JP2009511886A - ポイント・オブ・ケア・オスモル濃度検査のための方法および装置 - Google Patents
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Abstract
【解決手段】装置(26)は、試料流体の受け入れおよび検査のために流体経路が貫通している試料受け入れチップ(2)を有する。本発明により、試料流体のオスモル濃度検査が可能になり、試料流体は、容量が約30nL未満であり、また本発明により、流体の蒸発も低減しつつ、臨床の場において迅速かつ正確に流体オスモル濃度を測定する方法および装置が実現される。
【選択図】図1
Description
Claims (20)
- 試料受け入れチップであって、
試料流体を受け入れるために前記基板を貫通する流体経路を有する基板であって、該流体経路が、第1のポートと、少なくとも1つの第2のポートと、窪んだ流路とを含み、該窪んだ流路が基板中に封入される、基板と、
前記試料流体の特性を測定するために前記窪んだ流路中の前記試料流体に接触するように前記基板中に配置された少なくとも2つの電極と、
を含む、
試料受け入れチップ。 - 前記基板がさらに、
a) 前記少なくとも2つの電極へのアクセスを提供する少なくとも2つの電極窓、および
b) 接点に接続された前記少なくとも2つの電極、
の一方を含み、前記接点は、前記基板の外表面に配置されている、
請求項1に記載のチップ。 - 前記基板が多層である、請求項1に記載のチップ。
- 前記基板が、菫青石(コージライト)ベースのガラス・セラミックであり、前記少なくとも2つの電極が、銅、ニッケル、およびガラス・セラミックで共焼結される、請求項1に記載のチップ。
- 前記試料流体が、30nL未満の容量を有する、請求項1に記載のチップ。
- 前記第1のポートが、前記試料流体を前記窪んだ流路に流し込み、前記少なくとも1つの第2のポートが、前記窪んだ流路をガス抜きする、請求項1に記載のチップ。
- 前記チップが装置に結合されており、該装置は、ベース部材と、試料流体を受け入れるために前記ベース部材に固定された試料受け入れチップと、前記試料流体を前記試料受け入れチップ上に置くために前記ベース部材に固定された導管であって、第1の端部および第2の端部を含む導管と、を含む、請求項1に記載のチップ。
- オスモル濃度検査のための装置であって、
ベース部材と、
試料流体を受け入れるために前記ベース部材に固定された試料受け入れチップと、
前記試料流体を前記試料受け入れチップ上に置くために前記ベース部材に固定された導管であって、第1の端部および第2の端部を含む導管と、
を含む、
装置。 - 毛細管容器をさらに含み、該毛細管容器が、
ベース・ユニットであって、前記導管を前記ベース・ユニットに固定するための留め具と、前記導管の前記第1の端部を受け入れるためのチャンバであって、実質的に可撓性の隔壁を含むチャンバと、を含むベース・ユニットと、
前記導管の前記第2の端部から前記試料流体を排出するためにチャンバ圧力を変更するために、前記実質的に可撓性の隔壁に外圧をかけるための機構と、
を含む、
請求項8に記載の装置。 - 前記試料受け入れチップが、
試料流体を受け入れるために前記基板を貫通する流体経路を有する基板であって、該流体経路が、第1のポートと、少なくとも1つの第2のポートと、窪んだ流路とを含み、該窪んだ流路が基板中に封入される基板と、
前記試料流体の特性を測定するために前記窪んだ流路中の前記試料流体に接触するように前記基板中に配置された少なくとも2つの電極と、
を含む、
請求項8に記載の装置。 - 前記基板がさらに、
a) 前記少なくとも2つの電極へのアクセスを提供する少なくとも2つの電極窓、および
b) 接点に接続された前記少なくとも2つの電極、
の一方を含み、前記接点は、前記基板の外表面に配置されている、
請求項10に記載の装置。 - 前記基板が、菫青石ベースのガラス・セラミックであり、前記少なくとも2つの電極が、銅、ニッケル、およびガラス・セラミックで共焼結される、請求項10に記載の装置。
- 前記第1のポートが、前記試料流体を前記窪んだ流路に流し込み、前記少なくとも1つの第2のポートが、前記窪んだ流路をガス抜きする、請求項10に記載の装置。
- 前記導管の前記第1の端部が試料流体を抽出し、前記導管の前記第2の端部が前記試料流体を前記試料受け入れチップ上に置く、請求項10の装置。
- 前記ベース部材が、前記試料流体のオスモル濃度を決定するように構成された導電率測定回路をさらに含む、請求項8に記載の装置。
- 試料流体のオスモル濃度を決定するための方法であって、
ベース部材に固定された導管を通して試料流体を試料受け入れチップまで連通させるステップと、
前記試料流体のオスモル濃度を決定するステップと、
を含む、
方法。 - 前記試料受け入れチップが、
試料流体を受け入れるために前記基板を貫通する流体経路を有する基板であって、該流体経路が、第1のポートと、少なくとも1つの第2のポートと、窪んだ流路とを含み、該窪んだ流路が基板中に封入される、基板と、
前記試料流体の特性を測定するために前記窪んだ流路中の前記試料流体に接触するように前記基板中に配置された、多層セラミックで共焼結された少なくとも2つの電極と、
を含む、
請求項16に記載の方法。 - 前記連通させるステップが、ベース・ユニットに外圧をかけるステップを含み、前記ベース・ユニットは、前記導管の第1の端部を受け入れるためのチャンバを含み、該チャンバは、実質的に可撓性の隔壁を含む、請求項16に記載の方法。
- 前記試料流体の前記オスモル濃度を決定する前記ステップが、導電率値を得るために前記試料流体の前記導電率を測定するステップと、前記導電率を対応するオスモル濃度値に変換するステップと、を含む、請求項16に記載の方法。
- 前記連通させるステップが、人間の眼球上の体液の生体内試料と接触させるステップを含み、前記試料流体は、毛管力により前記導管内に引き込まれる、請求項16に記載の方法。
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Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/163,327 US7344679B2 (en) | 2005-10-14 | 2005-10-14 | Method and apparatus for point of care osmolarity testing |
US11/163,327 | 2005-10-14 | ||
PCT/EP2006/067341 WO2007042555A1 (en) | 2005-10-14 | 2006-10-12 | Method and apparatus for point of care osmolarity testing |
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JP2009511886A true JP2009511886A (ja) | 2009-03-19 |
JP2009511886A5 JP2009511886A5 (ja) | 2009-04-30 |
JP5046164B2 JP5046164B2 (ja) | 2012-10-10 |
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JP2008535032A Expired - Fee Related JP5046164B2 (ja) | 2005-10-14 | 2006-10-12 | ポイント・オブ・ケア・オスモル濃度検査のための方法および装置 |
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Country | Link |
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US (3) | US7344679B2 (ja) |
EP (1) | EP1946071A1 (ja) |
JP (1) | JP5046164B2 (ja) |
KR (1) | KR101120823B1 (ja) |
CN (1) | CN101287979A (ja) |
TW (1) | TWI377933B (ja) |
WO (1) | WO2007042555A1 (ja) |
Cited By (4)
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Also Published As
Publication number | Publication date |
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EP1946071A1 (en) | 2008-07-23 |
US20080050282A1 (en) | 2008-02-28 |
KR20080048529A (ko) | 2008-06-02 |
CN101287979A (zh) | 2008-10-15 |
WO2007042555A1 (en) | 2007-04-19 |
US7344679B2 (en) | 2008-03-18 |
US20070086927A1 (en) | 2007-04-19 |
JP5046164B2 (ja) | 2012-10-10 |
KR101120823B1 (ko) | 2012-03-23 |
US20080053206A1 (en) | 2008-03-06 |
TW200730129A (en) | 2007-08-16 |
TWI377933B (en) | 2012-12-01 |
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