JP2009109788A5 - - Google Patents

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Publication number
JP2009109788A5
JP2009109788A5 JP2007282653A JP2007282653A JP2009109788A5 JP 2009109788 A5 JP2009109788 A5 JP 2009109788A5 JP 2007282653 A JP2007282653 A JP 2007282653A JP 2007282653 A JP2007282653 A JP 2007282653A JP 2009109788 A5 JP2009109788 A5 JP 2009109788A5
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JP
Japan
Prior art keywords
light
scanning microscope
infrared
laser scanning
infrared light
Prior art date
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Application number
JP2007282653A
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English (en)
Japanese (ja)
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JP5038094B2 (ja
JP2009109788A (ja
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Priority to JP2007282653A priority Critical patent/JP5038094B2/ja
Priority claimed from JP2007282653A external-priority patent/JP5038094B2/ja
Priority to US12/250,680 priority patent/US7915575B2/en
Publication of JP2009109788A publication Critical patent/JP2009109788A/ja
Publication of JP2009109788A5 publication Critical patent/JP2009109788A5/ja
Application granted granted Critical
Publication of JP5038094B2 publication Critical patent/JP5038094B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2007282653A 2007-10-31 2007-10-31 レーザー走査型顕微鏡 Expired - Fee Related JP5038094B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2007282653A JP5038094B2 (ja) 2007-10-31 2007-10-31 レーザー走査型顕微鏡
US12/250,680 US7915575B2 (en) 2007-10-31 2008-10-14 Laser scanning microscope having an IR partial transmission filter for realizing oblique illumination

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007282653A JP5038094B2 (ja) 2007-10-31 2007-10-31 レーザー走査型顕微鏡

Publications (3)

Publication Number Publication Date
JP2009109788A JP2009109788A (ja) 2009-05-21
JP2009109788A5 true JP2009109788A5 (https=) 2010-12-16
JP5038094B2 JP5038094B2 (ja) 2012-10-03

Family

ID=40581626

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007282653A Expired - Fee Related JP5038094B2 (ja) 2007-10-31 2007-10-31 レーザー走査型顕微鏡

Country Status (2)

Country Link
US (1) US7915575B2 (https=)
JP (1) JP5038094B2 (https=)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5363199B2 (ja) * 2009-06-04 2013-12-11 日本分光株式会社 顕微全反射測定装置
BR112012025738A2 (pt) * 2010-04-09 2016-06-28 Univ Northeastern sistema de formação de imagem infravermelho baseado em laser sintonizável e seu método de utilização
JP5653944B2 (ja) * 2011-04-12 2015-01-14 パナソニック株式会社 有機ｅｌ素子の製造方法及びレーザー焦点位置設定方法
JP6313211B2 (ja) 2011-10-25 2018-04-18 デイライト ソリューションズ、インコーポレイテッド 赤外撮像顕微鏡
CN103676128A (zh) * 2012-09-17 2014-03-26 昆山尚达智机械有限公司 一种新型的光学比较显微仪器
JP6525161B2 (ja) 2013-04-12 2019-06-05 デイライト ソリューションズ、インコーポレイテッド 赤外光用屈折対物レンズ・アセンブリ
WO2016056147A1 (ja) * 2014-10-08 2016-04-14 オリンパス株式会社 結像光学系、照明装置および観察装置
US11506877B2 (en) 2016-11-10 2022-11-22 The Trustees Of Columbia University In The City Of New York Imaging instrument having objective axis and light sheet or light beam projector axis intersecting at less than 90 degrees
US20190101489A1 (en) * 2017-09-29 2019-04-04 Michael John Darwin Method and Apparatus for Simultaneously Measuring 3Dimensional Structures and Spectral Content of Said Structures
CN108387562B (zh) * 2018-02-02 2020-09-15 中国科学院上海光学精密机械研究所 共聚焦显微系统中针孔轴向位置的调节方法

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH036511A (ja) * 1989-06-05 1991-01-14 Nikon Corp 赤外線用可変濃度フィルタ
JP2931268B2 (ja) 1993-06-03 1999-08-09 浜松ホトニクス株式会社 レーザスキャン光学装置
DE69418248T2 (de) * 1993-06-03 1999-10-14 Hamamatsu Photonics Kk Optisches Laser-Abtastsystem mit Axikon
JPH1020198A (ja) * 1996-07-02 1998-01-23 Olympus Optical Co Ltd 近赤外線顕微鏡及びこれを用いた顕微鏡観察システム
EP1008884B1 (en) * 1997-08-29 2006-09-27 Olympus Optical Co., Ltd. Transmission illuminator for microscopes
JP4503716B2 (ja) * 1997-08-29 2010-07-14 オリンパス株式会社 顕微鏡透過照明装置
GB2349033B (en) * 1998-01-27 2002-06-26 Wisconsin Alumni Res Found Signal enhancement for fluorescence microscopy
DE19858206C2 (de) * 1998-12-17 2001-10-11 Leica Microsystems Verfahren zur Anpassung von Anregungsintensitäten bei einem Multiband-Fluoreszenz-Mikroskop und Multiband-Fluoreszenz-Mikroskop zur Durchführung des Verfahrens
DE10003570A1 (de) * 2000-01-27 2001-08-02 Leica Microsystems Mikroskop-Aufbau
JP2002031758A (ja) * 2000-07-17 2002-01-31 Olympus Optical Co Ltd 顕微鏡
JP2003042845A (ja) * 2001-07-30 2003-02-13 Sony Corp 光学装置
JP2003264842A (ja) * 2002-03-08 2003-09-19 Hitachi Kokusai Electric Inc フィルタ及び調光板及び固体撮像素子
JP2004302421A (ja) * 2003-03-17 2004-10-28 Nikon Corp 全反射顕微鏡
HU227859B1 (en) * 2005-01-27 2012-05-02 E Szilveszter Vizi Real-time 3d nonlinear microscope measuring system and its application
JP4512698B2 (ja) * 2005-08-30 2010-07-28 ナノフォトン株式会社 レーザ顕微鏡
US7542137B2 (en) * 2006-07-24 2009-06-02 University Of Ottawa Pathogen detection using coherent anti-stokes Raman scattering microscopy
KR100829439B1 (ko) * 2007-06-08 2008-05-15 한국표준과학연구원 적외선 사광파 혼합 편광 이미징 장치

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