JP2010066021A - 静電容量型近接センサ - Google Patents

静電容量型近接センサ Download PDF

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Publication number
JP2010066021A
JP2010066021A JP2008230099A JP2008230099A JP2010066021A JP 2010066021 A JP2010066021 A JP 2010066021A JP 2008230099 A JP2008230099 A JP 2008230099A JP 2008230099 A JP2008230099 A JP 2008230099A JP 2010066021 A JP2010066021 A JP 2010066021A
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Japan
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change
electrode
voltage
current
frequency
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JP2008230099A
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Japanese (ja)
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JP2010066021A5 (enExample
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Keiichi Nonogaki
慶一 野々垣
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JP2008230099A 2008-09-08 2008-09-08 静電容量型近接センサ Pending JP2010066021A (ja)

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JP2008230099A JP2010066021A (ja) 2008-09-08 2008-09-08 静電容量型近接センサ

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JP2008230099A JP2010066021A (ja) 2008-09-08 2008-09-08 静電容量型近接センサ

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JP2010066021A true JP2010066021A (ja) 2010-03-25
JP2010066021A5 JP2010066021A5 (enExample) 2011-06-23

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018081013A (ja) * 2016-11-17 2018-05-24 東京パーツ工業株式会社 静電容量式近接センサおよびこの静電容量式近接センサを備えるドアハンドル装置
CN111201582A (zh) * 2017-11-10 2020-05-26 阿尔卑斯阿尔派株式会社 输入装置
JP2021167747A (ja) * 2020-04-10 2021-10-21 東京パーツ工業株式会社 静電容量式近接センサ
CN114001692A (zh) * 2020-07-27 2022-02-01 长鑫存储技术有限公司 测量电容之间最短距离的方法及评价电容制程的方法
US11933863B2 (en) 2020-07-27 2024-03-19 Changxin Memory Technologies, Inc. Method for measuring shortest distance between capacitances and method for evaluating capacitance manufacture procedure

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0864365A (ja) * 1994-08-17 1996-03-08 Seikosha Co Ltd 物体検知装置およびそれにより制御される照明点滅装置
JP2000177380A (ja) * 1998-12-14 2000-06-27 Harness Syst Tech Res Ltd 挟込み検知装置
JP2001141836A (ja) * 1999-11-12 2001-05-25 Sumitomo Chem Co Ltd 人体検出装置
JP2002039708A (ja) * 2000-07-27 2002-02-06 Aisin Seiki Co Ltd 静電容量式近接センサ
JP2006078422A (ja) * 2004-09-13 2006-03-23 Mitsuba Corp 近接センサ及びそれを用いた挟み込み検出装置
JP2009222423A (ja) * 2008-03-13 2009-10-01 Keiichi Nonogaki 静電容量型近接センサ
JP2009278319A (ja) * 2008-05-14 2009-11-26 Keiichi Nonogaki 静電容量型近接センサ

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0864365A (ja) * 1994-08-17 1996-03-08 Seikosha Co Ltd 物体検知装置およびそれにより制御される照明点滅装置
JP2000177380A (ja) * 1998-12-14 2000-06-27 Harness Syst Tech Res Ltd 挟込み検知装置
JP2001141836A (ja) * 1999-11-12 2001-05-25 Sumitomo Chem Co Ltd 人体検出装置
JP2002039708A (ja) * 2000-07-27 2002-02-06 Aisin Seiki Co Ltd 静電容量式近接センサ
JP2006078422A (ja) * 2004-09-13 2006-03-23 Mitsuba Corp 近接センサ及びそれを用いた挟み込み検出装置
JP2009222423A (ja) * 2008-03-13 2009-10-01 Keiichi Nonogaki 静電容量型近接センサ
JP2009278319A (ja) * 2008-05-14 2009-11-26 Keiichi Nonogaki 静電容量型近接センサ

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018081013A (ja) * 2016-11-17 2018-05-24 東京パーツ工業株式会社 静電容量式近接センサおよびこの静電容量式近接センサを備えるドアハンドル装置
CN111201582A (zh) * 2017-11-10 2020-05-26 阿尔卑斯阿尔派株式会社 输入装置
JPWO2019092953A1 (ja) * 2017-11-10 2020-10-22 アルプスアルパイン株式会社 入力装置
JP2021167747A (ja) * 2020-04-10 2021-10-21 東京パーツ工業株式会社 静電容量式近接センサ
CN114001692A (zh) * 2020-07-27 2022-02-01 长鑫存储技术有限公司 测量电容之间最短距离的方法及评价电容制程的方法
CN114001692B (zh) * 2020-07-27 2023-04-07 长鑫存储技术有限公司 测量电容之间最短距离的方法及评价电容制程的方法
US11933863B2 (en) 2020-07-27 2024-03-19 Changxin Memory Technologies, Inc. Method for measuring shortest distance between capacitances and method for evaluating capacitance manufacture procedure

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