JP2009025059A5 - - Google Patents

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Publication number
JP2009025059A5
JP2009025059A5 JP2007186444A JP2007186444A JP2009025059A5 JP 2009025059 A5 JP2009025059 A5 JP 2009025059A5 JP 2007186444 A JP2007186444 A JP 2007186444A JP 2007186444 A JP2007186444 A JP 2007186444A JP 2009025059 A5 JP2009025059 A5 JP 2009025059A5
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JP
Japan
Prior art keywords
emi
antenna
band antenna
measurement
antennas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2007186444A
Other languages
English (en)
Japanese (ja)
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JP2009025059A (ja
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Publication date
Application filed filed Critical
Priority to JP2007186444A priority Critical patent/JP2009025059A/ja
Priority claimed from JP2007186444A external-priority patent/JP2009025059A/ja
Publication of JP2009025059A publication Critical patent/JP2009025059A/ja
Publication of JP2009025059A5 publication Critical patent/JP2009025059A5/ja
Pending legal-status Critical Current

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JP2007186444A 2007-07-18 2007-07-18 Ｅｍｉ測定システム及びｅｍｉ測定方法 Pending JP2009025059A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2007186444A JP2009025059A (ja) 2007-07-18 2007-07-18 Ｅｍｉ測定システム及びｅｍｉ測定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007186444A JP2009025059A (ja) 2007-07-18 2007-07-18 Ｅｍｉ測定システム及びｅｍｉ測定方法

Publications (2)

Publication Number Publication Date
JP2009025059A JP2009025059A (ja) 2009-02-05
JP2009025059A5 true JP2009025059A5 (zh) 2010-06-17

Family

ID=40397011

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007186444A Pending JP2009025059A (ja) 2007-07-18 2007-07-18 Ｅｍｉ測定システム及びｅｍｉ測定方法

Country Status (1)

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JP (1) JP2009025059A (zh)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5582075B2 (ja) * 2011-03-17 2014-09-03 富士通株式会社 ノイズ測定方法、ノイズ測定装置、およびノイズ測定プログラム
KR101937227B1 (ko) * 2016-07-15 2019-01-11 주식회사 테스콤 안테나 구동 기반의 테스트 시스템
CN107796995A (zh) * 2017-11-30 2018-03-13 上海英恒电子有限公司 微波暗室及相应的天线测试系统

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2942569B2 (ja) * 1989-02-28 1999-08-30 アンリツ株式会社 Ｅｍｉ測定装置
JPH06138158A (ja) * 1992-10-27 1994-05-20 Fuji Xerox Co Ltd 妨害波識別システム
JPH0886821A (ja) * 1994-09-16 1996-04-02 Fujitsu Ltd 電波測定装置
JP2001116785A (ja) * 1999-10-18 2001-04-27 Kankyo Denji Gijutsu Kenkyusho:Kk 放射電磁妨害波の測定方法及び装置
JP2001228188A (ja) * 2000-02-21 2001-08-24 San Technos Kk 電波暗室
JP4338292B2 (ja) * 2000-05-23 2009-10-07 Ｔｄｋ株式会社 ノイズ測定システム、ノイズ測定方法およびノイズ測定用プログラムを記録した記録媒体

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