JP2010052090A - 研磨装置および研磨方法 - Google Patents

研磨装置および研磨方法 Download PDF

Info

Publication number
JP2010052090A
JP2010052090A JP2008219233A JP2008219233A JP2010052090A JP 2010052090 A JP2010052090 A JP 2010052090A JP 2008219233 A JP2008219233 A JP 2008219233A JP 2008219233 A JP2008219233 A JP 2008219233A JP 2010052090 A JP2010052090 A JP 2010052090A
Authority
JP
Japan
Prior art keywords
polishing
slurry
surface plate
water
polishing apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2008219233A
Other languages
English (en)
Japanese (ja)
Other versions
JP2010052090A5 (enExample
Inventor
Hiroaki Yuki
広昭 結城
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Miyazaki Epson Corp
Original Assignee
Epson Toyocom Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Epson Toyocom Corp filed Critical Epson Toyocom Corp
Priority to JP2008219233A priority Critical patent/JP2010052090A/ja
Publication of JP2010052090A publication Critical patent/JP2010052090A/ja
Publication of JP2010052090A5 publication Critical patent/JP2010052090A5/ja
Withdrawn legal-status Critical Current

Links

Images

Landscapes

  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
JP2008219233A 2008-08-28 2008-08-28 研磨装置および研磨方法 Withdrawn JP2010052090A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2008219233A JP2010052090A (ja) 2008-08-28 2008-08-28 研磨装置および研磨方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008219233A JP2010052090A (ja) 2008-08-28 2008-08-28 研磨装置および研磨方法

Publications (2)

Publication Number Publication Date
JP2010052090A true JP2010052090A (ja) 2010-03-11
JP2010052090A5 JP2010052090A5 (enExample) 2011-07-28

Family

ID=42068557

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008219233A Withdrawn JP2010052090A (ja) 2008-08-28 2008-08-28 研磨装置および研磨方法

Country Status (1)

Country Link
JP (1) JP2010052090A (enExample)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101596598B1 (ko) * 2014-11-10 2016-02-22 주식회사 엘지실트론 웨이퍼 연마장치
JP2016064478A (ja) * 2014-09-25 2016-04-28 株式会社Sumco ワークの研磨装置およびワークの製造方法
WO2021140737A1 (ja) * 2020-01-09 2021-07-15 信越半導体株式会社 ラッピング装置の洗浄装置
KR20210111095A (ko) 2020-03-02 2021-09-10 에스케이실트론 주식회사 웨이퍼 랩핑 장치
TWI758100B (zh) * 2020-12-23 2022-03-11 大陸商上海新昇半導體科技有限公司 具有自清洗功能的雙面拋光設備及拋光方法
WO2025226359A1 (en) * 2024-04-25 2025-10-30 Applied Materials, Inc. A nozzle assembly for a fluid recovery system

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016064478A (ja) * 2014-09-25 2016-04-28 株式会社Sumco ワークの研磨装置およびワークの製造方法
KR101596598B1 (ko) * 2014-11-10 2016-02-22 주식회사 엘지실트론 웨이퍼 연마장치
WO2021140737A1 (ja) * 2020-01-09 2021-07-15 信越半導体株式会社 ラッピング装置の洗浄装置
JP2021109271A (ja) * 2020-01-09 2021-08-02 信越半導体株式会社 ラッピング装置の洗浄装置
CN114786871A (zh) * 2020-01-09 2022-07-22 信越半导体株式会社 研磨装置的清洗装置
KR20220119387A (ko) * 2020-01-09 2022-08-29 신에쯔 한도타이 가부시키가이샤 래핑장치의 세정장치
CN114786871B (zh) * 2020-01-09 2024-03-08 信越半导体株式会社 研磨装置的清洗装置
TWI861293B (zh) * 2020-01-09 2024-11-11 日商信越半導體股份有限公司 研光裝置的清洗裝置
KR102844591B1 (ko) 2020-01-09 2025-08-11 신에쯔 한도타이 가부시키가이샤 래핑장치의 세정장치
KR20210111095A (ko) 2020-03-02 2021-09-10 에스케이실트론 주식회사 웨이퍼 랩핑 장치
TWI758100B (zh) * 2020-12-23 2022-03-11 大陸商上海新昇半導體科技有限公司 具有自清洗功能的雙面拋光設備及拋光方法
WO2025226359A1 (en) * 2024-04-25 2025-10-30 Applied Materials, Inc. A nozzle assembly for a fluid recovery system

Similar Documents

Publication Publication Date Title
JP3701126B2 (ja) 基板の洗浄方法及び研磨装置
US5860181A (en) Method of and apparatus for cleaning workpiece
CN206541804U (zh) 基板处理系统
US6953390B2 (en) Polishing apparatus
US20020007840A1 (en) Substrate cleaning apparatus, substrate cleaning method and substrate processing apparatus
EP1080840A2 (en) Polishing apparatus, polishing method and method of conditioning polishing pad
JP2010052090A (ja) 研磨装置および研磨方法
JPH11347917A (ja) ポリッシング装置
KR100474365B1 (ko) 웨이퍼연마장치 및 그 연마방법
KR102265229B1 (ko) 버프 처리 장치 및 기판 처리 장치
WO2015061741A1 (en) Systems, methods and apparatus for post-chemical mechanical planarization substrate buff pre-cleaning
US20070232201A1 (en) Apparatus and method for polishing semiconductor wafer
JP2001138233A (ja) 研磨装置、研磨方法および研磨工具の洗浄方法
JP2986446B2 (ja) 半導体研磨装置および研磨方法
JP2008296351A (ja) 基板処理装置及び基板処理方法
JPH11129153A (ja) Cmp研磨装置
JP5533355B2 (ja) 磁気記録媒体用ガラス基板、両面研磨装置、ガラス基板の研磨方法及びガラス基板の製造方法
TWI824755B (zh) 一種用於承載和清潔矽片的裝置
JP2005012238A (ja) 基板洗浄方法及び装置
KR20100052831A (ko) 반도체 웨이퍼용 래핑 후 세정 방법 및 장치
JPH11320385A (ja) 研磨方法及びその装置
JPH1110526A (ja) 基板研磨装置及び基板研磨の方法
KR100523623B1 (ko) Cmp 장비의 다이아몬드 디스크의 클리닝 드레서
JP2001260024A (ja) ドレッサー装置用洗浄装置
JP2008028232A (ja) 半導体基板研磨装置および半導体基板研磨方法、半導体装置の製造方法

Legal Events

Date Code Title Description
A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20110610

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20110610

A711 Notification of change in applicant

Free format text: JAPANESE INTERMEDIATE CODE: A712

Effective date: 20110729

RD03 Notification of appointment of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7423

Effective date: 20110729

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20110819

A761 Written withdrawal of application

Free format text: JAPANESE INTERMEDIATE CODE: A761

Effective date: 20111212