JP2010103505A - Soi基板の作製方法 - Google Patents
Soi基板の作製方法 Download PDFInfo
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- JP2010103505A JP2010103505A JP2009216367A JP2009216367A JP2010103505A JP 2010103505 A JP2010103505 A JP 2010103505A JP 2009216367 A JP2009216367 A JP 2009216367A JP 2009216367 A JP2009216367 A JP 2009216367A JP 2010103505 A JP2010103505 A JP 2010103505A
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- single crystal
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- semiconductor layer
- crystal semiconductor
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- FAQYAMRNWDIXMY-UHFFFAOYSA-N trichloroborane Chemical compound ClB(Cl)Cl FAQYAMRNWDIXMY-UHFFFAOYSA-N 0.000 description 1
- WQJQOUPTWCFRMM-UHFFFAOYSA-N tungsten disilicide Chemical compound [Si]#[W]#[Si] WQJQOUPTWCFRMM-UHFFFAOYSA-N 0.000 description 1
- 229910021342 tungsten silicide Inorganic materials 0.000 description 1
- 238000004506 ultrasonic cleaning Methods 0.000 description 1
- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
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Abstract
【解決手段】単結晶半導体基板に加速されたイオンを照射して単結晶半導体基板に脆化領域を形成し、絶縁層を介して単結晶半導体基板とベース基板とを貼り合わせ、脆化領域において単結晶半導体基板を分離して、ベース基板上に半導体層を形成し、熱処理を施して、半導体層中の欠陥を低減させた後、半導体層にレーザー光を照射する。
【選択図】図1
Description
本実施の形態では、半導体基板(SOI基板)の作製方法の一例に関して図面を参照して説明する。具体的には、ベース基板上に単結晶半導体層が設けられた半導体基板を作製する場合について説明する。
O2+hν(λ1nm)→O(3P)+O(3P) ・・・ (1)
O(3P)+O2→O3 ・・・ (2)
O3+hν(λ2nm)→O(1D)+O2 ・・・ (3)
O2+hν(λ3nm)→O(1D)+O(3P) ・・・ (4)
O(3P)+O2→O3 ・・・ (5)
O3+hν(λ3nm)→O(1D)+O2 ・・・ (6)
本実施の形態では、半導体基板(SOI基板)の作製方法の別の一例に関して図面を参照して説明する。
本実施の形態では、図5乃至7を参照して、上述の半導体基板を用いた半導体装置の作製方法について説明する。ここでは、半導体装置の一例として複数のトランジスタからなる半導体装置の作製方法について説明することとする。なお、以下において示すトランジスタを組み合わせて用いることで、様々な半導体装置を形成することができる。
本実施の形態では、上記の実施の形態にて作製した半導体装置、特に表示装置を用いた電子機器について、図8及び図9を参照して説明する。
102 窒素含有層
110 単結晶半導体基板
112 脆化領域
114 絶縁層
115 酸化膜
116 単結晶半導体層
118 単結晶半導体層
120 単結晶半導体層
130 イオン
132 レーザー光
500 半導体層
502 半導体膜
504 半導体膜
506 ゲート絶縁膜
508 電極
510 電極
512 不純物領域
514 不純物領域
516 サイドウォール
518 サイドウォール
520 高濃度不純物領域
522 低濃度不純物領域
524 チャネル形成領域
526 高濃度不純物領域
528 低濃度不純物領域
530 チャネル形成領域
532 nチャネル型トランジスタ
534 pチャネル型トランジスタ
536 絶縁膜
538 絶縁膜
540 導電膜
542 導電膜
544 導電膜
546 導電膜
1601 筺体
1602 支持台
1603 表示部
1604 スピーカー部
1605 ビデオ入力端子
1611 本体
1612 表示部
1613 受像部
1614 操作キー
1615 外部接続ポート
1616 シャッターボタン
1621 本体
1622 筐体
1623 表示部
1624 キーボード
1625 外部接続ポート
1626 ポインティングデバイス
1631 本体
1632 表示部
1633 スイッチ
1634 操作キー
1635 赤外線ポート
1641 本体
1642 筐体
1643 表示部
1644 表示部
1645 記録媒体読み込み部
1646 操作キー
1647 スピーカー部
1651 本体
1652 表示部
1653 操作キー
1661 本体
1662 表示部
1663 筐体
1664 外部接続ポート
1665 リモコン受信部
1666 受像部
1667 バッテリー
1668 音声入力部
1669 操作キー
1671 本体
1672 筐体
1673 表示部
1674 音声入力部
1675 音声出力部
1676 操作キー
1677 外部接続ポート
1678 アンテナ
1700 携帯電子機器
1701 筐体
1702 筐体
1711 表示部
1712 スピーカー
1713 マイクロフォン
1714 操作キー
1715 ポインティングデバイス
1716 カメラ用レンズ
1717 外部接続端子
1721 キーボード
1722 外部メモリスロット
1723 カメラ用レンズ
1724 ライト
1725 イヤフォン端子
Claims (8)
- 単結晶半導体基板に加速されたイオンを照射して該単結晶半導体基板に脆化領域を形成し、
絶縁層を介して前記単結晶半導体基板とベース基板とを貼り合わせ、
前記脆化領域において前記単結晶半導体基板を分離して、前記ベース基板上に半導体層を形成し、
熱処理を施して、前記半導体層中の欠陥を低減させた後、
前記半導体層にレーザー光を照射することを特徴とするSOI基板の作製方法。 - 請求項1において、
前記ベース基板上の半導体層をエッチングした後、前記熱処理を施すことを特徴とするSOI基板の作製方法。 - 請求項1において、
前記熱処理によって、前記単結晶半導体基板を分離すると共に、前記半導体層中の欠陥を低減させることを特徴とするSOI基板の作製方法。 - 請求項1乃至3のいずれか一において、
前記レーザー光の照射は、前記半導体層を部分溶融させる光強度で行われることを特徴とするSOI基板の作製方法。 - 請求項1乃至4のいずれか一において、
前記ベース基板として、ガラス基板を用いることを特徴とするSOI基板の作製方法。 - 請求項5において、
前記熱処理の温度を680℃以上且つ前記ベース基板の歪み点未満とすることを特徴とするSOI基板の作製方法。 - 請求項1乃至6のいずれか一において、
前記レーザー光の照射によって前記半導体層表面の平坦性を向上させると共に、前記半導体層中の欠陥を低減させることを特徴とするSOI基板の作製方法。 - 請求項1乃至7のいずれか一において、
前記単結晶半導体基板として単結晶シリコン基板を用い、
前記熱処理後の前記半導体層において、ラマンスペクトルのピークの波数が520cm−1以上521cm−1以下となり、且つそのピークの半値全幅が3.5cm−1以下となるように前記熱処理を施すことを特徴とするSOI基板の作製方法。
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JP2005252244A (ja) * | 2004-02-03 | 2005-09-15 | Ishikawajima Harima Heavy Ind Co Ltd | 半導体基板の製造方法 |
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