JP2009170909A - 半導体素子の熱処理システム - Google Patents
半導体素子の熱処理システム Download PDFInfo
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- 238000010438 heat treatment Methods 0.000 title claims abstract description 122
- 239000004065 semiconductor Substances 0.000 title claims abstract description 40
- 239000000758 substrate Substances 0.000 claims abstract description 107
- 239000011521 glass Substances 0.000 claims description 52
- 239000003638 chemical reducing agent Substances 0.000 claims description 45
- 239000010453 quartz Substances 0.000 claims description 10
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 10
- 239000000463 material Substances 0.000 claims description 9
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 3
- 229910052782 aluminium Inorganic materials 0.000 claims description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 3
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 claims description 3
- 229910052799 carbon Inorganic materials 0.000 claims description 3
- 239000000919 ceramic Substances 0.000 claims description 3
- 239000002131 composite material Substances 0.000 claims description 3
- 229910052802 copper Inorganic materials 0.000 claims description 3
- 239000010949 copper Substances 0.000 claims description 3
- 238000009434 installation Methods 0.000 abstract description 9
- 239000010409 thin film Substances 0.000 description 14
- 238000000034 method Methods 0.000 description 8
- 229910021417 amorphous silicon Inorganic materials 0.000 description 7
- 238000002425 crystallisation Methods 0.000 description 5
- 239000002019 doping agent Substances 0.000 description 4
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 239000000498 cooling water Substances 0.000 description 2
- 230000008025 crystallization Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 2
- 238000004151 rapid thermal annealing Methods 0.000 description 2
- 238000004904 shortening Methods 0.000 description 2
- 239000007790 solid phase Substances 0.000 description 2
- 230000001360 synchronised effect Effects 0.000 description 2
- 230000004913 activation Effects 0.000 description 1
- 238000000137 annealing Methods 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 238000010924 continuous production Methods 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 229910021419 crystalline silicon Inorganic materials 0.000 description 1
- 238000007715 excimer laser crystallization Methods 0.000 description 1
- 238000005224 laser annealing Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/324—Thermal treatment for modifying the properties of semiconductor bodies, e.g. annealing, sintering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67742—Mechanical parts of transfer devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67751—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber vertical transfer of a single workpiece
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68742—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a lifting arrangement, e.g. lift pins
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Robotics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
【解決手段】半導体素子が形成された基板を熱処理する半導体素子の熱処理システムは、移動可能な基板移送板150を備えるローディング部100と、熱処理部フレームの上部に位置する上部炉220、前記上部炉の下部に位置する下部炉230、および前記上部炉または前記下部炉に連結される移動炉240を備え、前記ローディング部から前記基板を受けて前記上部炉、前記移動炉および前記下部炉で熱処理する熱処理部と、前記移動炉が積載され移動可能な水平移動移送板325と、前記水平移動移送板の下部に設けられ、移動可能な垂直移動移送板315を備え、前記水平移動移送板と前記垂直移動移送板を移動させ、前記移動炉を前記上部炉または前記下部炉に連結させるバッファエレベータ部300とを含む。
【選択図】図1
Description
150 基板移送板
200 加熱処理部
220 上部炉
230 下部炉
240 移動炉
300 バッファエレベータ部
315 垂直移動移送板
325 水平移動移送板
Claims (13)
- 半導体素子が形成された基板を熱処理する半導体素子の熱処理システムにおいて、
移動可能な基板移送板を備えるローディング部と、
熱処理部フレームの上部に位置する上部炉、前記上部炉の下部に位置する下部炉、および前記上部炉または前記下部炉に連結される移動炉を備え、前記ローディング部から前記基板を受けて前記上部炉、前記移動炉および前記下部炉で熱処理する熱処理部と、
前記移動炉が積載され移動可能な水平移動移送板と、前記水平移動移送板の下部に設けられ、移動可能な垂直移動移送板を備え、前記水平移動移送板と前記垂直移動移送板を移動させ、前記移動炉を前記上部炉または前記下部炉に連結させるバッファエレベータ部とを含むことを特徴とする半導体素子の熱処理システム。 - 前記上部炉、前記下部炉、および前記移動炉のそれぞれは、少なくとも1つ以上の加熱炉(furnace)で構成され、前記加熱炉の内部は石英材質からなることを特徴とする請求項1に記載の半導体素子の熱処理システム。
- 前記上部炉、前記下部炉および前記移動炉間で前記基板の往来が可能なように、互いに対向する前記上部における最後の加熱炉と前記移動炉における加熱炉のそれぞれの側面、および前記移動炉の加熱炉と対向する前記下部炉における一番目の加熱炉の側面にゲートドアが備えられることを特徴とする請求項2に記載の半導体素子の熱処理システム。
- 前記ゲートドアは、
外観となり、プレート状に形成されるボディー部と、
前記基板が前記加熱炉に出入りできるように前記ボディー部に溝状に形成されるゲートと、
前記ゲートを開閉できるように前記ボディー部に設けられるシャッタープレートと、
前記シャッタープレートの下部に取り付けられ、前記シャッタープレートを移動させるシリンダと、
前記シャッタープレートの両側に前記シャッタープレートと連結される形態で設けられ、前記シャッタープレートの移動時に前記シャッタープレートが均衡スライドするようにガイドするエルエムガイドとを含むことを特徴とする請求項3に記載の半導体素子の熱処理システム。 - 前記シャッタープレートは、石英、不透明石英、アルミナ、セラミックスガラスおよびカーボン複合材から選択されたいずれか1つから形成されることを特徴とする請求項4に記載の半導体素子の熱処理システム。
- 前記ボディー部はアルミニウム材質から形成されることを特徴とする請求項4に記載の半導体素子の熱処理システム。
- 前記ゲートドアは、前記ボディー部に巻く形態で設けられ、銅材質からなるパイプをさらに含むことを特徴とする請求項6に記載の半導体素子の熱処理システム。
- 前記ローディング部は、
外観となるローディング部フレームと、
前記ローディング部フレームの内部の下部に設けられ、電源の印加によって駆動されるサーボモータと、
前記サーボモータと連結され、前記サーボモータの駆動によって回転するマイターギアと、
垂直に接する二軸を有し前記マイターギアの両側にそれぞれ設けられ、一軸が前記マイターギアと連結されて前記マイターギアの回転によって回転するワーム減速器と、
前記ワーム減速器の他軸に連結されて前記ローディング部の上部に延び、前記基板移送板と連結され、前記ワーム減速器の回転によって回転して前記基板移送板を上下に移動させるボールスクリューと、
前記ボールスクリューの両側に前記ボールスクリューと平行に設けられ、前記基板移送板と連結して前記基板移送板の移動時に前記基板移送板が均衡にスライドするようにガイドするエルエムガイドとを含むことを特徴とする請求項1に記載の半導体素子の熱処理システム。 - 前記ローディング部は、
前記ローディング部フレーム内部の上部および下部にそれぞれ設けられ、前記基板移送板の上下移動位置をセンシングする位置センサと、
前記ローディング部フレームの内部に前記基板移送板の原点となる位置に設けられ、前記サーボモータが前記基板移送板の原点をキャッチできるようにセンシングするホームセンサとをさらに含むことを特徴とする請求項8に記載の半導体素子の熱処理システム。 - 前記バッファエレベータ部は、
外観となるバッファエレベータ部フレーム内で前記移動炉を垂直方向に移動させる垂直移動部と、前記移動炉を水平方向に移動させる水平移動部とを含んでなることを特徴とする請求項1に記載の半導体素子の熱処理システム。 - 前記垂直移動部は、
前記バッファエレベータ部フレーム内部の下部に設けられ、電源の印加によって駆動する第1サーボモータと、
前記第1サーボモータと連結され、前記第1サーボモータの駆動によって回転するマイターギアと、
垂直に接する二軸を有し前記マイターギアの両側にそれぞれ設けられ、一軸が前記マイターギアと連結して前記マイターギアの回転によって回転するワーム減速器と、
前記ワーム減速器の他軸に連結されて前記バッファエレベータ部の上部に延び、前記垂直移動移送板と連結され、前記ワーム減速器の回転によって回転して前記垂直移動移送板を上下に移動させる第1ボールスクリューと、
前記第1ボールスクリューの両側に前記第1ボールスクリューと平行に設けられ、前記垂直移動移送板と連結して前記垂直移動移送板の移動時に前記垂直移動移送板が均衡にスライドするようにガイドする第1エルエムガイドとを含むことを特徴とする請求項10に記載の半導体素子の熱処理システム。 - 前記垂直移動部は、
前記バッファエレベータ部フレームの内部の上部および下部にそれぞれ設けられ、前記垂直移動移送板の上下移動位置をセンシングする位置センサと、
前記バッファエレベータ部フレームの内部に前記垂直移動移送板の原点となる位置に設けられ、前記第1サーボモータが前記垂直移動移送板の原点をキャッチできるようにセンシングするホームセンサとをさらに含むことを特徴とする請求項11に記載の半導体素子の熱処理システム。 - 前記水平移動部は、
前記水平移動移送板と前記垂直移動移送板との間に設けられ電源の印加によって駆動される第2サーボモータと、
前記第2サーボモータと連結され、前記第2サーボモータの駆動によって回転して前記水平移動移送板を左右に移動させる第2ボールスクリューと、
前記第2ボールスクリューの両側に前記第2ボールスクリューと平行に設けられ、前記水平移動移送板と連結して前記水平移動移送板の移動時に前記水平移動移送板が均衡にスライドするようにガイドする第2エルエムガイドとを含むことを特徴とする請求項10に記載の半導体素子の熱処理システム。
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KR1020080002905A KR100945912B1 (ko) | 2008-01-10 | 2008-01-10 | 반도체 소자의 열처리 장치 |
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CN109132474A (zh) * | 2017-06-28 | 2019-01-04 | 江苏凯尔生物识别科技有限公司 | 水平竖直一体式接驳传送体系 |
CN112853474A (zh) * | 2021-02-26 | 2021-05-28 | 连智(大连)智能科技有限公司 | 一种直拉法单晶硅炉热场自动拆除设备 |
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KR101104201B1 (ko) * | 2010-07-13 | 2012-01-10 | (주)에스엠텍 | 기판 열처리 장치 |
KR101254931B1 (ko) * | 2010-09-29 | 2013-04-16 | 에스엔유 프리시젼 주식회사 | 이송 장치 |
CN106743655A (zh) * | 2017-02-17 | 2017-05-31 | 江苏凯尔生物识别科技有限公司 | Smt生产线pcb接驳设备 |
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2008
- 2008-01-10 KR KR1020080002905A patent/KR100945912B1/ko active IP Right Grant
- 2008-12-23 TW TW097150338A patent/TWI397127B/zh not_active IP Right Cessation
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2009
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Cited By (2)
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CN109132474A (zh) * | 2017-06-28 | 2019-01-04 | 江苏凯尔生物识别科技有限公司 | 水平竖直一体式接驳传送体系 |
CN112853474A (zh) * | 2021-02-26 | 2021-05-28 | 连智(大连)智能科技有限公司 | 一种直拉法单晶硅炉热场自动拆除设备 |
Also Published As
Publication number | Publication date |
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KR100945912B1 (ko) | 2010-03-05 |
KR20090077133A (ko) | 2009-07-15 |
TWI397127B (zh) | 2013-05-21 |
JP5006350B2 (ja) | 2012-08-22 |
TW200931538A (en) | 2009-07-16 |
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