TWI456255B - 反向聚焦顯微成像結構及方法 - Google Patents
反向聚焦顯微成像結構及方法 Download PDFInfo
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- TWI456255B TWI456255B TW101129807A TW101129807A TWI456255B TW I456255 B TWI456255 B TW I456255B TW 101129807 A TW101129807 A TW 101129807A TW 101129807 A TW101129807 A TW 101129807A TW I456255 B TWI456255 B TW I456255B
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- light
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- imaging structure
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- 238000003384 imaging method Methods 0.000 title claims 15
- 238000000034 method Methods 0.000 title 1
- 238000000386 microscopy Methods 0.000 title 1
- 230000003287 optical effect Effects 0.000 claims 7
- 239000000523 sample Substances 0.000 claims 3
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0056—Optical details of the image generation based on optical coherence, e.g. phase-contrast arrangements, interference arrangements
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/06—Means for illuminating specimens
- G02B21/08—Condensers
- G02B21/082—Condensers for incident illumination only
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/06—Means for illuminating specimens
- G02B21/08—Condensers
- G02B21/14—Condensers affording illumination for phase-contrast observation
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/365—Control or image processing arrangements for digital or video microscopes
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B5/00—Measuring for diagnostic purposes; Identification of persons
- A61B5/0059—Measuring for diagnostic purposes; Identification of persons using light, e.g. diagnosis by transillumination, diascopy, fluorescence
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- Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Optics & Photonics (AREA)
- Multimedia (AREA)
- Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Microscoopes, Condenser (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Claims (13)
- 一種反向聚焦之顯微成像結構,其包括:一第一分光鏡,具有一第一輸入端、一第一導光端及一第一輸出端,其中該第一輸出端係與該第一導光端平行相對,又與該第一輸入端相垂直,自該第一輸入端入射之光線係受該第一分光鏡反射而自該第一導光端射出,且自該第一導光端入射之光線係穿透該第一分光鏡而自該第一輸出端射出;一物鏡,設置於該第一導光端之光路徑上,自該第一導光端入射之光線係由該物鏡聚焦至一待測生醫組織內部,且由該待測生醫組織反射與散射之光線係由該物鏡傳導至該第一導光端;以及一相位共軛模組,其為一相位共軛反射鏡或是一相位共軛訊號處理模組,設置於該第一輸出端之光路徑上。
- 如申請專利範圍第1項所述之顯微成像結構,其中該相位共軛模組為一相位共軛反射鏡。
- 如申請專利範圍第1項所述之顯微成像結構,其中該第一輸入端之光路徑上進一步設置有一空間光調制器。
- 如申請專利範圍第1項所述之顯微成像結構,其中該第一輸入端之光路徑上進一步設置有一衰減器。
- 如申請專利範圍第1項所述之顯微成像結構,其中該第一輸入端之光路徑上進一步設置有一透鏡。
- 如申請專利範圍第1項所述之顯微成像結構,其中該第一輸入端之光路徑上進一步依序串設有一空間光調制器及一 衰減器,其中該空間光調制器係設置於該第一輸入端與該衰減器之間。
- 如申請專利範圍第1項所述之顯微成像結構,其中該第一輸入端之光路徑上進一步依序串設有一電光調制器及一衰減器,其中該電光調制器係設置於該第一輸入端與該衰減器之間。
- 如申請專利範圍第1項所述之顯微成像結構,其中該第一輸入端之光路徑上進一步依序串設有一空間光調制器、一電光調制器及一衰減器,其中該空間光調制器、該電光調制器及該衰減器三者中,該衰減器係與該第一輸入端距離最遠。
- 如申請專利範圍第1項所述之顯微成像結構,其中該第一輸入端之光路徑上進一步依序串設有一透鏡、一空間光調制器、一電光調制器及一衰減器,其中該透鏡、該空間光調制器、該電光調制器及該衰減器四者中,該衰減器係與該第一輸入端距離最遠。
- 如申請專利範圍第1項至第9項其中之一項所述之顯微成像結構,其中該物鏡與該第一導光端之間進一步設有一第二分光鏡,該第二分光鏡係將自該物鏡入射之光線傳導至該第一導光端及與該物鏡及該第一導光端之連線相垂直之一輸出光路徑上,又該輸出光路徑上設有一影像檢測系統。
- 如申請專利範圍第1項所述之顯微成像結構,其中該相位共軛模組包括:一第三分光鏡,其具有一第二導光端、一第二輸入端、一 第三輸入端及一第二輸出端,該第二導光端係耦合於該第一輸出端,又該第二輸入端之輸入光路徑上設有一空間光調制器;一影像感測器,設置於該第二輸出端之光路徑上;以及一光訊號處理系統,用以輸出一控制訊號至該空間光調制器,又讀取該影像感測器之輸出訊號。
- 如申請專利範圍第11項所述之顯微成像結構,其中該第一輸入端之光路徑上進一步依序串設有一該空間光調制器、一電光調制器及一衰減器,其中該空間光調制器、該電光調制器及該衰減器三者中,該衰減器係與該第一輸入端距離最遠。
- 一種反向聚焦之顯微成像方法,其包括下列步驟:將探測光聚焦於生醫組織內部,其係經由物鏡將探測光聚焦於生醫組織內部進行照射;收取生醫組織內散射與反射之光線當作成訊號光,其係利用物鏡收取探測光在生醫組織內散射與反射之光線;利用PCM機制得到共軛訊號光,其係利用一反向聚焦之顯微成像結構得到與該訊號光相位共軛之一共軛訊號光;以及引入原訊號光並調整其光強與共軛訊號光形成高明析度之干涉條紋,其係引入該訊號光並調整其光束強度後,與該共軛訊號光形成高明析度之干涉條紋。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW101129807A TWI456255B (zh) | 2012-08-16 | 2012-08-16 | 反向聚焦顯微成像結構及方法 |
CN201210308029.7A CN103584834B (zh) | 2012-08-16 | 2012-08-27 | 反向聚焦显微成像结构及方法 |
US13/652,206 US9689797B2 (en) | 2012-08-16 | 2012-10-15 | Microscopy imaging structure with phase conjugated mirror and the method thereof |
Applications Claiming Priority (1)
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TW101129807A TWI456255B (zh) | 2012-08-16 | 2012-08-16 | 反向聚焦顯微成像結構及方法 |
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TW201409071A TW201409071A (zh) | 2014-03-01 |
TWI456255B true TWI456255B (zh) | 2014-10-11 |
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TW101129807A TWI456255B (zh) | 2012-08-16 | 2012-08-16 | 反向聚焦顯微成像結構及方法 |
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US (1) | US9689797B2 (zh) |
CN (1) | CN103584834B (zh) |
TW (1) | TWI456255B (zh) |
Families Citing this family (17)
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US9730649B1 (en) | 2016-09-13 | 2017-08-15 | Open Water Internet Inc. | Optical imaging of diffuse medium |
US10778911B2 (en) | 2018-03-31 | 2020-09-15 | Open Water Internet Inc. | Optical transformation device for imaging |
US10778912B2 (en) | 2018-03-31 | 2020-09-15 | Open Water Internet Inc. | System and device for optical transformation |
US10506181B2 (en) | 2018-03-31 | 2019-12-10 | Open Water Internet Inc. | Device for optical imaging |
US10966612B2 (en) | 2018-06-14 | 2021-04-06 | Open Water Internet Inc. | Expanding beam optical element |
US10962929B2 (en) | 2018-09-14 | 2021-03-30 | Open Water Internet Inc. | Interference optics for optical imaging device |
US10874370B2 (en) | 2019-01-28 | 2020-12-29 | Open Water Internet Inc. | Pulse measurement in optical imaging |
CN113574438B (zh) * | 2019-02-03 | 2023-07-18 | 巴伊兰大学 | 通过散射介质成像的系统及方法 |
US10955406B2 (en) | 2019-02-05 | 2021-03-23 | Open Water Internet Inc. | Diffuse optical imaging with multiple beams |
CN109884030A (zh) * | 2019-03-12 | 2019-06-14 | 牛建国 | 一种利用激光的食品/药品安全识别装置 |
US11320370B2 (en) | 2019-06-26 | 2022-05-03 | Open Water Internet Inc. | Apparatus for directing optical and acoustic signals |
US11581696B2 (en) | 2019-08-14 | 2023-02-14 | Open Water Internet Inc. | Multi-channel laser |
US11622686B2 (en) | 2019-11-22 | 2023-04-11 | Open Water Internet, Inc. | Optical imaging with unshifted reference beam |
US11819318B2 (en) | 2020-04-27 | 2023-11-21 | Open Water Internet Inc. | Optical imaging from light coherence |
US11259706B2 (en) | 2020-05-19 | 2022-03-01 | Open Water Internet Inc. | Dual wavelength imaging and out of sample optical imaging |
US11559208B2 (en) | 2020-05-19 | 2023-01-24 | Open Water Internet Inc. | Imaging with scattering layer |
CN112711130B (zh) * | 2020-10-31 | 2022-02-11 | 浙江大学 | 基于电光调制技术的相位调制荧光差分显微成像方法和装置 |
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2012
- 2012-08-16 TW TW101129807A patent/TWI456255B/zh not_active IP Right Cessation
- 2012-08-27 CN CN201210308029.7A patent/CN103584834B/zh not_active Expired - Fee Related
- 2012-10-15 US US13/652,206 patent/US9689797B2/en active Active
Patent Citations (6)
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JP2004303827A (ja) * | 2003-03-28 | 2004-10-28 | National Institute Of Advanced Industrial & Technology | 補償光学用参照点光源の作成法 |
TW200711773A (en) * | 2005-06-17 | 2007-04-01 | Olympus Corp | Laser beam machining method and apparatus |
US20090323056A1 (en) * | 2007-05-04 | 2009-12-31 | The General Hospital Corporation | Methods, arrangements and systems for obtaining information associated with a sample using optical microscopy |
US20110109962A1 (en) * | 2009-11-10 | 2011-05-12 | California Institute Of Technology | Optical phase conjugation 4 pi microscope |
US20120070817A1 (en) * | 2010-09-20 | 2012-03-22 | California Institute Of Technology | Acoustic-assisted iterative wave form optimization for deep tissue focusing |
US20120182558A1 (en) * | 2010-12-17 | 2012-07-19 | Canon Kabushiki Kaisha | Apparatus and method for irradiating a scattering medium |
Also Published As
Publication number | Publication date |
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US20140049631A1 (en) | 2014-02-20 |
TW201409071A (zh) | 2014-03-01 |
CN103584834A (zh) | 2014-02-19 |
US9689797B2 (en) | 2017-06-27 |
CN103584834B (zh) | 2015-09-23 |
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