11
- 239000004065 semiconductor Substances 0.000 description 18
- 239000012535 impurity Substances 0.000 description 6
- 238000010586 diagram Methods 0.000 description 4
- 238000002955 isolation Methods 0.000 description 4
- 208000035039 Orofaciodigital syndrome type 4 Diseases 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 201000003734 orofaciodigital syndrome IV Diseases 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical group [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- 239000000370 acceptor Substances 0.000 description 1
- 229910052785 arsenic Inorganic materials 0.000 description 1
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical group [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 230000001186 cumulative effect Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 229920005591 polysilicon Polymers 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
- H04N25/711—Time delay and integration [TDI] registers; TDI shift registers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/148—Charge coupled imagers
- H01L27/14831—Area CCD imagers
- H01L27/14856—Time-delay and integration
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/148—Charge coupled imagers
- H01L27/14887—Blooming suppression
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/62—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels
- H04N25/621—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels for the control of blooming
- H04N25/622—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels for the control of blooming by controlling anti-blooming drains
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/148—Charge coupled imagers
- H01L27/14831—Area CCD imagers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
- H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
- H01L31/112—Devices sensitive to infrared, visible or ultraviolet radiation characterised by field-effect operation, e.g. junction field-effect phototransistor
- H01L31/113—Devices sensitive to infrared, visible or ultraviolet radiation characterised by field-effect operation, e.g. junction field-effect phototransistor being of the conductor-insulator-semiconductor type, e.g. metal-insulator-semiconductor field-effect transistor
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Abstract
【解決手段】 固体撮像装置1では、オーバーフローゲート(OFG)5が所定の電気抵抗値を有し、電圧印加部161〜165が接続部171〜175にてOFG5と電気的に接続されている。そのため、電圧印加部161〜165によって接続部171〜175に印加される電圧値V1〜V5を調整することで、OFG5の前段側部分に生じる電圧値を高くし、OFG5の後段側部分に生じる電圧値を低くすることができる。その結果、OFG5の前段側部分でバリアレベル(ポテンシャル)が低くなり、OFG5の後段側部分でバリアレベルが高くなるので、光電変換部2の前段側領域で発生した電荷の全てをオーバーフロードレイン(OFD)4に流出させて、光電変換部2の後段側領域で発生した電荷のみをTDI転送することができる。
【選択図】 図1
Description
Claims (4)
- 所定の方向に沿うように設けられ、光入射に応じて電荷を発生する光電変換部と、
前記光電変換部で発生した電荷を前記所定の方向に沿って前段側から後段側にTDI転送するTDI転送部と、
前記光電変換部に沿うように設けられ、所定の電気抵抗値を有するオーバーフローゲートを含むオーバーフロードレインと、
前記オーバーフローゲート上の複数の接続部において前記オーバーフローゲートと電気的に接続された電圧印加部と、を備えることを特徴とする固体撮像装置。 - 前記接続部は、前記所定の方向における前記オーバーフローゲートの両端部、及び前記所定の方向における前記オーバーフローゲートの中間部に位置し、
前記中間部に位置する前記接続部は、少なくとも、前記所定の方向における前記オーバーフローゲートの中央部よりも前記後段側に位置していることを特徴とする請求項1記載の固体撮像装置。 - 隣り合う前記接続部同士の間隔は、前記後段側ほど狭くなっていることを特徴とする請求項1又は2記載の固体撮像装置。
- 前記電圧印加部は、前記光電変換部における前記前段側の所定の領域で発生した電荷の全てが前記オーバーフロードレインに流出するように、前記オーバーフローゲートに電圧を印加して前記オーバーフローゲートのバリアレベルを変化させることを特徴とする請求項1〜3のいずれか一項記載の固体撮像装置。
Priority Applications (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009089157A JP5302073B2 (ja) | 2009-04-01 | 2009-04-01 | 固体撮像装置 |
US13/258,344 US9491384B2 (en) | 2009-04-01 | 2010-03-25 | Solid imaging device including photoelectric conversion unit and TDI transfer unit |
CN201080013270.6A CN102362488B (zh) | 2009-04-01 | 2010-03-25 | 固体摄像装置 |
EP10758533.3A EP2416362B1 (en) | 2009-04-01 | 2010-03-25 | Solid imaging device |
PCT/JP2010/055239 WO2010113760A1 (ja) | 2009-04-01 | 2010-03-25 | 固体撮像装置 |
KR1020117014324A KR101668130B1 (ko) | 2009-04-01 | 2010-03-25 | 고체 촬상 장치 |
TW099109685A TWI544796B (zh) | 2009-04-01 | 2010-03-30 | Solid-state imaging device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009089157A JP5302073B2 (ja) | 2009-04-01 | 2009-04-01 | 固体撮像装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2010245103A true JP2010245103A (ja) | 2010-10-28 |
JP5302073B2 JP5302073B2 (ja) | 2013-10-02 |
Family
ID=42828053
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2009089157A Active JP5302073B2 (ja) | 2009-04-01 | 2009-04-01 | 固体撮像装置 |
Country Status (7)
Country | Link |
---|---|
US (1) | US9491384B2 (ja) |
EP (1) | EP2416362B1 (ja) |
JP (1) | JP5302073B2 (ja) |
KR (1) | KR101668130B1 (ja) |
CN (1) | CN102362488B (ja) |
TW (1) | TWI544796B (ja) |
WO (1) | WO2010113760A1 (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013098420A (ja) * | 2011-11-02 | 2013-05-20 | Hamamatsu Photonics Kk | 固体撮像装置 |
JP2014049779A (ja) * | 2012-08-29 | 2014-03-17 | Toshiba Corp | 固体撮像装置 |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101360849B1 (ko) * | 2012-09-10 | 2014-02-12 | 클레어픽셀 주식회사 | 씨모스 이미지 센서 |
KR101360850B1 (ko) * | 2013-11-13 | 2014-02-12 | 클레어픽셀 주식회사 | 씨모스 이미지 센서 |
CN104716151B (zh) * | 2015-03-14 | 2017-05-17 | 长春长光辰芯光电技术有限公司 | 背照式tdi图像传感器及其电子快门控制方法 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002231914A (ja) * | 2001-01-30 | 2002-08-16 | Hamamatsu Photonics Kk | 半導体エネルギー検出器 |
JP2003521837A (ja) * | 1999-03-22 | 2003-07-15 | サーノフ コーポレイション | 時間遅延/積分チャージカップルド・デバイスのダイナミックレンジを拡げる方法及び装置 |
JP2006064197A (ja) * | 2004-08-24 | 2006-03-09 | Mitsubishi Electric Corp | 液体燃料燃焼装置の燃料流量調整方法 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11298805A (ja) | 1998-04-06 | 1999-10-29 | Nikon Corp | Tdi転送方式の固体撮像装置 |
US6278142B1 (en) * | 1999-08-30 | 2001-08-21 | Isetex, Inc | Semiconductor image intensifier |
JP3647390B2 (ja) * | 2000-06-08 | 2005-05-11 | キヤノン株式会社 | 電荷転送装置、固体撮像装置及び撮像システム |
TWI350587B (en) | 2005-11-14 | 2011-10-11 | Panasonic Electric Works Ltd | Spatial information detecting device and light detecting element suitable for the same device |
US7508432B2 (en) * | 2006-07-19 | 2009-03-24 | Eastman Kodak Company | CCD with improved substrate voltage setting circuit |
EP2093801B1 (en) * | 2006-11-28 | 2016-11-16 | Hamamatsu Photonics K.K. | Solid-state imaging element |
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2009
- 2009-04-01 JP JP2009089157A patent/JP5302073B2/ja active Active
-
2010
- 2010-03-25 CN CN201080013270.6A patent/CN102362488B/zh active Active
- 2010-03-25 KR KR1020117014324A patent/KR101668130B1/ko active IP Right Grant
- 2010-03-25 US US13/258,344 patent/US9491384B2/en active Active
- 2010-03-25 EP EP10758533.3A patent/EP2416362B1/en active Active
- 2010-03-25 WO PCT/JP2010/055239 patent/WO2010113760A1/ja active Application Filing
- 2010-03-30 TW TW099109685A patent/TWI544796B/zh active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003521837A (ja) * | 1999-03-22 | 2003-07-15 | サーノフ コーポレイション | 時間遅延/積分チャージカップルド・デバイスのダイナミックレンジを拡げる方法及び装置 |
JP2002231914A (ja) * | 2001-01-30 | 2002-08-16 | Hamamatsu Photonics Kk | 半導体エネルギー検出器 |
JP2006064197A (ja) * | 2004-08-24 | 2006-03-09 | Mitsubishi Electric Corp | 液体燃料燃焼装置の燃料流量調整方法 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013098420A (ja) * | 2011-11-02 | 2013-05-20 | Hamamatsu Photonics Kk | 固体撮像装置 |
US9305969B2 (en) | 2011-11-02 | 2016-04-05 | Hamamatsu Photonics K.K. | Solid-state imaging device operable with two readout modes in two different directions coincident with a moving speed and a moving direction of a moving subject |
JP2014049779A (ja) * | 2012-08-29 | 2014-03-17 | Toshiba Corp | 固体撮像装置 |
Also Published As
Publication number | Publication date |
---|---|
TWI544796B (zh) | 2016-08-01 |
EP2416362B1 (en) | 2018-06-13 |
WO2010113760A1 (ja) | 2010-10-07 |
EP2416362A1 (en) | 2012-02-08 |
KR20120011838A (ko) | 2012-02-08 |
US9491384B2 (en) | 2016-11-08 |
CN102362488B (zh) | 2014-04-16 |
JP5302073B2 (ja) | 2013-10-02 |
CN102362488A (zh) | 2012-02-22 |
EP2416362A4 (en) | 2015-03-25 |
US20120007149A1 (en) | 2012-01-12 |
TW201110687A (en) | 2011-03-16 |
KR101668130B1 (ko) | 2016-10-20 |
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