JP2009076729A5 - - Google Patents

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Publication number
JP2009076729A5
JP2009076729A5 JP2007244969A JP2007244969A JP2009076729A5 JP 2009076729 A5 JP2009076729 A5 JP 2009076729A5 JP 2007244969 A JP2007244969 A JP 2007244969A JP 2007244969 A JP2007244969 A JP 2007244969A JP 2009076729 A5 JP2009076729 A5 JP 2009076729A5
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JP
Japan
Prior art keywords
insulating film
substrate
single crystal
forming
insulating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2007244969A
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English (en)
Japanese (ja)
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JP2009076729A (ja
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Publication date
Application filed filed Critical
Priority to JP2007244969A priority Critical patent/JP2009076729A/ja
Priority claimed from JP2007244969A external-priority patent/JP2009076729A/ja
Publication of JP2009076729A publication Critical patent/JP2009076729A/ja
Publication of JP2009076729A5 publication Critical patent/JP2009076729A5/ja
Withdrawn legal-status Critical Current

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JP2007244969A 2007-09-21 2007-09-21 半導体装置の作製方法 Withdrawn JP2009076729A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2007244969A JP2009076729A (ja) 2007-09-21 2007-09-21 半導体装置の作製方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007244969A JP2009076729A (ja) 2007-09-21 2007-09-21 半導体装置の作製方法

Publications (2)

Publication Number Publication Date
JP2009076729A JP2009076729A (ja) 2009-04-09
JP2009076729A5 true JP2009076729A5 (zh) 2010-10-14

Family

ID=40611419

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007244969A Withdrawn JP2009076729A (ja) 2007-09-21 2007-09-21 半導体装置の作製方法

Country Status (1)

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JP (1) JP2009076729A (zh)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2013057771A1 (ja) * 2011-10-21 2015-04-02 株式会社島津製作所 薄膜トランジスタの製造方法
WO2013057771A1 (ja) * 2011-10-21 2013-04-25 株式会社島津製作所 薄膜トランジスタの製造方法
WO2015050350A1 (ko) * 2013-10-01 2015-04-09 코닝정밀소재 주식회사 전이 기판 제조방법, 이에 의해 제조된 전이 기판, 및 이를 이용한 반도체 소자 제조방법
CN107845606B (zh) * 2017-10-17 2020-05-05 武汉华星光电半导体显示技术有限公司 一种tft基板的制备方法以及tft基板
CN109950392A (zh) * 2019-03-13 2019-06-28 电子科技大学 具有沟槽的单晶薄膜制备方法、单晶薄膜及谐振器

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1145862A (ja) * 1997-07-24 1999-02-16 Denso Corp 半導体基板の製造方法
JPH11145481A (ja) * 1997-11-06 1999-05-28 Denso Corp 半導体基板およびその製造方法
JP4609867B2 (ja) * 1998-07-29 2011-01-12 株式会社半導体エネルギー研究所 Soi基板の作製方法及び半導体装置の作製方法
JP2001102555A (ja) * 1999-09-30 2001-04-13 Seiko Epson Corp 半導体装置、薄膜トランジスタ及びそれらの製造方法
JP2004259970A (ja) * 2003-02-26 2004-09-16 Shin Etsu Handotai Co Ltd Soiウエーハの製造方法及びsoiウエーハ
US7691730B2 (en) * 2005-11-22 2010-04-06 Corning Incorporated Large area semiconductor on glass insulator

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