JP2009128218A - Electric contact and inspection tool having it - Google Patents

Electric contact and inspection tool having it Download PDF

Info

Publication number
JP2009128218A
JP2009128218A JP2007304311A JP2007304311A JP2009128218A JP 2009128218 A JP2009128218 A JP 2009128218A JP 2007304311 A JP2007304311 A JP 2007304311A JP 2007304311 A JP2007304311 A JP 2007304311A JP 2009128218 A JP2009128218 A JP 2009128218A
Authority
JP
Japan
Prior art keywords
contact
deformation
deforming
deformable
spring constant
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2007304311A
Other languages
Japanese (ja)
Other versions
JP5103566B2 (en
Inventor
Kenji Dobashi
賢治 土橋
Mitsuhiko Ito
光彦 伊藤
Kazuhiko Morozumi
和彦 両角
Kenichi Kagawa
健一 加川
Saimo Kin
宰模 金
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
KOYO TECHNOS KK
MICRO PRECISION KK
TOWA DENKI KK
Original Assignee
KOYO TECHNOS KK
MICRO PRECISION KK
TOWA DENKI KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by KOYO TECHNOS KK, MICRO PRECISION KK, TOWA DENKI KK filed Critical KOYO TECHNOS KK
Priority to JP2007304311A priority Critical patent/JP5103566B2/en
Publication of JP2009128218A publication Critical patent/JP2009128218A/en
Application granted granted Critical
Publication of JP5103566B2 publication Critical patent/JP5103566B2/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Abstract

<P>PROBLEM TO BE SOLVED: To provide an electric contact that is brought into contact with a contact object at a predetermined contact pressure and has deflection amount of a predetermined amount or more. <P>SOLUTION: This electric contact 2 integrally formed of a thin plate having conductivity and spring property comprises a first contact section 2c having one end section, a second contact section 2d having the other end section, and a deforming section 2e for connecting the first contact part 2c to the second contact section 2d and deforming the electric contact 2 in the longitudinal direction of the electric contact 2. The deforming section 2e has a first deforming section 2j connected to the first contact section 2c, a second deforming section 2k connected to the second contact section 2d, and a third deforming section 2m arranged between the first deforming section 2j and the second deforming section 2k. The spring constant of the third deforming section 2m is smaller than that of the first deforming section 2j and that of the second deforming section 2k. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

本発明は、回路基板や電子部品等の電気的特性を検査するための電気接触子およびこの電気接触子を備える検査冶具に関する。   The present invention relates to an electrical contact for inspecting electrical characteristics of a circuit board, an electronic component, and the like, and an inspection jig including the electrical contact.

一般に、回路基板の配線パターンあるいはIC等の集積回路の短絡や断線等の異常を発見するための電気的検査には、検査対象物に接触する複数の電気接触子を備える検査冶具が使用されている。この種の検査冶具では、一般的に、線状に形成された接触ピンが電気接触子として使用されている。また、電気接触子として、板バネを用いた検査冶具も知られている(たとえば、特許文献1および2参照)。   In general, an inspection jig having a plurality of electrical contacts that contact an object to be inspected is used for an electrical inspection to detect an abnormality such as a short circuit or disconnection of a circuit board wiring pattern or an integrated circuit such as an IC. Yes. In this type of inspection jig, generally, a contact pin formed in a linear shape is used as an electric contact. Further, an inspection jig using a leaf spring as an electrical contact is also known (see, for example, Patent Documents 1 and 2).

特許文献1および2に記載の電気接触子は、2枚の板体と板体間を繋ぐ帯状物とから構成されている。この電気接触子では、一方の板体の端部が検査対象物に接触し、この一方の板体が検査対象物に接触すると、帯状物が弾性変形する。なお、特許文献1および2に記載の帯状物はたとえば、サインカーブ状に形成されている。   The electric contacts described in Patent Documents 1 and 2 are composed of two plate bodies and a belt-like object connecting the plate bodies. In this electrical contact, when the end of one plate contacts the inspection object, and the one plate contacts the inspection object, the belt-like object is elastically deformed. In addition, the strip | belt-shaped object of patent document 1 and 2 is formed in the sine curve shape, for example.

特開2004−170360号公報JP 2004-170360 A 特開2004−144663号公報JP 2004-144663 A

検査対象物の電気的検査を行うための検査冶具では、電気接触子を所定の接触圧で検査対象物に接触させないと、検査対象物と検査装置の本体側とを適切に導通させることは困難である。また、電気接触子の撓み量が所定量以上でないと、複数の電気接触子のそれぞれを検査対象物に確実に接触させることは困難である。   In an inspection jig for performing electrical inspection of an inspection object, it is difficult to properly connect the inspection object and the main body side of the inspection apparatus unless the electrical contact is brought into contact with the inspection object with a predetermined contact pressure. It is. Moreover, unless the amount of bending of the electrical contact is greater than or equal to a predetermined amount, it is difficult to reliably contact each of the plurality of electrical contacts with the inspection object.

しかしながら、特許文献1および2に記載の電気接触子では、帯状物がたとえばサインカーブ状に形成されており、帯状物部分のバネ定数は比較的大きい。そのため、特許文献1および2に記載の電気接触子を所定の接触圧で検査対象物に接触させることは可能であるが、電気接触子の撓み量を所定量以上とすることは困難である。   However, in the electrical contacts described in Patent Documents 1 and 2, the strip is formed in a sine curve, for example, and the spring constant of the strip portion is relatively large. For this reason, it is possible to bring the electrical contact described in Patent Documents 1 and 2 into contact with the inspection object with a predetermined contact pressure, but it is difficult to set the amount of deflection of the electrical contact to a predetermined amount or more.

そこで、本発明の課題は、所定の接触圧で被接触物に接触させることが可能で、かつ、撓み量を所定量以上とすることが可能な電気接触子およびこの電気接触子を備える検査冶具を提供することにある。   SUMMARY OF THE INVENTION An object of the present invention is to provide an electrical contact that can be brought into contact with an object to be contacted with a predetermined contact pressure and that can be deflected to a predetermined amount or more, and an inspection jig equipped with the electrical contact. Is to provide.

上記の課題を解決するため、本発明は、導電性およびバネ性を有する薄板によって一体で形成される電気接触子において、一端部を構成するとともに所定の第1被接触物に接触する第1接触部と、他端部を構成するとともに所定の第2被接触物に接触する第2接触部と、第1接触部と第2接触部とを繋ぐとともに電気接触子の長手方向へ電気接触子を変形させるための変形部とを備え、変形部は、第1接触部に繋がる第1変形部と、第2接触部に繋がる第2変形部と、第1変形部と第2変形部との間に配置される第3変形部とを備え、第3変形部のバネ定数は、第1変形部のバネ定数および第2変形部のバネ定数よりも小さくなっていることを特徴とする。   In order to solve the above-mentioned problems, the present invention provides a first contact that constitutes one end and contacts a predetermined first contact object in an electric contact formed integrally by a thin plate having conductivity and spring property. And the second contact portion that constitutes the other end portion and contacts the predetermined second contacted object, and connects the first contact portion and the second contact portion, and the electric contactor in the longitudinal direction of the electric contactor A deformable portion for deforming, the deformable portion between the first deformable portion connected to the first contact portion, the second deformable portion connected to the second contact portion, and the first deformable portion and the second deformable portion. And a spring constant of the third deformation portion is smaller than a spring constant of the first deformation portion and a spring constant of the second deformation portion.

本発明の電気接触子では、第1接触部と第2接触部とを繋ぐ変形部が、第1変形部と、第2変形部と、第1変形部のバネ定数および第2変形部のバネ定数よりもバネ定数の小さな第3変形部とを備えている。そのため、第1接触部が第1被接触物に接触し、第2接触部が第2被接触物に接触すると、まず、比較的バネ定数の小さな第3変形部が主として変形し、その後、比較的バネ定数の大きな第1変形部および第2変形部が変形する。その結果、本発明では、バネ定数の小さな第3変形部の変形によって、電気接触子の撓み量を所定量以上とすることが可能になり、かつ、バネ定数の大きな第1変形部および第2変形部の変形によって、所定の接触圧で電気接触子を第1被接触物および第2被接触物に接触させることが可能になる。   In the electric contact according to the present invention, the deforming portion connecting the first contact portion and the second contact portion includes the first deforming portion, the second deforming portion, the spring constant of the first deforming portion, and the spring of the second deforming portion. A third deforming portion having a spring constant smaller than the constant. Therefore, when the first contact portion comes into contact with the first contact object and the second contact portion comes into contact with the second contact object, the third deformation portion having a relatively small spring constant is mainly deformed, and then the comparison is performed. The first deformable portion and the second deformable portion having a large static spring constant are deformed. As a result, in the present invention, the deformation of the third deforming portion having a small spring constant enables the amount of bending of the electric contactor to be equal to or greater than a predetermined amount, and the first deforming portion and the second having a large spring constant. Due to the deformation of the deformation portion, the electric contact can be brought into contact with the first contact object and the second contact object with a predetermined contact pressure.

また、本発明の電気接触子では、比較的バネ定数が大きくて変形しにくい第1変形部が第1接触部に繋がり、同じく変形しにくい第2変形部が第2接触部に繋がっている。そのため、電気接触子の変形時に応力が集中しやすい第1接触部と第1変形部との境界部分および第2接触部と第2変形部との境界部分の機械強度を向上させることができる。その結果、本発明では、電気接触子の破壊を抑制することができる。   In the electrical contact according to the present invention, the first deformable portion that has a relatively large spring constant and is difficult to deform is connected to the first contact portion, and the second deformable portion that is also difficult to deform is connected to the second contact portion. Therefore, it is possible to improve the mechanical strength of the boundary portion between the first contact portion and the first deformable portion and the boundary portion between the second contact portion and the second deformable portion where stress tends to concentrate when the electric contact is deformed. As a result, in the present invention, it is possible to suppress the destruction of the electrical contact.

本発明において、変形部は、略ジグザグ状に形成されるとともに、第1変形部および第2変形部は、長手方向に平行な第1平面に略平行な方向で変形する曲面状に形成され、第3変形部は、複数の平面部と、複数の平面部を繋ぐとともに第1変形部および第2変形部よりも大きな曲率でかつ第1平面に略平行な方向で変形する接続曲面部とを備えることが好ましい。このように構成すると、バネ定数が比較的大きな第1変形部および第2変形部とバネ定数の比較的小さな第3変形部とを備える変形部を容易に形成することが可能になる。   In the present invention, the deformation portion is formed in a substantially zigzag shape, and the first deformation portion and the second deformation portion are formed in a curved surface shape that is deformed in a direction substantially parallel to a first plane parallel to the longitudinal direction, The third deforming portion includes a plurality of plane portions and a connecting curved surface portion that connects the plurality of plane portions and has a larger curvature than the first deforming portion and the second deforming portion and deforms in a direction substantially parallel to the first plane. It is preferable to provide. If comprised in this way, it will become possible to form easily the deformation | transformation part provided with the 1st deformation part and 2nd deformation part with a comparatively large spring constant, and the 3rd deformation part with a comparatively small spring constant.

本発明において、第3変形部は、長手方向に向かって平面部から突出する突起部を備えることが好ましい。このように構成すると、比較的バネ定数が小さくて変形しやすい第3変形部の過剰な変形を抑制することができ、第3変形部の破壊を抑制することができる。   In this invention, it is preferable that a 3rd deformation part is provided with the projection part which protrudes from a plane part toward a longitudinal direction. If comprised in this way, the excessive deformation | transformation of the 3rd deformation | transformation part which has a comparatively small spring constant and is easy to deform | transform can be suppressed, and destruction of a 3rd deformation | transformation part can be suppressed.

本発明において、突起部は、平面部の端部側であって、長手方向における複数の接続曲面部の間に形成されていることが好ましい。このように構成すると、第3変形部がジグザグ状に形成される場合であっても、電気接触子の変形時には、突起部を介して平面部の端部側同士を短絡させることが可能になる。したがって、第3変形部における電気抵抗値を低減することが可能になる。また、第3変形部のインダクタンスを低減することが可能になり、電気接触子の高周波特性を向上させることが可能になる。   In this invention, it is preferable that the projection part is the edge part side of a plane part, Comprising: It forms between the some connection curved surface parts in a longitudinal direction. If comprised in this way, even if it is a case where a 3rd deformation | transformation part is formed in zigzag shape, it will become possible to short-circuit the edge part sides of a plane part via a projection part at the time of a deformation | transformation of an electric contactor. . Therefore, it becomes possible to reduce the electrical resistance value in the third deformed portion. Moreover, it becomes possible to reduce the inductance of a 3rd deformation part, and it becomes possible to improve the high frequency characteristic of an electrical contactor.

本発明において、第1平面に直交する方向での変形部の厚さは、変形部の幅よりも大きくなっていることが好ましい。このように構成すると、変形部でのバネ定数の設定が容易になる。   In this invention, it is preferable that the thickness of the deformation | transformation part in the direction orthogonal to a 1st plane is larger than the width | variety of a deformation | transformation part. If comprised in this way, the setting of the spring constant in a deformation | transformation part will become easy.

本発明において、第3変形部の一端は第1変形部に繋がり、第3変形部の他端は第2変形部に繋がっていることが好ましい。このように構成すると、電気接触子の構成を簡素化することができる。   In the present invention, it is preferable that one end of the third deformation portion is connected to the first deformation portion, and the other end of the third deformation portion is connected to the second deformation portion. If comprised in this way, the structure of an electrical contact can be simplified.

本発明において、第1変形部のバネ定数と第2変形部のバネ定数とは略等しいことが好ましい。第1変形部のバネ定数と第2変形部のバネ定数とが相違する場合には、電気接触子の変形時にバネ定数の小さな方の変形量が大きくなるため、バネ定数の小さな第1変形部または第2変形部に破壊が発生しやすくなるが、このように構成すると、第1変形部および第2変形部を略均等に変形させることが可能になり、第1変形部および第2変形部の破壊を抑制することができる。   In the present invention, it is preferable that the spring constant of the first deformable portion and the spring constant of the second deformable portion are substantially equal. When the spring constant of the first deformable portion is different from the spring constant of the second deformable portion, the amount of deformation with the smaller spring constant increases when the electric contactor is deformed. Alternatively, the second deformable portion is likely to be broken, but if configured in this way, the first deformable portion and the second deformable portion can be deformed substantially uniformly, and the first deformable portion and the second deformable portion. Can be prevented from breaking.

本発明の電気接触子は、第2被接触物としての電極と、電気接触子が配置される配置孔が複数形成される配置部材とを備える検査冶具に用いることができる。この検査冶具では、電気接触子の撓み量を所定量以上とすることが可能になり、かつ、所定の接触圧で電気接触子を第1被接触物および第2被接触物に接触させることが可能になる。また、電気接触子の破壊を抑制することができる。   The electric contact of the present invention can be used for an inspection jig including an electrode as a second contacted object and an arrangement member in which a plurality of arrangement holes in which electric contacts are arranged are formed. In this inspection jig, the amount of bending of the electric contact can be made a predetermined amount or more, and the electric contact can be brought into contact with the first contact object and the second contact object with a predetermined contact pressure. It becomes possible. Moreover, destruction of the electrical contact can be suppressed.

以上のように、本発明の電気接触子および検査冶具では、所定の接触圧で電気接触子を被接触物に接触させることが可能になるとともに、電気接触子の撓み量を所定量以上とすることが可能になる。   As described above, in the electrical contact and the inspection jig of the present invention, the electrical contact can be brought into contact with the contacted object with a predetermined contact pressure, and the deflection amount of the electrical contact is set to a predetermined amount or more. It becomes possible.

以下、本発明の実施の形態を図面に基づいて説明する。   Hereinafter, embodiments of the present invention will be described with reference to the drawings.

(検査冶具の構成)
図1は、本発明の実施の形態にかかる検査冶具1を示す正面図である。図2は、図1のE−E方向から検査冶具1を示す図である。図3は、図1に示す検査冶具1の内部構造を説明するための拡大断面図である。図4は、図3のF−F方向から電気接触子2および配置部材4を示す拡大図である。なお、図2では、一部の電気接触子2および配置孔4aにのみ符号を付している。
(Configuration of inspection jig)
FIG. 1 is a front view showing an inspection jig 1 according to an embodiment of the present invention. FIG. 2 is a diagram illustrating the inspection jig 1 from the EE direction in FIG. 1. FIG. 3 is an enlarged cross-sectional view for explaining the internal structure of the inspection jig 1 shown in FIG. FIG. 4 is an enlarged view showing the electric contact 2 and the arrangement member 4 from the FF direction of FIG. 3. In FIG. 2, only some of the electric contacts 2 and the arrangement holes 4a are denoted by reference numerals.

本形態の検査治具1は、回路基板やIC等の検査対象物(図示省略)の電気的特性を検査して、検査対象物の短絡や断線等の異常を発見するための電気的検査に用いられる。特に、本形態の検査冶具1は、検査対象物に形成される検査用端子の配置ピッチが狭い検査対象物の検査に適している。   The inspection jig 1 of this embodiment is used for an electrical inspection for inspecting an electrical characteristic of an inspection object (not shown) such as a circuit board or an IC to find an abnormality such as a short circuit or a disconnection of the inspection object. Used. In particular, the inspection jig 1 of this embodiment is suitable for inspection of an inspection object having a narrow arrangement pitch of inspection terminals formed on the inspection object.

この検査治具1は、図1〜図3に示すように、検査対象物の検査用端子に接触する先端部2aを有する複数の電気接触子2(以下、「接触子2」とする。)と、接触子2の後端部2bのそれぞれが接触する複数の電極3と、複数の接触子2がそれぞれ1枚ずつ配置される配置孔4aが複数形成された配置部材4と、電極3を保持する電極保持部材5と、検査冶具1が搭載される検査装置(図示省略)の本体部と検査治具1とを電気的に接続するための配線部6とを備えている。配線部6は、複数の導線7(図3参照)によって構成されている。   As shown in FIGS. 1 to 3, the inspection jig 1 has a plurality of electrical contacts 2 (hereinafter referred to as “contacts 2”) having tip portions 2 a that come into contact with the inspection terminals of the inspection object. A plurality of electrodes 3 with which each of the rear end portions 2b of the contactor 2 contacts, an arrangement member 4 having a plurality of arrangement holes 4a in which a plurality of contactors 2 are arranged one by one, and an electrode 3 The electrode holding member 5 to hold | maintain, and the wiring part 6 for electrically connecting the main-body part of the test | inspection apparatus (illustration omitted) in which the test | inspection jig 1 is mounted, and the test | inspection jig 1 are provided. The wiring part 6 is comprised by the some conducting wire 7 (refer FIG. 3).

接触子2は、導電性およびバネ性を有する薄板によって一体で形成されている。たとえば、接触子2は、ニッケル合金等の薄板で形成されている。この接触子2は、非常に薄くかつ非常に小さく形成されている。接触子2の詳細な構成については後述する。   The contact 2 is integrally formed of a thin plate having conductivity and spring properties. For example, the contact 2 is formed of a thin plate such as a nickel alloy. The contact 2 is very thin and very small. The detailed configuration of the contact 2 will be described later.

配置部材4は、絶縁性材料によってブロック状に形成されている。この配置部材4には、上述のように、複数の配置孔4aが形成されている。具体的には、配置部材4には、図1の上下方向に貫通する配置孔4aが複数形成されている。なお、図2では、便宜上、縦方向および横方向に所定ピッチで均等に配置孔4aが形成された配置部材4を図示しているが、実際には、検査対象物の検査用端子の配置に対応するように、複数の配置孔4aが配置部材4に形成されている。   The arrangement member 4 is formed in a block shape from an insulating material. The arrangement member 4 is formed with a plurality of arrangement holes 4a as described above. Specifically, the arrangement member 4 has a plurality of arrangement holes 4a penetrating in the vertical direction in FIG. In FIG. 2, for the sake of convenience, the arrangement member 4 in which the arrangement holes 4a are uniformly formed at a predetermined pitch in the vertical direction and the horizontal direction is illustrated. However, in practice, the arrangement of the inspection terminals of the inspection object is illustrated. A plurality of arrangement holes 4 a are formed in the arrangement member 4 so as to correspond.

配置孔4aは、略丸孔状に形成されている。具体的には、配置孔4aは、端部(図3の下端部)に形成される小径孔4bと、小径孔4bより内径が大きい大径孔4cとから構成されている。小径部4bと大径孔4cとの境界部分には、段部4dが形成されている。   The arrangement hole 4a is formed in a substantially round hole shape. Specifically, the arrangement hole 4a includes a small-diameter hole 4b formed at an end (the lower end in FIG. 3) and a large-diameter hole 4c having a larger inner diameter than the small-diameter hole 4b. A step portion 4d is formed at a boundary portion between the small diameter portion 4b and the large diameter hole 4c.

電極保持部材5は、配置部材4と同様に、絶縁性材料によってブロック状に形成されている。この電極保持部材5は、ネジ等の固定手段によって配置部材4に固定されている。   Similarly to the arrangement member 4, the electrode holding member 5 is formed in a block shape from an insulating material. The electrode holding member 5 is fixed to the arrangement member 4 by fixing means such as screws.

本形態では、配線部6を構成する複数の導線7のそれぞれの先端部分が電極3となっている。具体的には、図3に示すように、導線7の先端部分が電極保持部材5に接着固定されており、電極保持部材5に接着固定された部分が電極3となっている。電極3は、配置孔4aの径方向の中心位置と電極3の径方向の中心位置とが略一致するように、電極保持部材5に保持されている。電極3には、1枚の接触子2の後端部2bが接触している。   In this embodiment, the tip portions of the plurality of conducting wires 7 constituting the wiring portion 6 are the electrodes 3. Specifically, as shown in FIG. 3, the tip portion of the conductive wire 7 is bonded and fixed to the electrode holding member 5, and the portion bonded and fixed to the electrode holding member 5 is the electrode 3. The electrode 3 is held by the electrode holding member 5 so that the radial center position of the arrangement hole 4a and the radial center position of the electrode 3 substantially coincide. The rear end portion 2b of one contact 2 is in contact with the electrode 3.

導線7は、たとえば、銅線の回りに絶縁層となる絶縁被膜(図示省略)が形成されたエナメル線である。この導線7の先端(図3における電極3の下端面、すなわち、接触子2の後端部2bの接触面)には、所定のメッキ層が形成されている。   The conducting wire 7 is, for example, an enameled wire in which an insulating film (not shown) serving as an insulating layer is formed around a copper wire. A predetermined plating layer is formed on the leading end of the conductive wire 7 (the lower end surface of the electrode 3 in FIG. 3, that is, the contact surface of the rear end portion 2b of the contact 2).

(電気接触子の構成)
図5は、図3に示す接触子2の斜視図である。図6は、図3に示す接触子2の一部を拡大した拡大図であり、(A)は図3のG部の拡大図、(B)は図3のH部の拡大図、(C)は図3のJ部の拡大図である。なお、以下の説明では、図3の左右方向をX方向、上下方向をY方向、紙面垂直方向をZ方向とする。また、X方向とY方向とで形成される平面をXY平面、Z方向とX方向とで形成される平面をZX平面とする。
(Configuration of electrical contact)
FIG. 5 is a perspective view of the contact 2 shown in FIG. 6 is an enlarged view in which a part of the contact 2 shown in FIG. 3 is enlarged, (A) is an enlarged view of a G portion in FIG. 3, (B) is an enlarged view of an H portion in FIG. ) Is an enlarged view of a portion J in FIG. In the following description, the left-right direction in FIG. 3 is the X direction, the up-down direction is the Y direction, and the vertical direction on the drawing is the Z direction. A plane formed by the X direction and the Y direction is an XY plane, and a plane formed by the Z direction and the X direction is a ZX plane.

接触子2は、図5等に示すように、先端部2aを含む第1接触部としての先端側接触部2cと、後端部2bを含む第2接触部としての後端側接触部2dと、接触子2の長手方向となるY方向へ接触子2を変形ささせるための変形部2eとを備えている。変形部2eは、先端側接触部2cと後端側接触部2dとを繋いでいる。また、先端側接触部2cは接触子2の一端部を構成し、後端側接触部2dは接触子2の他端部を構成している。なお、本形態では、検査対象物は、先端側接触部2cが接触する第1被接触物であり、電極3は、後端側接触部2dが接触する第2被接触物である。   As shown in FIG. 5 and the like, the contact 2 includes a front end side contact portion 2c as a first contact portion including the front end portion 2a, and a rear end side contact portion 2d as a second contact portion including the rear end portion 2b. And a deforming portion 2e for deforming the contact 2 in the Y direction which is the longitudinal direction of the contact 2. The deformable portion 2e connects the front end side contact portion 2c and the rear end side contact portion 2d. The front end side contact portion 2 c constitutes one end portion of the contact 2, and the rear end side contact portion 2 d constitutes the other end portion of the contact 2. In this embodiment, the inspection object is a first contact object that is in contact with the front end side contact portion 2c, and the electrode 3 is a second contact object that is in contact with the rear end side contact portion 2d.

本形態では、Z方向が接触子2の厚さ方向となる。図4に示すように、接触子2の厚さは小径孔4bの径よりも小さくなっている。また、図5に示すように、接触子2の厚さは略均一となっている。なお、接触子2の長さはたとえば、2〜4mm程度となっている。   In this embodiment, the Z direction is the thickness direction of the contact 2. As shown in FIG. 4, the thickness of the contact 2 is smaller than the diameter of the small diameter hole 4b. Moreover, as shown in FIG. 5, the thickness of the contact 2 is substantially uniform. In addition, the length of the contact 2 is about 2-4 mm, for example.

先端側接触部2cは、先端部2aを含む幅狭部2fと、幅狭部2fよりもX方向の幅が広い幅広部2gとから構成されている。幅狭部2fの幅は、小径孔4bの径より小さくなっており、幅狭部2fが小径孔4bに挿入できるように設定されている。また、幅狭部2fの先端側部分の幅は、先端部2aに向かうにしたがって狭くなっている。幅広部2gの幅は、小径孔4bよりも大きくかつ大径孔4cの径よりも小さくなっており、幅広部2gが小径孔4bに挿入できずかつ大径孔4cに挿入できるように設定されている。   The front end side contact portion 2c includes a narrow portion 2f including the front end portion 2a and a wide portion 2g having a width in the X direction wider than the narrow portion 2f. The width of the narrow part 2f is smaller than the diameter of the small diameter hole 4b, and is set so that the narrow part 2f can be inserted into the small diameter hole 4b. Moreover, the width | variety of the front end side part of the narrow part 2f becomes narrow as it goes to the front-end | tip part 2a. The width of the wide portion 2g is larger than the small diameter hole 4b and smaller than the diameter of the large diameter hole 4c, and is set so that the wide portion 2g cannot be inserted into the small diameter hole 4b but can be inserted into the large diameter hole 4c. ing.

図3に示すように、幅狭部2fは、小径孔4bの中に配置されている。また、幅狭部2fの長さ(Y方向の長さ)は、小径孔4bの長さよりも長くなっている。そのため、配置孔4a内に配置され、後端部2bが電極3に接触した状態の接触子2の先端側は、配置部材4の端面4eから突出している。すなわち、図3に示すように、幅狭部2fの先端側は、端面4eから突出している。たとえば、端面4eからの幅狭部2fの先端側の突出量は、100μmである。   As shown in FIG. 3, the narrow portion 2f is disposed in the small diameter hole 4b. The length of the narrow portion 2f (the length in the Y direction) is longer than the length of the small diameter hole 4b. Therefore, the distal end side of the contact 2 that is arranged in the arrangement hole 4 a and the rear end 2 b is in contact with the electrode 3 protrudes from the end surface 4 e of the arrangement member 4. That is, as shown in FIG. 3, the front end side of the narrow portion 2f protrudes from the end face 4e. For example, the amount of protrusion on the tip side of the narrow portion 2f from the end face 4e is 100 μm.

後端側接触部2dは、大径孔4cの中に配置されている。この後端側接触部2dの幅は、先端側接触部2cの幅広部2gの幅とほぼ等しくなっている。また、後端接触部2dの後端側部分の幅は、後端部2bに向かうにしたがって狭くなっている。   The rear end side contact portion 2d is disposed in the large diameter hole 4c. The width of the rear end side contact portion 2d is substantially equal to the width of the wide portion 2g of the front end side contact portion 2c. Further, the width of the rear end side portion of the rear end contact portion 2d becomes narrower toward the rear end portion 2b.

変形部2eは、先端側接触部2cに繋がる第1変形部2jと、後端側接触部2dに繋がる第2変形部2kと、第1変形部2jと第2変形部2kとの間に配置される第3変形部2mとを備え、大径孔4cの中に配置されている。この変形部2eは全体として略ジグザグ状に形成されている。本形態では、第3変形部2mの一端が第1変形部2jに直接繋がり、第3変形部2mの他端が第2変形部2kに直接繋がっている。   The deformation part 2e is disposed between the first deformation part 2j connected to the front end side contact part 2c, the second deformation part 2k connected to the rear end side contact part 2d, and the first deformation part 2j and the second deformation part 2k. The third deformed portion 2m is disposed in the large-diameter hole 4c. The deformed portion 2e is formed in a substantially zigzag shape as a whole. In this embodiment, one end of the third deformation portion 2m is directly connected to the first deformation portion 2j, and the other end of the third deformation portion 2m is directly connected to the second deformation portion 2k.

第1変形部2jは、略ジグザグ状に形成されている。具体的には、第1変形部2jは、XY平面に略平行な方向で変形する曲面状に形成されている。本形態では、図6(A)に示すように、第1変形部2jは、略半円筒状に形成された複数の部分曲面部2n同士を繋いだ曲面状に形成されている。部分曲面部2nの幅H1は、略均一になっている。なお、第1変形部2jは、略正弦波の曲面状に形成されても良い。   The first deformation portion 2j is formed in a substantially zigzag shape. Specifically, the first deformation portion 2j is formed in a curved surface shape that deforms in a direction substantially parallel to the XY plane. In this embodiment, as shown in FIG. 6 (A), the first deformable portion 2j is formed in a curved shape connecting a plurality of partial curved surface portions 2n formed in a substantially semi-cylindrical shape. The width H1 of the partial curved surface portion 2n is substantially uniform. The first deforming portion 2j may be formed in a substantially sinusoidal curved surface.

図6(C)に示すように、第1変形部2jの、先端側接触部2cとの境界部2pの幅H4は、部分曲面部2nの幅H1よりも広くなっている。また、境界部2pの外側は、図6(C)に示すように、応力の集中を避けるため、曲面状に形成されている。なお、境界部2pは、X方向における先端側接触部2cの略中心位置で、部分曲面部2nと先端側接触部2cとを繋いでいる。   As shown in FIG. 6C, the width H4 of the boundary portion 2p between the first deformable portion 2j and the tip side contact portion 2c is wider than the width H1 of the partial curved surface portion 2n. In addition, as shown in FIG. 6C, the outside of the boundary portion 2p is formed in a curved surface in order to avoid stress concentration. The boundary portion 2p connects the partial curved surface portion 2n and the distal end side contact portion 2c at a substantially center position of the distal end side contact portion 2c in the X direction.

第2変形部2kは、第1変形部2jと同様に形成されている。すなわち、第2変形部2kは、略ジグザグ状に形成されるとともに、XY平面に略平行な方向で変形する曲面状に形成されている。具体的には、第2変形部2kは、略半円筒状に形成された複数の部分曲面部2n同士を繋いだ曲面状に形成されている。また、第2変形部2kの、後端側接触部2dとの境界部2vは、境界部2pと同様に形成され、X方向における後端側接触部2dの略中心位置で、部分曲面2nと後端側接触部2dとを繋いでいる。   The second deformation portion 2k is formed in the same manner as the first deformation portion 2j. That is, the second deforming portion 2k is formed in a substantially zigzag shape and a curved shape that deforms in a direction substantially parallel to the XY plane. Specifically, the 2nd deformation part 2k is formed in the curved surface shape which connected several partial curved surface parts 2n formed in the substantially semi-cylindrical shape. Further, the boundary portion 2v of the second deformable portion 2k with the rear end side contact portion 2d is formed in the same manner as the boundary portion 2p, and is substantially at the center position of the rear end side contact portion 2d in the X direction. The rear end side contact portion 2d is connected.

第3変形部2mは、略ジグザグ状に形成されている。具体的には、図6(B)に示すように、第3変形部2mは、ZX平面に略平行な複数の平面部2qと、複数の平面部2qを繋ぐとともにXY平面に略平行な方向で変形する接続曲面部2rとを備えている。接続曲面部2rは、略半円筒状に形成されている。また、接続曲面部2rの曲率は、部分曲面部2nの曲率よりも大きくなっている。たとえば、接続曲面部2rの曲率は、部分曲面部2nの曲率の約3倍程度となっている。   The third deformation portion 2m is formed in a substantially zigzag shape. Specifically, as shown in FIG. 6 (B), the third deforming portion 2m connects the plurality of plane portions 2q substantially parallel to the ZX plane and the plurality of plane portions 2q, and is a direction substantially parallel to the XY plane. The connecting curved surface portion 2r is deformed. The connection curved surface portion 2r is formed in a substantially semi-cylindrical shape. Further, the curvature of the connection curved surface portion 2r is larger than the curvature of the partial curved surface portion 2n. For example, the curvature of the connection curved surface portion 2r is about three times the curvature of the partial curved surface portion 2n.

平面部2qの幅H2および接続曲面部2rの幅H3(図6(B)参照)は、略均一になっている。本形態では、幅H2、H3は、部分曲面部2nの幅H1と略等しくなっている。また、X方向における接続曲面部2rの外周間距離D1(図6(B)参照)は、部分曲面部2nの外径(すなわち、X方向における部分曲面部2nの外周間距離D2)と略等しくなっている。たとえば、外周間距離D1は100μm程度となっている。   The width H2 of the flat surface portion 2q and the width H3 of the connecting curved surface portion 2r (see FIG. 6B) are substantially uniform. In this embodiment, the widths H2 and H3 are substantially equal to the width H1 of the partial curved surface portion 2n. Further, the distance D1 between the outer circumferences of the connection curved surface portion 2r in the X direction (see FIG. 6B) is substantially equal to the outer diameter of the partial curved surface portion 2n (that is, the distance D2 between the outer circumferences of the partial curved surface portion 2n in the X direction). It has become. For example, the distance D1 between the outer peripheries is about 100 μm.

また、第3変形部2mは、平面部2qからY方向に向かって突出する突起部2sを備えている。この突起部2sは、Z方向から見た形状が矩形状になるように形成されるとともに、平面部2qのX方向端部(すなわち、接続曲面部2rとの境界部)に形成されている。具体的には、図6(B)に示すように、突起部2sは、Y方向における複数の接続曲面部2rの間に形成されている。すなわち、突起部2sは、平面部2qの、接続曲面部2rとの境界部において接続曲面部2rの外周側に形成され、接続曲面部2rとの境界部において接続曲面部2rの内周側には形成されていない。また、平面部2qのX方向端部に形成される突起部2sは、所定の隙間t1を介してY方向で対向している。この隙間t1はたとえば4μmであり、幅H1〜H3の約半分程度となっている。   The third deforming portion 2m includes a protruding portion 2s that protrudes from the flat surface portion 2q in the Y direction. The projecting portion 2s is formed so that the shape viewed from the Z direction is rectangular, and is formed at the end portion in the X direction of the flat surface portion 2q (that is, the boundary portion with the connecting curved surface portion 2r). Specifically, as shown in FIG. 6B, the protrusion 2s is formed between the plurality of connection curved surfaces 2r in the Y direction. That is, the protrusion 2s is formed on the outer peripheral side of the connection curved surface portion 2r at the boundary between the flat surface portion 2q and the connection curved surface portion 2r, and on the inner peripheral side of the connection curved surface portion 2r at the boundary with the connection curved surface portion 2r. Is not formed. Further, the protrusion 2s formed at the end in the X direction of the flat portion 2q is opposed in the Y direction via a predetermined gap t1. The gap t1 is 4 μm, for example, and is about half of the widths H1 to H3.

図5に示すように、本形態では、変形部2eの厚さは、部分曲面部2nの幅H1、平面部2qの幅H2および接続曲面部2rの幅H3よりも大きくなっている。すなわち、変形部2eの厚さは、境界部2p、2vを除く変形部2eの幅H1〜H3よりも大きくなっている。たとえば、変形部2eの厚さは50μm〜100μmであり、幅H1〜H3は5μm〜15μmである。本形態では、変形部2eの厚さは、幅H1〜H3の約6倍となっており、変形部2eのアスペクト比は高くなっている。   As shown in FIG. 5, in this embodiment, the thickness of the deformable portion 2e is larger than the width H1 of the partially curved surface portion 2n, the width H2 of the flat surface portion 2q, and the width H3 of the connecting curved surface portion 2r. That is, the thickness of the deformed portion 2e is larger than the widths H1 to H3 of the deformed portion 2e excluding the boundary portions 2p and 2v. For example, the thickness of the deformed portion 2e is 50 μm to 100 μm, and the widths H1 to H3 are 5 μm to 15 μm. In this embodiment, the thickness of the deformed portion 2e is about 6 times the widths H1 to H3, and the aspect ratio of the deformed portion 2e is high.

上述のように、第3変形部2mは、複数の平面部2qと、部分曲面部2nよりも曲率の大きな複数の接続曲面部2rとによって形成されている。そのため、第3変形部2mのバネ定数は、第1変形部2jのバネ定数および第2変形部2kのバネ定数よりも小さくなっている。また、上述のように、第2変形部2kは、第1変形部2jと同様に形成されており、第1変形部2jのバネ定数と第2変形部2kのバネ定数とは略等しくなっている。   As described above, the third deformation portion 2m is formed by the plurality of flat surface portions 2q and the plurality of connection curved surface portions 2r having a larger curvature than the partial curved surface portion 2n. Therefore, the spring constant of the third deformation portion 2m is smaller than the spring constant of the first deformation portion 2j and the spring constant of the second deformation portion 2k. Further, as described above, the second deformation portion 2k is formed in the same manner as the first deformation portion 2j, and the spring constant of the first deformation portion 2j and the spring constant of the second deformation portion 2k are substantially equal. Yes.

本形態では、検査対象物の検査時に先端部2aが検査用端子に接触すると、主としてY方向へ接触子2が変形する(撓む)。具体的には、まず、対向する突起部2s同士が接触するまで第3変形部2mが主として変形する。このときには、接触子2の撓み量に対して接触子2のバネ圧は緩やかに上昇する。その後、第1変形部2jおよび第2変形部2kが変形する。このときには、接触子2の撓み量に対して接触子2のバネ圧は急激に上昇する。   In this embodiment, when the tip 2a contacts the inspection terminal during inspection of the inspection object, the contact 2 is deformed (bent) mainly in the Y direction. Specifically, first, the third deforming portion 2m is mainly deformed until the opposing protruding portions 2s come into contact with each other. At this time, the spring pressure of the contact 2 gradually increases with respect to the deflection amount of the contact 2. Thereafter, the first deformation portion 2j and the second deformation portion 2k are deformed. At this time, the spring pressure of the contact 2 rapidly increases with respect to the amount of deflection of the contact 2.

(電気接触子の製造方法)
図7は、図3に示す接触子2の製造工程の前半を説明するための斜視図である。図8は、図3に示す接触子2の製造工程の後半を説明するための斜視図である。
(Method for manufacturing electrical contacts)
FIG. 7 is a perspective view for explaining the first half of the manufacturing process of the contact 2 shown in FIG. FIG. 8 is a perspective view for explaining the latter half of the manufacturing process of the contact 2 shown in FIG.

以上のように構成された接触子2は、フォトリソグラフィー技術と金属メッキ技術とを組み合わせることにより製造される。具体的には、接触子2は、以下のように製造される。   The contact 2 configured as described above is manufactured by combining a photolithography technique and a metal plating technique. Specifically, the contact 2 is manufactured as follows.

まず、図7(A)に示すように、基板11上に感光性高分子材料であるフォトレジスト12を形成(成膜)する。その後、図7(B)に示すように、接触子2の形状に対応する形状の孔13aが形成されたマスク13でフォトレジスト12の表面を覆い、マスク13の表面(図7の上面)から紫外線やX線を照射(露光)する。また、紫外線やX線を照射した後、所望のアルカリ溶液等に浸す(現像する)と、接触子2の形状に対応する孔がフォトレジスト12に形成(モールド形成)される。   First, as shown in FIG. 7A, a photoresist 12 which is a photosensitive polymer material is formed (film formation) on a substrate 11. Thereafter, as shown in FIG. 7B, the surface of the photoresist 12 is covered with a mask 13 in which a hole 13a having a shape corresponding to the shape of the contact 2 is formed, and from the surface of the mask 13 (upper surface in FIG. 7). Irradiate (expose) ultraviolet rays or X-rays. Further, after irradiating with ultraviolet rays or X-rays and then immersing (developing) in a desired alkaline solution or the like, holes corresponding to the shape of the contact 2 are formed in the photoresist 12 (mold formation).

その後、電気メッキ加工を行って、図8(A)に示すように、フォトレジスト12に形成された孔の中に接触子2となる肉厚のメッキ体14を形成する。その後、図8(B)に示すように、フォトレジスト12を除去する。また、メッキ体14を基板11から剥離する。基板11からメッキ体14が剥離されると、接触子2が完成する。なお、本形態では、電気メッキ技術によりメッキ体14を形成しているが、無電解メッキ技術によりメッキ体14を形成しても良い。   Thereafter, electroplating is performed to form a thick plated body 14 that becomes the contact 2 in the hole formed in the photoresist 12 as shown in FIG. Thereafter, as shown in FIG. 8B, the photoresist 12 is removed. Further, the plated body 14 is peeled from the substrate 11. When the plated body 14 is peeled from the substrate 11, the contact 2 is completed. In this embodiment, the plated body 14 is formed by the electroplating technique, but the plated body 14 may be formed by the electroless plating technique.

(本形態の主な効果)
以上説明したように、本形態では、先端側接触部2cと後端側接触部2dとを繋ぐ変形部2eが、第1変形部2jと、第2変形部2kと、第1変形部2jおよび第2変形部2kよりもバネ定数の小さな第3変形部2mとを備えている。そのため、上述のように、先端部2aが検査用端子に接触すると、まず、第3変形部2mが主として変形し、その後、第1変形部2jおよび第2変形部2kが変形する。したがって、本形態では、バネ定数の小さな第3変形部2mを変形させて、接触子2の撓み量を所定量以上とすることが可能になる。また、本形態では、バネ定数の大きな第1変形部2jおよび第2変形部2kの変形によって、所定の接触圧で接触子2を検査対象物に接触させることが可能になる。
(Main effects of this form)
As described above, in this embodiment, the deformable portion 2e that connects the front end side contact portion 2c and the rear end side contact portion 2d includes the first deformable portion 2j, the second deformable portion 2k, the first deformable portion 2j, and And a third deforming portion 2m having a smaller spring constant than the second deforming portion 2k. Therefore, as described above, when the tip 2a comes into contact with the inspection terminal, first, the third deformable portion 2m is mainly deformed, and then the first deformable portion 2j and the second deformable portion 2k are deformed. Therefore, in this embodiment, the third deformation portion 2m having a small spring constant can be deformed to make the deflection amount of the contactor 2 equal to or larger than a predetermined amount. In the present embodiment, the contact 2 can be brought into contact with the inspection object with a predetermined contact pressure by the deformation of the first deformation portion 2j and the second deformation portion 2k having a large spring constant.

また、本形態では、比較的バネ定数が大きくて変形しにくい第1変形部2jが先端側接触部2cに繋がり、同じく変形しにくい第2変形部2kが後端側接触部2dに繋がっている。そのため、接触子2の変形時に応力が集中しやすい先端側接触部2cと第1変形部2jとの境界部2pおよび後端側接触部2dと第2変形部2kとの境界部2vの機械強度を向上させることができる。その結果、接触子2の破壊を抑制することができる。   In this embodiment, the first deformation portion 2j that has a relatively large spring constant and is difficult to deform is connected to the front end side contact portion 2c, and the second deformation portion 2k that is also difficult to deform is connected to the rear end side contact portion 2d. . Therefore, the mechanical strength of the boundary portion 2p between the front-end-side contact portion 2c and the first deformation portion 2j and the boundary portion 2v between the rear-end-side contact portion 2d and the second deformation portion 2k where stress tends to concentrate when the contact 2 is deformed. Can be improved. As a result, destruction of the contact 2 can be suppressed.

本形態では、変形部2eは、略ジグザグ状に形成されている。また、第1変形部2jおよび第2変形部2kは、XY平面に略平行な方向で変形する曲面状に形成され、第3変形部は、複数の平面部2qと、複数の平面部2qを繋ぐとともにXY平面に略平行な方向で変形する接続曲面部2rとから構成されている。そのため、バネ定数が比較的大きな第1変形部2j、第2変形部2kおよびバネ定数の比較的小さな第3変形部2mを備える変形部2eをフォトリソグラフィー技術と金属メッキ技術とを組み合わせることによって比較的容易に形成することができる。また、本形態では、変形部2eの厚さは、変形部2eの幅H1〜H3よりも大きくなっている。そのため、変形部2eでのバネ定数の設定が容易になる。   In this embodiment, the deformable portion 2e is formed in a substantially zigzag shape. The first deformable portion 2j and the second deformable portion 2k are formed in a curved shape that deforms in a direction substantially parallel to the XY plane, and the third deformable portion includes a plurality of plane portions 2q and a plurality of plane portions 2q. The connecting curved surface portion 2r is connected and deformed in a direction substantially parallel to the XY plane. Therefore, the deformable portion 2e including the first deformable portion 2j, the second deformable portion 2k having a relatively large spring constant and the third deformable portion 2m having a relatively small spring constant is compared by combining the photolithography technique and the metal plating technique. Can be formed easily. In the present embodiment, the thickness of the deformable portion 2e is larger than the widths H1 to H3 of the deformable portion 2e. Therefore, it becomes easy to set the spring constant in the deforming portion 2e.

本形態では、第3変形部2mは、平面部2qからY方向に向かって突出する突起部2sを備えている。そのため、比較的バネ定数が小さくて変形しやすい第3変形部2mの過剰な変形を抑制することができ、第3変形部2mの破壊を抑制することができる。   In the present embodiment, the third deforming portion 2m includes a protruding portion 2s protruding from the flat surface portion 2q toward the Y direction. Therefore, excessive deformation of the third deformable portion 2m, which has a relatively small spring constant and is easily deformed, can be suppressed, and destruction of the third deformable portion 2m can be suppressed.

特に本形態では、突起部2sは、平面部2qの端部側、かつ、Y方向における接続曲面部2rの間に形成されている。そのため、上述のように、接触子2が変形すると、対向する突起部2s同士が接触する。したがって、第3変形部2mがジグザグ状に形成される場合であっても、接触子2の変形時には、突起部2sを介して平面部2q同士を短絡させることができる。具体的には、平面部2qと接続曲面部2rとの境界部の外周側同士を短絡させることができる。その結果、検査対象物の検査時には、第3変形部2mの電気抵抗値を低減することができ、検査対象物の適切な検査が可能になる。   In particular, in this embodiment, the projecting portion 2s is formed on the end side of the flat surface portion 2q and between the connection curved surface portions 2r in the Y direction. Therefore, as described above, when the contact 2 is deformed, the protruding portions 2s facing each other come into contact with each other. Therefore, even when the third deforming portion 2m is formed in a zigzag shape, the planar portions 2q can be short-circuited via the protruding portions 2s when the contact 2 is deformed. Specifically, the outer peripheral sides of the boundary portion between the flat surface portion 2q and the connection curved surface portion 2r can be short-circuited. As a result, when inspecting the inspection object, the electrical resistance value of the third deforming portion 2m can be reduced, and the inspection object can be inspected appropriately.

また、接触子2が変形すると、対向する突起部2s同士が接触するため、第3変形部2mのインダクタンスを低減することができる。その結果、電気接触子2の高周波特性を向上させることができる。   Further, when the contact 2 is deformed, the projecting portions 2s facing each other come into contact with each other, so that the inductance of the third deforming portion 2m can be reduced. As a result, the high frequency characteristics of the electrical contact 2 can be improved.

本形態では、第3変形部2mの一端が第1変形部2jに繋がり、他端が第2変形部2kに繋がっている。そのため、接触子2の構成を簡素化することができる。   In this embodiment, one end of the third deformation portion 2m is connected to the first deformation portion 2j, and the other end is connected to the second deformation portion 2k. Therefore, the configuration of the contact 2 can be simplified.

本形態では、第1変形部2jのバネ定数と第2変形部2kのバネ定数とが略等しくなっている。そのため、検査対象物の検査時における第1変形部2jの変形量と第2変形部2kの変形量とを略等しくすることが可能になり、第1変形部2jおよび第2変形部2kの破壊を抑制することができる。   In this embodiment, the spring constant of the first deformable portion 2j and the spring constant of the second deformable portion 2k are substantially equal. Therefore, the deformation amount of the first deformation portion 2j and the deformation amount of the second deformation portion 2k at the time of inspection of the inspection object can be made substantially equal, and the first deformation portion 2j and the second deformation portion 2k are destroyed. Can be suppressed.

(他の実施の形態)
上述した形態では、第3変形部2mの一端が第1変形部2jに直接繋がっている。この他にもたとえば、第3変形部2mの一端と第1変形部2jとの間に、第3変形部2mのバネ定数および第1変形部2jのバネ定数と異なるバネ定数を有する第4変形部が配置されても良い。すなわち、第3変形部2mの一端が第4変形部の一端に繋がり、第4変形部の他端が第1変形部2jに繋がっても良い。この場合には、第4変形部のバネ定数は、第3変形部2mのバネ定数より小さくても良いし、第1変形部2jのバネ定数より大きくても良いが、接触子2の破壊を抑制するためには、第4変形部のバネ定数は、第3変形部2mのバネ定数よりも大きくかつ第1変形部2jのバネ定数より小さいことが好ましい。
(Other embodiments)
In the embodiment described above, one end of the third deformation portion 2m is directly connected to the first deformation portion 2j. In addition to this, for example, a fourth deformation having a spring constant different from the spring constant of the third deformation portion 2m and the spring constant of the first deformation portion 2j between one end of the third deformation portion 2m and the first deformation portion 2j. The part may be arranged. That is, one end of the third deformable portion 2m may be connected to one end of the fourth deformable portion, and the other end of the fourth deformable portion may be connected to the first deformable portion 2j. In this case, the spring constant of the fourth deforming part may be smaller than the spring constant of the third deforming part 2m or larger than the spring constant of the first deforming part 2j. In order to suppress, it is preferable that the spring constant of the fourth deforming portion is larger than the spring constant of the third deforming portion 2m and smaller than the spring constant of the first deforming portion 2j.

また、第3変形部2mの一端と第1変形部2jとの間に、第4変形部に加え、バネ定数の異なる1以上の部分変形部が配置されても良い。同様に、第3変形部2mの他端と第2変形部2kとの間に、第4変形部等のバネ定数の異なる1以上の部分変形部が配置されても良い。   Further, in addition to the fourth deformation portion, one or more partial deformation portions having different spring constants may be arranged between one end of the third deformation portion 2m and the first deformation portion 2j. Similarly, one or more partial deformation portions having different spring constants such as a fourth deformation portion may be arranged between the other end of the third deformation portion 2m and the second deformation portion 2k.

上述した形態では、第1変形部2jのバネ定数と第2変形部2kのバネ定数とが略等しくなっている。この他にもたとえば、第1変形部2jのバネ定数と第2変形部2kのバネ定数とが異なっていても良い。   In the form mentioned above, the spring constant of the 1st deformation | transformation part 2j and the spring constant of the 2nd deformation | transformation part 2k are substantially equal. In addition, for example, the spring constant of the first deformable portion 2j and the spring constant of the second deformable portion 2k may be different.

上述した形態では、第1変形部2jおよび第2変形部2kは、XY平面に略平行な方向で変形する曲面状に形成されている。この他にもたとえば、第1変形部2jおよび/または第2変形部2kは、第3変形部2mと同様に、複数の平面部と、複数の平面部を繋ぐとともにXY平面に略平行な方向で変形する接続曲面部とによって形成されても良い。   In the form mentioned above, the 1st deformation | transformation part 2j and the 2nd deformation | transformation part 2k are formed in the curved surface shape deform | transformed in the direction substantially parallel to XY plane. In addition to this, for example, the first deforming portion 2j and / or the second deforming portion 2k is connected to the plurality of plane portions and the plurality of plane portions and is substantially parallel to the XY plane, like the third deforming portion 2m. It may be formed by a connecting curved surface portion that deforms.

上述した形態では、第3変形部2mの平面部2qは、ZX平面と略平行になっている。この他にもたとえば、平面部2qは、ZX平面に対して傾斜していても良い。また、第3変形部2mは、第1変形部2j、第2変形部2kと同様に、XY平面に略平行な方向で変形する曲面状に形成されても良い。   In the form mentioned above, the plane part 2q of the 3rd deformation | transformation part 2m is substantially parallel to the ZX plane. In addition, for example, the plane portion 2q may be inclined with respect to the ZX plane. Further, the third deforming portion 2m may be formed in a curved surface shape that deforms in a direction substantially parallel to the XY plane, similarly to the first deforming portion 2j and the second deforming portion 2k.

上述した形態では、変形部2eの厚さは略均一になっており、第1変形部2jの厚さ、第2変形部2kの厚さおよび第3変形部2mの厚さは略等しくなっている。この他にもたとえば、第1変形部2jおよび第2変形部2kの厚さと、第3変形部2mの厚さとが異なっていても良い。また、上述した形態では、部分曲面部2nの幅H1、平面部2qの幅H2および接続曲面部2rの幅H3は、略均一になっている。この他にもたとえば、幅H2および幅H3と幅H1とが異なっていても良い。また、厚さや幅H1〜H3が異なることで、第3変形部2mのバネ定数が第1変形部2jおよび第2変形部2kのバネ定数よりも小さく設定されても良い。   In the embodiment described above, the thickness of the deformable portion 2e is substantially uniform, and the thickness of the first deformable portion 2j, the thickness of the second deformable portion 2k, and the thickness of the third deformable portion 2m are substantially equal. Yes. In addition, for example, the thickness of the first deformable portion 2j and the second deformable portion 2k may be different from the thickness of the third deformable portion 2m. In the embodiment described above, the width H1 of the partial curved surface portion 2n, the width H2 of the flat surface portion 2q, and the width H3 of the connection curved surface portion 2r are substantially uniform. In addition, for example, the width H2 and the width H3 and the width H1 may be different. Moreover, the spring constant of the 3rd deformation | transformation part 2m may be set smaller than the spring constant of the 1st deformation | transformation part 2j and the 2nd deformation | transformation part 2k because thickness and width H1-H3 differ.

上述した形態では、変形部2eの厚さは、部分曲面部2nの幅H1、平面部2qの幅H3および接続曲面部2rの幅H4よりも大きくなっている。この他にもたとえば、変形部2eの厚さは、幅H1〜H3と同じであっても良いし、幅H1〜H3よりも小さくても良い。   In the embodiment described above, the thickness of the deformable portion 2e is larger than the width H1 of the partially curved surface portion 2n, the width H3 of the flat surface portion 2q, and the width H4 of the connecting curved surface portion 2r. In addition, for example, the thickness of the deformable portion 2e may be the same as the widths H1 to H3, or may be smaller than the widths H1 to H3.

上述した形態では、突起部2sは、平面部2qのX方向端部に形成されているが、突起部2sは、X方向における平面部2qの中心部に形成されても良い。また、上述した形態では、導線7の先端部分が電極3となっており、この電極3が電極保持部材5に保持されているが、プリント基板上に電極3が形成されても良い。この場合には、電極3が形成されるプリント基板が配置部材4に固定される。   In the embodiment described above, the protrusion 2s is formed at the end of the flat portion 2q in the X direction, but the protrusion 2s may be formed at the center of the flat portion 2q in the X direction. Further, in the above-described form, the tip portion of the conducting wire 7 is the electrode 3, and this electrode 3 is held by the electrode holding member 5. However, the electrode 3 may be formed on the printed board. In this case, the printed circuit board on which the electrode 3 is formed is fixed to the arrangement member 4.

本発明の実施の形態1にかかる検査冶具を示す正面図である。It is a front view which shows the inspection jig concerning Embodiment 1 of this invention. 図1のE−E方向から検査冶具を示す図である。It is a figure which shows an inspection jig from the EE direction of FIG. 図1に示す検査冶具の内部構造を説明するための拡大断面図である。It is an expanded sectional view for demonstrating the internal structure of the inspection jig shown in FIG. 図3のF−F方向から電気接触子および配置部材を示す拡大図である。It is an enlarged view which shows an electrical contact and an arrangement | positioning member from the FF direction of FIG. 図3に示す接触子の斜視図である。It is a perspective view of the contact shown in FIG. 図3に示す接触子の一部を拡大した拡大図であり、(A)は図3のG部の拡大図、(B)は図3のH部の拡大図、(C)は図3のJ部の拡大図である。It is the enlarged view to which a part of contactor shown in FIG. 3 was expanded, (A) is an enlarged view of the G section of FIG. 3, (B) is an enlarged view of the H section of FIG. 3, (C) is FIG. It is an enlarged view of J section. 図3に示す接触子の製造工程の前半を説明するための斜視図である。It is a perspective view for demonstrating the first half of the manufacturing process of the contactor shown in FIG. 図3に示す接触子の製造工程の後半を説明するための斜視図である。It is a perspective view for demonstrating the second half of the manufacturing process of the contactor shown in FIG.

符号の説明Explanation of symbols

1 検査冶具
2 接触子(電気接触子)
2c 先端側接触部(第1接触部)
2d 後端側接触部(第2接触部)
2e 変形部
2j 第1変形部
2k 第2変形部
2m 第3変形部
2q 平面部
2r 接続曲面部
2s 突起部
3 電極(第2被接触物)
4 配置部材
4a 配置孔
1 Inspection jig 2 Contact (electric contact)
2c Tip side contact part (first contact part)
2d Rear end side contact portion (second contact portion)
2e Deformation part 2j 1st deformation part 2k 2nd deformation part 2m 3rd deformation part 2q Plane part 2r Connection curved surface part 2s Protrusion part 3 Electrode (2nd to-be-contacted object)
4 Arrangement member 4a Arrangement hole

Claims (8)

導電性およびバネ性を有する薄板によって一体で形成される電気接触子において、
一端部を構成するとともに所定の第1被接触物に接触する第1接触部と、他端部を構成するとともに所定の第2被接触物に接触する第2接触部と、上記第1接触部と上記第2接触部とを繋ぐとともに上記電気接触子の長手方向へ上記電気接触子を変形させるための変形部とを備え、
上記変形部は、上記第1接触部に繋がる第1変形部と、上記第2接触部に繋がる第2変形部と、上記第1変形部と上記第2変形部との間に配置される第3変形部とを備え、
上記第3変形部のバネ定数は、上記第1変形部のバネ定数および上記第2変形部のバネ定数よりも小さくなっていることを特徴とする電気接触子。
In an electrical contact formed integrally by a thin plate having electrical conductivity and spring property,
A first contact portion that constitutes one end portion and contacts a predetermined first contacted object, a second contact portion that constitutes the other end portion and contacts a predetermined second contacted object, and the first contact portion And a deforming part for deforming the electric contact in the longitudinal direction of the electric contact and connecting the second contact part and the second contact part,
The deformation portion is disposed between the first deformation portion connected to the first contact portion, the second deformation portion connected to the second contact portion, and the first deformation portion and the second deformation portion. 3 deformation parts,
The electrical contact according to claim 3, wherein a spring constant of the third deformable portion is smaller than a spring constant of the first deformable portion and a spring constant of the second deformable portion.
前記変形部は、略ジグザグ状に形成されるとともに、
前記第1変形部および前記第2変形部は、前記長手方向に平行な第1平面に略平行な方向で変形する曲面状に形成され、
前記第3変形部は、複数の平面部と、複数の上記平面部を繋ぐとともに前記第1変形部および前記第2変形部よりも大きな曲率でかつ上記第1平面に略平行な方向で変形する接続曲面部とを備えることを特徴とする請求項1記載の電気接触子。
The deformation portion is formed in a substantially zigzag shape,
The first deformation portion and the second deformation portion are formed in a curved surface shape that deforms in a direction substantially parallel to a first plane parallel to the longitudinal direction,
The third deforming portion connects the plurality of plane portions and the plurality of plane portions, and has a larger curvature than the first deforming portion and the second deforming portion and deforms in a direction substantially parallel to the first plane. The electrical contact according to claim 1, further comprising a connecting curved surface portion.
前記第3変形部は、前記長手方向に向かって前記平面部から突出する突起部を備えることを特徴とする請求項2記載の電気接触子。   The electrical contact according to claim 2, wherein the third deformable portion includes a protrusion that protrudes from the planar portion in the longitudinal direction. 前記突起部は、前記平面部の端部側であって、前記長手方向における複数の前記接続曲面部の間に形成されていることを特徴とする請求項3記載の電気接触子。   The electrical contact according to claim 3, wherein the protruding portion is formed between the plurality of connecting curved surface portions in the longitudinal direction on the end side of the planar portion. 前記第1平面に直交する方向での前記変形部の厚さは、前記変形部の幅よりも大きくなっていることを特徴とする請求項2から4いずれかに記載の電気接触子。   5. The electrical contact according to claim 2, wherein a thickness of the deforming portion in a direction orthogonal to the first plane is larger than a width of the deforming portion. 前記第3変形部の一端は前記第1変形部に繋がり、前記第3変形部の他端は前記第2変形部に繋がっていることを特徴とする請求項1から5いずれかに記載の電気接触子。   6. The electricity according to claim 1, wherein one end of the third deformable portion is connected to the first deformable portion, and the other end of the third deformable portion is connected to the second deformable portion. Contactor. 前記第1変形部のバネ定数と前記第2変形部のバネ定数とは略等しいことを特徴とする請求項1から6いずれかに記載の電気接触子。   The electric contact according to any one of claims 1 to 6, wherein a spring constant of the first deformable portion and a spring constant of the second deformable portion are substantially equal. 請求項1から7いずれかに記載の電気接触子と、前記第2被接触物としての電極と、前記電気接触子が配置される配置孔が複数形成される配置部材とを備えることを特徴とする検査冶具。   An electrical contact according to any one of claims 1 to 7, an electrode as the second contact object, and an arrangement member in which a plurality of arrangement holes in which the electric contact is arranged are formed. Inspection jig to do.
JP2007304311A 2007-11-26 2007-11-26 Electrical contact and inspection jig having the same Expired - Fee Related JP5103566B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2007304311A JP5103566B2 (en) 2007-11-26 2007-11-26 Electrical contact and inspection jig having the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007304311A JP5103566B2 (en) 2007-11-26 2007-11-26 Electrical contact and inspection jig having the same

Publications (2)

Publication Number Publication Date
JP2009128218A true JP2009128218A (en) 2009-06-11
JP5103566B2 JP5103566B2 (en) 2012-12-19

Family

ID=40819292

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007304311A Expired - Fee Related JP5103566B2 (en) 2007-11-26 2007-11-26 Electrical contact and inspection jig having the same

Country Status (1)

Country Link
JP (1) JP5103566B2 (en)

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013054557A1 (en) * 2011-10-14 2013-04-18 オムロン株式会社 Contactor
WO2013054554A1 (en) * 2011-10-14 2013-04-18 オムロン株式会社 Contactor
WO2013054558A1 (en) * 2011-10-14 2013-04-18 オムロン株式会社 Contact and probe using same
WO2013054555A1 (en) * 2011-10-14 2013-04-18 オムロン株式会社 Contactor
WO2013137406A1 (en) * 2012-03-15 2013-09-19 オムロン株式会社 Connection terminal and connector using same
JP2013229250A (en) * 2012-04-26 2013-11-07 Yazaki Corp Striking type terminal metal fittings
WO2015020176A1 (en) * 2013-08-09 2015-02-12 日本発條株式会社 Connection terminal, power module, and energization unit
JP2017009385A (en) * 2015-06-19 2017-01-12 日本電子材料株式会社 probe
JP2017036959A (en) * 2015-08-07 2017-02-16 オムロン株式会社 Probe pin, and inspection jig provided with the same
WO2018216273A1 (en) * 2017-05-24 2018-11-29 山一電機株式会社 Mems-type probe and electrical inspection device using same
JPWO2019138507A1 (en) * 2018-01-11 2020-12-24 オムロン株式会社 Probe pins, inspection jigs, inspection units and inspection equipment
KR102256652B1 (en) * 2020-11-26 2021-05-27 주식회사 세인블루텍 A probe pin and a test socket using the probe pin

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101752468B1 (en) * 2015-11-11 2017-07-04 주식회사 오킨스전자 Elastic contact pins and Test socket including thereof

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10312845A (en) * 1997-05-09 1998-11-24 Yokowo Co Ltd Spring connector and device using the same
JP2001091537A (en) * 1999-09-24 2001-04-06 Isao Kimoto Contact and contact assembly using it
JP2004138391A (en) * 2002-10-15 2004-05-13 Renesas Technology Corp Method for manufacturing semiconductor device
JP2006226907A (en) * 2005-02-18 2006-08-31 Nhk Spring Co Ltd Conductive contact unit and conductive contact
JP2007024555A (en) * 2005-07-13 2007-02-01 Tokyo Electron Ltd Probe card
JP2007155507A (en) * 2005-12-05 2007-06-21 Nhk Spring Co Ltd Probe card
JP2007194187A (en) * 2005-12-20 2007-08-02 Enplas Corp Contact pin, and socket for electrical component
JP2007218776A (en) * 2006-02-17 2007-08-30 Nhk Spring Co Ltd Conductive contact and conductive contact unit

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10312845A (en) * 1997-05-09 1998-11-24 Yokowo Co Ltd Spring connector and device using the same
JP2001091537A (en) * 1999-09-24 2001-04-06 Isao Kimoto Contact and contact assembly using it
JP2004138391A (en) * 2002-10-15 2004-05-13 Renesas Technology Corp Method for manufacturing semiconductor device
JP2006226907A (en) * 2005-02-18 2006-08-31 Nhk Spring Co Ltd Conductive contact unit and conductive contact
JP2007024555A (en) * 2005-07-13 2007-02-01 Tokyo Electron Ltd Probe card
JP2007155507A (en) * 2005-12-05 2007-06-21 Nhk Spring Co Ltd Probe card
JP2007194187A (en) * 2005-12-20 2007-08-02 Enplas Corp Contact pin, and socket for electrical component
JP2007218776A (en) * 2006-02-17 2007-08-30 Nhk Spring Co Ltd Conductive contact and conductive contact unit

Cited By (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9322846B2 (en) 2011-10-14 2016-04-26 Omron Corporation Contactor
JP2013089370A (en) * 2011-10-14 2013-05-13 Omron Corp Contact
WO2013054558A1 (en) * 2011-10-14 2013-04-18 オムロン株式会社 Contact and probe using same
WO2013054555A1 (en) * 2011-10-14 2013-04-18 オムロン株式会社 Contactor
EP2747210A4 (en) * 2011-10-14 2015-01-14 Omron Tateisi Electronics Co Contactor
JP2013089374A (en) * 2011-10-14 2013-05-13 Omron Corp Contact
JP2013089373A (en) * 2011-10-14 2013-05-13 Omron Corp Contact
US9726692B2 (en) 2011-10-14 2017-08-08 Omron Corporation Contactor and probe using same
WO2013054557A1 (en) * 2011-10-14 2013-04-18 オムロン株式会社 Contactor
KR101545105B1 (en) 2011-10-14 2015-08-17 오므론 가부시키가이샤 Contactor
CN103765688A (en) * 2011-10-14 2014-04-30 欧姆龙株式会社 Contactor
CN103765687A (en) * 2011-10-14 2014-04-30 欧姆龙株式会社 Contactor
CN103782454A (en) * 2011-10-14 2014-05-07 欧姆龙株式会社 Contactor
EP2747209A1 (en) * 2011-10-14 2014-06-25 Omron Corporation Contactor
EP2747210A1 (en) * 2011-10-14 2014-06-25 Omron Corporation Contactor
EP2747209A4 (en) * 2011-10-14 2015-01-14 Omron Tateisi Electronics Co Contactor
JP2013089381A (en) * 2011-10-14 2013-05-13 Omron Corp Contact and probe using the same
WO2013054554A1 (en) * 2011-10-14 2013-04-18 オムロン株式会社 Contactor
KR101574448B1 (en) 2011-10-14 2015-12-03 오므론 가부시키가이샤 Contact and probe using same
US9124012B2 (en) 2011-10-14 2015-09-01 Omron Corporation Bellows body contactor having a fixed touch piece
US9130290B2 (en) 2011-10-14 2015-09-08 Omron Corporation Bellows body contactor having a fixed touch piece
KR101570009B1 (en) 2011-10-14 2015-11-17 오므론 가부시키가이샤 Contactor
KR101570010B1 (en) 2011-10-14 2015-11-17 오므론 가부시키가이샤 Contactor
WO2013137406A1 (en) * 2012-03-15 2013-09-19 オムロン株式会社 Connection terminal and connector using same
US9368893B2 (en) 2012-03-15 2016-06-14 Omron Corporation Connection terminal and connector using same
JP2013229250A (en) * 2012-04-26 2013-11-07 Yazaki Corp Striking type terminal metal fittings
JPWO2015020176A1 (en) * 2013-08-09 2017-03-02 日本発條株式会社 Energizing unit
WO2015020176A1 (en) * 2013-08-09 2015-02-12 日本発條株式会社 Connection terminal, power module, and energization unit
JP2017009385A (en) * 2015-06-19 2017-01-12 日本電子材料株式会社 probe
JP2017036959A (en) * 2015-08-07 2017-02-16 オムロン株式会社 Probe pin, and inspection jig provided with the same
WO2017026304A1 (en) * 2015-08-07 2017-02-16 オムロン株式会社 Probe pin and inspection jig provided with same
WO2018216273A1 (en) * 2017-05-24 2018-11-29 山一電機株式会社 Mems-type probe and electrical inspection device using same
JPWO2019138507A1 (en) * 2018-01-11 2020-12-24 オムロン株式会社 Probe pins, inspection jigs, inspection units and inspection equipment
KR102256652B1 (en) * 2020-11-26 2021-05-27 주식회사 세인블루텍 A probe pin and a test socket using the probe pin

Also Published As

Publication number Publication date
JP5103566B2 (en) 2012-12-19

Similar Documents

Publication Publication Date Title
JP5103566B2 (en) Electrical contact and inspection jig having the same
US8834183B2 (en) Housingless connector
KR102015798B1 (en) Probe for the test device
JP2004221052A (en) Contact sheet, manufacturing method therefor, and socket
JP2013007730A (en) Connection terminal and connection jig
JP2019015542A (en) Contact terminal, inspection jig, and inspection device
JP6283929B2 (en) Inspection jig and method for manufacturing inspection jig
JP4421550B2 (en) Probes and probe cards
JP2018004260A (en) Electrical connection device and contactor
JP2009014480A (en) Inspection tool
KR101160996B1 (en) Electric contact and inspection jig therewith
JP2008197009A (en) Electronic component inspection probe
JP2007232558A (en) Electronic component inspection probe
TWM495641U (en) Contact probe
JP2011039066A (en) Multilayer electric probe and method of manufacturing the same
WO2023188369A1 (en) Probe pin and probe card
JP2010019672A (en) Substrate body
JP2008116284A (en) Contact probe, and method for manufacturing the same
JPH07161426A (en) Socket for bare chip burn-in test and its manufacture
JP2002232112A (en) Circuit board and connector mounted thereon
JP2013003002A (en) Probe unit and circuit board inspection device
WO2022054802A1 (en) Contact terminal, inspection jig, inspection device, and manufacturing method
JP2010276359A (en) Inspection jig for board inspection device
JP2007003207A (en) Probe unit and its manufacturing method
JP5363943B2 (en) Conductive sheet, method for manufacturing conductive sheet, probe card, and inspection apparatus

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20101125

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20120420

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20120508

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20120606

A711 Notification of change in applicant

Free format text: JAPANESE INTERMEDIATE CODE: A711

Effective date: 20120629

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20120702

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A821

Effective date: 20120629

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20120720

R150 Certificate of patent or registration of utility model

Ref document number: 5103566

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20151012

Year of fee payment: 3

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees