JP2009542450A5 - - Google Patents
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- Publication number
- JP2009542450A5 JP2009542450A5 JP2009518460A JP2009518460A JP2009542450A5 JP 2009542450 A5 JP2009542450 A5 JP 2009542450A5 JP 2009518460 A JP2009518460 A JP 2009518460A JP 2009518460 A JP2009518460 A JP 2009518460A JP 2009542450 A5 JP2009542450 A5 JP 2009542450A5
- Authority
- JP
- Japan
- Prior art keywords
- polishing pad
- fluid
- upstream
- director
- disposed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005498 polishing Methods 0.000 claims 12
- 239000012530 fluid Substances 0.000 claims 5
- 238000011144 upstream manufacturing Methods 0.000 claims 5
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims 3
- 230000003750 conditioning effect Effects 0.000 claims 2
- 238000004140 cleaning Methods 0.000 claims 1
- 239000007921 spray Substances 0.000 claims 1
- 239000000126 substance Substances 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/475,639 | 2006-06-27 | ||
| US11/475,639 US7452264B2 (en) | 2006-06-27 | 2006-06-27 | Pad cleaning method |
| PCT/US2007/071701 WO2008002811A2 (en) | 2006-06-27 | 2007-06-20 | Pad cleaning method |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2009542450A JP2009542450A (ja) | 2009-12-03 |
| JP2009542450A5 true JP2009542450A5 (enExample) | 2011-08-18 |
| JP5020317B2 JP5020317B2 (ja) | 2012-09-05 |
Family
ID=38846417
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009518460A Expired - Fee Related JP5020317B2 (ja) | 2006-06-27 | 2007-06-20 | パッドクリーニング方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US7452264B2 (enExample) |
| JP (1) | JP5020317B2 (enExample) |
| TW (1) | TWI354584B (enExample) |
| WO (1) | WO2008002811A2 (enExample) |
Families Citing this family (39)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2007045267A1 (en) * | 2005-10-19 | 2007-04-26 | Freescale Semiconductor, Inc. | A system and method for cleaning a conditioning device |
| WO2007054125A1 (en) * | 2005-11-08 | 2007-05-18 | Freescale Semiconductor, Inc. | A system and method for removing particles from a polishing pad |
| US8012000B2 (en) * | 2007-04-02 | 2011-09-06 | Applied Materials, Inc. | Extended pad life for ECMP and barrier removal |
| US7674156B2 (en) * | 2007-10-08 | 2010-03-09 | K.C. Tech Co., Ltd | Cleaning device for chemical mechanical polishing equipment |
| DE102008016463A1 (de) * | 2008-03-31 | 2009-10-01 | Texas Instruments Deutschland Gmbh | Verfahren zur Planarisierung einer Halbleiterstruktur |
| US8337279B2 (en) * | 2008-06-23 | 2012-12-25 | Applied Materials, Inc. | Closed-loop control for effective pad conditioning |
| US8172641B2 (en) * | 2008-07-17 | 2012-05-08 | Taiwan Semiconductor Manufacturing Co., Ltd. | CMP by controlling polish temperature |
| US20100291841A1 (en) * | 2009-05-14 | 2010-11-18 | Chien-Min Sung | Methods and Systems for Water Jet Assisted CMP Processing |
| KR101170760B1 (ko) * | 2009-07-24 | 2012-08-03 | 세메스 주식회사 | 기판 연마 장치 |
| JP2011079076A (ja) * | 2009-10-05 | 2011-04-21 | Toshiba Corp | 研磨装置及び研磨方法 |
| CN102528651B (zh) * | 2010-12-21 | 2014-10-22 | 中国科学院微电子研究所 | 化学机械抛光设备及其预热方法 |
| JP5628067B2 (ja) * | 2011-02-25 | 2014-11-19 | 株式会社荏原製作所 | 研磨パッドの温度調整機構を備えた研磨装置 |
| US20120289131A1 (en) * | 2011-05-13 | 2012-11-15 | Li-Chung Liu | Cmp apparatus and method |
| US8920214B2 (en) * | 2011-07-12 | 2014-12-30 | Chien-Min Sung | Dual dressing system for CMP pads and associated methods |
| KR101219547B1 (ko) | 2011-08-18 | 2013-01-16 | 주식회사 케이씨텍 | 화학 기계적 연마 장치 및 그 제어 방법 |
| KR20140116542A (ko) * | 2012-01-24 | 2014-10-02 | 어플라이드 머티어리얼스, 인코포레이티드 | 입자 감소를 위한 세정 모듈 및 프로세스 |
| US9138861B2 (en) * | 2012-02-15 | 2015-09-22 | Taiwan Semiconductor Manufacturing Co., Ltd. | CMP pad cleaning apparatus |
| JP6209088B2 (ja) * | 2013-01-25 | 2017-10-04 | 株式会社荏原製作所 | 研磨方法および装置 |
| WO2014149676A1 (en) * | 2013-03-15 | 2014-09-25 | Applied Materials, Inc. | Polishing pad cleaning with vacuum apparatus |
| US10293462B2 (en) * | 2013-07-23 | 2019-05-21 | Taiwan Semiconductor Manufacturing Company, Ltd. | Pad conditioner and method of reconditioning planarization pad |
| US9833876B2 (en) * | 2014-03-03 | 2017-12-05 | Taiwan Semiconductor Manufacturing Co., Ltd. | Polishing apparatus and polishing method |
| KR101597457B1 (ko) * | 2014-09-26 | 2016-02-24 | 현대제철 주식회사 | 폴리싱 패드 세정 장치 |
| CN105234823B (zh) * | 2015-10-27 | 2017-09-29 | 上海华力微电子有限公司 | 研磨液供给及研磨垫整理装置、研磨机台 |
| KR102559647B1 (ko) * | 2016-08-12 | 2023-07-25 | 삼성디스플레이 주식회사 | 기판 연마 시스템 및 기판 연마 방법 |
| CN108284383B (zh) * | 2017-01-09 | 2021-02-26 | 中芯国际集成电路制造(上海)有限公司 | 一种化学机械研磨装置及化学机械研磨方法 |
| CN110352115A (zh) * | 2017-03-06 | 2019-10-18 | 应用材料公司 | 为cmp位置特定研磨(lsp)设计的螺旋及同心圆移动 |
| US10593603B2 (en) | 2018-03-16 | 2020-03-17 | Sandisk Technologies Llc | Chemical mechanical polishing apparatus containing hydraulic multi-chamber bladder and method of using thereof |
| JP7083722B2 (ja) * | 2018-08-06 | 2022-06-13 | 株式会社荏原製作所 | 研磨装置、及び、研磨方法 |
| JP7162465B2 (ja) | 2018-08-06 | 2022-10-28 | 株式会社荏原製作所 | 研磨装置、及び、研磨方法 |
| US11717936B2 (en) * | 2018-09-14 | 2023-08-08 | Applied Materials, Inc. | Methods for a web-based CMP system |
| CN109333337A (zh) * | 2018-11-19 | 2019-02-15 | 深圳市华星光电技术有限公司 | 研磨装置及研磨方法 |
| US12138741B2 (en) | 2019-04-04 | 2024-11-12 | Applied Materials, Inc. | Polishing fluid collection apparatus and methods related thereto |
| US11712778B2 (en) | 2019-08-23 | 2023-08-01 | Taiwan Semiconductor Manufacturing Company, Ltd. | Chemical mechanical planarization tool |
| US12240078B2 (en) | 2020-06-24 | 2025-03-04 | Applied Materials, Inc. | Cleaning system for polishing liquid delivery arm |
| US11794305B2 (en) | 2020-09-28 | 2023-10-24 | Applied Materials, Inc. | Platen surface modification and high-performance pad conditioning to improve CMP performance |
| KR20220073192A (ko) | 2020-11-26 | 2022-06-03 | 에스케이실트론 주식회사 | 연마 패드 세정 장치 및 연마 장치 |
| CN112588682B (zh) * | 2020-12-16 | 2024-07-02 | 无锡先导智能装备股份有限公司 | 清洗装置 |
| CN116000816A (zh) * | 2022-11-21 | 2023-04-25 | 北京晶亦精微科技股份有限公司 | 适于清洗研磨垫沟槽内废弃物的腔室结构及清洗方法 |
| CN118073239B (zh) * | 2024-02-27 | 2024-12-20 | 无锡海浥半导体科技有限公司 | 利用多喷嘴递进式硅片清洗装置的清洗硅片的方法 |
Family Cites Families (49)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3128880C2 (de) * | 1981-07-22 | 1987-03-19 | Fa. Peter Wolters, 2370 Rendsburg | Maschine zum Läppen oder Polieren |
| US4450652A (en) * | 1981-09-04 | 1984-05-29 | Monsanto Company | Temperature control for wafer polishing |
| US4515313A (en) * | 1982-12-27 | 1985-05-07 | Marshall And Williams Company | Air knife apparatus |
| US6146851A (en) * | 1985-02-05 | 2000-11-14 | Chiron Corporation | DNA encoding NV2 (long form) and carboxy truncated fragments thereof |
| JPH0760812B2 (ja) * | 1991-06-26 | 1995-06-28 | インターナショナル・ビジネス・マシーンズ・コーポレイション | 半導体ウェーハ研摩装置及び研摩方法 |
| US5308438A (en) * | 1992-01-30 | 1994-05-03 | International Business Machines Corporation | Endpoint detection apparatus and method for chemical/mechanical polishing |
| US5607718A (en) * | 1993-03-26 | 1997-03-04 | Kabushiki Kaisha Toshiba | Polishing method and polishing apparatus |
| US5700180A (en) * | 1993-08-25 | 1997-12-23 | Micron Technology, Inc. | System for real-time control of semiconductor wafer polishing |
| SE9402091D0 (sv) * | 1994-06-14 | 1994-06-14 | Pharmacia Biotech Ab | Kromatografikolonn |
| JP3633062B2 (ja) * | 1994-12-22 | 2005-03-30 | 株式会社デンソー | 研磨方法および研磨装置 |
| JP2581478B2 (ja) * | 1995-01-13 | 1997-02-12 | 日本電気株式会社 | 平面研磨装置 |
| US5533923A (en) * | 1995-04-10 | 1996-07-09 | Applied Materials, Inc. | Chemical-mechanical polishing pad providing polishing unformity |
| JP3594357B2 (ja) * | 1995-04-10 | 2004-11-24 | 株式会社荏原製作所 | ポリッシング方法及び装置 |
| KR100281723B1 (ko) | 1995-05-30 | 2001-10-22 | 코트게리 | 연마방법및그장치 |
| JP2833552B2 (ja) * | 1995-10-19 | 1998-12-09 | 日本電気株式会社 | ウェハ研磨方法および研磨装置 |
| US5709593A (en) * | 1995-10-27 | 1998-01-20 | Applied Materials, Inc. | Apparatus and method for distribution of slurry in a chemical mechanical polishing system |
| US5643050A (en) * | 1996-05-23 | 1997-07-01 | Industrial Technology Research Institute | Chemical/mechanical polish (CMP) thickness monitor |
| US6165053A (en) * | 1996-07-24 | 2000-12-26 | Mayekawa Mfg. Co., Ltd. | Method and apparatus for processing in cold air blast |
| US6475253B2 (en) * | 1996-09-11 | 2002-11-05 | 3M Innovative Properties Company | Abrasive article and method of making |
| JP3672685B2 (ja) * | 1996-11-29 | 2005-07-20 | 松下電器産業株式会社 | 研磨方法及び研磨装置 |
| US6065794A (en) * | 1997-02-14 | 2000-05-23 | Schlachter; Bradley S. | Security enclosure for open deck vehicles |
| US5993298A (en) * | 1997-03-06 | 1999-11-30 | Keltech Engineering | Lapping apparatus and process with controlled liquid flow across the lapping surface |
| US6139406A (en) * | 1997-06-24 | 2000-10-31 | Applied Materials, Inc. | Combined slurry dispenser and rinse arm and method of operation |
| US5916010A (en) * | 1997-10-30 | 1999-06-29 | International Business Machines Corporation | CMP pad maintenance apparatus and method |
| US5957750A (en) * | 1997-12-18 | 1999-09-28 | Micron Technology, Inc. | Method and apparatus for controlling a temperature of a polishing pad used in planarizing substrates |
| US6000997A (en) * | 1998-07-10 | 1999-12-14 | Aplex, Inc. | Temperature regulation in a CMP process |
| US6250994B1 (en) * | 1998-10-01 | 2001-06-26 | Micron Technology, Inc. | Methods and apparatuses for mechanical and chemical-mechanical planarization of microelectronic-device substrate assemblies on planarizing pads |
| US6358124B1 (en) * | 1998-11-02 | 2002-03-19 | Applied Materials, Inc. | Pad conditioner cleaning apparatus |
| US6319098B1 (en) * | 1998-11-13 | 2001-11-20 | Applied Materials, Inc. | Method of post CMP defect stability improvement |
| US6217422B1 (en) | 1999-01-20 | 2001-04-17 | International Business Machines Corporation | Light energy cleaning of polishing pads |
| JP2000216120A (ja) * | 1999-01-27 | 2000-08-04 | Mitsubishi Electric Corp | 研磨装置およびこれを用いた半導体装置の製造方法 |
| US6056794A (en) | 1999-03-05 | 2000-05-02 | 3M Innovative Properties Company | Abrasive articles having bonding systems containing abrasive particles |
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| US6878629B1 (en) * | 2002-06-27 | 2005-04-12 | International Business Machines Corporation | Method for detecting CMP endpoint in acidic slurries |
| US6899784B1 (en) * | 2002-06-27 | 2005-05-31 | International Business Machines Corporation | Apparatus for detecting CMP endpoint in acidic slurries |
| US6752858B1 (en) * | 2002-12-13 | 2004-06-22 | Kerr-Mcgee Chemical, Llc | Circumferential air knife and applications |
| US6910951B2 (en) * | 2003-02-24 | 2005-06-28 | Dow Global Technologies, Inc. | Materials and methods for chemical-mechanical planarization |
| US6913518B2 (en) * | 2003-05-06 | 2005-07-05 | Applied Materials, Inc. | Profile control platen |
| US6918821B2 (en) * | 2003-11-12 | 2005-07-19 | Dow Global Technologies, Inc. | Materials and methods for low pressure chemical-mechanical planarization |
| US20050126708A1 (en) * | 2003-12-10 | 2005-06-16 | Applied Materials, Inc. | Retaining ring with slurry transport grooves |
| US7520968B2 (en) * | 2004-10-05 | 2009-04-21 | Applied Materials, Inc. | Conductive pad design modification for better wafer-pad contact |
| JP2006159317A (ja) * | 2004-12-03 | 2006-06-22 | Asahi Sunac Corp | 研磨パッドのドレッシング方法 |
-
2006
- 2006-06-27 US US11/475,639 patent/US7452264B2/en not_active Expired - Fee Related
-
2007
- 2007-06-20 WO PCT/US2007/071701 patent/WO2008002811A2/en not_active Ceased
- 2007-06-20 JP JP2009518460A patent/JP5020317B2/ja not_active Expired - Fee Related
- 2007-06-27 TW TW096123378A patent/TWI354584B/zh active
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