JP2009200496A5 - - Google Patents

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Publication number
JP2009200496A5
JP2009200496A5 JP2009037541A JP2009037541A JP2009200496A5 JP 2009200496 A5 JP2009200496 A5 JP 2009200496A5 JP 2009037541 A JP2009037541 A JP 2009037541A JP 2009037541 A JP2009037541 A JP 2009037541A JP 2009200496 A5 JP2009200496 A5 JP 2009200496A5
Authority
JP
Japan
Prior art keywords
segment
sugar water
soluble polymer
polymer
composition contains
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2009037541A
Other languages
English (en)
Japanese (ja)
Other versions
JP2009200496A (ja
JP5514449B2 (ja
Filing date
Publication date
Priority claimed from US12/072,015 external-priority patent/US20090215266A1/en
Application filed filed Critical
Publication of JP2009200496A publication Critical patent/JP2009200496A/ja
Publication of JP2009200496A5 publication Critical patent/JP2009200496A5/ja
Application granted granted Critical
Publication of JP5514449B2 publication Critical patent/JP5514449B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2009037541A 2008-02-22 2009-02-20 銅含有パターン付きウエーハの研磨 Active JP5514449B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/072,015 US20090215266A1 (en) 2008-02-22 2008-02-22 Polishing Copper-Containing patterned wafers
US12/072,015 2008-02-22

Publications (3)

Publication Number Publication Date
JP2009200496A JP2009200496A (ja) 2009-09-03
JP2009200496A5 true JP2009200496A5 (enExample) 2012-03-08
JP5514449B2 JP5514449B2 (ja) 2014-06-04

Family

ID=40521506

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009037541A Active JP5514449B2 (ja) 2008-02-22 2009-02-20 銅含有パターン付きウエーハの研磨

Country Status (6)

Country Link
US (1) US20090215266A1 (enExample)
EP (1) EP2093789A3 (enExample)
JP (1) JP5514449B2 (enExample)
KR (1) KR101560648B1 (enExample)
CN (1) CN101515546B (enExample)
TW (1) TWI487760B (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102121127A (zh) * 2011-01-04 2011-07-13 安徽工业大学 一种集成电路铜互连结构中铜的电化学机械抛光液
WO2012105651A1 (ja) * 2011-02-03 2012-08-09 ニッタ・ハース株式会社 研磨用組成物およびそれを用いた研磨方法
US8435896B2 (en) * 2011-03-03 2013-05-07 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Stable, concentratable chemical mechanical polishing composition and methods relating thereto
US8440097B2 (en) 2011-03-03 2013-05-14 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Stable, concentratable, water soluble cellulose free chemical mechanical polishing composition
CN104131289B (zh) * 2014-07-01 2015-09-23 安徽拓普森电池有限责任公司 一种具有杀菌效果的抛光液及其制备方法
JP6837958B2 (ja) 2017-12-28 2021-03-03 花王株式会社 酸化珪素膜用研磨液組成物
CN116438267A (zh) * 2020-10-29 2023-07-14 富士胶片电子材料美国有限公司 研磨组成物及其使用方法
CN114561187B (zh) * 2022-03-07 2022-10-21 山东麦丰新材料科技股份有限公司 一种环保型乳化精磨液及其制备方法
EP4643371A1 (en) * 2022-12-29 2025-11-05 Basf Se Composition for selectively removing oxide compounds and etching residues of one or both of co and cu

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4642221A (en) * 1983-07-05 1987-02-10 Atlantic Richfield Company Method and composition for inhibiting corrosion in aqueous heat transfer systems
JPH0982668A (ja) * 1995-09-20 1997-03-28 Sony Corp 研磨用スラリー及びこの研磨用スラリーを用いる研磨方法
JP2000160139A (ja) * 1998-12-01 2000-06-13 Fujimi Inc 研磨用組成物およびそれを用いた研磨方法
US6238592B1 (en) * 1999-03-10 2001-05-29 3M Innovative Properties Company Working liquids and methods for modifying structured wafers suited for semiconductor fabrication
JP3941284B2 (ja) * 1999-04-13 2007-07-04 株式会社日立製作所 研磨方法
US6234875B1 (en) * 1999-06-09 2001-05-22 3M Innovative Properties Company Method of modifying a surface
AU6537000A (en) * 1999-08-13 2001-03-13 Cabot Microelectronics Corporation Polishing system with stopping compound and method of its use
US7041599B1 (en) * 1999-12-21 2006-05-09 Applied Materials Inc. High through-put Cu CMP with significantly reduced erosion and dishing
WO2001060940A1 (en) * 2000-02-16 2001-08-23 Rodel Inc Biocides for polishing slurries
US6451697B1 (en) * 2000-04-06 2002-09-17 Applied Materials, Inc. Method for abrasive-free metal CMP in passivation domain
US6409781B1 (en) * 2000-05-01 2002-06-25 Advanced Technology Materials, Inc. Polishing slurries for copper and associated materials
US20020068454A1 (en) * 2000-12-01 2002-06-06 Applied Materials, Inc. Method and composition for the removal of residual materials during substrate planarization
US6632259B2 (en) * 2001-05-18 2003-10-14 Rodel Holdings, Inc. Chemical mechanical polishing compositions and methods relating thereto
US7029373B2 (en) * 2001-08-14 2006-04-18 Advanced Technology Materials, Inc. Chemical mechanical polishing compositions for metal and associated materials and method of using same
US6692546B2 (en) * 2001-08-14 2004-02-17 Advanced Technology Materials, Inc. Chemical mechanical polishing compositions for metal and associated materials and method of using same
US6805812B2 (en) * 2001-10-11 2004-10-19 Cabot Microelectronics Corporation Phosphono compound-containing polishing composition and method of using same
US20030119692A1 (en) * 2001-12-07 2003-06-26 So Joseph K. Copper polishing cleaning solution
US20040077295A1 (en) * 2002-08-05 2004-04-22 Hellring Stuart D. Process for reducing dishing and erosion during chemical mechanical planarization
JP2005142516A (ja) * 2003-06-11 2005-06-02 Toshiro Doi 化学機械研磨用スラリー組成物及び化学機械研磨方法
JP4464111B2 (ja) * 2003-11-13 2010-05-19 旭硝子株式会社 銅配線研磨用組成物、半導体集積回路表面の研磨方法および半導体集積回路用銅配線の作製方法
US7384871B2 (en) * 2004-07-01 2008-06-10 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Chemical mechanical polishing compositions and methods relating thereto
US7086935B2 (en) * 2004-11-24 2006-08-08 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Cellulose-containing polishing compositions and methods relating thereto
US7435356B2 (en) * 2004-11-24 2008-10-14 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Abrasive-free chemical mechanical polishing compositions and methods relating thereto
TW200714696A (en) * 2005-08-05 2007-04-16 Advanced Tech Materials High throughput chemical mechanical polishing composition for metal film planarization

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