KR102256652B1 - A probe pin and a test socket using the probe pin - Google Patents

Abstract

The present invention relates to a probe pin and a test socket using the same and, more specifically, to a probe pin which can disperse the stress concentrated on the elastic part of the probe pin and reduce the frictional force on the contact parts of the probe plate and a socket when a load is applied to the probe pin, thereby increasing the operating life even if the load is repeatedly applied to the probe pin, and a test socket using the same. In accordance with an embodiment of the present invention, provided are the probe pin comprising: a first contact part extending in a vertical direction; a second contact part vertically spaced apart from the first contact part and extending in the vertical direction; and an elastic part which that is curved between the first contact part and the second contact part, of which one end is connected to the first contact part, and the other end is connected to the second contact part. The elastic part includes: a first elastic part on a side of the first contact part; a third elastic part on a side of the second contact part; and a second elastic part between the first elastic part and the third elastic part. The elastic part is elastically deformed when a load is applied thereto and is formed so that the stress of the second elastic part is smaller than that of the first elastic part and the third elastic part, and the test socket using the same. Therefore, the present invention can provide the probe pin capable of increasing the operating life, and the test socket capable of providing excellent dimensional stability.

Description

Probe pin and socket for inspection using the same {A PROBE PIN AND A TEST SOCKET USING THE PROBE PIN}

The present invention is a probe pin and a socket for inspection using the same, distributing stress concentrated on the elastic portion of the probe pin when a load is generated on the probe pin, reducing frictional force generated at the contact portion of the probe pin, It relates to a probe pin that can improve the operating life and a socket for inspection using the same.

An integrated circuit (IC) is an electronic component in which many devices are integrated into one chip to process a specific complex function, and is widely used in electronic products such as smartphones and automobiles. When a poor integrated circuit is used, a malfunction of an electronic product occurs. Therefore, the integrated circuit must be inspected under various environmental conditions to see whether it can perform various special functions as well as durability for proper operation of the electronic product.

The integrated circuit is encapsulated in a case to prevent physical damage and corrosion, and the inspection of the integrated circuit may be performed in a state in which the encapsulated integrated circuit package is mounted on the inspection socket of the inspection equipment. Alternatively, the inspection may be performed while the connector connected to the printed circuit board on which the integrated circuit is mounted is mounted on the inspection socket of the inspection equipment.

The test socket is provided with a portion on which an integrated circuit package or connector to be inspected can be seated and includes a metallic probe pin. The probe pins form an electrical connection between the integrated circuit package or connector seated on one side of the inspection socket and the printed circuit board of the inspection equipment disposed on the other side of the inspection socket.

Since the integrated circuit package and the printed circuit board of the inspection equipment are spaced apart from each other with the inspection socket in between, the probe pin of the inspection socket is configured to be elastically deformed by the load, and the inspection target side and the inspection equipment with an uncertain distance. Can provide reliable electrical contact of the side.

Inspection equipment used for testing IC chips and probe pins mounted thereto are disclosed in Korean Patent Publication No. 10-1911002.

However, since the miniaturization of electronic products and the miniaturization of the inspection socket are required in recent years, the probe pins of the inspection socket must be designed to have a thin thickness so that they can be integrated. However, as the thickness of the probe pin decreases, the stress limit of the probe pin decreases, and thus the possibility of destruction of the probe pin increases in the process of repeating the test of the integrated circuit. In addition, due to the repeated inspection, there is a concern about damage to the printed circuit board of the inspection equipment in contact with the end of the probe pin.

Accordingly, there is a demand for a method of improving the structure of the probe pin so as to improve the operating life of the inspection equipment.

On the other hand, since the test socket to which the probe pin is mounted is used to test various test targets according to a predetermined standard, it must be able to provide excellent dimensional stability.

The present invention is to provide a structure of a probe pin that can improve the operating life of the inspection equipment.

Further, an object of the present invention is to provide an inspection socket in which a probe pin having an improved structure can be mounted.

In addition, it is intended to provide a socket for inspection that can provide excellent dimensional stability.

A probe pin according to an embodiment of the present invention includes: a first contact portion extending in a vertical direction as a probe pin; A second contact portion spaced apart from the first contact portion in a vertical direction and extending in a vertical direction; And an elastic part that is rounded and rounded between the first contact part and the second contact part, one end connected to the first contact part, and the other end connected to the second contact part, wherein the elastic part is a first elastic part on the side of the first contact part. And, a third elastic portion on the side of the second contact portion, and a second elastic portion between the first elastic portion and the third elastic portion, and the elastic portion elastically deforms when a load is applied, but the second elastic portion A probe pin is provided such that the stress is less than the stress of the first elastic portion and the third elastic portion.

Here, the second elastic portion provides a probe pin, characterized in that the cross-sectional area is smaller than the cross-sectional area of the first elastic portion and the third elastic portion.

And, it provides a probe pin, characterized in that the elastic portion is made of a plurality of plates disposed with a gap, and the second elastic portion is made of a smaller number of plates than the first elastic portion and the third elastic portion. .

In addition, the first elastic portion is curved at an angle of 110 °, and the second elastic portion and the third elastic portion provides a probe pin, characterized in that it is curved in a substantially U-shape.

In addition, there is provided a probe pin comprising a first support portion extending in a direction crossing the extending direction of the first contact portion at a portion connecting the first contact portion and the first elastic portion.

Further, it provides a probe pin, characterized in that it comprises a second support portion extending in a direction crossing the extending direction of the second contact portion at a portion connected to the second contact portion and the third elastic portion.

Further, it provides a probe pin, characterized in that formed of nickel cobalt or nickel carbon alloy.

On the other hand, the test socket according to an embodiment of the present invention is a test socket to which a plurality of probe pins made of the probe pin according to claim 1 are mounted, and includes an upper plate and a lower plate that are laminated and coupled, and the upper The plate is provided with a first array having a first contact portion insertion hole into which the first contact portion of the probe pin is inserted, and the lower plate has a second contact portion insertion hole into which the second contact portion of the probe pin is inserted. An additional portion is provided, and the plurality of probe pins are arranged in two rows, wherein the probe pins of one row face each other with the probe pins of the other row, and between the upper plate and the lower plate, the first array portion and the first array portion corresponding to each other It provides a socket for inspection, characterized in that accommodated in the hollow portion provided by the 2 array.

Here, the first arrangement portion provides an inspection socket, characterized in that the uneven portion that can guide the movement of the first contact portion of the probe pin in a vertical direction is formed.

In addition, the upper plate and the lower plate provide a socket for inspection, characterized in that formed by machining.

According to the present invention, it is possible to provide a probe pin capable of improving the operating life of the inspection equipment.

And, it is possible to provide a socket for inspection that can provide excellent dimensional stability.

1 is a perspective view of a probe pin according to an embodiment of the present invention.
2 is a diagram illustrating an operation state of a probe pin.
3 is a diagram illustrating a state in which a probe pin is mounted on a socket.
4 is an enlarged view of portion A in FIG. 3.
5 is a diagram illustrating a state in which a load is applied to a probe pin in FIG. 3.
6 is an enlarged view of portion B in FIG. 5.
7 is a perspective view of an inspection socket to which a probe pin is mounted according to an embodiment of the present invention.
8 is an exploded perspective view of FIG. 7.
9 is a perspective view of the lower side of the upper plate of the test socket.
10 is a perspective view of the lower side of the contact terminal.

Hereinafter, a probe pin and a test socket using the same according to the present invention will be described in more detail with reference to the drawings.

In the present specification, expressions in the singular include plural expressions unless the context clearly indicates otherwise.

In describing the embodiments disclosed in the present specification, when it is determined that a detailed description of related known technologies may obscure the subject matter of the embodiments disclosed in the present specification, a detailed description thereof will be omitted.

In the present specification, terms indicating a position or direction such as'up','bottom','left','right','before', and'after' are only for describing a relative position or direction based on the drawings, It does not limit the invention.

The accompanying drawings are only for making it easier to understand the embodiments disclosed in the present specification, and the technical idea disclosed in the present specification is not limited by the accompanying drawings, and all changes and equivalents included in the spirit and scope of the present invention It should be understood to include water or substitutes.

Probe pins are parts used in inspection equipment for inspecting electronic components. One of the probe pins is placed on the inspection target side and the other is placed on the inspection equipment side, and is formed of a conductive material such as nickel cobalt or nickel carbon alloy. As a result, electrical connection between the inspection object and the inspection equipment is made while the inspection object is seated in the inspection socket.

1 to 6 are diagrams of probe pins according to an embodiment of the present invention, and the probe pins will be described with reference to these drawings.

1 is a perspective view of a probe pin 100, in which the probe pin 100 according to an embodiment of the present invention includes a first contact portion 110 and a second contact portion 120 extending in a vertical direction (here, The vertical direction is shown as a longitudinal direction in the drawing, and means a straight line direction from the inspection object to the inspection equipment).

The first contact portion 110 and the second contact portion 120 of the probe pin 100 are vertically spaced apart from each other, so that the first contact portion 110 is disposed toward the object to be inspected, and the second contact portion 120 is toward the inspection equipment. Is placed. In addition, an elastic part 130 is formed between the first contact part 110 and the second contact part 120 to connect the first contact part 110 and the second contact part 120 to each other. In order to provide a possible electrical contact, the elastic portion 130 is configured to be elastically deformed by a load applied to the probe pin 100.

In addition, the elastic part 130 has one end connected to the first contact part 110 and the other end connected to the second contact part 120, and between the first contact part 110 and the second contact part 120 to provide elastic force. It can be made in a rounded shape.

As an embodiment, the elastic portion 130 integrally formed includes a first elastic portion 132 on the first contact portion 110 side and a third elastic portion on the second contact portion 120 side ( 136 and a second elastic portion 134 between the first elastic portion 132 and the second elastic portion 134.

The elastic portion 130 divided into three is preferably formed in a structure that is not damaged by a repeatedly applied load so that the stress is not concentrated in any one portion and the stress can be distributed in each portion.

Thus, as shown, the first elastic portion 132, the second elastic portion 134 and the third elastic portion 136 connected in series, the first elastic portion 132 is bent at a predetermined angle , The second elastic part 134 is bent in a U-shape, and the third elastic part 136 is bent in a U-shape opposite to the second elastic part 134, and the elastic parts 132, 134, 136 All can be prepared in different forms. In this case, the second elastic portion 134 and the third elastic portion 136 need not necessarily have a U-shape, and may have an approximately U-shape similar to a U-shape in which the center portion is convexly curved.

2 is a view showing an operating state of the probe pin 100 according to an embodiment of the present invention. As shown, when the probe pin 100 operates, the first contact portion 110 and the second contact portion ( 120) reciprocates in a vertical direction, which is the direction in which they extend, and the elastic part 130 elastically deforms according to the reciprocation of the first contact part 110 and the second contact part 120.

If the cross-sectional area of the elastic part 130 is large, the conductivity of the probe pin 100 may be excellent, but the stress and elastic force of the elastic part 130 due to the load may increase. It may cause the loss of the printed circuit board. On the other hand, if the cross-sectional area of the elastic part 130 is small, the stress and elastic force of the elastic part 130 are reduced to reduce the loss of the terminal to be tested or the printed circuit board of the test equipment, but Conductivity can be reduced.

Therefore, the probe pin 100 according to an embodiment of the present invention is configured to reduce the stress on the second elastic portion 134, which has the greatest effect on the stress of the elastic portion 130, but suppress the decrease in conductivity as much as possible. Can be.

For example, the cross-sectional area of the second elastic portion 134 may be smaller than that of the first elastic portion 132 and the third elastic portion 136.

Alternatively, as shown, the elastic portion 130 is made of a plurality of plates disposed with a gap, the second elastic portion 134 is more than the first elastic portion 132 and the third elastic portion 136 It can be made with a small number of plates. In the drawing, the first elastic part 132 and the third elastic part 136 are composed of three plates, and the second elastic part 134 is composed of two plates, but are not limited to the number of plates shown. .

The test socket is a part of the test equipment to which the test target or connector of the test target is mounted, and FIGS. 3 to 7 show, according to an embodiment of the present invention, the probe pin 100 is mounted on the test socket and operates. It is a conceptual diagram showing the state.

3 shows a state in which the probe pin 100 is mounted between the upper plate 1100 and the lower plate 1300 of the inspection socket, and FIG. 4 is an enlarged view of part A in FIG. 3, and FIG. 5 is 3 is a diagram showing a state in which a load is applied to the probe pin 100, and FIG. 6 is an enlarged view of part B in FIG. 5, through which the probe pin 100 is mounted on the test socket. Can explain what works as

3, the first contact part 110 of the probe pin 100 is inserted into the first contact part insertion hole formed in the upper plate 1100 of the test socket, and the second contact part of the probe pin 100 120 is inserted into the second contact portion insertion hole formed in the lower plate 1300 of the test socket, and the probe pin 100 is mounted on the test socket.

The probe pin 100 may include a first support portion 114 formed on the side of the first contact portion 110 and a second support portion 124 formed on the side of the second contact portion 120. Then, because the first support portion 114 can be in close contact with the lower surface of the upper plate 1100 and the second support portion 124 to the upper surface of the lower plate 1300 by the elastic force of the elastic portion 130, the probe The pin 100 may be mounted while being fixed to the test socket.

As shown in FIG. 5, a load is applied to the probe pin 100 mounted on the test socket. The first contact part 110 is pressed by the behavior of the test object seated on the test equipment, and the second contact part 120 is pressed by the printed circuit board 300 of the test equipment coupled to the lower surface of the lower plate 1300. do.

In a state in which the test socket is installed in the test equipment, the second contact part 120 maintains a pressurized state by the printed circuit board 300 unless the test socket is removed, so that the first contact part 110 is mainly The reciprocation of will be made.

When the first contact part 110 is pressed, the first contact part 110 is inclined to the left while the first contact part is inclined to the left, as shown in part B of FIG. 5 and FIG. 6 due to the curved structure of the elastic part 130. ) Rubs against the wall surface of the first contact insertion hole 1112.

Repetitive friction between the first contact part 110 and the wall surface of the first contact part insertion hole 1112 adversely affects the life of the inspection equipment, so in order to improve the operating life of the probe pin 100, the first contact part ( It is very important to reduce the friction between 110) and the wall surface of the first contact insertion hole 1112.

Accordingly, a method of improving the operating life of the probe pin 100 by setting the angle of the curved portion of the first elastic portion 132 to a predetermined value, as shown in portion A of FIG. 3 and FIG. 4. You can consider it.

According to the angle Θ formed by the rounded portion of the first elastic portion 132, the stress (σ) generated in the second elastic portion 134 and the moving distance d of the end of the first contact portion 110 1 The change in the load (n) acting between the contact part 110 and the first contact part insertion hole 1112 is measured as shown in Table 1 below.

[Table 1]

Referring to this, when the angle formed by the curved portion of the first elastic portion 132 is 110°, except for the case of 120° where the stress of the second elastic portion 134 acts the greatest, the second elastic portion It can be seen that the smallest stress (σ) occurs at (134), and the smallest load (n) between the first contact part 110 and the first contact part insertion hole 1112 acts. Therefore, if the angle formed by the rounded portion of the first elastic portion 132 is 110°, the operating life of the probe pin 100 can be improved.

Accordingly, according to an embodiment of the present invention, the probe pin 100 may be formed in a curved shape in which the angle formed by the curved portion of the first elastic portion 132 is 110°.

On the other hand, FIGS. 7 to 10 are views related to the test socket 1000 according to an embodiment of the present invention, and the test socket 1000 to which the probe pin 100 according to an embodiment of the present invention may be mounted. ).

7 is a perspective view of the test socket 1000 to which the connector 1410 of the test object can be mounted, FIG. 8 is an exploded perspective view of the test socket 1000, and FIG. 9 is an upper part of the test socket 1000 It is a perspective view of the lower side of the plate 1100, and FIG. 10 is a perspective view of the lower side of the contact terminal 1412 formed on the connector 1410 to be inspected.

The test socket 1000 according to an embodiment of the present invention includes an upper plate 1100 and a lower plate 1300, as shown in FIGS. 7 and 8, and may be formed by stacking and bonding them. .

In addition, when the probe pins 100 are mounted on the test socket 1000, the probe pins 100 are arranged in two rows, so that the probe pins 100 of one row face each other with the probe pins 100 of the other row. Can be placed.

Assuming that the test object is disposed on the side of the upper plate 1100 and the test equipment is disposed on the side of the lower plate 1300, as shown, the first contact part of the probe pin 100 on one side of the upper plate 1100 ( A first arrangement portion 1110 in which 110 may be arranged is provided, and a first contact portion insertion hole 1112 into which the first contact portion 110 of the probe pin 100 can be inserted into the first arrangement portion 1110. ) Can be formed. The first contact part 110 may pass through the insertion hole 1112 of the first contact part and its end may protrude upward from the upper plate 1100.

In addition, a second arrangement part 1310 to which the second contact part 120 of the probe pin 100 may be arranged is provided on one side of the lower plate 1300, and the second arrangement part 1310 has a probe pin 100. A second contact part insertion hole 1312 into which the second contact part 120 of) may be inserted may be formed. The second contact part 120 may pass through the insertion hole of the second contact part 120 and its end may protrude downward from the lower plate 1300.

When the upper plate 1100 and the lower plate 1300 are stacked and coupled, the first array 1110 and the second array 1310 correspond to each other, so that a hollow part can be formed in the corresponding part. , The probe pin 100 may be accommodated in the hollow part. Accordingly, a portion where the first array portion 1110 is formed may be concave on the lower surface of the upper plate 1100, and a portion where the second array portion 1310 is formed on the upper surface of the lower plate 1300 may be concave. have. That is, when the upper plate 1100 and the lower plate 1300 are stacked and bonded, the concave portions on the lower surface of the upper plate 1100 and the upper surface of the lower plate 1300 correspond to each other, so that the probe pin 100 can be accommodated. A hollow part can be provided.

The first array portion 1110 of the upper plate 1100 or the second array portion 1310 of the lower plate 1300 may be provided with an uneven portion 1114 according to a state in which the probe pins 100 are arranged. When the probe pin 100 is operated by a load, the uneven portion 1114 is the first contact portion 110 or the second contact portion 120 of the probe pin 100 to behave only in the vertical direction. The contact part 110 or the second contact part 120 may be guided.

For example, as shown in FIG. 9, the first support portion 114 of the probe pin 100 is inserted into the concave portion of the uneven portion 1114 formed on the lower surface of the first array portion 1110 of the upper plate 1100. , When a load is generated on the probe pin 100, the first support portion 114 can move along a predetermined path, so that the first contact portion 110 is limited in its behavior in the direction of the adjacent probe, and the adjacent probe pin 100 The distance between them can be kept constant.

According to an embodiment of the present invention, an adapter 1400 that can be mounted corresponding to the position of the first array 1110 on the upper surface of the upper plate 1100 may be further included. The lower surface of the adapter 1400 may be formed to correspond to the upper surface of the upper plate 1100 on which the adapter 1400 is mounted, and the upper surface of the adapter 1400 may be formed such that the connector 1410 to be inspected is seated.

A contact terminal 1412 including a GND or POWER terminal terminal 1414 and a SIGNAL terminal terminal 1416 is formed on the connector 1410 to be inspected, the first contact portion protruding through the first contact portion insertion hole 1112 The terminal of (110) should be able to make electrical contact with the contact terminal (1412) of the connector (1410).

The adapter 1400 has an insertion hole corresponding to the first contact insertion hole 1112 so that the adapter 1400 is mounted on the upper plate 1100 and the probe pin 100 penetrates the upper plate 1100. The first contact part 110 may pass through the adapter 1400.

When the connector 1410 to be inspected is seated on the adapter 1400, the terminal terminal of the connector 1410 to be inspected contacts the end of the first contact portion 110 of the probe pin 100 passing through the adapter 1400 In addition, the end of the second contact portion 120 of the probe pin 100 comes into contact with the pad terminal of the printed circuit board, so that the inspection object may be inspected.

Depending on the connector 1410, the positions of the SIGNAL terminal terminal 1416 and the GND or POWER terminal terminal 1414 are different, so the adapter 1400 on which the connector 1410 is mounted, the upper plate 1100, and the lower plate 1300 The arrangement of the probe pins 100 mounted on the test socket 1000 may also be different.

Various molds are required to manufacture the inspection socket 1000 applicable to the various connectors 1410, and a lot of time, cost, and effort are put into the development of the mold.

Accordingly, according to an embodiment of the present invention, the adapter 1400, the upper plate 1100, and the lower plate 1300 may be formed by machining.

What has been described above is merely examples for implementing a probe pin and a test socket using the same according to the present invention, and the present invention is not limited to the above embodiments, and the present invention is as claimed in the claims below. Within the scope not departing from the gist of the invention, anyone of ordinary skill in the field to which the present invention pertains will have the technical idea of the present invention to the extent that various changes can be implemented.

100: probe pin
110: first contact portion
114: first support
120: second contact portion
124: second support
130: elastic part
132: first elastic portion
134: second elastic portion
136: third elastic portion
300: printed circuit board
1000: socket for inspection
1100: top plate
1110: first arrangement
1112: first contact part insertion hole
1114: irregularities
1300: lower plate
1310: second arrangement
1312: second contact part insertion hole
1400: adapter
1410: connector
1412: contact terminal
1414: GND or POWER terminal terminal
1416: SIGNAL terminal terminal
Θ: the angle formed by the rounded portion of the first elastic portion
d: the moving distance of the end of the first contact part

Claims (10)

As a probe pin,
A first contact portion extending in a vertical direction;
A second contact portion spaced apart from the first contact portion in a vertical direction and extending in a vertical direction; And
And an elastic portion that is rounded and rounded between the first contact portion and the second contact portion, and has one end connected to the first contact portion, and the other end connected to the second contact portion,
The elastic portion is made of a first elastic portion on the side of the first contact portion, a third elastic portion on the side of the second contact portion, and a second elastic portion between the first elastic portion and the third elastic portion,
The elastic portion is formed to elastically deform when a load is applied, but the stress of the second elastic portion is less than the stress of the first elastic portion and the third elastic portion,
The elastic portion is formed of a plurality of plates disposed with a gap, and the second elastic portion is formed of a smaller number of plates than the first elastic portion and the third elastic portion. The method of claim 1,
A probe pin, wherein a cross-sectional area of the second elastic portion is smaller than a cross-sectional area of the first elastic portion and the third elastic portion. delete The method of claim 1,
The first elastic part is rounded and curved at an angle of 110°,
The second elastic portion and the third elastic portion of the probe pin, characterized in that the U-shape. The method of claim 1,
And a first support portion extending in a direction crossing an extension direction of the first contact portion at a portion connecting the first contact portion and the first elastic portion. The method of claim 1,
And a second support portion extending in a direction crossing the extending direction of the second contact portion at a portion connecting the second contact portion and the third elastic portion. The method of claim 1,
Probe pin, characterized in that formed of nickel cobalt or nickel carbon alloy. An inspection socket to which a plurality of probe pins comprising the probe pin according to claim 1 are mounted,
It includes an upper plate and a lower plate to be laminated and bonded,
The upper plate is provided with a first arrangement portion having a first contact portion insertion hole into which the first contact portion of the probe pin is inserted,
The lower plate is provided with a second arrangement portion having a second contact portion insertion hole into which the second contact portion of the probe pin is inserted,
The plurality of probe pins are arranged in two rows, wherein the probe pins of one row face each other with the probe pins of the other row, and the first array portion and the second array portion corresponding to each other are provided between the upper plate and the lower plate. Socket for inspection, characterized in that accommodated in the hollow portion. The method of claim 8,
The test socket, wherein the first arrangement portion is formed with an uneven portion capable of guiding the movement of the first contact portion of the probe pin in a vertical direction. The method of claim 9,
The socket for inspection, characterized in that the upper plate and the lower plate are formed by machining.

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