JP2010165532A - フューエルゲージ回路及びバッテリパック - Google Patents
フューエルゲージ回路及びバッテリパック Download PDFInfo
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- HBBGRARXTFLTSG-UHFFFAOYSA-N Lithium ion Chemical compound [Li+] HBBGRARXTFLTSG-UHFFFAOYSA-N 0.000 description 19
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- H—ELECTRICITY
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- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M10/00—Secondary cells; Manufacture thereof
- H01M10/42—Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
- H01M10/48—Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
- G01R31/382—Arrangements for monitoring battery or accumulator variables, e.g. SoC
- G01R31/3835—Arrangements for monitoring battery or accumulator variables, e.g. SoC involving only voltage measurements
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48135—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/48137—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4912—Layout
- H01L2224/49175—Parallel arrangements
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- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
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- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1306—Field-effect transistor [FET]
- H01L2924/13091—Metal-Oxide-Semiconductor Field-Effect Transistor [MOSFET]
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- H01L2924/11—Device type
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M10/00—Secondary cells; Manufacture thereof
- H01M10/05—Accumulators with non-aqueous electrolyte
- H01M10/052—Li-accumulators
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- H—ELECTRICITY
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- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M10/00—Secondary cells; Manufacture thereof
- H01M10/42—Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
- Y02E60/10—Energy storage using batteries
Abstract
【解決手段】電池1の充放電を保護する保護回路40と共に基板20上に配設され、電池の残量を測定するフューエルゲージ回路30であって、基板の正の電源端子21に対向する一辺に設けられ基板の正の電源端子21に接続されると共に回路内部の電圧センサ31に接続される電圧モニタ端子T1と、基板の正の電源端子21に対向する一辺とは逆側の保護回路に対向する一辺に設けられ保護回路の電圧モニタ端子T11に接続される電圧スルー端子T6と、フューエルゲージ回路の電圧モニタ端子T1と電圧スルー端子T11間を回路内部で接続する配線32と、を有する。
【選択図】 図1
Description
前記基板の正の電源端子(21)に対向する一辺に設けられ前記基板の正の電源端子(21)に接続されると共に回路内部の電圧センサ(31)に接続される電圧モニタ端子(T1)と、
前記基板の正の電源端子(21)に対向する一辺とは逆側の前記保護回路に対向する一辺に設けられ前記保護回路の電圧モニタ端子(T11)に接続される電圧スルー端子(T6)と、
前記フューエルゲージ回路の電圧モニタ端子(T1)と前記電圧スルー端子(T11)間を回路内部で接続する配線(32)と、を有する。
前記保護回路(40)を介して前記回路内部の通信部(33)と前記電池が搭載される携帯機器の通信部との間で双方向通信を行う。
前記保護回路(40)は、前記フューエルゲージ回路の通信部(33)と前記携帯機器の通信部との間で双方向通信される通信信号のレベルシフトを行うレベルシフト回路(41)を有する。
図1は、本発明のバッテリパックの回路部の一実施形態の平面図を示す。図1に示すプリント基板20は、図4に示す角形のリチウムイオン電池1の上面に固定されて使用される。
図2は、フューエルゲージICの一実施形態のブロック図を示す。同図中、フューエルゲージIC200は、図1のフューエルゲージIC30に対応し、フューエルゲージIC200はデジタル部210とアナログ部250とから大略構成されている。
図3は、保護ICの一実施形態のブロック図を示す。同図中、保護IC400は図1の保護IC40に対応する。保護IC400にはポート401〜414が設けられている。
21,22 電源端子
23 通信端子
25a〜25g スルーホール
26a〜26e,32 配線
30 フューエルゲージIC
31 電圧センサ
33 通信部
40 保護IC
41 レベルシフト回路
T1〜T22 端子
Claims (4)
- 電池の充放電を保護する保護回路と共に基板上に配設され、前記電池の残量を測定するフューエルゲージ回路であって、
前記基板の正の電源端子に対向する一辺に設けられ前記基板の正の電源端子に接続されると共に回路内部の電圧センサに接続される電圧モニタ端子と、
前記基板の正の電源端子に対向する一辺とは逆側の前記保護回路に対向する一辺に設けられ前記保護回路の電圧モニタ端子に接続される電圧スルー端子と、
前記フューエルゲージ回路の電圧モニタ端子と前記電圧スルー端子間を回路内部で接続する配線と、
を有することを特徴とするフューエルゲージ回路。 - 請求項1記載のフューエルゲージ回路において、
前記保護回路に対向する一辺に設けられ、前記保護回路の通信端子と接続されて双方向通信を行う通信端子を
有することを特徴とするフューエルゲージ回路。 - 請求項2記載のフューエルゲージ回路において、
前記保護回路に対向する一辺に設けられ前記保護回路の携帯機器間通信端子と接続される携帯機器間通信端子を有し、
前記保護回路を介して前記回路内部の通信部と前記電池が搭載される携帯機器の通信部との間で双方向通信を行うことを特徴とするフューエルゲージ回路。 - 電池の一面に、前記電池の充放電を保護する保護回路と前記電池の残量を測定する請求項3記載のフューエルゲージ回路を有する基板を配設したバッテリパックであって、
前記保護回路は、前記フューエルゲージ回路の通信部と前記携帯機器の通信部との間で通信される通信信号のレベルシフトを行うレベルシフト回路を
有することを特徴とするバッテリパック。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009006161A JP5316008B2 (ja) | 2009-01-14 | 2009-01-14 | フューエルゲージ回路及びバッテリパック |
CN201080004531.8A CN102282717B (zh) | 2009-01-14 | 2010-01-12 | 燃料仪电路以及电池组 |
KR1020117011466A KR101660814B1 (ko) | 2009-01-14 | 2010-01-12 | 연료 게이지 회로 및 배터리팩 |
PCT/JP2010/050223 WO2010082564A1 (ja) | 2009-01-14 | 2010-01-12 | フューエルゲージ回路及びバッテリパック |
US13/143,949 US8658300B2 (en) | 2009-01-14 | 2010-01-12 | Fuel gauge circuit and battery pack |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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JP2009006161A JP5316008B2 (ja) | 2009-01-14 | 2009-01-14 | フューエルゲージ回路及びバッテリパック |
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JP2010165532A true JP2010165532A (ja) | 2010-07-29 |
JP5316008B2 JP5316008B2 (ja) | 2013-10-16 |
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JP2009006161A Active JP5316008B2 (ja) | 2009-01-14 | 2009-01-14 | フューエルゲージ回路及びバッテリパック |
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Country | Link |
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US (1) | US8658300B2 (ja) |
JP (1) | JP5316008B2 (ja) |
KR (1) | KR101660814B1 (ja) |
CN (1) | CN102282717B (ja) |
WO (1) | WO2010082564A1 (ja) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013211974A (ja) * | 2012-03-30 | 2013-10-10 | Renesas Electronics Corp | 電池制御用半導体装置及び電池パック |
KR101450222B1 (ko) * | 2013-04-17 | 2014-10-15 | 주식회사 아이티엠반도체 | 배터리 보호회로 모듈 패키지 |
JP2017034792A (ja) * | 2015-07-30 | 2017-02-09 | ミツミ電機株式会社 | マルチチップ、電池保護装置及び電池パック |
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US8436620B2 (en) * | 2010-09-02 | 2013-05-07 | Texas Instruments Incorporated | Voltage monitoring using bitstream signal processing |
US9054528B2 (en) | 2010-12-22 | 2015-06-09 | Atmel Corporation | Event system and timekeeping for battery management and protection system |
US8943335B2 (en) | 2010-12-22 | 2015-01-27 | Atmel Corporation | Battery management and protection system using a module in a sleepwalking mode to monitor operational characteristics of a battery |
US20140244193A1 (en) * | 2013-02-24 | 2014-08-28 | Fairchild Semiconductor Corporation | Battery state of charge tracking, equivalent circuit selection and benchmarking |
DE102014212247A1 (de) | 2014-06-26 | 2015-12-31 | Robert Bosch Gmbh | Elektrischer Verbinder für ein Batteriemodul |
KR102511224B1 (ko) | 2015-11-05 | 2023-03-17 | 삼성전자주식회사 | 배터리 전류량을 측정하는 퓨얼 게이지 시스템 및 이를 포함하는 휴대용 전자장치 |
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- 2010-01-12 US US13/143,949 patent/US8658300B2/en active Active
- 2010-01-12 WO PCT/JP2010/050223 patent/WO2010082564A1/ja active Application Filing
- 2010-01-12 CN CN201080004531.8A patent/CN102282717B/zh active Active
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KR101450222B1 (ko) * | 2013-04-17 | 2014-10-15 | 주식회사 아이티엠반도체 | 배터리 보호회로 모듈 패키지 |
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JP2017034792A (ja) * | 2015-07-30 | 2017-02-09 | ミツミ電機株式会社 | マルチチップ、電池保護装置及び電池パック |
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Publication number | Publication date |
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CN102282717A (zh) | 2011-12-14 |
KR20110111363A (ko) | 2011-10-11 |
CN102282717B (zh) | 2014-03-26 |
KR101660814B1 (ko) | 2016-09-28 |
WO2010082564A1 (ja) | 2010-07-22 |
US8658300B2 (en) | 2014-02-25 |
JP5316008B2 (ja) | 2013-10-16 |
US20110274952A1 (en) | 2011-11-10 |
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