JP2009025059A5 - - Google Patents

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Publication number
JP2009025059A5
JP2009025059A5 JP2007186444A JP2007186444A JP2009025059A5 JP 2009025059 A5 JP2009025059 A5 JP 2009025059A5 JP 2007186444 A JP2007186444 A JP 2007186444A JP 2007186444 A JP2007186444 A JP 2007186444A JP 2009025059 A5 JP2009025059 A5 JP 2009025059A5
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Japan
Prior art keywords
emi
antenna
band antenna
measurement
antennas
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Pending
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JP2007186444A
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Japanese (ja)
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JP2009025059A (en
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Priority to JP2007186444A priority Critical patent/JP2009025059A/en
Priority claimed from JP2007186444A external-priority patent/JP2009025059A/en
Publication of JP2009025059A publication Critical patent/JP2009025059A/en
Publication of JP2009025059A5 publication Critical patent/JP2009025059A5/ja
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Claims (6)

外界からの電波を遮断したEMI測定用の電波暗室内に、被試験装置を載せて回転させることが可能なターンテーブルと、前記被試験装置から放射された電波の内、周波数帯域の異なる2種類の電波を受信させるための2種類のアンテナを配置し、前記電波暗室外には、前記アンテナからの受信信号を基にEMI測定を行うEMI測定器と、EMI測定全体の制御を行う測定用制御装置を設置し、
前記測定用制御装置の制御により、前記ターンテーブルを回転させながら前記2種類のアンテナにより、2種類の周波数帯域でのEMI測定を同時に行うEMI測定システムであって、
前記2種類のアンテナの内、一方のアンテナを30MHZ 〜1GHZ を測定するためのMHZ 帯アンテナとし、前記他方のアンテナを1GHZ 以上の周波数帯の測定を行うGHZ 帯アンテナとして、個別にアンテナ昇降台に設置してアンテナの高さを可変できるように構成すると共に、前記2種類のアンテナは、お互いの電波反射影響を抑えるため、被測定装置を中心にして、互いに90°の向きに設置してEMI測定ができるように構成したことを特徴とするEMI測定システム。
A turntable capable of mounting and rotating the device under test in an EMI measurement anechoic chamber that blocks radio waves from the outside, and two types of radio waves radiated from the device under test having different frequency bands Two types of antennas for receiving radio waves are arranged, and outside the anechoic chamber, an EMI measuring device that performs EMI measurement based on a received signal from the antenna, and a measurement control that controls the entire EMI measurement Install the equipment,
An EMI measurement system that simultaneously performs EMI measurements in two frequency bands with the two types of antennas while rotating the turntable under the control of the measurement control device;
Of the two kinds of antennas, one antenna and MH Z band antenna for measuring 30MH Z ~1GH Z, as the other GH Z band antenna for measuring the frequency bands above 1GH Z antennas, separate The two antennas are arranged at 90 ° with respect to the device under test so as to suppress the influence of mutual radio wave reflection. An EMI measurement system, which is configured so as to be installed in a EMI measurement system.
前記EMI測定器を少なくとも2台で構成し、
前記MHZ 帯アンテナと、GHZ 帯アンテナを、それぞれ前記電波暗室の外に設置した専用のEMI測定器に個別に接続したことを特徴とする請求項1記載のEMI測定システム。
The EMI measuring instrument is composed of at least two units,
2. The EMI measurement system according to claim 1, wherein the MH Z band antenna and the GH Z band antenna are individually connected to dedicated EMI measuring devices installed outside the anechoic chamber, respectively.
前記MHZ 帯アンテナを水平方向に設定した場合、前記GHZ 帯アンテナを垂直方向に設定し、前記MHZ 帯アンテナを垂直方向に設定した場合、前記GHZ 帯アンテナを水平方向に設定するように、前記両方のアンテナを異なる偏波に設定して、反射波が他のアンテナに入ることを防止するようにしたことを特徴とする請求項1記載のEMI測定システム。 When the MH Z band antenna is set in the horizontal direction, the GH Z band antenna is set in the vertical direction, and when the MH Z band antenna is set in the vertical direction, the GH Z band antenna is set in the horizontal direction. The EMI measurement system according to claim 1, wherein both antennas are set to different polarizations to prevent a reflected wave from entering another antenna. 前記アンテナ昇降台により、前記MHZ 帯アンテナと、GHZ 帯アンテナの高さを設定する場合、両方のアンテナの高さを異なる高さに設定して、反射波が他のアンテナに入ることを防止したことを特徴とする請求項1記載のEMI測定システム。 When the height of the MH Z band antenna and the GH Z band antenna is set by the antenna lifting platform, the height of both antennas is set to a different height so that the reflected wave enters the other antenna. The EMI measurement system according to claim 1, which is prevented. 外界からの電波を遮断したEMI測定用の電波暗室内に、被試験装置を載せて回転させることが可能なターンテーブルと、前記被試験装置から放射された電波の内、周波数帯域の異なる2種類の電波を受信させるためのアンテナを配置し、前記電波暗室外には、アンテナからの受信信号を基にEMI測定を行うEMI測定器と、EMI測定全体の制御を行う測定用制御装置を設置し、
前記測定用制御装置の制御により前記ターンテーブルを回転させながら、前記2種類のアンテナにより、周波数の異なる2種類の周波数帯域でのEMI測定を同時に行うEMI測定方法であって、
前記測定用制御装置の制御により、MHZ アンテナ用のアンテナ昇降台と、GHZ アンテナ用のアンテナ昇降台を、それぞれの周波数に適したアンテナの高さに設定する第1の手順と、
前記第1の手順が終了した時点で、それそれのアンテナに接続されたEMI測定器をデータ書き込み状態にする第2の手順と、
前記第2の手順が終了した時点で、前記ターンテーブルを回転させ、回転が終了した時点で、それぞれのEMI測定器のデータ書き込みを終了する第3の手順と、
前記第3の手順が終了した時点で、測定したデータを取り込む第4の手順とを実行することでEMI測定を行うことを特徴とするEMI測定方法。
A turntable capable of mounting and rotating the device under test in an EMI measurement anechoic chamber that blocks radio waves from the outside, and two types of radio waves radiated from the device under test having different frequency bands An EMI measuring device that performs EMI measurement based on a received signal from the antenna and a measurement control device that controls the entire EMI measurement are installed outside the anechoic chamber. ,
An EMI measurement method for simultaneously performing EMI measurement in two types of frequency bands with different frequencies using the two types of antennas while rotating the turntable under the control of the measurement control device,
A first procedure for setting the antenna lift for the MH Z antenna and the antenna lift for the GH Z antenna to antenna heights suitable for the respective frequencies under the control of the measurement control device;
A second procedure for setting the EMI measuring device connected to each antenna to a data writing state when the first procedure is completed;
When the second procedure is finished, the turntable is rotated, and when the rotation is finished, a third procedure for ending data writing of each EMI measuring device;
An EMI measurement method, wherein EMI measurement is performed by executing a fourth procedure for capturing measured data when the third procedure is completed.
前記MHMH Z Z 帯アンテナが垂直偏波の場合、該MHWhen the band antenna is vertically polarized, the MH Z Z 帯アンテナの高さは1mに設定し、前記GHThe height of the band antenna is set to 1 m and the GH Z Z 帯アンテナは水平偏波として高さ1.5mに設定することを特徴とする請求項3又は4に記載のEMI測定システム。The EMI measurement system according to claim 3 or 4, wherein the band antenna is set to a height of 1.5 m as a horizontally polarized wave.
JP2007186444A 2007-07-18 2007-07-18 Emi-measuring system and emi measurement method Pending JP2009025059A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2007186444A JP2009025059A (en) 2007-07-18 2007-07-18 Emi-measuring system and emi measurement method

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Application Number Priority Date Filing Date Title
JP2007186444A JP2009025059A (en) 2007-07-18 2007-07-18 Emi-measuring system and emi measurement method

Publications (2)

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JP2009025059A JP2009025059A (en) 2009-02-05
JP2009025059A5 true JP2009025059A5 (en) 2010-06-17

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5582075B2 (en) * 2011-03-17 2014-09-03 富士通株式会社 Noise measurement method, noise measurement device, and noise measurement program
KR101937227B1 (en) * 2016-07-15 2019-01-11 주식회사 테스콤 Test system based on actuating antenna
CN107796995A (en) * 2017-11-30 2018-03-13 上海英恒电子有限公司 Microwave dark room and corresponding Antenna testing system

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JP2942569B2 (en) * 1989-02-28 1999-08-30 アンリツ株式会社 EMI measurement device
JPH06138158A (en) * 1992-10-27 1994-05-20 Fuji Xerox Co Ltd Interference-wave discrimination system
JPH0886821A (en) * 1994-09-16 1996-04-02 Fujitsu Ltd Radio wave measuring apparatus
JP2001116785A (en) * 1999-10-18 2001-04-27 Kankyo Denji Gijutsu Kenkyusho:Kk Method and apparatus for measuring radiation electromagnetic jamming wave
JP2001228188A (en) * 2000-02-21 2001-08-24 San Technos Kk Anechoic chamber
JP4338292B2 (en) * 2000-05-23 2009-10-07 Tdk株式会社 Noise measurement system, noise measurement method, and recording medium recording noise measurement program

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