JP2008546550A - Cmpのための透過性微細多孔質材料 - Google Patents

Cmpのための透過性微細多孔質材料 Download PDF

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Publication number
JP2008546550A
JP2008546550A JP2008518178A JP2008518178A JP2008546550A JP 2008546550 A JP2008546550 A JP 2008546550A JP 2008518178 A JP2008518178 A JP 2008518178A JP 2008518178 A JP2008518178 A JP 2008518178A JP 2008546550 A JP2008546550 A JP 2008546550A
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JP
Japan
Prior art keywords
polishing pad
pad substrate
polishing
substrate
thermoplastic polyurethane
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2008518178A
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English (en)
Japanese (ja)
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JP2008546550A5 (enExample
Inventor
プラサード,アバネシュワー
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CMC Materials LLC
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Cabot Microelectronics Corp
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Filing date
Publication date
Application filed by Cabot Microelectronics Corp filed Critical Cabot Microelectronics Corp
Publication of JP2008546550A publication Critical patent/JP2008546550A/ja
Publication of JP2008546550A5 publication Critical patent/JP2008546550A5/ja
Pending legal-status Critical Current

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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/20Lapping pads for working plane surfaces
    • B24B37/24Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24DTOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D13/00Wheels having flexibly-acting working parts, e.g. buffing wheels; Mountings therefor
    • B24D13/02Wheels having flexibly-acting working parts, e.g. buffing wheels; Mountings therefor acting by their periphery
    • B24D13/12Wheels having flexibly-acting working parts, e.g. buffing wheels; Mountings therefor acting by their periphery comprising assemblies of felted or spongy material, e.g. felt, steel wool, foamed latex
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24DTOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D3/00Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
    • B24D3/02Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent
    • B24D3/20Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent and being essentially organic
    • B24D3/28Resins or natural or synthetic macromolecular compounds
    • B24D3/32Resins or natural or synthetic macromolecular compounds for porous or cellular structure
    • H10P52/00

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  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Manufacture Of Porous Articles, And Recovery And Treatment Of Waste Products (AREA)
JP2008518178A 2005-06-22 2006-05-24 Cmpのための透過性微細多孔質材料 Pending JP2008546550A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/158,694 US7267607B2 (en) 2002-10-28 2005-06-22 Transparent microporous materials for CMP
PCT/US2006/020193 WO2007001699A1 (en) 2005-06-22 2006-05-24 Tranparent microporous materials for cmp

Publications (2)

Publication Number Publication Date
JP2008546550A true JP2008546550A (ja) 2008-12-25
JP2008546550A5 JP2008546550A5 (enExample) 2009-07-09

Family

ID=37101929

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008518178A Pending JP2008546550A (ja) 2005-06-22 2006-05-24 Cmpのための透過性微細多孔質材料

Country Status (8)

Country Link
US (1) US7267607B2 (enExample)
EP (1) EP1915233B1 (enExample)
JP (1) JP2008546550A (enExample)
KR (1) KR101265370B1 (enExample)
CN (1) CN101208180A (enExample)
IL (1) IL187705A (enExample)
TW (1) TWI295946B (enExample)
WO (1) WO2007001699A1 (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016528054A (ja) * 2013-08-22 2016-09-15 キャボット マイクロエレクトロニクス コーポレイション 独立気泡構造を有する超高空隙体積研磨パッド
JP2016533037A (ja) * 2013-08-22 2016-10-20 キャボット マイクロエレクトロニクス コーポレイション 多孔質界面および中実コアを備えた研磨パッドならびにその装置および方法
JP2019521231A (ja) * 2016-07-11 2019-07-25 浙江新恒泰新材料有限公司 高倍率の熱可塑性ポリウレタン微細孔発泡シート及びその生産方法

Families Citing this family (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050276967A1 (en) * 2002-05-23 2005-12-15 Cabot Microelectronics Corporation Surface textured microporous polishing pads
JP3754436B2 (ja) * 2004-02-23 2006-03-15 東洋ゴム工業株式会社 研磨パッドおよびそれを使用する半導体デバイスの製造方法
US7438636B2 (en) * 2006-12-21 2008-10-21 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Chemical mechanical polishing pad
TW200904591A (en) * 2007-07-18 2009-02-01 Kinik Co Polishing tool having brazing filler layer made from spraying molding and processing method utilizing the same
EP2389275A1 (en) 2009-01-05 2011-11-30 innoPad, Inc. Multi-layered chemical-mechanical planarization pad
WO2010143899A2 (ko) * 2009-06-10 2010-12-16 주식회사 엘지화학 다공성 시트의 제조방법 및 이에 의해 제조된 다공성 시트
KR101217265B1 (ko) 2009-06-24 2012-12-31 주식회사 엘지화학 다공성 시트의 제조방법 및 이에 의해 제조된 다공성 시트
US8162728B2 (en) 2009-09-28 2012-04-24 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Dual-pore structure polishing pad
US9017140B2 (en) 2010-01-13 2015-04-28 Nexplanar Corporation CMP pad with local area transparency
WO2011112352A1 (en) 2010-03-10 2011-09-15 Dow Global Technologies Llc Nanoporous polymeric foam having high cell density without nanofiller
US9156124B2 (en) 2010-07-08 2015-10-13 Nexplanar Corporation Soft polishing pad for polishing a semiconductor substrate
DE102010026722A1 (de) 2010-07-09 2012-01-12 Ahlbrandt System Gmbh Vorrichtung zum Modifizieren der Oberfläche von Bahn-, Platten- oder Bogenware
US9186772B2 (en) 2013-03-07 2015-11-17 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Chemical mechanical polishing pad with broad spectrum, endpoint detection window and method of polishing therewith
US9873180B2 (en) 2014-10-17 2018-01-23 Applied Materials, Inc. CMP pad construction with composite material properties using additive manufacturing processes
US10399201B2 (en) 2014-10-17 2019-09-03 Applied Materials, Inc. Advanced polishing pads having compositional gradients by use of an additive manufacturing process
US10821573B2 (en) 2014-10-17 2020-11-03 Applied Materials, Inc. Polishing pads produced by an additive manufacturing process
US11745302B2 (en) 2014-10-17 2023-09-05 Applied Materials, Inc. Methods and precursor formulations for forming advanced polishing pads by use of an additive manufacturing process
US10875153B2 (en) 2014-10-17 2020-12-29 Applied Materials, Inc. Advanced polishing pad materials and formulations
US10875145B2 (en) 2014-10-17 2020-12-29 Applied Materials, Inc. Polishing pads produced by an additive manufacturing process
US9776361B2 (en) 2014-10-17 2017-10-03 Applied Materials, Inc. Polishing articles and integrated system and methods for manufacturing chemical mechanical polishing articles
CN107078048B (zh) 2014-10-17 2021-08-13 应用材料公司 使用加成制造工艺的具复合材料特性的cmp衬垫建构
US20160121578A1 (en) * 2014-10-29 2016-05-05 Nonwoven Networks Llc High performance moldable composite
CN113103145B (zh) 2015-10-30 2023-04-11 应用材料公司 形成具有期望ζ电位的抛光制品的设备与方法
US10593574B2 (en) 2015-11-06 2020-03-17 Applied Materials, Inc. Techniques for combining CMP process tracking data with 3D printed CMP consumables
US10391605B2 (en) 2016-01-19 2019-08-27 Applied Materials, Inc. Method and apparatus for forming porous advanced polishing pads using an additive manufacturing process
CN108698206B (zh) 2016-01-19 2021-04-02 应用材料公司 多孔化学机械抛光垫
US10259099B2 (en) * 2016-08-04 2019-04-16 Rohm And Haas Electronic Materials Cmp Holdings, Inc. Tapering method for poromeric polishing pad
US11471999B2 (en) 2017-07-26 2022-10-18 Applied Materials, Inc. Integrated abrasive polishing pads and manufacturing methods
WO2019032286A1 (en) 2017-08-07 2019-02-14 Applied Materials, Inc. ABRASIVE DISTRIBUTION POLISHING PADS AND METHODS OF MAKING SAME
WO2020050932A1 (en) 2018-09-04 2020-03-12 Applied Materials, Inc. Formulations for advanced polishing pads
US11813712B2 (en) 2019-12-20 2023-11-14 Applied Materials, Inc. Polishing pads having selectively arranged porosity
US11806829B2 (en) 2020-06-19 2023-11-07 Applied Materials, Inc. Advanced polishing pads and related polishing pad manufacturing methods
KR102794221B1 (ko) * 2020-11-19 2025-04-15 주식회사 케이씨텍 기판 연마 장치
US11878389B2 (en) 2021-02-10 2024-01-23 Applied Materials, Inc. Structures formed using an additive manufacturing process for regenerating surface texture in situ
CN114536212B (zh) * 2022-01-29 2024-02-09 浙江环龙新材料科技有限公司 一种微孔热塑性聚氨酯抛光垫及其半连续制备方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003218074A (ja) * 2001-11-13 2003-07-31 Toyobo Co Ltd 半導体ウエハ研磨パッド及び半導体ウエハの研磨方法
US20030220061A1 (en) * 2002-05-23 2003-11-27 Cabot Microelectronics Corporation Microporous polishing pads
JP2004043768A (ja) * 2001-12-07 2004-02-12 Toyo Tire & Rubber Co Ltd 研磨パッド

Family Cites Families (51)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4138228A (en) * 1977-02-02 1979-02-06 Ralf Hoehn Abrasive of a microporous polymer matrix with inorganic particles thereon
US4239567A (en) * 1978-10-16 1980-12-16 Western Electric Company, Inc. Removably holding planar articles for polishing operations
JPH01193166A (ja) * 1988-01-28 1989-08-03 Showa Denko Kk 半導体ウェハ鏡面研磨用パッド
US5182307A (en) * 1990-11-21 1993-01-26 Board Of Regents Of The University Of Washington Polyethylene terephthalate foams with integral crystalline skins
DE4321823C2 (de) * 1993-07-01 1997-03-06 Telefunken Microelectron Beleuchtungseinheit für Leuchtschilder
US5441598A (en) * 1993-12-16 1995-08-15 Motorola, Inc. Polishing pad for chemical-mechanical polishing of a semiconductor substrate
US5489233A (en) * 1994-04-08 1996-02-06 Rodel, Inc. Polishing pads and methods for their use
US5684055A (en) * 1994-12-13 1997-11-04 University Of Washington Semi-continuous production of solid state polymeric foams
US5893796A (en) * 1995-03-28 1999-04-13 Applied Materials, Inc. Forming a transparent window in a polishing pad for a chemical mechanical polishing apparatus
US5964643A (en) * 1995-03-28 1999-10-12 Applied Materials, Inc. Apparatus and method for in-situ monitoring of chemical mechanical polishing operations
US5605760A (en) 1995-08-21 1997-02-25 Rodel, Inc. Polishing pads
GB2316414B (en) * 1996-07-31 2000-10-11 Tosoh Corp Abrasive shaped article, abrasive disc and polishing method
WO1998008667A2 (en) * 1996-08-27 1998-03-05 Trexel, Inc. Method and apparatus for microcellular polymer extrusion
WO1998028108A1 (en) 1996-12-20 1998-07-02 Unique Technology International Private Limited Manufacture of porous polishing pad
US6022268A (en) * 1998-04-03 2000-02-08 Rodel Holdings Inc. Polishing pads and methods relating thereto
DE69809265T2 (de) * 1997-04-18 2003-03-27 Cabot Microelectronics Corp., Aurora Polierkissen fur einen halbleitersubstrat
US6235380B1 (en) * 1997-07-24 2001-05-22 Trexel, Inc. Lamination of microcellular articles
EP1040158B2 (en) * 1997-12-19 2012-04-18 Trexel, Inc. Microcellular foam extrusion/blow molding process and article made thereby
US6231942B1 (en) * 1998-01-21 2001-05-15 Trexel, Inc. Method and apparatus for microcellular polypropylene extrusion, and polypropylene articles produced thereby
GB2334205B (en) * 1998-02-12 2001-11-28 Shinetsu Handotai Kk Polishing method for semiconductor wafer and polishing pad used therein
US6248000B1 (en) * 1998-03-24 2001-06-19 Nikon Research Corporation Of America Polishing pad thinning to optically access a semiconductor wafer surface
JP2918883B1 (ja) * 1998-07-15 1999-07-12 日本ピラー工業株式会社 研磨パッド
JP3685064B2 (ja) 1998-08-28 2005-08-17 東レ株式会社 研磨パッド
US6322347B1 (en) 1999-04-02 2001-11-27 Trexel, Inc. Methods for manufacturing foam material including systems with pressure restriction element
EP1043378B1 (en) * 1999-04-09 2006-02-15 Tosoh Corporation Molded abrasive product and polishing wheel using it
US6656018B1 (en) 1999-04-13 2003-12-02 Freudenberg Nonwovens Limited Partnership Polishing pads useful in chemical mechanical polishing of substrates in the presence of a slurry containing abrasive particles
US6146242A (en) * 1999-06-11 2000-11-14 Strasbaugh, Inc. Optical view port for chemical mechanical planarization endpoint detection
US6171181B1 (en) * 1999-08-17 2001-01-09 Rodel Holdings, Inc. Molded polishing pad having integral window
JP2001062703A (ja) * 1999-08-27 2001-03-13 Asahi Chem Ind Co Ltd 多孔性樹脂窓付き研磨パッド
US6602064B1 (en) 1999-08-31 2003-08-05 Trexel, Inc. Polymer processing system and apparatus
US20020090819A1 (en) 1999-08-31 2002-07-11 Cangshan Xu Windowless belt and method for improved in-situ wafer monitoring
EP1224060B1 (en) * 1999-09-29 2004-06-23 Rodel Holdings, Inc. Polishing pad
AU2750201A (en) 1999-11-05 2001-05-30 Trexel, Inc. Thermoformed polyolefin foams and methods of their production
US6368200B1 (en) * 2000-03-02 2002-04-09 Agere Systems Guardian Corporation Polishing pads from closed-cell elastomer foam
EP1263548A1 (en) 2000-03-15 2002-12-11 Rodel Holdings, Inc. Window portion with an adjusted rate of wear
US6454634B1 (en) * 2000-05-27 2002-09-24 Rodel Holdings Inc. Polishing pads for chemical mechanical planarization
JP3925041B2 (ja) * 2000-05-31 2007-06-06 Jsr株式会社 研磨パッド用組成物及びこれを用いた研磨パッド
JP2001348271A (ja) * 2000-06-01 2001-12-18 Tosoh Corp 研磨用成形体及びこれを用いた研磨用定盤
US6685537B1 (en) 2000-06-05 2004-02-03 Speedfam-Ipec Corporation Polishing pad window for a chemical mechanical polishing tool
US6623337B2 (en) 2000-06-30 2003-09-23 Rodel Holdings, Inc. Base-pad for a polishing pad
US6458013B1 (en) 2000-07-31 2002-10-01 Asml Us, Inc. Method of chemical mechanical polishing
US6477926B1 (en) * 2000-09-15 2002-11-12 Ppg Industries Ohio, Inc. Polishing pad
US6641471B1 (en) * 2000-09-19 2003-11-04 Rodel Holdings, Inc Polishing pad having an advantageous micro-texture and methods relating thereto
US20020072296A1 (en) * 2000-11-29 2002-06-13 Muilenburg Michael J. Abrasive article having a window system for polishing wafers, and methods
EP1211024A3 (en) 2000-11-30 2004-01-02 JSR Corporation Polishing method
US20020098790A1 (en) * 2001-01-19 2002-07-25 Burke Peter A. Open structure polishing pad and methods for limiting pore depth
US20020098789A1 (en) * 2001-01-19 2002-07-25 Peter A. Burke Polishing pad and methods for improved pad surface and pad interior characteristics
WO2002070200A1 (en) * 2001-03-01 2002-09-12 Cabot Microelectronics Corporation Method for manufacturing a polishing pad having a compressed translucent region
KR100877385B1 (ko) 2001-11-13 2009-01-07 도요 고무 고교 가부시키가이샤 연마 패드 및 그 제조 방법
US7435165B2 (en) * 2002-10-28 2008-10-14 Cabot Microelectronics Corporation Transparent microporous materials for CMP
US6998166B2 (en) 2003-06-17 2006-02-14 Cabot Microelectronics Corporation Polishing pad with oriented pore structure

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003218074A (ja) * 2001-11-13 2003-07-31 Toyobo Co Ltd 半導体ウエハ研磨パッド及び半導体ウエハの研磨方法
JP2004043768A (ja) * 2001-12-07 2004-02-12 Toyo Tire & Rubber Co Ltd 研磨パッド
US20030220061A1 (en) * 2002-05-23 2003-11-27 Cabot Microelectronics Corporation Microporous polishing pads

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016528054A (ja) * 2013-08-22 2016-09-15 キャボット マイクロエレクトロニクス コーポレイション 独立気泡構造を有する超高空隙体積研磨パッド
JP2016533037A (ja) * 2013-08-22 2016-10-20 キャボット マイクロエレクトロニクス コーポレイション 多孔質界面および中実コアを備えた研磨パッドならびにその装置および方法
JP2019521231A (ja) * 2016-07-11 2019-07-25 浙江新恒泰新材料有限公司 高倍率の熱可塑性ポリウレタン微細孔発泡シート及びその生産方法

Also Published As

Publication number Publication date
IL187705A (en) 2013-03-24
WO2007001699A1 (en) 2007-01-04
TW200702102A (en) 2007-01-16
TWI295946B (en) 2008-04-21
EP1915233B1 (en) 2019-01-30
EP1915233A1 (en) 2008-04-30
KR20080016663A (ko) 2008-02-21
CN101208180A (zh) 2008-06-25
US7267607B2 (en) 2007-09-11
KR101265370B1 (ko) 2013-05-22
US20050277371A1 (en) 2005-12-15
IL187705A0 (en) 2008-08-07

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