JP2010071871A5 - - Google Patents

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Publication number
JP2010071871A5
JP2010071871A5 JP2008241151A JP2008241151A JP2010071871A5 JP 2010071871 A5 JP2010071871 A5 JP 2010071871A5 JP 2008241151 A JP2008241151 A JP 2008241151A JP 2008241151 A JP2008241151 A JP 2008241151A JP 2010071871 A5 JP2010071871 A5 JP 2010071871A5
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JP
Japan
Prior art keywords
signal light
sample
signal
light
probe
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Application number
JP2008241151A
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English (en)
Japanese (ja)
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JP2010071871A (ja
JP5270280B2 (ja
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Priority to JP2008241151A priority Critical patent/JP5270280B2/ja
Priority claimed from JP2008241151A external-priority patent/JP5270280B2/ja
Priority to PCT/JP2009/004588 priority patent/WO2010032429A1/ja
Publication of JP2010071871A publication Critical patent/JP2010071871A/ja
Publication of JP2010071871A5 publication Critical patent/JP2010071871A5/ja
Application granted granted Critical
Publication of JP5270280B2 publication Critical patent/JP5270280B2/ja
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JP2008241151A 2008-09-19 2008-09-19 近接場光学顕微鏡の信号光測定システム Active JP5270280B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2008241151A JP5270280B2 (ja) 2008-09-19 2008-09-19 近接場光学顕微鏡の信号光測定システム
PCT/JP2009/004588 WO2010032429A1 (ja) 2008-09-19 2009-09-15 近接場光学顕微鏡の信号光測定システム

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008241151A JP5270280B2 (ja) 2008-09-19 2008-09-19 近接場光学顕微鏡の信号光測定システム

Publications (3)

Publication Number Publication Date
JP2010071871A JP2010071871A (ja) 2010-04-02
JP2010071871A5 true JP2010071871A5 (enrdf_load_stackoverflow) 2011-09-15
JP5270280B2 JP5270280B2 (ja) 2013-08-21

Family

ID=42039279

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008241151A Active JP5270280B2 (ja) 2008-09-19 2008-09-19 近接場光学顕微鏡の信号光測定システム

Country Status (2)

Country Link
JP (1) JP5270280B2 (enrdf_load_stackoverflow)
WO (1) WO2010032429A1 (enrdf_load_stackoverflow)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8650660B2 (en) 2008-11-13 2014-02-11 Bruker Nano, Inc. Method and apparatus of using peak force tapping mode to measure physical properties of a sample
KR101920606B1 (ko) 2008-11-13 2019-02-13 브루커 나노, 인코퍼레이션. 탐침형 원자 현미경 작동 방법 및 장치
US8955161B2 (en) 2008-11-13 2015-02-10 Bruker Nano, Inc. Peakforce photothermal-based detection of IR nanoabsorption
CN102844666B (zh) 2009-12-01 2016-03-30 布鲁克纳米公司 操作扫描探针显微镜的方法和装置
JP6010040B2 (ja) * 2010-11-29 2016-10-19 ブルカー ナノ インコーポレイテッドＢｒｕｋｅｒ Ｎａｎｏ，Ｉｎｃ． ピークフォースタッピングモードを使用して試料の物理的特性を測定するための方法および装置
JP5802417B2 (ja) 2011-04-04 2015-10-28 株式会社日立製作所 走査プローブ顕微鏡およびこれを用いた測定方法
JP5820886B2 (ja) * 2011-10-03 2015-11-24 株式会社日立製作所 走査プローブ顕微鏡
WO2014033844A1 (ja) * 2012-08-28 2014-03-06 株式会社日立製作所 走査プローブ顕微鏡およびそれを用いた計測方法
FR3001294B1 (fr) * 2013-01-24 2015-03-20 Ecole Polytech Microscope a sonde locale multimode, microscope raman exalte par pointe et procede de regulation de la distance entre la sonde locale et l'echantillon
KR20190060769A (ko) 2016-08-22 2019-06-03 브루커 나노, 아이엔씨. 피크 포스 탭핑을 이용한 샘플의 적외선 특성

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3425615B2 (ja) * 1994-03-24 2003-07-14 科学技術庁長官官房会計課長 走査型近視野原子間力顕微鏡
JP4361221B2 (ja) * 2001-02-15 2009-11-11 エスアイアイ・ナノテクノロジー株式会社 走査型近接場顕微鏡におけるイルミネーション反射モードの測定方法
CN100476379C (zh) * 2003-04-04 2009-04-08 Vp控股有限公司 用于增强的纳米-光谱扫描的方法和装置

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